TW202002133A - Receiving and correcting unit of electronic component, and operation categorizing equipment applying the same in which the center positions of the electronic components of different sizes are aligned with the preset correction positions of the receiving member for accurately correcting the electronic components of different sizes - Google Patents
Receiving and correcting unit of electronic component, and operation categorizing equipment applying the same in which the center positions of the electronic components of different sizes are aligned with the preset correction positions of the receiving member for accurately correcting the electronic components of different sizes Download PDFInfo
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- TW202002133A TW202002133A TW107122657A TW107122657A TW202002133A TW 202002133 A TW202002133 A TW 202002133A TW 107122657 A TW107122657 A TW 107122657A TW 107122657 A TW107122657 A TW 107122657A TW 202002133 A TW202002133 A TW 202002133A
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Abstract
Description
本發明係提供一種可使不同尺寸之電子元件的中心位置對位於預設校正位置,以利精準校正不同尺寸電子元件之承置校正單元。 The invention provides a supporting and correcting unit that enables the center positions of electronic components of different sizes to be located at preset calibration positions, so as to accurately calibrate electronic components of different sizes.
在現今,電子元件日趨精密輕巧,自動化作業設備係以移料器將電子元件移載至各裝置之承置器,該承置器可為料盤、預溫盤或載台等,若電子元件偏移擺置於承置器內,當移料器將偏置之電子元件移入下一製程之測試座時,由於該偏置之電子元件的中心位置無法對位測試座之中心位置,不僅影響電子元件移入測試座之準確性,更將影響測試品質,故業者係於機台上設有一校正機構,用以校正電子元件之中心位置,以期提升移料器之取放料精準性。 Nowadays, electronic components are becoming more and more precise and lightweight. Automated operation equipment transfers electronic components to the holders of various devices by means of a material shifter. The holder can be a material tray, a pre-heating plate or a stage. The offset is placed in the holder. When the feeder moves the offset electronic component into the test base of the next process, the center position of the offset electronic component cannot be aligned with the center position of the test base, which not only affects The accuracy of moving the electronic components into the test seat will also affect the quality of the test. Therefore, the manufacturer is equipped with a correction mechanism on the machine to correct the center position of the electronic components, in order to improve the accuracy of the pick and place of the feeder.
請參閱第1圖,該校正機構係於一台板11上固設一呈L型之基準件12,並於基準件12之對角處設有一由壓缸13驅動位移之夾持件14,當移料器21將電子元件22移入基準件12與夾持件14之間,且置放於台板11上時,該壓缸13即驅動夾持件14相對基準件12作位移,令夾持件14推移電子元件22,使電子元件22之一角部靠抵於基準件12而定位,進而校正電子元件22之中心位置A,使電子元件22之中心位置A相對於移料器21之中心位置,再供移料器21取出已校正之電子元件22,並移載至下一製程之測試座(圖未示出)而執行測試作業;惟,該校正機構於使用上具有如下缺失: Please refer to FIG. 1, the calibration mechanism is fixed on a
1.由於不同型式之電子元件具有不同尺寸,當移料器21將另一批次大尺寸之電子元件23移入校正機構時,該夾持件1 4雖可推移電子元件23靠抵於基準件12而定位,但大尺寸之電子元件23的中心位置B已改變,當移料器21位移至預設取料位置時,移料器21之中心位置並無法對位於大尺寸電子元件23之中心位置B,導致移料器21取出偏置之電子元件23,進而降低校正使用效能。 1. Since different types of electronic components have different sizes, when the
2.請參閱第2圖,該校正機構之基準件12係固定於台板11上,由於移料器21上之電子元件24的偏置量不一,若移料器21將偏置量較大之電子元件24依預設卸料位置作Z方向向下位移時,易發生偏置之電子元件24碰撞到基準件12,導致電子元件24受損,進而影響測試品質。 2. Please refer to FIG. 2, the
本發明之目的一,係提供一種電子元件承置校正單元,其係於載具上配置可承置電子元件之承置件,該承置件之第一、二側分別設有第一、二承靠部件,另於承置件之第一側方設置一具第一頂推部件及第一抵擋部件之第一校正具,以及於第二側方設置一具第二頂推部件及第二抵擋部件之第二校正具,一驅動機構係於載具上設置二分別驅動第一、二校正具位移之第一、二驅動源,利用第一、二驅動源驅動第一、二校正具作相對位移而可推移不同尺寸之電子元件,並於第一、二抵擋部件靠置於承置件之第一、二承靠部件時,使不同尺寸電子元件之中心位置對位於承置件之預設校正位置,達到精準校正不同尺寸電子元件之實用效益。 The first object of the present invention is to provide an electronic component receiving and correcting unit, which is configured on the carrier with a supporting member capable of supporting an electronic component, and the first and second sides of the supporting member are provided with first and second sides respectively The bearing component, a first calibrating tool with a first pushing component and a first resisting component is provided on the first side of the receiving member, and a second pushing component and a second component are provided on the second side The second calibration tool of the resisting component, a driving mechanism is provided on the carrier with two first and second driving sources respectively driving the displacement of the first and second calibration tools, and the first and second driving sources are used to drive the first and second calibration tools Relative displacement can move electronic components of different sizes, and when the first and second resisting parts are placed against the first and second bearing parts of the supporting member, the center position of the electronic components of different sizes is placed on the pre-position of the supporting member Set the calibration position to achieve the practical benefit of accurately calibrating electronic components of different sizes.
