TW201113211A - Testing sorter machine for micro electric sensor elements - Google Patents
Testing sorter machine for micro electric sensor elements Download PDFInfo
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- TW201113211A TW201113211A TW98134178A TW98134178A TW201113211A TW 201113211 A TW201113211 A TW 201113211A TW 98134178 A TW98134178 A TW 98134178A TW 98134178 A TW98134178 A TW 98134178A TW 201113211 A TW201113211 A TW 201113211A
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201113211 六、發明說明: 【發明所屬之技術領域】 本發明係提供-種可有效縮減機構配置,並易 tSSi】以大幅節省成本及提升測試品質之測試分類機’ 纩,感測電子元件於製作完成後’必須 试作業以確保品質’並淘汰出不良品,請參閱 再 電子元件之測試分類機,其包含設於機台1Q ^置11、複數個收料裝置12及空盤裝置13,苴中,^ 11係承置制之微感測電子元件,複數錢ϋ系 承置不同等級制之微制電子元件,空魏纟祖 1〇之後端則設有角度運動測試裝置丄4,該角二 閱第2圖’各角度測試機;:有 、γ㈣_機構及χ軸向祕顧,該升降機 馬達1 4 1經傳動組1 4 2帶動一承置板丄43作升 ,、 =ίχ軸向旋轉機構,該Χ軸向旋轉機構係 上ίί!4 第一承架145作Χ軸向旋轉角度運動, 構传以γ軸向旋轉機構,該γ軸向旋轉機 馬達14 6驅動第二承架14 7作Υ軸向旋轉角度運 4 8 ,土 4 7承置具複數個測試座1 4 9之測試板1 =未,),測試器再將測試結果 二’奸機台1 g上财輸送裝置 處再以一可作X—Y—Z軸向位移之第二取放器153於第- 201113211201113211 VI. Description of the Invention: [Technical Field] The present invention provides a test sorting machine that can effectively reduce the configuration of the mechanism and is easy to save cost and improve test quality. 纩, sensing electronic components are produced. After the completion, 'it must be tried to ensure the quality' and the defective products are eliminated. Please refer to the test and classification machine for electronic components, which is provided on the machine 1Q ^11, a plurality of receiving devices 12 and an empty device 13, In the middle, the ^11 series is equipped with micro-sensing electronic components, and the plurality of money-based electronic components are installed in different grades. The rear end of the air Wei-zu is equipped with an angle motion test device 丄4, which is read at the corner. Figure 2 'All angle testers;: Yes, γ (four) _ mechanism and χ axial secrets, the elevator motor 141 is driven by a transmission group 1 4 2 to drive a slab 43 for lifting, = χ axial rotation The mechanism, the Χ axial rotation mechanism is attached to the first frame 145 as an axial rotation angle movement, and is configured to transmit a γ-axis rotation mechanism, and the γ-axis rotary machine motor 14 6 drives the second frame 14 7 as the axial rotation angle of the transport 4 8 , soil 4 7 bearing The test board with a plurality of test sockets 1 4 9 = not,), the tester will then test the results of the second 'profit machine' 1 g on the financial conveying device and then can be used as X-Y-Z axial displacement Second pick and place device 153 at the first - 201113211
載台15 2上取出待測之微感測電子元件16,並移載至角度剛 試機之測試座14 9上以進行旋轉角度測試作業,於測試作業完 畢後,一可作X — Y — Z軸向位移之第三取放器15 4即於測試 座14 9上取出完測之微感測電子元件16,並移載至一可作X 軸向位移之第二載台15 5上,該第二載台15 5則將完測之微 感測電子元件16載出角度運動測試裝置14,一可作X — γ〜 Ζ軸向位移之第四取放器2 5 6則於第二載台2 5 5取出完測之 微感測電子元件16,並依檢測結果移載至收料裝置丄2而分類 收置;惟,該角度測試機必須配置一升降機構供裝配又軸向旋轉 機構及Υ軸向旋轉機構,以帶動測試座14 9升降作動,又必須 於X軸向旋轉機構上裝配Υ軸向旋轉機構,方可使測試座1 4 g 及,感測電子元件16作二軸向之旋轉角度運動測試,不僅角度 測試機之各機構設計複雜,以致製作繁瑣耗時而增加成本,測試 作業亦僅限於作χ — γ軸向旋轉角度測試,致使檢測品質盔法有 效提=,再者,該輸送裝置i 5係必須於角度測試機處配g第二 取放器15 3及第三取放器15 4,用以分別取放待測/完測 微感測電子元件16,不僅增加製作成本,亦相當佔用機台工 空間’而不利於空間配置。 【發明内容】 本發明之目的-’係提供—種微細電子元件之測試分 ’包含供料裝置、收料裝置、角度運酬試裝置及輸送裝置,該 供料裝置係容納制之微感測電子元件,收料裝置係容納g 級完測之微_電子元件,肢運細試驗係設有至少—且 試座之多軸向關節式角度職機’輸送裝錄於供料裝置處^中 待測之微㈣電子元件’並移載至角度職機 測試機即帶_試座及微制電子元件執 $ 分類收置·,藉此’可有效縮減機構配置及簡化組=作^|= 201113211 幅節省設備成本之實用效益。 ,其二發^:,提供-種微感測電子元件之測試分類機 上穿配^座動測試裝置係於—多軸向關節式之角度測試機 ίί棘角叙使測試座上之微感測電子元件進行四軸以上 ’使微_電子元件作全方位之測試作業, 不偈細測試作業,達到提升測試品質之實用效益。 ,其中提供—種微感測電子元件之測試分類機 ==_成本及減少機構佔用機台空間,以= 【實施方式】 為使貴審查委員對本發明作更進一步之瞭解 實施例並配合圖式,詳述如后: 拉牛杈佳 請參閱第3圖’本發明測試分麵係於機台2 〇之 供料裝置3 0、收料裝置4 0及空盤裝置5 0,該機台2 0之後 端則設有角度運動戦裝置6 0,肋職微_電子元件 於機台20上設有輸送裝置7〇,用以於供、收料裝置 件,該供彳核置3 0係容納至少—錄待測微感測電子 盤3 1 ’收料裝置4 0係設有複數個空的料盤4 1,並可依繼 結果分級盛裝良品之完測微感測電子元件、不良品之完測微感= 電子疋件及她品之完測滅啦子元件,空缝置 收供料裝置3 0處空的料盤31 ’或將空的料盤31補充於收斜 裝置4 0 ’請配合參閱第4、5圖,該角度運動測試裂置6 ’ 設有至少-角度測試機61,該角度測試機6丄係具有 姑 手臂之多轴向’式角度運賴構6 i i,該多轴向關節式 度運動機構61 1係可作四軸(如乂―γ_ζ —$)以上之入月 位角度運動’並設有承架612供承置具複數個測試座614之 201113211 參The micro-sensing electronic component 16 to be tested is taken out from the stage 15 2 and transferred to the test stand 14 9 of the angle test machine for performing the rotation angle test operation. After the test operation is completed, one can be used as X-Y. The Z-axis displacement third pick-and-place device 15 4 takes the measured micro-sensing electronic component 16 on the test socket 14 9 and transfers it to a second stage 15 5 which can be X-axis displaced. The second stage 15 5 carries the measured micro-sensing electronic component 16 out of the angular motion testing device 14, and a fourth pick-and-placer that can be used for X-γ~Ζ axial displacement is in the second The stage 255 takes out the measured micro-sensing electronic component 16 and sorts it according to the detection result to the receiving device 丄2; however, the angle testing machine must be equipped with a lifting mechanism for assembly and axial rotation. The mechanism and the axial rotation mechanism are used to drive the test seat 14 9 to move up and down, and the X-axis rotation mechanism must be equipped with the axial rotation mechanism, so that the test seat 1 4 g and the sensing electronic component 16 can be used as two The axial rotation angle motion test not only makes the design of each mechanism of the angle tester complicated, but also makes the production cumbersome and time-consuming. Increasing the cost, the test operation is also limited to the χ-γ axial rotation angle test, so that the detection quality helmet method is effectively raised. Furthermore, the conveyor device i 5 must be equipped with the g second pick-and-place device 15 at the angle test machine. 3 and the third pick-and-place device 15 4 are used for respectively picking and dropping the micro-sensing electronic components 16 to be tested/finished, which not only increases the manufacturing cost, but also occupies the space of the machine bench, which is unfavorable for spatial configuration. SUMMARY OF THE INVENTION The object of the present invention is to provide a test device, a receiving device, an angular load test device and a transport device, which are equipped with micro-sensing. The electronic component and the receiving device are equipped with the micro-electronic components of the g-level test, and the limb transport test system is provided with at least the multi-axial articulated angle machine of the test stand, which is transported and recorded in the feeding device. The micro (four) electronic components to be tested 'and transferred to the angle machine test machine that is equipped with _ test stand and micro-electronic components to carry out the classification and collection, which can effectively reduce the organization configuration and simplify the group = ^ ^ 201113211 The practical benefit of saving equipment costs. , the second