TW202002133A

TW202002133A - Receiving and correcting unit of electronic component, and operation categorizing equipment applying the same in which the center positions of the electronic components of different sizes are aligned with the preset correction positions of the receiving member for accurately correcting the electronic components of different sizes

Info

Publication number: TW202002133A
Application number: TW107122657A
Authority: TW
Inventors: 蔡志欣
Original assignee: 鴻勁精密股份有限公司
Priority date: 2018-06-29
Filing date: 2018-06-29
Publication date: 2020-01-01
Also published as: TWI710047B

Abstract

The present invention relates to a receiving and correcting unit of electronic component, wherein the carrier is allocated with a receiving member capable of receiving electronic components. The first and second sides of the receiving member are respectively provided with the first and second abutment members. Also, a first correction tool having a first pushing member and a first resisting member is provided on the first side of the receiving member. A second correction tool having a second pushing member and a second resisting member is provided on the second side. A driving mechanism is provided on the carrier with two first and second driving sources that respectively drive the displacement of the first and second correction tools. The first and second driving sources are used to drive the first and second correction tools for relative displacement and can move the electronic components of different sizes. When the first and second abutment members of the receiving member are abutted against the first and second resisting members, the center positions of the electronic components of different sizes are aligned with the preset correction positions of the receiving member to achieve the practical benefits of accurately correcting the electronic components of different sizes.

Description

電子元件承置校正單元及其應用之作業分類設備 Electronic component bearing correction unit and its applied operation classification equipment

本發明係提供一種可使不同尺寸之電子元件的中心位置對位於預設校正位置，以利精準校正不同尺寸電子元件之承置校正單元。 The invention provides a supporting and correcting unit that enables the center positions of electronic components of different sizes to be located at preset calibration positions, so as to accurately calibrate electronic components of different sizes.

在現今，電子元件日趨精密輕巧，自動化作業設備係以移料器將電子元件移載至各裝置之承置器，該承置器可為料盤、預溫盤或載台等，若電子元件偏移擺置於承置器內，當移料器將偏置之電子元件移入下一製程之測試座時，由於該偏置之電子元件的中心位置無法對位測試座之中心位置，不僅影響電子元件移入測試座之準確性，更將影響測試品質，故業者係於機台上設有一校正機構，用以校正電子元件之中心位置，以期提升移料器之取放料精準性。 Nowadays, electronic components are becoming more and more precise and lightweight. Automated operation equipment transfers electronic components to the holders of various devices by means of a material shifter. The holder can be a material tray, a pre-heating plate or a stage. The offset is placed in the holder. When the feeder moves the offset electronic component into the test base of the next process, the center position of the offset electronic component cannot be aligned with the center position of the test base, which not only affects The accuracy of moving the electronic components into the test seat will also affect the quality of the test. Therefore, the manufacturer is equipped with a correction mechanism on the machine to correct the center position of the electronic components, in order to improve the accuracy of the pick and place of the feeder.

請參閱第1圖，該校正機構係於一台板11上固設一呈L型之基準件12，並於基準件12之對角處設有一由壓缸13驅動位移之夾持件14，當移料器21將電子元件22移入基準件12與夾持件14之間，且置放於台板11上時，該壓缸13即驅動夾持件14相對基準件12作位移，令夾持件14推移電子元件22，使電子元件22之一角部靠抵於基準件12而定位，進而校正電子元件22之中心位置A，使電子元件22之中心位置A相對於移料器21之中心位置，再供移料器21取出已校正之電子元件22，並移載至下一製程之測試座(圖未示出)而執行測試作業；惟，該校正機構於使用上具有如下缺失： Please refer to FIG. 1, the calibration mechanism is fixed on a plate 11 with an L-shaped reference member 12, and a clamping member 14 driven and displaced by a pressing cylinder 13 is provided at the diagonal of the reference member 12, When the material shifter 21 moves the electronic component 22 between the reference member 12 and the clamping member 14 and places it on the platen 11, the pressing cylinder 13 drives the clamping member 14 to displace relative to the reference member 12, so that the clamping The holding member 14 pushes the electronic component 22 so that one corner of the electronic component 22 is positioned against the reference member 12 and then corrects the center position A of the electronic component 22 so that the center position A of the electronic component 22 is relative to the center of the material shifter 21 At the position, the feeder 21 takes out the calibrated electronic component 22 and transfers it to the test seat (not shown) of the next process to perform the test operation; however, the calibration mechanism has the following defects in use:

1．由於不同型式之電子元件具有不同尺寸，當移料器21將另一批次大尺寸之電子元件23移入校正機構時，該夾持件1 4雖可推移電子元件23靠抵於基準件12而定位，但大尺寸之電子元件23的中心位置B已改變，當移料器21位移至預設取料位置時，移料器21之中心位置並無法對位於大尺寸電子元件23之中心位置B，導致移料器21取出偏置之電子元件23，進而降低校正使用效能。 1. Since different types of electronic components have different sizes, when the feeder 21 moves another batch of large-sized electronic components 23 into the calibration mechanism, the clamping member 14 can move the electronic component 23 against the reference member 12 Positioning, but the center position B of the large-sized electronic component 23 has changed. When the feeder 21 is moved to the preset retrieving position, the center position of the feeder 21 cannot be located at the center position B of the large-sized electronic component 23 , Causing the shifter 21 to take out the biased electronic component 23, thereby reducing the calibration performance.

2．請參閱第2圖，該校正機構之基準件12係固定於台板11上，由於移料器21上之電子元件24的偏置量不一，若移料器21將偏置量較大之電子元件24依預設卸料位置作Z方向向下位移時，易發生偏置之電子元件24碰撞到基準件12，導致電子元件24受損，進而影響測試品質。 2. Please refer to FIG. 2, the reference member 12 of the calibration mechanism is fixed on the platen 11, because the offset of the electronic components 24 on the shifter 21 is different, if the shifter 21 will have a larger offset When the electronic component 24 is displaced downward in the Z direction according to the preset discharge position, the electronic component 24 that is easily biased collides with the reference member 12, causing the electronic component 24 to be damaged, thereby affecting the test quality.

本發明之目的一，係提供一種電子元件承置校正單元，其係於載具上配置可承置電子元件之承置件，該承置件之第一、二側分別設有第一、二承靠部件，另於承置件之第一側方設置一具第一頂推部件及第一抵擋部件之第一校正具，以及於第二側方設置一具第二頂推部件及第二抵擋部件之第二校正具，一驅動機構係於載具上設置二分別驅動第一、二校正具位移之第一、二驅動源，利用第一、二驅動源驅動第一、二校正具作相對位移而可推移不同尺寸之電子元件，並於第一、二抵擋部件靠置於承置件之第一、二承靠部件時，使不同尺寸電子元件之中心位置對位於承置件之預設校正位置，達到精準校正不同尺寸電子元件之實用效益。 The first object of the present invention is to provide an electronic component receiving and correcting unit, which is configured on the carrier with a supporting member capable of supporting an electronic component, and the first and second sides of the supporting member are provided with first and second sides respectively The bearing component, a first calibrating tool with a first pushing component and a first resisting component is provided on the first side of the receiving member, and a second pushing component and a second component are provided on the second side The second calibration tool of the resisting component, a driving mechanism is provided on the carrier with two first and second driving sources respectively driving the displacement of the first and second calibration tools, and the first and second driving sources are used to drive the first and second calibration tools Relative displacement can move electronic components of different sizes, and when the first and second resisting parts are placed against the first and second bearing parts of the supporting member, the center position of the electronic components of different sizes is placed on the pre-position of the supporting member Set the calibration position to achieve the practical benefit of accurately calibrating electronic components of different sizes.