本發明之目的二,係提供一種電子元件承置校正單元,其中,該第一、二校正具係採活動式配置於載具上,於移料器移入該偏置之電子元件前,驅動機構之第一、二驅動源即驅動第一、二校正具向外位移開啟,以提供較大之入料空間,進而有效避免電子元件碰撞受損,達到提升電子元件良率及測試品質之實用效益。 The second objective of the present invention is to provide an electronic component bearing correction unit, wherein the first and second correction tools are movably arranged on the carrier, and the driving mechanism is moved before the material shifter moves into the offset electronic component The first and second driving sources drive the first and second calibration tools to move outward to open, so as to provide a larger feeding space, thereby effectively avoiding collision and damage of electronic components, and achieving practical benefits of improving the yield and testing quality of electronic components .
本發明之目的三,係提供一種電子元件承置校正單 元,其中,該第一校正具係於底面設有相通第一頂推部件之第一通槽,以及第二校正具係於底面設有相通第二頂推部件之第二通槽,另於載具上設置至少一感測器,當第一、二校正具向外位移開啟時,該第一、二通槽即會錯開而形成一檢知通道,以供感測器檢知承置件上是否殘留電子元件,亦或檢知驅動機構之第一、二驅動源是否作動,以有效避免疊料或壓損電子元件,達到提升使用效能之實用效益。 The third object of the present invention is to provide an electronic component receiving correction unit, wherein the first correction tool is provided with a first through groove communicating with the first pushing member on the bottom surface, and the second correction tool is provided on the bottom surface The second through slot communicating with the second pushing member is provided with at least one sensor on the carrier. When the first and second calibration tools are outwardly displaced and opened, the first and second through slots will be staggered to form a Detection channel, for the sensor to detect whether there are residual electronic components on the mounting member, or to detect whether the first and second driving sources of the driving mechanism are actuated, so as to effectively avoid stacking or pressure damage to the electronic components, to achieve improved use Practical benefits of efficiency.
本發明之目的四,係提供一種應用電子元件承置校正單元之作業分類設備,其包含機台、供料裝置、收料裝置、作業裝置、輸送裝置、承置校正單元及中央控制裝置,該供料裝置係配置於機台上,並設有至少一容納待作業電子元件之供料承置器,該收料裝置係配置於機台上,並設有至少一容納已作業電子元件之收料承置器,該作業裝置係配置於機台上,並設有至少一對電子元件執行預設作業之作業器,該輸送裝置係配置於機台上,並設有至少一移載電子元件之移料器,以及設置至少一本發明之承置校正單元,以校正電子元件,該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 The fourth object of the present invention is to provide an operation classification device that uses electronic components to support a calibration unit, which includes a machine, a feeding device, a receiving device, a working device, a conveying device, a supporting calibration unit and a central control device. The feeding device is arranged on the machine table, and is provided with at least one feeding holder for accommodating the electronic components to be operated. The feeding device is arranged on the machine table and is provided with at least one receiving device for accommodating the operated electronic components. Material carrier, the working device is arranged on the machine table, and is provided with at least one pair of electronic components to perform preset operations, the conveying device is arranged on the machine table, and is provided with at least one transfer electronic component The material shifter and at least one bearing calibration unit of the present invention are used to calibrate the electronic components. The central control device is used to control and integrate the actions of each device to perform automated operations, so as to achieve the practical benefit of improving the operating efficiency.
