TW200710415A - Probe for testing flat display panel - Google Patents

Probe for testing flat display panel

Info

Publication number
TW200710415A
TW200710415A TW095125232A TW95125232A TW200710415A TW 200710415 A TW200710415 A TW 200710415A TW 095125232 A TW095125232 A TW 095125232A TW 95125232 A TW95125232 A TW 95125232A TW 200710415 A TW200710415 A TW 200710415A
Authority
TW
Taiwan
Prior art keywords
driving
probe
block
contact portion
display panel
Prior art date
Application number
TW095125232A
Other languages
English (en)
Inventor
Kyu-Sam Han
Myeong-Ja Yoo
Original Assignee
From 30 Co Ltd
Mct Korea Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by From 30 Co Ltd, Mct Korea Co Ltd filed Critical From 30 Co Ltd
Publication of TW200710415A publication Critical patent/TW200710415A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
TW095125232A 2005-07-12 2006-07-11 Probe for testing flat display panel TW200710415A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050062573A KR100533193B1 (ko) 2005-07-12 2005-07-12 평판표시패널 검사용 프로브 장치

Publications (1)

Publication Number Publication Date
TW200710415A true TW200710415A (en) 2007-03-16

Family

ID=37306519

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095125232A TW200710415A (en) 2005-07-12 2006-07-11 Probe for testing flat display panel

Country Status (2)

Country Link
KR (1) KR100533193B1 (zh)
TW (1) TW200710415A (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102236183A (zh) * 2010-05-06 2011-11-09 迪普劳布株式会社 显示面板检查用探针块以及探针单元

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100696416B1 (ko) * 2006-11-20 2007-03-19 주식회사 리뷰텍 평판표시소자 검사용 프로브 조립체
KR100781379B1 (ko) 2007-01-30 2007-11-30 안재일 프로브장치
CN105242415B (zh) * 2015-09-16 2018-10-02 武汉精测电子集团股份有限公司 探针基板及显示面板检测装置
KR102117023B1 (ko) * 2018-08-30 2020-05-29 대한민국 항공기 기골 균열탐지를 위한 와전류 검사장치
KR102377600B1 (ko) * 2020-08-06 2022-03-24 (주)티에스이 프로브 카드
KR102409030B1 (ko) * 2022-05-09 2022-06-14 이시훈 블레이드형 프로브 블록

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102236183A (zh) * 2010-05-06 2011-11-09 迪普劳布株式会社 显示面板检查用探针块以及探针单元

Also Published As

Publication number Publication date
KR100533193B1 (ko) 2005-12-08

Similar Documents

Publication Publication Date Title
TW200710415A (en) Probe for testing flat display panel
TW200630672A (en) System and method for display testing
TW200704935A (en) Inspection device for display panel and interface used therein
WO2010104303A3 (en) Probe unit for testing panel
TW200734660A (en) Display circuits
TW200710401A (en) Probe card
TW200708815A (en) Test circuit for flat panel display device
US20100022104A1 (en) Electrical connecting apparatus
MY146719A (en) Probe assembly, method of producing it and electrical connecting apparatus
TW200715017A (en) An active matrix substrate and a liquid crystal display device including the active matrix substrate
TW201129814A (en) Electrical connecting apparatus and testing system using the same
TW368600B (en) Probing card for multi-pins apparatus
TW200725526A (en) Display device and pixel testing method thereof
TW200739084A (en) Probe card for semiconductor test
WO2008028171A3 (en) Method and apparatus for switching tester resources
TW200606435A (en) Probe card
AU2001280869A1 (en) Test systems for wireless-communications devices
SG138551A1 (en) Probe card
WO2007146581A3 (en) Method of expanding tester drive and measurement capability
KR101441618B1 (ko) 디스플레이 패널 검사용 프로버
WO2008093465A1 (ja) 試験装置およびプローブカード
TW200619634A (en) Double sided probing structures
TW200638641A (en) Electrical connecting apparatus
TW200707610A (en) Electric connection device
WO2007146584A3 (en) Contactor having a global spring structure and methods of making and using the contactor