本發明之目的二，係提供一種電子元件承置校正單元，其中，該第一、二校正具係採活動式配置於載具上，於移料器移入該偏置之電子元件前，驅動機構之第一、二驅動源即驅動第一、二校正具向外位移開啟，以提供較大之入料空間，進而有效避免電子元件碰撞受損，達到提升電子元件良率及測試品質之實用效益。 The second objective of the present invention is to provide an electronic component bearing correction unit, wherein the first and second correction tools are movably arranged on the carrier, and the driving mechanism is moved before the material shifter moves into the offset electronic component The first and second driving sources drive the first and second calibration tools to move outward to open, so as to provide a larger feeding space, thereby effectively avoiding collision and damage of electronic components, and achieving practical benefits of improving the yield and testing quality of electronic components .

本發明之目的三，係提供一種電子元件承置校正單元，其中，該第一校正具係於底面設有相通第一頂推部件之第一通槽，以及第二校正具係於底面設有相通第二頂推部件之第二通槽，另於載具上設置至少一感測器，當第一、二校正具向外位移開啟時，該第一、二通槽即會錯開而形成一檢知通道，以供感測器檢知承置件上是否殘留電子元件，亦或檢知驅動機構之第一、二驅動源是否作動，以有效避免疊料或壓損電子元件，達到提升使用效能之實用效益。 The third object of the present invention is to provide an electronic component receiving correction unit, wherein the first correction tool is provided with a first through groove communicating with the first pushing member on the bottom surface, and the second correction tool is provided on the bottom surface The second through slot communicating with the second pushing member is provided with at least one sensor on the carrier. When the first and second calibration tools are outwardly displaced and opened, the first and second through slots will be staggered to form a Detection channel, for the sensor to detect whether there are residual electronic components on the mounting member, or to detect whether the first and second driving sources of the driving mechanism are actuated, so as to effectively avoid stacking or pressure damage to the electronic components, to achieve improved use Practical benefits of efficiency.

本發明之目的四，係提供一種應用電子元件承置校正單元之作業分類設備，其包含機台、供料裝置、收料裝置、作業裝置、輸送裝置、承置校正單元及中央控制裝置，該供料裝置係配置於機台上，並設有至少一容納待作業電子元件之供料承置器，該收料裝置係配置於機台上，並設有至少一容納已作業電子元件之收料承置器，該作業裝置係配置於機台上，並設有至少一對電子元件執行預設作業之作業器，該輸送裝置係配置於機台上，並設有至少一移載電子元件之移料器，以及設置至少一本發明之承置校正單元，以校正電子元件，該中央控制裝置係用以控制及整合各裝置作動，以執行自動化作業，達到提升作業效能之實用效益。 The fourth object of the present invention is to provide an operation classification device that uses electronic components to support a calibration unit, which includes a machine, a feeding device, a receiving device, a working device, a conveying device, a supporting calibration unit and a central control device. The feeding device is arranged on the machine table, and is provided with at least one feeding holder for accommodating the electronic components to be operated. The feeding device is arranged on the machine table and is provided with at least one receiving device for accommodating the operated electronic components. Material carrier, the working device is arranged on the machine table, and is provided with at least one pair of electronic components to perform preset operations, the conveying device is arranged on the machine table, and is provided with at least one transfer electronic component The material shifter and at least one bearing calibration unit of the present invention are used to calibrate the electronic components. The central control device is used to control and integrate the actions of each device to perform automated operations, so as to achieve the practical benefit of improving the operating efficiency.