11‧‧‧台板 11‧‧‧ Platen
12‧‧‧基準件 12‧‧‧ benchmark
13‧‧‧壓缸 13‧‧‧Press cylinder
14‧‧‧夾持件 14‧‧‧Clamping parts
21‧‧‧移料器 21‧‧‧shifter
22、23、24‧‧‧電子元件 22, 23, 24 ‧‧‧ Electronic components
A、B‧‧‧中心位置 A, B‧‧‧Central location
30‧‧‧承置校正單元 30‧‧‧Bearing correction unit
31‧‧‧載具 31‧‧‧Vehicle
32‧‧‧承置件 32‧‧‧Bearing
321‧‧‧承置部 321‧‧‧ Bearing Department
322‧‧‧第一承靠部件 322‧‧‧First bearing part
323‧‧‧第二承靠部件 323‧‧‧The second bearing part
324‧‧‧第一承抵部件 324‧‧‧The first bearing part
325‧‧‧第二承抵部件 325‧‧‧Second bearing part
326‧‧‧第一容置槽 326‧‧‧The first receiving slot
327‧‧‧第二容置槽 327‧‧‧Second accommodating slot
L‧‧‧中心軸線 L‧‧‧Central axis
33‧‧‧第一校正具 33‧‧‧First calibrator
3301、3301A‧‧‧第一塊體 3301, 3301A‧‧‧The first block
3302‧‧‧第二塊體 3302‧‧‧The second block
331、331A‧‧‧第一頂推部件 331, 331A‧‧‧First push component
332、332A‧‧‧第一讓位部 332, 332A‧‧‧ First Concession Department
333、333A‧‧‧第一嵌接部 333, 333A‧‧‧First embedding part
334、334A‧‧‧第一通槽 334, 334A‧‧‧First channel
335‧‧‧第一抵擋部件 335‧‧‧First resisting part
336‧‧‧第一連結部 336‧‧‧First Connection Department
337‧‧‧第一桿件 337‧‧‧The first rod
34‧‧‧第二校正具 34‧‧‧Second correction tool
3401、3401A‧‧‧第三塊體 3401, 3401A‧‧‧third block
3402‧‧‧第四塊體 3402‧‧‧The fourth block
341、341A‧‧‧第二頂推部件 341, 341A‧‧‧Second thrust component
342、342A‧‧‧第二讓位部 342, 342A‧‧‧ Second Concession Department
343、343A‧‧‧第二嵌接部 343, 343A‧‧‧Second embedding part
344、344A‧‧‧第二通槽 344、344A‧‧‧Second channel
345‧‧‧第二抵擋部件 345‧‧‧Second resisting part
346‧‧‧第二連結部 346‧‧‧Second Link Department
347‧‧‧第二桿件 347‧‧‧Second lever
35‧‧‧第一驅動源 35‧‧‧ First driving source
351‧‧‧第一本體 351‧‧‧The first body
352‧‧‧第一頂桿 352‧‧‧First jack
36‧‧‧第二驅動源 36‧‧‧Second drive source
361‧‧‧第二本體 361‧‧‧Second body
362‧‧‧第二頂桿 362‧‧‧Second jack
37‧‧‧彈性件 37‧‧‧Elastic parts
381‧‧‧滑軌 381‧‧‧slide
382‧‧‧第一滑座 382‧‧‧First Slide
383‧‧‧第二滑座 383‧‧‧Second Slide
391‧‧‧投光元件 391‧‧‧Projection element
392‧‧‧接光元件 392‧‧‧Light receiving element
40‧‧‧移料器 40‧‧‧shifter
P‧‧‧中心位置 P‧‧‧Central location
41、42‧‧‧電子元件 41、42‧‧‧Electronic components
C、D‧‧‧中心位置 C, D‧‧‧ Central position
50‧‧‧機台 50‧‧‧machine
60‧‧‧供料裝置 60‧‧‧Feeding device
61‧‧‧供料承置器 61‧‧‧Feeding holder
70‧‧‧收料裝置 70‧‧‧Receiving device
71‧‧‧收料承置器 71‧‧‧ Receiver
80‧‧‧作業裝置 80‧‧‧operating device
81‧‧‧電路板 81‧‧‧ circuit board
82‧‧‧測試座 82‧‧‧Test seat
90‧‧‧輸送裝置 90‧‧‧Conveying device
91‧‧‧第一移料器 91‧‧‧ First material shifter
92‧‧‧第一入料載台 92‧‧‧First loading platform
93‧‧‧第二入料載台 93‧‧‧Second loading table
94‧‧‧第二移料器 94‧‧‧Second material shifter
95‧‧‧第三移料器 95‧‧‧The third feeder
96‧‧‧第一出料載台 96‧‧‧The first discharge platform
97‧‧‧第二出料載台 97‧‧‧Second discharge platform
98‧‧‧第四移料器 98‧‧‧ Fourth material shifter
第1圖:習知電子元件校正機構之使用示意圖(一)。 Figure 1: Schematic diagram of the use of conventional electronic component calibration mechanisms (1).