hair ^:, provide - a kind of micro-sensing electronic component test classification machine on the ^ seat motion test device is attached to - multi-axial joint angle tester ίί spine to make the test seat The electronic components are tested for more than four axes, so that the micro-electronic components can be tested in all directions, and the test operations are not carried out to achieve the practical benefits of improving the test quality. Providing a test sorting machine for micro-sensing electronic components ==_cost and reducing the occupation of machine space by the mechanism, to = [Embodiment] In order to enable the reviewing committee to further understand the present invention and cooperate with the schema For details, please refer to Figure 3: The test section of the present invention is based on the feeding device 30 of the machine 2, the receiving device 40 and the empty device 50, the machine 2 The rear end of 0 is provided with an angle movement device 60, and the ribs micro-electronic component is provided with a conveying device 7〇 on the machine table 20 for the supply and receiving device parts, and the supply core is arranged for 30 At least—recording the micro-sensing electronic disk 3 1 'receiving device 40 is equipped with a plurality of empty trays 4 1 and can be used to classify the finished products to measure the micro-sensing electronic components and defective products. After measuring the micro-inductance = the electronic component and the end of the product, the empty slot is placed in the feeding device 30 empty tray 31 ' or the empty tray 31 is added to the tilting device 4 0 ' Please refer to Figures 4 and 5 for the angle motion test split 6 ' with at least - angle tester 61, the angle tester 6 丄There are a number of axial 'angles of the arm's arm 6 ii, the multi-axis articulated motion mechanism 61 1 can be used for four-axis (such as 乂 γ ζ ζ - $) above the angular movement of the moon' There is a frame 612 for mounting a plurality of test seats 614 of 201113211
iHL3/該測試座614可為常閉型測試座或常開型測試 ΐ ρίΐ例之測試座6 1 4係、為常開型測試座,而於承架6 1 移動下壓常開型測試座6 1 4内微感測電子元件之 為以下壓定位微感測電子元件’若測試座6 1 4 、、才》、°式座時,承架6 1 2上可移動下壓之下壓件6 1 5, ΐ會ί移動下壓開啟常閉型測試座,以供待測之微感測電子元件 ΐ型峨座後,接著下壓件6 1 5移出脫離下㈣閉型測 “上、’常難測試座即會自動關定位微感測電子元件,無論常 閉型測龜或常開酬試座,冑可使微躺電子元件避免於旋轉 角度運動測試的過程巾自測試座6 14峨出,使得角度運動機 構611可帶動測試剌丨4及待測之微感測電子元件執行多軸 向之旋轉角度運動測試作業,並使測試器(圖未示出)將測試結 ,傳輸至中央控制單元,由中央控制單元控制各裝置作動,該輸 送裝置7 0係包含有承載機構7丄及移料機構7 2,該承載機構 71係具有至少一載台,本實施例之承载機構7 i係於供料裝置 3 0之後方設有供料載台7丄丄,用以承載待測之微感測電子元 件,於收料裝置40之後方則設有收料載台7丄2,用以承載完 測之微感測電子元件,該移料機構7 2係設有至少一取放器,本 實施例之移料機構7 2係設有第一取放器721及第二取放器7 2 2,該第一取放器7 21係可作X — Y—Z軸向位移,用以於 供、收料裝置3 0、4 Q及承載機構71間取放待測/完測之微 感測電子元件,第二取放器7 2 2係設於角度測試機61之承架 612上,並可作Y — Z軸向位移,用以於測試座614及承載 機構71間取放待測/完測之微感測電子元件。 請參閱第6圖,本發明於初始狀態時,輪送裝置7 〇之移料 機構7 2係以第一取放器7 2 1作X_Y~~z軸向位移,於供料 裝置3 0之料盤31上取出待測之微感測電子元件81,並移載 置入於供料載台711上。 請參閱第7、8、9圖,由於角度測試機61之角度運鮮棒 6 201113211 構61 1可作至少χ — γ — ζ —0四軸向位移,而可以 機構61 1帶動第二取放器7 2 2直接位移至供料載台工 處,使第二取放器7 2 2取出待測之微感測電子元件 ,至测試座614 ’於測試座614置人待測之微感測電子元件 81後,該下壓件615即移動下壓微感測電子元件8 感測電子元件81穩固的電性接觸於測試座6丄4,之談 度運動機構611即帶動測試座614及微感測電子元件8/作 θ之旋轉角度運動戦’並使測試板6 i 3將待測之 3電子it件8 1的測試訊號傳輸至職器,測試器再將微感測 電子疋件81之測試結果傳輸至中央控制單元。 "' 閱第i0圖,當角度測試機61執行測試作業時,移料 =7 2係以第-取放器7 2 1作X-Y — Z軸向位移,於供料 裝置3 0之健3 1上取出下-待測之微感測電子 了 移載置入於供料載台7 ! i上。 