〔習知〕〔Knowledge〕

11‧‧‧台板 11‧‧‧ Platen

12‧‧‧基準件 12‧‧‧ benchmark

13‧‧‧壓缸 13‧‧‧Press cylinder

14‧‧‧夾持件 14‧‧‧Clamping parts

21‧‧‧移料器 21‧‧‧shifter

22、23、24‧‧‧電子元件 22, 23, 24 ‧‧‧ Electronic components

A、B‧‧‧中心位置 A, B‧‧‧Central location

〔本發明〕〔this invention〕

30‧‧‧承置校正單元 30‧‧‧Bearing correction unit

31‧‧‧載具 31‧‧‧Vehicle

32‧‧‧承置件 32‧‧‧Bearing

321‧‧‧承置部 321‧‧‧ Bearing Department

322‧‧‧第一承靠部件 322‧‧‧First bearing part

323‧‧‧第二承靠部件 323‧‧‧The second bearing part

324‧‧‧第一承抵部件 324‧‧‧The first bearing part

325‧‧‧第二承抵部件 325‧‧‧Second bearing part

326‧‧‧第一容置槽 326‧‧‧The first receiving slot

327‧‧‧第二容置槽 327‧‧‧Second accommodating slot

L‧‧‧中心軸線 L‧‧‧Central axis

33‧‧‧第一校正具 33‧‧‧First calibrator

3301、3301A‧‧‧第一塊體 3301, 3301A‧‧‧The first block

3302‧‧‧第二塊體 3302‧‧‧The second block

331、331A‧‧‧第一頂推部件 331, 331A‧‧‧First push component

332、332A‧‧‧第一讓位部 332, 332A‧‧‧ First Concession Department

333、333A‧‧‧第一嵌接部 333, 333A‧‧‧First embedding part

334、334A‧‧‧第一通槽 334, 334A‧‧‧First channel

335‧‧‧第一抵擋部件 335‧‧‧First resisting part

336‧‧‧第一連結部 336‧‧‧First Connection Department

337‧‧‧第一桿件 337‧‧‧The first rod

34‧‧‧第二校正具 34‧‧‧Second correction tool

3401、3401A‧‧‧第三塊體 3401, 3401A‧‧‧third block

3402‧‧‧第四塊體 3402‧‧‧The fourth block

341、341A‧‧‧第二頂推部件 341, 341A‧‧‧Second thrust component

342、342A‧‧‧第二讓位部 342, 342A‧‧‧ Second Concession Department

343、343A‧‧‧第二嵌接部 343, 343A‧‧‧Second embedding part

344、344A‧‧‧第二通槽 344、344A‧‧‧Second channel

345‧‧‧第二抵擋部件 345‧‧‧Second resisting part

346‧‧‧第二連結部 346‧‧‧Second Link Department

347‧‧‧第二桿件 347‧‧‧Second lever

35‧‧‧第一驅動源 35‧‧‧ First driving source

351‧‧‧第一本體 351‧‧‧The first body

352‧‧‧第一頂桿 352‧‧‧First jack

36‧‧‧第二驅動源 36‧‧‧Second drive source

361‧‧‧第二本體 361‧‧‧Second body

362‧‧‧第二頂桿 362‧‧‧Second jack

37‧‧‧彈性件 37‧‧‧Elastic parts

381‧‧‧滑軌 381‧‧‧slide

382‧‧‧第一滑座 382‧‧‧First Slide

383‧‧‧第二滑座 383‧‧‧Second Slide

391‧‧‧投光元件 391‧‧‧Projection element

392‧‧‧接光元件 392‧‧‧Light receiving element

40‧‧‧移料器 40‧‧‧shifter

P‧‧‧中心位置 P‧‧‧Central location

41、42‧‧‧電子元件 41、42‧‧‧Electronic components

C、D‧‧‧中心位置 C, D‧‧‧ Central position

50‧‧‧機台 50‧‧‧machine

60‧‧‧供料裝置 60‧‧‧Feeding device

61‧‧‧供料承置器 61‧‧‧Feeding holder

70‧‧‧收料裝置 70‧‧‧Receiving device

71‧‧‧收料承置器 71‧‧‧ Receiver

80‧‧‧作業裝置 80‧‧‧operating device

81‧‧‧電路板 81‧‧‧ circuit board

82‧‧‧測試座 82‧‧‧Test seat

90‧‧‧輸送裝置 90‧‧‧Conveying device

91‧‧‧第一移料器 91‧‧‧ First material shifter

92‧‧‧第一入料載台 92‧‧‧First loading platform

93‧‧‧第二入料載台 93‧‧‧Second loading table

94‧‧‧第二移料器 94‧‧‧Second material shifter

95‧‧‧第三移料器 95‧‧‧The third feeder

96‧‧‧第一出料載台 96‧‧‧The first discharge platform

97‧‧‧第二出料載台 97‧‧‧Second discharge platform

98‧‧‧第四移料器 98‧‧‧ Fourth material shifter

第1圖：習知電子元件校正機構之使用示意圖(一)。 Figure 1: Schematic diagram of the use of conventional electronic component calibration mechanisms (1).

第2圖：習知電子元件校正機構之使用示意圖(二)。 Figure 2: Schematic diagram of the use of conventional electronic component calibration mechanisms (2).

第3圖：本發明電子元件承置校正單元之俯視圖。 Figure 3: A top view of the electronic component receiving correction unit of the present invention.

第4圖：本發明電子元件承置校正單元之剖視圖。 Figure 4: A cross-sectional view of the electronic component receiving correction unit of the present invention.

第5圖：係校正小尺寸電子元件之使用示意圖(一)。 Figure 5: Schematic diagram of the use of calibrated small-sized electronic components (1).

第6圖：係校正小尺寸電子元件之使用示意圖(二)。 Figure 6: Schematic diagram of the use of calibrated small-sized electronic components (2).

第7圖：係校正小尺寸電子元件之使用示意圖(三)。 Figure 7: Schematic diagram of the use of calibrated small-sized electronic components (3).

第8圖：係校正小尺寸電子元件之使用示意圖(四)。 Figure 8: Schematic diagram of the use of calibrated small-sized electronic components (4).

第9圖：係校正大尺寸電子元件之使用示意圖(一)。 Figure 9: Schematic diagram of the calibration of large-sized electronic components (1).

第10圖：係校正大尺寸電子元件之使用示意圖(二)。 Figure 10: Schematic diagram of the use of calibrating large-sized electronic components (2).

第11圖：係校正大尺寸電子元件之使用示意圖(三)。 Figure 11: Schematic diagram of the use of calibrating large-sized electronic components (3).

第12圖：係承置校正單元應用於作業分類設備之示意圖。 Figure 12: A schematic diagram of the application of the calibration unit to the job classification equipment.

為使貴審查委員對本發明作更進一步之瞭解，茲舉一較佳實施例並配合圖式，詳述如後： In order to make your examination committee have a better understanding of the present invention, here is a preferred embodiment and accompanying drawings, detailed as follows:

請參閱第3、4圖，本發明電子元件承置校正單元30包含載具31、承置件32、第一校正具33、第二校正具34及驅動機構；該載具31係可為固定式配置，而固設於機台(圖未示出)上，亦或為活動式配置，而由至少一動力源(圖未示出)驅動作至少一方向位移，以載送電子元件至不同作業位置處，於本實施例中，該載具31係為架體，並固設於機台上；該承置件32係裝配於載具31上，並設有至少一承置電子元件之承置部321，於本實施例中，該承置件32係以頂面作為承置部321，又該承置件32係於第一側設有第一承靠部件322，以及於第二側設有第二承靠部件323，更進一步，可於承置件32之第一、二側分別裝配塊體作為第一、二承靠部件322、323，亦或直接以承置件32之第一、二側面作為第一、二承靠部件322、323，於本實施例中，該承置件32係以第一側面作為第一承靠部件322，及以第二側面作為第二承靠部件323，另該承置件32係於第一側設有第一承抵部件324，以及於第二側設有第二承抵部件325，更進一步，該第一、二承抵部件324、325可相同或不相同於第一、二承靠部件322、323，例如可於承置件32之第一、二側分別設有為凹部之第一、二承抵部件324、325，或例如以第一、二承靠部件322、323之部分區域作為第一、二承抵部件324、325，於本實施例中，承置件32係於第一側面凹設有第一承抵部件324，以及於第二側面凹設有第二承抵部件325，另該承置件32係於底部凹設至少一容置槽，於本實施例中，承置件32係於底部設有貫通第一、二側面之第一容置槽326及第二容置槽327；該第一校正具33係裝配於載具31上，並位於承置件32之第一側方，更進一步，該第一校正具33可為一體成型或包含複數個塊體，於本實施例中，第一校正具33係設有第一塊體3301及第二塊體3302，另該第一校正具33係於第二側設有至少一推移電子元件之第一頂推部件331，於本實施例中，第一校正具33係於第一塊體3301之第二側設有複數個為凹槽之第一讓位部332及複數個為凸塊之第一嵌接部333，並以第一讓位部332之第一角部作為第一頂推部件331，更進一步，第一校正具33係於第一嵌接部333之底面凹設有第一通槽334，另該第一校正具33係於第二側設有至少一第一抵擋部件335，以靠抵於承置件32之第一承靠部件322，於本實施例中，第一校正具33係以第二塊體3302之第二側面作為第一抵擋部件335，該第一抵擋部件335與第一讓位部332、第一嵌接部333具有高低位差，以使第一讓位部332及第一嵌接部333可跨置於承置件32之承置部321上，而第一抵擋部件335則位於承置件32之第一側方，又該第一校正具33係於第一側設有至少一第一連結部336，以連結第一驅動源35，於本實施例中，第一校正具33係以第二塊體3302之第一側設有第一連結部336，另該第一校正具33係於底面設有第一桿件337，於本實施例中，第一校正具33係於第二塊體3302之底面設有第一桿件337；該第二校正具34係裝配於載具31上，並位於承置件32之第二側方，更進一步，該第二校正具34可為一體成型或包含複數個塊體，於本實施例中，第二校正具34係設有第三塊體3401及第四塊體3402，該第二校正具34係於第一側設有至少一推移電子元件之第二頂推部件341，該第二頂推部件341並相對於第一校正具33之第一頂推部件331，於本實施例中，第二校正具34係於第三塊體3401之第一側設有複數個為凹槽之第二讓位部342及複數個為凸塊之第二嵌接部343，並以第二讓位部342之第二角部作為第二頂推部件341，更進一步，第二校正具34係於第二嵌接部343之底面凹設有第二通槽344，另該第二校正具34係於第一側設有至少一第二抵擋部件345，以靠抵於承置件32之第二承靠部件323，於本實施例中，第二校正具34係以第四塊體3402之第一側面作為第二抵擋部件345，該第二抵擋部件345與第二讓位部342、第二嵌接部343具有高低位差，以使第二讓位部342及第二嵌接部343可跨置於承置件32之承置部321上，而第二抵擋部件345則位於承置件32之第二側方，又該第二校正具34係於第二側設有至少一第二連結部346，以連結第二驅動源36，於本實施例中，第二校正具34係以第二塊體3402之第二側設有第二連結部346，又該第二校正具34係於底面設有第二桿件347，於本實施例中，第二校正具34係於第四塊體3402之底面設有第二桿件347；該驅動機構係裝配於載具31上，並設有一驅動第一校正具33位移之第一驅動源35，以及設有一驅動第二校正具34位移之第二驅動源36，更進一步，該第一、二驅動源35、36可為壓缸或皮帶輪組等，於本實施例中，該第一驅動源35係為壓缸，並以第一本體351連結第一校正具33之第一連結部336，而令一為活塞桿之第一頂桿352頂置於承置件32之第一承抵部件324，該第二驅動源36係為壓缸，並以第二本體361連結第二校正具34之第二連結部346，而令一為活塞桿之第二頂桿362頂置於承置件32之第二承抵部件325，另該驅動機構係設有至少一連結第一校正具33及第二校正具34之彈性件37，以帶動第一校正具33及第二校正具34復位，於本實施例中，係於承置件32之第一容置槽326配置一為彈簧之彈性件37，彈性件37之第一端係連結第一校正具33之第一桿件337，而第二端則連結第二校正具34之第二桿件347，又該驅動機構係設有至少一連結第一校正具33及第二校正具34之滑軌組，以輔助第一校正具33及第二校正具34位移，於本實施例中，係於承置件32之第二容置槽327配置滑軌組，滑軌組之滑軌381係固設於載具31上，並以第一滑座382連結第一校正具33之第一連結部336，及以第二滑座383連結第二校正具34之第二連結部346；該承置校正單元30更包含設有至少一感測器，該感測器係裝配於載具31上，以檢知承置件32上是否殘留電子元件，於本實施例中，感測器係於承置件32之第一端設有投光元件391，並於第二端設有接光元件392，以於第一、二校正具33、34向外位移開啟，其第一、二通槽334、344即會錯開而形成一檢知通道，利用檢知通道即可檢知承置件32上是否殘留電子元件，亦或檢知驅動機構之第一、二驅動源35、36是否作動。 Please refer to FIGS. 3 and 4, the electronic component receiving and correcting unit 30 of the present invention includes a carrier 31, a supporting member 32, a first corrector 33, a second corrector 34, and a driving mechanism; the carrier 31 may be fixed Type configuration, fixed on the machine (not shown), or movable configuration, and driven by at least one power source (not shown) for displacement in at least one direction to carry electronic components to different At the working position, in this embodiment, the carrier 31 is a frame body and is fixed on the machine table; the bearing member 32 is assembled on the carrier 31 and provided with at least one bearing electronic component The receiving portion 321, in this embodiment, the receiving member 32 uses the top surface as the receiving portion 321, and the receiving member 32 is provided with a first bearing member 322 on the first side and a second A second bearing part 323 is provided on the side, and further, blocks can be assembled on the first and second sides of the bearing member 32 as the first and second bearing parts 322, 323, or directly using the bearing member 32 The first and second sides serve as the first and second bearing members 322 and 323. In this embodiment, the receiving member 32 uses the first side as the first bearing member 322 and the second side as the second bearing Relying on the member 323, the receiving member 32 is provided with a first bearing member 324 on the first side, and a second bearing member 325 on the second side. Furthermore, the first and second bearing members 324 , 325 may be the same or different from the first and second bearing parts 322, 323, for example, the first and second bearing parts 324, 325 as recesses may be provided on the first and second sides of the bearing member 32, or For example, the partial areas of the first and second bearing members 322 and 323 are used as the first and second bearing members 324 and 325. In this embodiment, the receiving member 32 is concavely provided with the first bearing member on the first side surface 324, and a second bearing member 325 is recessed on the second side, and the receiving member 32 is recessed in the bottom with at least one accommodating groove. In this embodiment, the receiving member 32 is provided with a penetration on the bottom The first accommodating groove 326 and the second accommodating groove 327 on the first and second sides; the first calibration tool 33 is mounted on the carrier 31 and is located on the first side of the receiving member 32, and further, the The first calibrator 33 may be integrally formed or include a plurality of blocks. In this embodiment, the first calibrator 33 is provided with a first block 3301 and a second block 3302, and the first calibrator 33 is At least one first pushing member 331 for pushing the electronic component is provided on the second side. In this embodiment, the first calibrator 33 is provided with a plurality of grooves on the second side of the first block 3301 A concession portion 332 and a plurality of first embedding portions 333 that are bumps, and the first corner of the first concession portion 332 is used as the first pushing member 331, and further, the first correction tool 33 is attached to The bottom surface of the first engaging portion 333 is concavely provided with a first through slot 334, and the first correction tool 33 is provided with at least a first resisting member 335 on the second side to lean against the first of the receiving member 32 Relying on the component 322, in this embodiment, the first calibration tool 33 is a second block The second side surface of the body 3302 serves as a first blocking member 335. The first blocking member 335 has a height difference with the first yielding portion 332 and the first fitting portion 333, so that the first yielding portion 332 and the first fitting The connecting portion 333 can straddle the receiving portion 321 of the receiving member 32, and the first resisting member 335 is located on the first side of the receiving member 32, and the first calibrator 33 is provided on the first side At least one first connecting portion 336 for connecting the first driving source 35. In this embodiment, the first calibration tool 33 is provided with a first connecting portion 336 on the first side of the second block 3302, and the first The calibration tool 33 is provided with a first rod 337 on the bottom surface. In this embodiment, the first calibration tool 33 is provided with a first rod 337 on the bottom surface of the second block 3302; the second calibration tool 34 is assembled It is on the carrier 31 and is located on the second side of the bearing member 32. Furthermore, the second calibration tool 34 may be formed in one piece or include a plurality of blocks. In this embodiment, the second calibration tool 34 is A third block 3401 and a fourth block 3402 are provided. The second calibration tool 34 is provided with a second pushing member 341 that pushes at least one electronic component on the first side. The second pushing member 341 is opposite to The first pushing member 331 of the first calibrator 33. In this embodiment, the second calibrator 34 is provided with a plurality of second concessions 342 as grooves on the first side of the third block 3401 and A plurality of second engaging portions 343 are bumps, and the second corner of the second yielding portion 342 is used as the second pushing member 341. Furthermore, the second calibration tool 34 is attached to the second engaging portion 343 The bottom surface is concavely provided with a second through slot 344, and the second calibration tool 34 is provided with at least one second resisting member 345 on the first side to lean against the second bearing member 323 of the receiving member 32, In this embodiment, the second calibration tool 34 uses the first side surface of the fourth block 3402 as the second blocking member 345. The second blocking member 345 and the second yielding portion 342 and the second engaging portion 343 have a height Position difference, so that the second yielding portion 342 and the second engaging portion 343 can straddle the receiving portion 321 of the receiving member 32, and the second resisting member 345 is located on the second side of the receiving member 32 At least one second connecting portion 346 is provided on the second side of the second calibrator 34 to connect the second driving source 36. In this embodiment, the second calibrator 34 is a second block 3402 The second connecting portion 346 is provided on the second side, and the second correction tool 34 is provided with a second rod 347 on the bottom surface. In this embodiment, the second correction tool 34 is provided on the bottom surface of the fourth block 3402 There is a second lever 347; the drive mechanism is mounted on the carrier 31, and is provided with a first drive source 35 that drives the displacement of the first calibrator 33, and a second drive source that drives the displacement of the second calibrator 34 36. Further, the first and second driving sources 35, 36 may be a pressing cylinder or a pulley set, etc. In this embodiment, the first driving source 35 is a pressing cylinder, and the first body 351 is connected to the first Corrector 33 The first connecting portion 336, so that a first plunger 352 as a piston rod is placed on the first bearing member 324 of the receiving member 32, the second driving source 36 is a pressure cylinder, and the second body 361 The second connecting portion 346 of the second calibration tool 34 is connected, so that a second plunger 362 which is a piston rod is placed on the second bearing part 325 of the receiving member 32, and the driving mechanism is provided with at least one connecting The elastic members 37 of the first calibrator 33 and the second calibrator 34 drive the first calibrator 33 and the second calibrator 34 to reset. In this embodiment, the first accommodating groove 326 of the receiving member 32 An elastic member 37 is configured as a spring. The first end of the elastic member 37 is connected to the first rod member 337 of the first calibration tool 33, and the second end is connected to the second rod member 347 of the second calibration tool 34. The driving mechanism is provided with at least one sliding rail set connecting the first calibrator 33 and the second calibrator 34 to assist the displacement of the first calibrator 33 and the second calibrator 34. In this embodiment, it is attached to the bearing The second accommodating groove 327 of 32 is configured with a slide rail set, and the slide rail 381 of the slide rail set is fixed on the carrier 31, and the first connecting portion 336 of the first correction tool 33 is connected to the first slide seat 382, and The second connecting portion 346 of the second calibration tool 34 is connected to the second sliding seat 383; the receiving calibration unit 30 further includes at least one sensor, which is mounted on the carrier 31 to detect Whether the electronic component remains on the receiving member 32. In this embodiment, the sensor is provided with a light projecting element 391 at the first end of the receiving member 32 and a light receiving element 392 at the second end The first and second calibrators 33 and 34 are displaced outwards to open, and the first and second through slots 334 and 344 are staggered to form a detection channel, and the detection channel can be used to detect whether electrons remain on the holding member 32 The device may also detect whether the first and second driving sources 35 and 36 of the driving mechanism are actuated.