第2圖:習知電子元件校正機構之使用示意圖(二)。 Figure 2: Schematic diagram of the use of conventional electronic component calibration mechanisms (2).
第3圖:本發明電子元件承置校正單元之俯視圖。 Figure 3: A top view of the electronic component receiving correction unit of the present invention.
第4圖:本發明電子元件承置校正單元之剖視圖。 Figure 4: A cross-sectional view of the electronic component receiving correction unit of the present invention.
第5圖:係校正小尺寸電子元件之使用示意圖(一)。 Figure 5: Schematic diagram of the use of calibrated small-sized electronic components (1).
第6圖:係校正小尺寸電子元件之使用示意圖(二)。 Figure 6: Schematic diagram of the use of calibrated small-sized electronic components (2).
第7圖:係校正小尺寸電子元件之使用示意圖(三)。 Figure 7: Schematic diagram of the use of calibrated small-sized electronic components (3).
第8圖:係校正小尺寸電子元件之使用示意圖(四)。 Figure 8: Schematic diagram of the use of calibrated small-sized electronic components (4).
第9圖:係校正大尺寸電子元件之使用示意圖(一)。 Figure 9: Schematic diagram of the calibration of large-sized electronic components (1).
第10圖:係校正大尺寸電子元件之使用示意圖(二)。 Figure 10: Schematic diagram of the use of calibrating large-sized electronic components (2).
第11圖:係校正大尺寸電子元件之使用示意圖(三)。 Figure 11: Schematic diagram of the use of calibrating large-sized electronic components (3).
第12圖:係承置校正單元應用於作業分類設備之示意圖。 Figure 12: A schematic diagram of the application of the calibration unit to the job classification equipment.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後: In order to make your examination committee have a better understanding of the present invention, here is a preferred embodiment and accompanying drawings, detailed as follows:
請參閱第3、4圖,本發明電子元件承置校正單元30包含載具31、承置件32、第一校正具33、第二校正具34及驅動機構;該載具31係可為固定式配置,而固設於機台(圖未示出)上,亦或為活動式配置,而由至少一動力源(圖未示出)驅動作至少一方向位移,以載送電子元件至不同作業位置處,於本實施例中,該載具31係為架體,並固設於機台上;該承置件32係裝配於載具31上,並設有至少一承置電子元件之承置部321,於本實施例中,該承置件32係以頂面作為承置部321,又該承置件32係於第一側設有第一承靠部件322,以及於第二側設有第二承靠部件323,更進一步,可於承置件32之第一、二側分別裝配塊體作為第一、二承靠部件322、323,亦或直接以承置件32之第一、二側面作為第一、二承靠部件322、323,於本實施例中,該承置件32係以第一側面作為第一承靠部件322,及以第二側面作為第二承靠部件323,另該承置件32係於第一側設有第一承抵部件324,以及於第二側設有第二承抵部件325,更進一步,該第一、二承抵部件324、325可相同或不相同於第一、二承靠部件322、323,例如可於承置件32之第一、二側分別設有為凹部之第一、二承抵部件324、325,或例如以第一、二承靠部件322、323之部分區域作為第一、二承抵部件324、325,於本實施例中,承置件32係於第一側面凹設有第一承抵部件324,以及於第二側面凹設有第二承抵部件325,另該承置件32係於底部凹設至少一容置槽,於本實施例中,承置 