电卞骑W,並 元件i1^12圖,當角度測試機61完成微感測電子 作業後’下壓件615係離開完測之微 第二取放器7 2 2即作¥-2軸向位移,於 ^座6 1 4中取出賴之微感測電子元件8 i,之後,角 =構61 1帶動第二取放器7 2 2位移至收料载台7 i 2處 測之微感測電子元件8 1移載置入於收 圖’該角度運動機構6 1 1可再帶 動第-取放器722位移至供料載台71^ 2取出下一待測之微感測電子元件8 工:=2 1 4中,以接續執行測試作業,此時式座= 放器T作X-Y-Z軸向位移,於 件^ ΐ感電子讀或次級品微❹m子秘),將完測之 以 ί移載收置於收_ 4 0之料盤41上 201113211 0 ◦二2 〇之後端則設有複數個角度運動:5 :用:測試微感測電子元件,另於機台2 0上設 動^試ί ί 21 =於供、收料裝置3 0、4 0及各角度運 兩二二馳縫6 3 B 2 ◦ C間移载待測/完測之微感測 :之健?裝置30係容納至少一盛裝待測微感測電子元 :牛=盤3 1,收料裝置4⑽設有複數個空哺盤41,並可 分良ί之?則微感測電子元件、不良品之完測 ? /、’ 7C牛及-人級品之完測微感測電The iHL3/ test stand 614 can be a normally closed test stand or a normally open test stand. The test stand 6 1 4 is a normally open test stand, and the support 6 1 moves down the normally open test stand. 6 1 4 inner micro-sensing electronic components are the following pressure positioning micro-sensing electronic components 'if the test seat 6 1 4, , only, ° ° seat, the frame 6 1 2 can be moved down the pressing member 6 1 5, ΐ会ί Move down to open the normally closed test socket for the micro-sensing electronic component to be tested, and then press the lower pressing member 6 1 5 to remove the detachment (4) closed type measurement 'The often difficult test seat will automatically close the micro-sensing electronic components, regardless of the normally closed type of turtle or the constant-open test stand, so that the micro-lying electronic components can be avoided from the rotational angle motion test process from the test stand 6 14 Pulling out, the angular motion mechanism 611 can drive the test 剌丨4 and the micro-sense electronic component to be tested to perform a multi-axis rotational angle motion test operation, and cause the tester (not shown) to transmit the test knot to The central control unit controls the operation of each device by a central control unit, and the transport device 70 includes a carrier The loading mechanism 71 has at least one loading platform, and the supporting mechanism 7 i of the embodiment is provided with a feeding carrier 7丄丄 behind the feeding device 30 for Carrying the micro-sensing electronic component to be tested, and after receiving the device 40, a receiving carrier 7丄2 is provided for carrying the measured micro-sensing electronic component, and the loading mechanism 7 2 is provided with at least The pick-and-place mechanism 7 2 of the embodiment is provided with a first pick-and-placer 721 and a second pick-and-placer 7 2 2, and the first pick-and-placer 7 21 can be used as an X-Y-Z axis. The displacement device is used for picking up the micro-sensing electronic component to be tested/finished between the feeding and receiving device 30, 4Q and the carrying mechanism 71, and the second pick-and-place device 7 2 2 is set at the angle testing machine 61. The frame 612 can be used for Y-Z axial displacement for picking up the micro-sensing electronic components to be tested/finished between the test socket 614 and the support mechanism 71. Referring to Figure 6, the present invention In the initial state, the transfer mechanism 7 2 of the transfer device 7 is axially displaced by the first pick-and-placer 7 2 1 , and the micro-discharge is taken on the tray 31 of the feeding device 30. Sensing the electronic component 81, and Mounted on the feeding stage 711. Please refer to Figures 7, 8, and 9, because the angle tester 61 angles the fresh rod 6 201113211 structure 61 1 can be at least χ - γ - ζ - 0 four axial displacement The mechanism 61 1 can drive the second pick-and-placer 7 2 2 to directly shift to the feeding stage, and the second pick-and-placer 72 2 takes out the micro-sensing