TW200710415A - Probe for testing flat display panel - Google Patents
Probe for testing flat display panelInfo
- Publication number
- TW200710415A TW200710415A TW095125232A TW95125232A TW200710415A TW 200710415 A TW200710415 A TW 200710415A TW 095125232 A TW095125232 A TW 095125232A TW 95125232 A TW95125232 A TW 95125232A TW 200710415 A TW200710415 A TW 200710415A
- Authority
- TW
- Taiwan
- Prior art keywords
- driving
- probe
- block
- contact portion
- display panel
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050062573A KR100533193B1 (ko) | 2005-07-12 | 2005-07-12 | 평판표시패널 검사용 프로브 장치 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200710415A true TW200710415A (en) | 2007-03-16 |
Family
ID=37306519
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095125232A TW200710415A (en) | 2005-07-12 | 2006-07-11 | Probe for testing flat display panel |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR100533193B1 (zh) |
TW (1) | TW200710415A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102236183A (zh) * | 2010-05-06 | 2011-11-09 | 迪普劳布株式会社 | 显示面板检查用探针块以及探针单元 |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100696416B1 (ko) * | 2006-11-20 | 2007-03-19 | 주식회사 리뷰텍 | 평판표시소자 검사용 프로브 조립체 |
KR100781379B1 (ko) | 2007-01-30 | 2007-11-30 | 안재일 | 프로브장치 |
CN105242415B (zh) * | 2015-09-16 | 2018-10-02 | 武汉精测电子集团股份有限公司 | 探针基板及显示面板检测装置 |
KR102117023B1 (ko) * | 2018-08-30 | 2020-05-29 | 대한민국 | 항공기 기골 균열탐지를 위한 와전류 검사장치 |
KR102377600B1 (ko) * | 2020-08-06 | 2022-03-24 | (주)티에스이 | 프로브 카드 |
KR102409030B1 (ko) * | 2022-05-09 | 2022-06-14 | 이시훈 | 블레이드형 프로브 블록 |
-
2005
- 2005-07-12 KR KR1020050062573A patent/KR100533193B1/ko not_active IP Right Cessation
-
2006
- 2006-07-11 TW TW095125232A patent/TW200710415A/zh unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102236183A (zh) * | 2010-05-06 | 2011-11-09 | 迪普劳布株式会社 | 显示面板检查用探针块以及探针单元 |
Also Published As
Publication number | Publication date |
---|---|
KR100533193B1 (ko) | 2005-12-08 |
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