件32係於底部設有貫通第一、二側面之第一容置槽326及第二容置槽327;該第一校正具33係裝配於載具31上,並位於承置件32之第一側方,更進一步,該第一校正具33可為一體成型或包含複數個塊體,於本實施例中,第一校正具33係設有第一塊體3301及第二塊體3302,另該第一校正具33係於第二側設有至少一推移電子元件之第一頂推部件331,於本實施例中,第一校正具33係於第一塊體3301之第二側設有複數個為凹槽之第一讓位部332及複數個為凸塊之第一嵌接部333,並以第一讓位部332之第一角部作為第一頂推部件331,更進一步,第一校正具33係於第一嵌接部333之底面凹設有第一通槽334,另該第一校正具33係於第二側設有至少一第一抵擋部件335,以靠抵於承置件32之第一承靠部件322,於本實施例中,第一校正具33係以第二塊體3302之第二側面作為第一抵擋部件335,該第一抵擋部件335與第一讓位部332、第一嵌接部333具有高低位差,以使第一讓位部332及第一嵌接部333可跨置於承置件32之承置部321上,而第一抵擋部件335則位於承置件32之第一側方,又該第一校正具33係於第一側設有至少一第一連結部336,以連結第一驅動源35,於本實施例中,第一校正具33係以第二塊體3302之第一側設有第一連結部336,另該第一校正具33係於底面設有第一桿件337,於本實施例中,第一校正具33係於第二塊體3302之底面設有第一桿件337;該第二校正具34係裝配於載具31上,並位於承置件32之第二側方,更進一步,該第二校正具34可為一體成型或包含複數個塊體,於本實施例中,第二校正具34係設有第三塊體3401及第四塊體3402,該第二校正具34係於第一側設有至少一推移電子元件之第二頂推部件341,該第二頂推部件341並相對於第一校正具33之第一頂推部件331,於本實施例中,第二校正具34係於第三塊體3401之第一側設有複數個 為凹槽之第二讓位部342及複數個為凸塊之第二嵌接部343,並以第二讓位部342之第二角部作為第二頂推部件341,更進一步,第二校正具34係於第二嵌接部343之底面凹設有第二通槽344,另該第二校正具34係於第一側設有至少一第二抵擋部件345,以靠抵於承置件32之第二承靠部件323,於本實施例中,第二校正具34係以第四塊體3402之第一側面作為第二抵擋部件345,該第二抵擋部件345與第二讓位部342、第二嵌接部343具有高低位差,以使第二讓位部342及第二嵌接部343可跨置於承置件32之承置部321上,而第二抵擋部件345則位於承置件32之第二側方,又該第二校正具34係於第二側設有至少一第二連結部346,以連結第二驅動源36,於本實施例中,第二校正具34係以第二塊體3402之第二側設有第二連結部346,又該第二校正具34係於底面設有第二桿件347,於本實施例中,第二校正具34係於第四塊體3402之底面設有第二桿件347;該驅動機構係裝配於載具31上,並設有一驅動第一校正具33位移之第一驅動源35,以及設有一驅動第二校正具34位移之第二驅動源36,更進一步,該第一、二驅動源35、36可為壓缸或皮帶輪組等,於本實施例中,該第一驅動源35係為壓缸,並以第一本體351連結第一校正具33之第一連結部336,而令一為活塞桿之第一頂桿352頂置於承置件32之第一承抵部件324,該第二驅動源36係為壓缸,並以第二本體361連結第二校正具34之第二連結部346,而令一為活塞桿之第二頂桿362頂置於承置件32之第二承抵部件325,另該驅動機構係設有至少一連結第一校正具33及第二校正具34之彈性件37,以帶動第一校正具33及第二校正具34復位,於本實施例中,係於承置件32之第一容置槽326配置一為彈簧之彈性件37,彈性件37之第一端係連結第一校正具33之第一桿件337,而第二端則連結第二校正具34之第二桿件347, 又該驅動機構係設有至少一連結第一校正具33及第二校正具34之滑軌組,以輔助第一校正具33及第二校正具34位移,於本實施例中,係於承置件32之第二容置槽327配置滑軌組,滑軌組之滑軌381係固設於載具31上,並以第一滑座382連結第一校正具33之第一連結部336,及以第二滑座383連結第二校正具34之第二連結部346;該承置校正單元30更包含設有至少一感測器,該感測器係裝配於載具31上,以檢知承置件32上是否殘留電子元件,於本實施例中,感測器係於承置件32之第一端設有投光元件391,並於第二端設有接光元件392,以於第一、二校正具33、34向外位移開啟,其第一、二通槽334、344即會錯開而形成一檢知通道,利用檢知通道即可檢知承置件32上是否殘留電子元件,亦或檢知驅動機構之第一、二驅動源35、36是否作動。 Please refer to FIGS. 3 and 4, the electronic component receiving and correcting
請參閱第5、6圖,於執行校正電子元件作業,該承置校正單元30之驅動機構係以第一、二驅動源35、36之第一、二頂桿352、362分別凸伸頂抵於承置件32之第一、二承抵部件324、325而限位,由於第一、二頂桿352、362無法繼續向外凸伸,即可令第一、二本體351、361作反向外移,第一驅動源35之第一本體351即帶動第一校正具33向外位移,第二驅動源36之第二本體361則帶動第二校正具34向外位移,第一校正具33及第二校正具34並拉伸彈性件37之第一端及第二端,以及利用第一滑座382及第二滑座383沿滑軌381位移,使得第一校正具33之第一頂推部件331與第二校正具34之第二頂推部件341之間提供一較大之入料空間;然於第一、二校正具33、34向外位移開啟時,該第一校正具33之第一通槽334及第二校正具34之第二通槽344即會錯開而形成一檢知通道,當感測器之接光元件392經由檢知通道接收到投光元件391之光線時,即代表承置件32之承置部321上並無殘留電子元件,以及第一、二驅 動源35、36正常作動,進而有效避免疊料或壓損電子元件,反之,若無接收到光線,則代表承置件32之承置部321上殘留電子元件或第一、二驅動源35、36異常,工作人員即需排除異常;當移料器40移載一偏置之電子元件41至承置校正單元30之上方時,由於第一校正具33之第一頂推部件331與第二校正具34之第二頂推部件341間提供一較大之入料空間,移料器40帶動偏置之電子元件41作Z方向向下位移時,即可防止偏置之電子元件41碰撞到第一校正具33或第二校正具34,進而提升電子元件41之良率,使得移料器40順利將偏置之電子元件41置放於承置件32之承置部321。 Please refer to Figures 5 and 6 to perform the calibration of electronic components. The driving mechanism of the