electronic component to be tested, to the test stand 614 ' After the test stand 614 is placed on the micro-sensing electronic component 81 to be tested, the lower pressing member 615 moves the depressed micro-sensing electronic component 8 to sense the stable electrical contact of the electronic component 81 with the test seat 6丄4. The kinetic motion mechanism 611 drives the test socket 614 and the micro-sensing electronic component 8 to perform the rotational angle motion θ of θ and causes the test board 6 i 3 to transmit the test signal of the 3 electronic component 8 1 to be tested to the server. The tester then transmits the test result of the micro-sensing electronic component 81 to the central control unit. "' Read the i0 diagram, when the angle tester 61 performs the test operation, the shifting material = 7 2 is the XY-Z axial displacement with the first pick-and-placer 7 2 1 , and the feed device is 30 1 Take out - the micro-sensing electrons to be tested are placed on the feeding stage 7 ! i. The electric cymbal rides W, and the component i1^12 is shown. When the angle tester 61 completes the micro-sensing electronic operation, the lower pressing member 615 is separated from the measured micro-second pick-and-place device 7 2 2 to be the ¥-2 axial direction. Displacement, take out the micro-sensing electronic component 8 i in the ^6 4 4, after that, the angle = structure 61 1 drives the second pick-and-placer 7 2 2 to the receiving stage 7 i 2 The measuring electronic component 8 1 is placed in the drawing. The angular moving mechanism 6 1 1 can further drive the first pick-and-placer 722 to the feeding stage 71 2 to take out the next micro-sensing electronic component 8 to be tested. Work: = 2 1 4, in order to continue the test operation, at this time the seat = the release T for XYZ axial displacement, in the piece ^ ΐ 电子 electronic reading or secondary product micro ❹ m sub-secret), will be completed ί shifting the load to the tray 41 on the receiving _ 4 0 201113211 0 ◦ 2 2 〇 at the end is equipped with a plurality of angular movements: 5: use: test micro-sensing electronic components, and set on the machine 20 Move ^ test ί ί 21 = at the supply and receiving device 3 0, 4 0 and all angles transport two two two sew 6 3 B 2 ◦ C transfer between the measured / completed micro-sensing: Jian? The device 30 is configured to accommodate at least one micro-sensing electronic component to be tested: cattle=disc 3 1, the receiving device 4 (10) is provided with a plurality of empty feeding trays 41, and can be divided into fine sensing electronic components and defective products. After the test? /, '7C cattle and - human grade measurement of micro-sensing
於收枓裝置4 0,各肖度運動峨錄置6 Q ==試機61A、61B、61C,!L』6 =j ’該角度測試機6 iA係具有一為機械手臂之多轴向關 T „度運動機構61 1A,該多軸向關節式之角度運動機構6 軸(如χ_γ—z—幻以上之全方位角度運動, w〇x架6 1 2八供承置具複數個測試座6 1 4 A之測試板6 13 A,該測試座6工4A係為常開型測試座,而於承架6工2 A上設有-可移動下壓常開型測試座6 i 4a内微感測電子元件 之了壓件6 1 5 A,用以下壓粒微感測電子元件,使微感測電 子元件避免於旋轉角度運動測試的過程中自測試座6丄4A内脫 出’使知角度運動機構61 1A可帶動測試座6丄4a及待測之 巧感測電^件執行乡軸錢轉肖度運_試作業,並使測試 器(圖未不出)將測試結果傳輸至中央控制單元,由中央控制單 元控制各裝置作動,該輸送裝置7 〇 a係設有一移料機構7 2 A,該移料機構72A係設有可同步作χ_γ軸向位移之第一取 放器7 21Α及第二取放器7 2 2 A,並使第一、二取放器7 2 1 A、7 2 2A可分別作Z軸向位移,使第一取放器7 2丄入於 供料裝置3 0及測試座614A間取放待測之微感測電子元件, --S ] 8 201113211 於收料裝置4 Q及測試座6 i 4 A間取放 A作二二=移料機構7 2 A係以第一取放器7 2 1 測之微感測電子元利% : 置3 〇之料盤3 1上取出待 i電子元二=:===8 3,,使微感In the receiving device 40, each of the short-range motions is recorded 6 Q == test machines 61A, 61B, 61C, ! L 』6 =j 'The angle tester 6 iA has a multi-axis closed T „ degree motion mechanism 61 1A for the mechanical arm, the multi-axis articulated angular motion mechanism 6 axis (such as χ γ γ - z - illusion The above omnidirectional angle motion, w〇x frame 6 1 2 eight for the test board 6 13 A with a plurality of test sockets 6 1 4 A, the test seat 6 4A is a normally open test seat, and Support 6 workers 2 A is provided - movable down pressure normally open type test seat 6 i 4a micro-sensing electronic components of the press part 6 1 5 A, with the following granules micro-sensing electronic components, making micro-sensing The electronic component is prevented from coming out of the test seat 6丄4A during the rotation angle motion test. 'The angled motion mechanism 61 1A can drive the test socket 6丄4a and the smart sensor to be tested to execute the axis money. Turning the test to the test, and letting the tester (not shown) transmit the test result to the central control unit, the central control unit controls the operation of each device, and the transport device 7 设有a is provided with a transfer mechanism 7 2 A, the moving mechanism 72A is provided with a first pick-and-placer 7 21Α and a second pick-and-placer 7 2 2 A which can be synchronously displaced as χγ, and the first The second pick-and-placer 7 2 1 A, 7 2 2A can be respectively displaced in the Z-axis, so that the first pick-and-placer 7 2 is inserted into the feeding device 30 and the test seat 614A to pick up and measure the micro-sensing to be tested. Electronic components, --S ] 8 201113211 Pick and place A between the receiving device 4 Q and the test stand 6 i 4 A for the second two = the moving mechanism 7 2 A is the first sensory 7 2 1 Measured electronic element %: Set 3 〇 of the tray 3 1 to take the i element 2 =:===8 3, so that the micro sense
卜今即帶動測試座614八及微感:子元^ 、目I丨之料/5之旋轉角度運_試,並使測試板6 1 3 A將待 3的測試訊號雜至測試器,測試器再將 微感測電子耕8 3之測試結果傳輸至中央控制單元。 麵.S3 1 ^圖’當1度測試機6 1 A執行測試作業時,移 4機冓2之第-取放器721A則再次於供料裝置3〇之料 盤31上取出下-待測之微感測電子元件84,並移載置入於角 度測試機6 1 B之測試座6 1 4 B内,以執行旋㈣度運動測試 作業^請參閱第20、21圖’當角度測試機6 iA完成微感測 電子元件8 3之角度運動測試作業後,下壓件6 ^ 5A係離開完Nowadays, the test seat 614 and the micro-sensation: the sub-element ^, the head I 丨 material /5 of the rotation angle _ test, and the test board 6 1 3 A will be 3 test signals mixed to the tester, test The test result of the micro-sensing electronic farming 8 3 is transmitted to the central control unit. Face.S3 1 ^图' When the 1 degree tester 6 1 A performs the test operation, the first pick-and-placer 721A of the shifting machine 2 is again taken out on the tray 31 of the feeding device 3 - to be tested The micro-sensing electronic component 84 is transferred and placed in the test socket 6 1 4 B of the angle tester 6 1 B to perform the rotary (four) degree motion test operation. Please refer to the figure 20 and 21 'when the angle tester 6 iA completes the angular motion test of the micro-sensing electronic component 8 3 , the lower pressing part 6 ^ 5A is finished