請參閱第5、6圖，於執行校正電子元件作業，該承置校正單元30之驅動機構係以第一、二驅動源35、36之第一、二頂桿352、362分別凸伸頂抵於承置件32之第一、二承抵部件324、325而限位，由於第一、二頂桿352、362無法繼續向外凸伸，即可令第一、二本體351、361作反向外移，第一驅動源35之第一本體351即帶動第一校正具33向外位移，第二驅動源36之第二本體361則帶動第二校正具34向外位移，第一校正具33及第二校正具34並拉伸彈性件37之第一端及第二端，以及利用第一滑座382及第二滑座383沿滑軌381位移，使得第一校正具33之第一頂推部件331與第二校正具34之第二頂推部件341之間提供一較大之入料空間；然於第一、二校正具33、34向外位移開啟時，該第一校正具33之第一通槽334及第二校正具34之第二通槽344即會錯開而形成一檢知通道，當感測器之接光元件392經由檢知通道接收到投光元件391之光線時，即代表承置件32之承置部321上並無殘留電子元件，以及第一、二驅動源35、36正常作動，進而有效避免疊料或壓損電子元件，反之，若無接收到光線，則代表承置件32之承置部321上殘留電子元件或第一、二驅動源35、36異常，工作人員即需排除異常；當移料器40移載一偏置之電子元件41至承置校正單元30之上方時，由於第一校正具33之第一頂推部件331與第二校正具34之第二頂推部件341間提供一較大之入料空間，移料器40帶動偏置之電子元件41作Z方向向下位移時，即可防止偏置之電子元件41碰撞到第一校正具33或第二校正具34，進而提升電子元件41之良率，使得移料器40順利將偏置之電子元件41置放於承置件32之承置部321。 Please refer to Figures 5 and 6 to perform the calibration of electronic components. The driving mechanism of the calibration unit 30 is supported by the first and second driving rods 352 and 362 of the first and second driving sources 35 and 36, respectively. The first and second bearing parts 324 and 325 of the bearing member 32 are limited. Since the first and second ejectors 352 and 362 cannot continue to extend outward, the first and second bodies 351 and 361 can be reversed. Moving outward, the first body 351 of the first driving source 35 drives the first calibrator 33 to move outward, and the second body 361 of the second driving source 36 drives the second calibrator 34 to move outward, and the first calibrator 33 and the second calibrator 34 and stretch the first end and the second end of the elastic member 37, and use the first slide 382 and the second slide 383 to move along the slide rail 381, so that the first A large feeding space is provided between the pushing member 331 and the second pushing member 341 of the second calibrator 34; however, when the first and second calibrators 33, 34 are opened outward, the first calibrator The first through-slot 334 of 33 and the second through-slot 344 of the second calibrator 34 are staggered to form a detection channel. When the light-receiving element 392 of the sensor receives the light from the light-emitting element 391 through the detection channel At this time, it means that there are no remaining electronic components on the receiving portion 321 of the receiving member 32, and the first and second driving sources 35, 36 are normally operated, thereby effectively avoiding stacking or compressing the electronic components. On the contrary, if no reception is received The light represents the abnormality of the remaining electronic components or the first and second driving sources 35, 36 on the receiving portion 321 of the receiving member 32, and the worker needs to eliminate the abnormality; when the material shifter 40 transfers an offset electronic component 41 When the upper side of the calibration unit 30 is supported, since the first pushing member 331 of the first calibration tool 33 and the second pushing member 341 of the second calibration tool 34 provide a larger feeding space, the material shifter 40 When the biased electronic component 41 is displaced downward in the Z direction, it can prevent the biased electronic component 41 from colliding with the first calibrator 33 or the second calibrator 34, thereby improving the yield of the electronic component 41 and making the material shift The device 40 smoothly places the biased electronic component 41 on the receiving portion 321 of the receiving member 32.