請參閱第3、7圖,接著該驅動機構之第一、二驅動源35、36係分別控制第一、二頂桿352、362內縮復位,由於第一、二本體351、361已無氣體壓力反向頂推,即可利用彈性件37之復位彈力,令其第一、二端分別帶動第一、二本體351、361向內位移,該第一本體351即帶動第一校正具33向內位移,該第二本體361則帶動第二校正具34向內位移,該第一校正具33之第一讓位部332及第一嵌接部333係與第二校正具34之第二嵌接部343及第二讓位部342相互嵌接,並使第一校正具33之第一頂推部件331推移電子元件41之一角部,以及使第二校正具34之第二頂推部件341推移電子元件41之另一角部,於第一校正具33之第一抵擋部件335貼靠承置件32之第一承靠部件322,以及於第二校正具34之第二抵擋部件345貼靠承置件32之第二承靠部件323時,可使第一校正具33及第二校正具34具有相同之位移行程,以令第一校正具33之第一頂推部件331及第二校正具34之第二頂推部件341夾持推移電子元件41之中心位置C對位於承置件32之承置部321的中心軸線L,進而校正電子元件41之中心位置C。 Please refer to Figures 3 and 7, and then the first and
請參閱第6、8圖,於完成校正作業後,該驅動機 構之第一驅動源35及第二驅動源36即分別帶動第一校正具33及第二校正具34向外位移,令第一校正具33之第一頂推部件331及第二校正具34之第二頂推部件341脫離電子元件41,當移料器40位移至預設取料位置時,由於移料器40之中心位置P已預設對位於承置件32之承置部321的中心軸線L,使得移料器40之中心位置P即可對位於電子元件41之中心位置C,該移料器40即可作Z方向向下位移而精準取出電子元件41,以利準確將電子元件41移入至下一作業器(如測試座,圖未示出)。 Please refer to Figures 6 and 8. After the calibration operation is completed, the
請參閱第9圖,欲校正大尺寸之電子元件42時,該承置校正單元30係更換第一校正具33之第一塊體,而於第二塊體3302上組裝另一具有第一頂推部件331A、第一讓位部332A、第一嵌接部333A及第一通槽334A的第一塊體3301A,以及更換第二校正具34之第三塊體,而於第四塊體3402上組裝另一具有第二頂推部件341A、第二讓位部342A、第二嵌接部343A及第二通槽344A的第三塊體3401A;該驅動機構之第一驅動源35及第二驅動源36係分別帶動第一校正具33及第二校正具34向外位移,使得第一校正具33之第一頂推部件331A與第二校正具34之第二頂推部件341A間提供一較大之入料空間,移料器40即可帶動偏置之電子元件42作Z方向向下位移置放於承置件32之承置部321。 Please refer to FIG. 9, when the large-sized
請參閱第10、11圖,該驅動機構之第一、二驅動源35、36係分別帶動第一校正具33及第二校正具34向內位移,該第一校正具33之第一讓位部332A及第一嵌接部333A係與第二校正具34之第二嵌接部343A及第二讓位部342A相互嵌接,並使第一校正具33之第一頂推部件331A推移電子元件42之一角部,以及使第二校正具34之第二頂推部件341A推移電子元件42之另一角部,於第一校正具 33之第一抵擋部件335貼靠承置件32之第一承靠部件322,以及於第二校正具34之第二抵擋部件345貼靠承置件32之第二承靠部件323時,可使第一校正具33及第二校正具34具有相同之位移行程,以令第一校正具33之第一頂推部件331A及第二校正具34之第二頂推部件341A夾持推移電子元件42之中心位置D對位於承置件32之承置部321的中心軸線L,進而校正電子元件42之中心位置D;於完成校正作業後,該驅動機構之第一驅動源35及第二驅動源36即分別帶動第一校正具33及第二校正具34向外位移,令第一校正具33之第一頂推部件331A及第二校正具34之第二頂推部件341A脫離電子元件42,當移料器40位移至預設取料位置時,由於移料器40之中心位置P已預設對位於承置件32之承置部321的中心軸線L,使得移料器40之中心位置P即可對位於電子元件42之中心位置D,該移料器40即可作Z方向向下位移而精準取出電子元件42,以利準確將電子元件42移入至下一作業器(如測試座,圖未示出)。 Please refer to Figs. 10 and 11, the first and second driving sources 35 and 36 of the driving mechanism respectively drive the first calibrator 33 and the second calibrator 34 to move inward, and the first calibrator 33 gives way The portion 332A and the first embedding portion 333A are inter-engaged with the second embedding portion 343A and the second yielding portion 342A of the second calibration tool 34, and cause the first pushing member 331A of the first calibration tool 33 to move electrons One corner of the element 42 and the second pushing member 341A of the second calibrator 34 pushes the other corner of the electronic element 42 to the first resisting member 335 of the first calibrator 33 against the first of the receiving member 32 When the supporting member 