測之微感測電子元件8 3,移料機構7 2A係以第二取放器7 2 2A於測試座6 14A中取出完測之微感測電子元件8 3,由於 第一取放器7 21A已於供料裝置3 〇處取出另一待測之微感測 電子元件8 5,而可使第一取放器7 21A將待測之微感測電子 元件8 5置入於測试座614 A中,以接續執行測試作業;請參 閱第2 2圖,移料機構72A之第二取放器72 2A可依測試結 果(如良品微感測電子元件、不良品微感測電子元件或次級品微 感測電子元件)’將完測之微感測電子元件8 3移載收置於收料裝 置4 0之料盤41上,以完成分類收置作業。 據此,本發明測試分類機可有效縮減機構配置,並作多軸向 之角度運動測試,以大幅節省成本及提升測試品質,實為一竿具, 9 201113211The micro-sensing electronic component 8 3 is measured, and the transfer mechanism 7 2A takes out the micro-sensing electronic component 8 3 in the test socket 6 14A with the second pick-and-placer 7 2 2A, because the first pick-and-place device 7 21A has taken out another micro-sensing electronic component 8 5 to be tested at the feeding device 3 ,, and the first pick-and-place device 7 21A can place the micro-sensing electronic component 8 5 to be tested into the test seat. In 614 A, the test operation is continued; see Figure 22, the second pick-and-placer 72 2A of the transfer mechanism 72A can be based on test results (such as good micro-sensing electronic components, defective micro-sensing electronic components or The sub-product micro-sensing electronic component) 'transfers the measured micro-sensing electronic component 8 3 to the tray 41 of the receiving device 40 to complete the sorting and collecting operation. Accordingly, the test sorting machine of the present invention can effectively reduce the configuration of the mechanism and perform multi-axial angular motion test to save cost and improve test quality, which is a cookware, 9 201113211
,未見有相同之產品及刊物公開 爰依法提出申請。 ’從而 第3圖: 第4圖: 第5圖: 圖.本發明測試分類機之各裝置配置圖。 第1圖:習式測試分類機之配置圖。 ί f 試分類機之角度運動測試裝置之示意圖。 t發明測試分軸之角度運細試裝置之示意圖(一) 本發明測試分賴之角度運細試裝置之^圖(二) 第6圖.本發明測試分類機之使用示意圖(一)。 第7圖:本發明測試分類機之使用示意圖(二)。 第8圖:本發明測試分類機之使用示意圖(三)。 第9圖:本發明測試分類機之使用示意圖(四 第1 0圖:本發明測試分類機之使用示意圖(五 第1 1圖:本發明測試分類機之使用示意圖(六)。 第1 2圖:本發明測試分類機之使用示意圖(七)。 第13圖:本發明測試分類機之使用示意圖(八)。 第14圖:本發明測試分類機另一實施例之各裝置配置圖。 第15圖:本發明測試分類機另一實施例之使用示意圖(一)。 第16圖:本發明測試分類機另一實施例之使用示意圖(二)。 第17圖:本發明測試分類機另一實施例之使用示意圖(三)。 第18圖:本發明測試分類機另一實施例之使用示意圖(四)。 第19圖:本發明測試分類機另一實施例之使用示意圖(五)。 第20圖:本發明測試分類機另一實施例之使用示意圖(六)。 第21圖:本發明測試分類機另一實施例之使用示意圖(七)。 第22圖:本發明測試分類機另一實施例之使用示意圖(八)。 【主要元件符號說明】 〔習式〕 機台:1 0 供料裝置:11 收料裝置:12 空盤裝置:13 角度運動測試裝置:14 馬達:141 r 201113211No identical products and publications were disclosed. 申请Apply in accordance with the law. </ RTI> Figure 3: Figure 4: Figure 5: Figure. Configuration diagram of each device of the test sorter of the present invention. Figure 1: Configuration diagram of the test test sorter. ί f Schematic diagram of the angle motion test device of the test sorter. The invention is a schematic diagram of the angle test device for testing the split shaft. (I) The angle of the test device according to the invention is shown in Fig. (2). Fig. 6 is a schematic view showing the use of the test sorter of the present invention (1). Figure 7: Schematic diagram of the use of the test sorter of the present invention (2). Figure 8: Schematic diagram of the use of the test sorter of the present invention (3). Figure 9: Schematic diagram of the use of the test sorter of the present invention (fourth Figure 10: Schematic diagram of the use of the test sorter of the present invention (five Figure 1: Schematic diagram of the use of the test sorter of the present invention (six). Figure 1 2 : Schematic diagram of the use of the test sorter of the present invention (7). Fig. 13: Schematic diagram of the use of the test sorter of the present invention (8). Fig. 14: Configuration diagram of each apparatus of another embodiment of the test sorter of the present invention. Figure: Schematic diagram of the use of another embodiment of the test sorter of the present invention (1). Figure 16: Schematic diagram of the use of another embodiment of the test sorter of the present invention (2). Figure 17: Another implementation of the test sorter