請參閱第3、7圖，接著該驅動機構之第一、二驅動源35、36係分別控制第一、二頂桿352、362內縮復位，由於第一、二本體351、361已無氣體壓力反向頂推，即可利用彈性件37之復位彈力，令其第一、二端分別帶動第一、二本體351、361向內位移，該第一本體351即帶動第一校正具33向內位移，該第二本體361則帶動第二校正具34向內位移，該第一校正具33之第一讓位部332及第一嵌接部333係與第二校正具34之第二嵌接部343及第二讓位部342相互嵌接，並使第一校正具33之第一頂推部件331推移電子元件41之一角部，以及使第二校正具34之第二頂推部件341推移電子元件41之另一角部，於第一校正具33之第一抵擋部件335貼靠承置件32之第一承靠部件322，以及於第二校正具34之第二抵擋部件345貼靠承置件32之第二承靠部件323時，可使第一校正具33及第二校正具34具有相同之位移行程，以令第一校正具33之第一頂推部件331及第二校正具34之第二頂推部件341夾持推移電子元件41之中心位置C對位於承置件32之承置部321的中心軸線L，進而校正電子元件41之中心位置C。 Please refer to Figures 3 and 7, and then the first and second driving sources 35 and 36 of the driving mechanism respectively control the retracting and resetting of the first and second ejectors 352 and 362, because the first and second bodies 351 and 361 are out of gas When the pressure is pushed in the reverse direction, the reset elastic force of the elastic member 37 can be used to cause the first and second ends to drive the first and second bodies 351 and 361 to move inward. The first body 351 drives the first correction tool 33 to Internal displacement, the second body 361 drives the second correction tool 34 to move inward, and the first yielding portion 332 and the first embedding portion 333 of the first correction tool 33 are coupled with the second correction tool 34 The connecting portion 343 and the second yielding portion 342 are embedded with each other, so that the first pushing member 331 of the first calibrator 33 pushes a corner of the electronic component 41, and the second pushing member 341 of the second calibrator 34 The other corner of the electronic component 41 is pushed against the first blocking member 335 of the first calibration device 33 against the first receiving component 322 of the receiving member 32, and against the second blocking member 345 of the second calibration device 34 When the second bearing member 323 of the holding member 32 can make the first calibrator 33 and the second calibrator 34 have the same displacement stroke, so that the first pushing member 331 and the second calibrator of the first calibrator 33 The second pushing member 341 of the tool 34 clamps and pushes the center position C of the electronic component 41 to the center axis L of the receiving portion 321 of the receiving member 32, thereby correcting the center position C of the electronic component 41.

請參閱第6、8圖，於完成校正作業後，該驅動機構之第一驅動源35及第二驅動源36即分別帶動第一校正具33及第二校正具34向外位移，令第一校正具33之第一頂推部件331及第二校正具34之第二頂推部件341脫離電子元件41，當移料器40位移至預設取料位置時，由於移料器40之中心位置P已預設對位於承置件32之承置部321的中心軸線L，使得移料器40之中心位置P即可對位於電子元件41之中心位置C，該移料器40即可作Z方向向下位移而精準取出電子元件41，以利準確將電子元件41移入至下一作業器(如測試座，圖未示出)。 Please refer to Figures 6 and 8. After the calibration operation is completed, the first driving source 35 and the second driving source 36 of the driving mechanism respectively drive the first calibrator 33 and the second calibrator 34 to move outward, so that the first The first pushing member 331 of the calibrator 33 and the second pushing member 341 of the second calibrator 34 are separated from the electronic component 41. When the feeder 40 is moved to the preset retrieving position, due to the center position of the feeder 40 P has been preset to the central axis L of the receiving portion 321 of the receiving member 32, so that the center position P of the material shifter 40 can be positioned at the center position C of the electronic component 41, and the material shifter 40 can be used as Z The direction is shifted downward to precisely take out the electronic component 41, so as to accurately move the electronic component 41 to the next working device (such as a test stand, not shown).

請參閱第9圖，欲校正大尺寸之電子元件42時，該承置校正單元30係更換第一校正具33之第一塊體，而於第二塊體3302上組裝另一具有第一頂推部件331A、第一讓位部332A、第一嵌接部333A及第一通槽334A的第一塊體3301A，以及更換第二校正具34之第三塊體，而於第四塊體3402上組裝另一具有第二頂推部件341A、第二讓位部342A、第二嵌接部343A及第二通槽344A的第三塊體3401A；該驅動機構之第一驅動源35及第二驅動源36係分別帶動第一校正具33及第二校正具34向外位移，使得第一校正具33之第一頂推部件331A與第二校正具34之第二頂推部件341A間提供一較大之入料空間，移料器40即可帶動偏置之電子元件42作Z方向向下位移置放於承置件32之承置部321。 Please refer to FIG. 9, when the large-sized electronic component 42 is to be calibrated, the receiving calibration unit 30 is to replace the first block of the first calibrator 33 and assemble another one with the first top on the second block 3302 The first block 3301A of the pushing member 331A, the first yielding portion 332A, the first fitting portion 333A, and the first through slot 334A, and the third block of the second calibration tool 34, and the fourth block 3402 Assemble another third block 3401A having a second pushing member 341A, a second yielding portion 342A, a second fitting portion 343A, and a second through slot 344A; the first driving source 35 and the second of the driving mechanism The driving source 36 drives the first calibrator 33 and the second calibrator 34 to move outward, respectively, so that a first pushing member 331A of the first calibrator 33 and a second pushing member 341A of the second calibrator 34 provide a With a larger feeding space, the feeder 40 can drive the biased electronic component 42 to move downward in the Z direction and place it on the receiving portion 321 of the receiving member 32.