322 and the second resisting member 345 of the second calibration tool 34 abut against the second supporting member 323 of the mounting member 32, the first calibration tool 33 and the second calibration tool 34 can have the same displacement Stroke, so that the first pushing member 331A of the first calibrator 33 and the second pushing member 341A of the second calibrator 34 clamp the center position D of the pushing electronic component 42 to the receiving portion 321 of the receiving member 32 The central axis L of the center, and then calibrate the center position D of the electronic component 42; after the calibration operation is completed, the first driving source 35 and the second driving source 36 of the driving mechanism drive the first calibrator 33 and the second calibrator 34, respectively Displace outward, so that the first pushing member 331A of the first calibrator 33 and the second pushing member 341A of the second calibrator 34 are separated from the electronic component 42. When the
請參閱第3、4、12圖,係本發明承置校正單元30應用於電子元件作業分類設備之示意圖,該作業分類設備係於機台50上配置有供料裝置60、收料裝置70、作業裝置80、輸送裝置90及中央控制裝置(圖未示出);該供料裝置60係裝配於機台50,並設有至少一為供料盤之供料承置器61,用以容納至少一待作業之電子元件;該收料裝置70係裝配於機台50,並設有至少一為收料盤之收料承置器71,用以容納至少一已作業之電子元件;該作業裝置80係裝配於機台50,並設有至少一作業器,以對電子元件執行預設作業,於本實施例中,該作業器係為一測試器,該測試器係設有電性連接之電路板81及測試座82,並以測試座82承置及測試電子元件;該輸送裝置90係裝配於機台50上,並設有至少一移載電子元件之移料器,以及設置至少一本發明之承置校正單元30,以校正電子元 件,於本實施例中,該輸送裝置90係設有第一移料器91,以於供料裝置60之供料承置器61取出待測之電子元件,並移載至第一入料載台92及第二入料載台93,第一入料載台92及第二入料載台93將待測之電子元件載送至測試裝置80之側方,該輸送裝置90係以第二移料器94及第三移料器95於第一入料載台92及第二入料載台93取出待測之電子元件,並分別先移入於二承置校正單元30,而校正電子元件,再以第二移料器94及第三移料器95將二承置校正單元30內已校正之電子元件移載至作業裝置80之測試座82而執行測試作業,以及將測試座82之已測電子元件移載至第一出料載台96及第二出料載台97,第一出料載台96及第二出料載台97載出已測之電子元件,該輸送裝置90係以第四移料器98於第一出料載台96及第二出料載台97上取出已測之電子元件,並依據測試結果,將已測之電子元件輸送至收料裝置70之收料承置器71處而分類收置;該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 Please refer to FIGS. 3, 4, and 12, which are schematic diagrams of the application of the
30‧‧‧承置校正單元 30‧‧‧Bearing correction unit
31‧‧‧載具 31‧‧‧Vehicle
32‧‧‧承置件 32‧‧‧Bearing
322‧‧‧第一承靠部件 322‧‧‧First bearing part
323‧‧‧第二承靠部件 323‧‧‧The second bearing part
324‧‧‧第一承抵部件 324‧‧‧The first bearing part
325‧‧‧第二承抵部件 325‧‧‧Second bearing part
326‧‧‧第一容置槽 326‧‧‧The first receiving slot
327‧‧‧第二容置槽 327‧‧‧Second accommodating slot
33‧‧‧第一校正具 33‧‧‧First calibrator
3301‧‧‧第一塊體 3301‧‧‧The first block
3302‧‧‧第二塊體 3302‧‧‧The second block
331‧‧‧第一頂推部件 331‧‧‧First push component
332‧‧‧第一讓位部 332‧‧‧ First Concession Department
333‧‧‧第一嵌接部 333‧‧‧First embedding department
335‧‧‧第一抵擋部件 335‧‧‧First resisting part
336‧‧‧第一連結部 336‧‧‧First Connection Department
337‧‧‧第一桿件 337‧‧‧The first rod