of the present invention Schematic diagram of the use of the example (3). Figure 18: Schematic diagram of the use of another embodiment of the test sorter of the present invention (4). Figure 19: Schematic diagram of the use of another embodiment of the test sorter of the present invention (5). Figure: Schematic diagram of the use of another embodiment of the test sorting machine of the present invention (6). Figure 21: Schematic diagram of the use of another embodiment of the test sorting machine of the present invention (7). Figure 22: Test sorting machine of the present invention Schematic diagram of the use of an embodiment (8) [Description of main component symbols] [Law] Machine: 1 0 Feeding device: 11 Receiving device: 12 Empty disk device: 13 Angle motion testing device: 14 Motor: 141 r 201113211
傳動組:14 2 馬達:14 4 馬達:14 6 測試板:14 8 輸送裝置:15 第一載台:15 2 第三取放器:15 4 第四取放器:15 6 〔本發明〕Transmission group: 14 2 Motor: 14 4 Motor: 14 6 Test board: 14 8 Conveying device: 15 First stage: 15 2 Third pick-and-place: 15 4 Fourth pick-and-place: 15 6 [Invention]
機台:2 0 供料裝置:3 0 收料裝置:40 空盤裝置:5 0 角度運動測試裝置:6 0、6 角度測試機:61、61 A、 角度運動機構:611、61 承架:612、612A 測試板:613、613 A 承置板:14 3 第一承架:14 5 第二承架:14 7 測試座:14 9 第一取放器:151 第二取放器:15 3 第二載台:15 5 微感測電子元件:16 料盤:3 1 料盤:4 1Machine: 2 0 Feeding device: 3 0 Receiving device: 40 Empty disk device: 5 0 Angle motion testing device: 6 0, 6 Angle testing machine: 61, 61 A, Angle motion mechanism: 611, 61 Shelf: 612, 612A Test board: 613, 613 A Bearing board: 14 3 First bracket: 14 5 Second bracket: 14 7 Test seat: 14 9 First pick-and-place: 151 Second pick-and-place: 15 3 Second stage: 15 5 micro-sensing electronic components: 16 tray: 3 1 tray: 4 1
、6 0B、6 0 C 6 1 B、6 1 C 1 A, 6 0B, 6 0 C 6 1 B, 6 1 C 1 A
測試座:614、614A、614BTest stand: 614, 614A, 614B
下壓件:615、615 A 輸送裝置:7 0、7 0 A 承載機構:71 供料載台:711 收料載台:712Lower pressing parts: 615, 615 A Conveying device: 7 0, 7 0 A Bearing mechanism: 71 Feeding platform: 711 Receiving platform: 712
移料機構:7 2、7 2 A 第一取放器:7 21、7 21 ATransfer mechanism: 7 2, 7 2 A First pick and place: 7 21, 7 21 A
第二取放器:7 2 2、7 2 2A 微感測電子元件:81、82、83、84、85Second pick and place: 7 2 2, 7 2 2A Micro-sensing electronic components: 81, 82, 83, 84, 85
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TWI488790B (en) * | 2011-07-15 | 2015-06-21 | 鴻海精密工業股份有限公司 | Device for production line and production line thereof |
CN113182198A (en) * | 2020-01-14 | 2021-07-30 | 鸿劲精密股份有限公司 | Testing device with temperature control unit and testing classification equipment applied by same |
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TW200846679A (en) * | 2007-05-18 | 2008-12-01 | Li-Ling Wang | Testing and classifying machine capable of initially using and further reading and writing test card |
WO2009069389A1 (en) * | 2007-11-26 | 2009-06-04 | Kabushiki Kaisha Yaskawa Denki | Vertical multi-joint robot |
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TWI488790B (en) * | 2011-07-15 | 2015-06-21 | 鴻海精密工業股份有限公司 | Device for production line and production line thereof |
CN113182198A (en) * | 2020-01-14 | 2021-07-30 | 鸿劲精密股份有限公司 | Testing device with temperature control unit and testing classification equipment applied by same |
CN113182198B (en) * | 2020-01-14 | 2023-08-29 | 鸿劲精密股份有限公司 | Testing device with temperature control unit and testing classification equipment applied by same |
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