請參閱第10、11圖，該驅動機構之第一、二驅動源35、36係分別帶動第一校正具33及第二校正具34向內位移，該第一校正具33之第一讓位部332A及第一嵌接部333A係與第二校正具34之第二嵌接部343A及第二讓位部342A相互嵌接，並使第一校正具33之第一頂推部件331A推移電子元件42之一角部，以及使第二校正具34之第二頂推部件341A推移電子元件42之另一角部，於第一校正具 33之第一抵擋部件335貼靠承置件32之第一承靠部件322，以及於第二校正具34之第二抵擋部件345貼靠承置件32之第二承靠部件323時，可使第一校正具33及第二校正具34具有相同之位移行程，以令第一校正具33之第一頂推部件331A及第二校正具34之第二頂推部件341A夾持推移電子元件42之中心位置D對位於承置件32之承置部321的中心軸線L，進而校正電子元件42之中心位置D；於完成校正作業後，該驅動機構之第一驅動源35及第二驅動源36即分別帶動第一校正具33及第二校正具34向外位移，令第一校正具33之第一頂推部件331A及第二校正具34之第二頂推部件341A脫離電子元件42，當移料器40位移至預設取料位置時，由於移料器40之中心位置P已預設對位於承置件32之承置部321的中心軸線L，使得移料器40之中心位置P即可對位於電子元件42之中心位置D，該移料器40即可作Z方向向下位移而精準取出電子元件42，以利準確將電子元件42移入至下一作業器(如測試座，圖未示出)。 Please refer to Figs. 10 and 11, the first and second driving sources 35 and 36 of the driving mechanism respectively drive the first calibrator 33 and the second calibrator 34 to move inward, and the first calibrator 33 gives way The portion 332A and the first embedding portion 333A are inter-engaged with the second embedding portion 343A and the second yielding portion 342A of the second calibration tool 34, and cause the first pushing member 331A of the first calibration tool 33 to move electrons One corner of the element 42 and the second pushing member 341A of the second calibrator 34 pushes the other corner of the electronic element 42 to the first resisting member 335 of the first calibrator 33 against the first of the receiving member 32 When the supporting member 322 and the second resisting member 345 of the second calibration tool 34 abut against the second supporting member 323 of the mounting member 32, the first calibration tool 33 and the second calibration tool 34 can have the same displacement Stroke, so that the first pushing member 331A of the first calibrator 33 and the second pushing member 341A of the second calibrator 34 clamp the center position D of the pushing electronic component 42 to the receiving portion 321 of the receiving member 32 The central axis L of the center, and then calibrate the center position D of the electronic component 42; after the calibration operation is completed, the first driving source 35 and the second driving source 36 of the driving mechanism drive the first calibrator 33 and the second calibrator 34, respectively Displace outward, so that the first pushing member 331A of the first calibrator 33 and the second pushing member 341A of the second calibrator 34 are separated from the electronic component 42. When the feeder 40 is moved to the preset retrieving position, The center position P of the feeder 40 has been preset to the center axis L of the receiving portion 321 of the receiving member 32, so that the center position P of the feeder 40 can be located at the center position D of the electronic component 42. The feeder 40 can be displaced downward in the Z direction to accurately take out the electronic component 42 so as to accurately move the electronic component 42 to the next operating device (such as a test stand, not shown).

請參閱第3、4、12圖，係本發明承置校正單元30應用於電子元件作業分類設備之示意圖，該作業分類設備係於機台50上配置有供料裝置60、收料裝置70、作業裝置80、輸送裝置90及中央控制裝置(圖未示出)；該供料裝置60係裝配於機台50，並設有至少一為供料盤之供料承置器61，用以容納至少一待作業之電子元件；該收料裝置70係裝配於機台50，並設有至少一為收料盤之收料承置器71，用以容納至少一已作業之電子元件；該作業裝置80係裝配於機台50，並設有至少一作業器，以對電子元件執行預設作業，於本實施例中，該作業器係為一測試器，該測試器係設有電性連接之電路板81及測試座82，並以測試座82承置及測試電子元件；該輸送裝置90係裝配於機台50上，並設有至少一移載電子元件之移料器，以及設置至少一本發明之承置校正單元30，以校正電子元件，於本實施例中，該輸送裝置90係設有第一移料器91，以於供料裝置60之供料承置器61取出待測之電子元件，並移載至第一入料載台92及第二入料載台93，第一入料載台92及第二入料載台93將待測之電子元件載送至測試裝置80之側方，該輸送裝置90係以第二移料器94及第三移料器95於第一入料載台92及第二入料載台93取出待測之電子元件，並分別先移入於二承置校正單元30，而校正電子元件，再以第二移料器94及第三移料器95將二承置校正單元30內已校正之電子元件移載至作業裝置80之測試座82而執行測試作業，以及將測試座82之已測電子元件移載至第一出料載台96及第二出料載台97，第一出料載台96及第二出料載台97載出已測之電子元件，該輸送裝置90係以第四移料器98於第一出料載台96及第二出料載台97上取出已測之電子元件，並依據測試結果，將已測之電子元件輸送至收料裝置70之收料承置器71處而分類收置；該中央控制裝置係用以控制及整合各裝置作動，以執行自動化作業，達到提升作業效能之實用效益。 Please refer to FIGS. 3, 4, and 12, which are schematic diagrams of the application of the calibration unit 30 of the present invention applied to electronic component operation classification equipment. The operation classification equipment is equipped with a feeding device 60 and a receiving device 70 on the machine 50. Working device 80, conveying device 90 and central control device (not shown); the feeding device 60 is assembled on the machine 50, and is provided with at least one feeding receptacle 61 which is a feeding tray for accommodating At least one electronic component to be operated; the receiving device 70 is assembled on the machine 50 and is provided with at least one receiving receptacle 71 as a receiving tray for accommodating at least one electronic component that has been operated; The device 80 is assembled on the machine 50 and is provided with at least one operating device to perform preset operations on the electronic components. In this embodiment, the operating device is a tester which is provided with an electrical connection The circuit board 81 and the test seat 82, and the test seat 82 is used to receive and test electronic components; the conveying device 90 is mounted on the machine 50, and is provided with at least one material transfer device for transferring electronic components, and at least A supporting calibration unit 30 of the present invention is used to calibrate electronic components. In this embodiment, the conveying device 90 is provided with a first material shifter 91 for taking out the material from the supply holder 61 of the feeding device 60 The electronic components under test are transferred to the first input carrier 92 and the second input carrier 93. The first input carrier 92 and the second input carrier 93 carry the electronic components to be tested to the test On the side of the device 80, the conveying device 90 takes out the electronic components to be tested on the first feed carrier 92 and the second feed carrier 93 with the second material shifter 94 and the third material shifter 95, and respectively First move into the second receiving correction unit 30 to calibrate the electronic components, and then transfer the corrected electronic components in the second receiving correction unit 30 to the operating device 80 with the second material shifter 94 and the third material shifter 95 Test the seat 82 to perform the test operation, and transfer the measured electronic components of the test seat 82 to the first discharge stage 96 and the second discharge stage 97, the first discharge stage 96 and the second discharge carrier The stage 97 carries the measured electronic components. The conveying device 90 uses the fourth shifter 98 to take out the measured electronic components on the first discharge stage 96 and the second discharge stage 97, and according to the test results , The measured electronic components are sent to the receiving device 71 of the receiving device 70 for classification and storage; the central control device is used to control and integrate the actions of each device to perform automated operations to achieve improved operating efficiency Practical benefits.