34‧‧‧第二校正具 34‧‧‧Second correction tool
3401‧‧‧第三塊體 3401‧‧‧The third block
3402‧‧‧第四塊體 3402‧‧‧The fourth block
341‧‧‧第二頂推部件 341‧‧‧Second thrust component
342‧‧‧第二讓位部 342‧‧‧ Second Concession
343‧‧‧第二嵌接部 343‧‧‧Second embedding part
345‧‧‧第二抵擋部件 345‧‧‧Second resisting part
346‧‧‧第二連結部 346‧‧‧Second Link Department
347‧‧‧第二桿件 347‧‧‧Second lever
35‧‧‧第一驅動源 35‧‧‧ First driving source
351‧‧‧第一本體 351‧‧‧The first body
352‧‧‧第一頂桿 352‧‧‧First jack
36‧‧‧第二驅動源 36‧‧‧Second drive source
361‧‧‧第二本體 361‧‧‧Second body
362‧‧‧第二頂桿 362‧‧‧Second jack
37‧‧‧彈性件 37‧‧‧Elastic parts
381‧‧‧滑軌 381‧‧‧slide
382‧‧‧第一滑座 382‧‧‧First Slide
383‧‧‧第二滑座 383‧‧‧Second Slide
391‧‧‧投光元件 391‧‧‧Projection element
392‧‧‧接光元件 392‧‧‧Light receiving element
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW107122657A TWI710047B (en) | 2018-06-29 | 2018-06-29 | Electronic component bearing correction unit and job classification equipment for its application |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW107122657A TWI710047B (en) | 2018-06-29 | 2018-06-29 | Electronic component bearing correction unit and job classification equipment for its application |
Publications (2)
Publication Number | Publication Date |
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TW202002133A true TW202002133A (en) | 2020-01-01 |
TWI710047B TWI710047B (en) | 2020-11-11 |
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Family Applications (1)
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TW107122657A TWI710047B (en) | 2018-06-29 | 2018-06-29 | Electronic component bearing correction unit and job classification equipment for its application |
Country Status (1)
Country | Link |
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TW (1) | TWI710047B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI745136B (en) * | 2020-10-27 | 2021-11-01 | 鴻勁精密股份有限公司 | Position shifter for electronic component support and operating apparatus using the same |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI564985B (en) * | 2015-11-06 | 2017-01-01 | Hon Tech Inc | Electronic components for the unit and its application of the operating equipment |
-
2018
- 2018-06-29 TW TW107122657A patent/TWI710047B/en active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI745136B (en) * | 2020-10-27 | 2021-11-01 | 鴻勁精密股份有限公司 | Position shifter for electronic component support and operating apparatus using the same |
Also Published As
Publication number | Publication date |
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TWI710047B (en) | 2020-11-11 |
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