30‧‧‧承置校正單元 30‧‧‧Bearing correction unit

31‧‧‧載具 31‧‧‧Vehicle

32‧‧‧承置件 32‧‧‧Bearing

322‧‧‧第一承靠部件 322‧‧‧First bearing part

323‧‧‧第二承靠部件 323‧‧‧The second bearing part

324‧‧‧第一承抵部件 324‧‧‧The first bearing part

325‧‧‧第二承抵部件 325‧‧‧Second bearing part

326‧‧‧第一容置槽 326‧‧‧The first receiving slot

327‧‧‧第二容置槽 327‧‧‧Second accommodating slot

33‧‧‧第一校正具 33‧‧‧First calibrator

3301‧‧‧第一塊體 3301‧‧‧The first block

3302‧‧‧第二塊體 3302‧‧‧The second block

331‧‧‧第一頂推部件 331‧‧‧First push component

332‧‧‧第一讓位部 332‧‧‧ First Concession Department

333‧‧‧第一嵌接部 333‧‧‧First embedding department

335‧‧‧第一抵擋部件 335‧‧‧First resisting part

336‧‧‧第一連結部 336‧‧‧First Connection Department

337‧‧‧第一桿件 337‧‧‧The first rod

34‧‧‧第二校正具 34‧‧‧Second correction tool

3401‧‧‧第三塊體 3401‧‧‧The third block

3402‧‧‧第四塊體 3402‧‧‧The fourth block

341‧‧‧第二頂推部件 341‧‧‧Second thrust component

342‧‧‧第二讓位部 342‧‧‧ Second Concession

343‧‧‧第二嵌接部 343‧‧‧Second embedding part

345‧‧‧第二抵擋部件 345‧‧‧Second resisting part

346‧‧‧第二連結部 346‧‧‧Second Link Department

347‧‧‧第二桿件 347‧‧‧Second lever

35‧‧‧第一驅動源 35‧‧‧ First driving source

351‧‧‧第一本體 351‧‧‧The first body

352‧‧‧第一頂桿 352‧‧‧First jack

36‧‧‧第二驅動源 36‧‧‧Second drive source

361‧‧‧第二本體 361‧‧‧Second body

362‧‧‧第二頂桿 362‧‧‧Second jack

37‧‧‧彈性件 37‧‧‧Elastic parts

381‧‧‧滑軌 381‧‧‧slide

382‧‧‧第一滑座 382‧‧‧First Slide

383‧‧‧第二滑座 383‧‧‧Second Slide

391‧‧‧投光元件 391‧‧‧Projection element

392‧‧‧接光元件 392‧‧‧Light receiving element

Claims

一種電子元件承置校正單元，包含：載具；承置件：係裝配於該載具上，並設有至少一承置電子元件之承置部，該承置件係於第一側設有第一承靠部件，以及於第二側設有第二承靠部件；第一校正具：係裝配於該載具上，並位於該承置件之第一側方，該第一校正具係於第二側設有至少一推移電子元件之第一頂推部件，以及設有至少一靠抵於該承置件之第一承靠部件的第一抵擋部件；第二校正具：係裝配於該載具上，並位於該承置件之第二側方，該第二校正具係於第一側設有至少一推移電子元件之第二頂推部件，以及設有至少一靠抵於該承置件之第二承靠部件的第二抵擋部件；驅動機構：係裝配於該載具上，並設有至少一驅動該第一校正具位移之第一驅動源，以及設有至少一驅動該第二校正具位移之第二驅動源。 An electronic component receiving and correcting unit, comprising: a carrier; a supporting member: assembled on the carrier, and provided with at least one supporting part for supporting an electronic component, the supporting member is provided on the first side A first bearing part, and a second bearing part is provided on the second side; a first calibrator: assembled on the carrier and located on the first side of the bearing part, the first calibrator is On the second side, there is at least one first pushing member for pushing the electronic component, and at least one first resisting member provided with at least one first bearing member against the receiving member; the second correction tool is assembled on The carrier is located on the second side of the receiving member. The second calibration device is provided with a second pushing member with at least one pushing electronic component on the first side and with at least one against the The second resisting part of the second bearing part of the bearing part; the driving mechanism: is mounted on the carrier, and is provided with at least one first driving source for driving the displacement of the first correcting tool, and at least one driving The second calibrator has a second driving source for displacement.

依申請專利範圍第1項所述之電子元件承置校正單元，其中，該承置件係於第一側設有供該第一驅動源頂抵之第一承抵部件，以及於第二側設有供該第二驅動源頂抵之第二承抵部件。 The electronic component receiving and correcting unit according to item 1 of the scope of the patent application, wherein the receiving member is provided with a first receiving part for the first driving source to abut on the first side and a second side A second bearing member is provided for the second driving source to abut against.

依申請專利範圍第1項所述之電子元件承置校正單元，其中，該第一校正具係於第二側設有至少一第一讓位部及至少一第一嵌接部，並以該第一讓位部之第一角部作為該第一頂推部件。 The electronic component bearing correction unit according to item 1 of the patent application scope, wherein the first correction tool is provided with at least a first yielding portion and at least a first embedding portion on the second side, and the The first corner of the first yielding part serves as the first pushing member.

依申請專利範圍第1項所述之電子元件承置校正單元，其中，該第一校正具係設有第一通槽。 The electronic component receiving correction unit according to item 1 of the patent application scope, wherein the first correction tool is provided with a first through slot.

依申請專利範圍第1項所述之電子元件承置校正單元，其中，該第二校正具係於第一側設有至少一第二讓位部及至少一第二嵌接部，並以該第二讓位部之第二角部作為該第二頂推部件。 The electronic component bearing correction unit according to item 1 of the patent application scope, wherein the second correction device is provided with at least a second concession portion and at least a second embedding portion on the first side, and the The second corner of the second concession serves as the second pushing member.

依申請專利範圍第1項所述之電子元件承置校正單元，其中，該第二校正具係設有第二通槽。 The electronic component receiving correction unit according to item 1 of the patent application scope, wherein the second correction tool is provided with a second through slot.

依申請專利範圍第1項所述之電子元件承置校正單元，其中，該驅動機構係設有至少一連結該第一校正具及該第二校正具之彈性件。 The electronic component bearing calibration unit according to item 1 of the patent application scope, wherein the driving mechanism is provided with at least one elastic member connecting the first calibration tool and the second calibration tool.

依申請專利範圍第1項所述之電子元件承置校正單元，其中，該驅動機構係設有至少一連結該第一校正具或該第二校正具之滑軌組。 The electronic component bearing correction unit according to item 1 of the patent application scope, wherein the driving mechanism is provided with at least one slide rail group connected to the first correction tool or the second correction tool.

依申請專利範圍第1項所述之電子元件承置校正單元，更包含設有至少一感測器，該感測器係裝配於該載具上。 The electronic component bearing correction unit according to item 1 of the scope of the patent application further includes at least one sensor, and the sensor is mounted on the carrier.

一種應用電子元件承置校正單元之作業分類設備，包含：機台；供料裝置：係配置於該機台上，並設有至少一供料承置器，用以容納至少一待作業之電子元件；收料裝置：係配置於該機台上，並設有至少一收料承置器，用以容納至少一已作業之電子元件；作業裝置：係配置於該機台上，並設有至少一作業器，以對電子元件執行預設作業；輸送裝置：係配置於該機台上，並設有至少一移載電子元件之移料器，以及設置至少一依申請專利範圍第1項所述之電子元件承置校正單元；中央控制裝置：係用以控制及整合各裝置作動，以執行自動化作業。 An operation classification device using electronic components to support a calibration unit, including: a machine; a feeding device: configured on the machine, and provided with at least one feeding holder for accommodating at least one electron to be operated Components; Receiving device: It is arranged on the machine, and is provided with at least one receiving receiver for accommodating at least one electronic component that has been operated; Operating device: It is arranged on the machine and is provided with At least one operating device to perform preset operations on the electronic components; the conveying device: is arranged on the machine, and is provided with at least one material moving device for transferring electronic components, and at least one is set according to the patent application The electronic component supports the calibration unit; the central control device is used to control and integrate the actions of each device to perform automated operations.