SU989403A1 - Method of checking main refractive indices of single axis crystals - Google Patents
Method of checking main refractive indices of single axis crystals Download PDFInfo
- Publication number
- SU989403A1 SU989403A1 SU802957483A SU2957483A SU989403A1 SU 989403 A1 SU989403 A1 SU 989403A1 SU 802957483 A SU802957483 A SU 802957483A SU 2957483 A SU2957483 A SU 2957483A SU 989403 A1 SU989403 A1 SU 989403A1
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- SU
- USSR - Soviet Union
- Prior art keywords
- refractive indices
- crystals
- single axis
- main refractive
- checking main
- Prior art date
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- Investigating Or Analysing Materials By Optical Means (AREA)
Description
Изобретение относитс к контрольно-измерительной технике, предназначено дл прецизионного одновременного контрол обыкновенного п и необыкновенного П0 показателей преломлени одноосных кристаллов непосредственно в процессе синтеза и может быть использовано в производстве искусственных кристаллов дл контрол их оптических свойств.The invention relates to instrumentation technology, is intended for precision simultaneous control of ordinary n and extraordinary r0 refractive indices of uniaxial crystals directly in the synthesis process and can be used in the production of artificial crystals to control their optical properties.
Известны способы измерени главных показателей преломлени одноос ных кристаллов, основанные на использовании нарушенного полного внутреннего отражени и измерении отклонени луча в призме, изготовленной из кристалла. Призма дл измерени показател преломлени одноосного кристалла изготовл етс так, чтобы ее .преломл ющее ребро было параллельно оптической оси кристалла flj и 2J.Methods are known for measuring the principal refractive indices of uniaxial crystals based on the use of impaired total internal reflection and measuring the deflection of a beam in a prism made of a crystal. A prism for measuring the refractive index of a uniaxial crystal is made so that its refractive edge is parallel to the optical axis of the crystal flj and 2J.
Этот способ вл етс весьма трудоемким и практически не поддаетс автоматизации . Кроме того, он применим только дл измерений кристаллов высокого оптического качества.This method is very time consuming and hardly automated. In addition, it is applicable only to measurements of crystals of high optical quality.
У измер емого кристалла полируют одну .плоскую поверхность,-помещают на полусферу кристаллорефрактометра и освещают через полусферу сход щимс пучком света от монохроматического источника. В отраженном (или преломленном ) свете наблюдаютс две границы , соответствующие предельным углам дл п., и Og. При этом необходимо проводить измерени двух углов и .измерени ограничиваютс высокопреломл ющими (п72,5) кристаллами. Снижение оптического качества кристаллов For the measured crystal, one flat surface is polished, placed on the hemisphere of the crystal refractometer, and illuminated through the hemisphere by a convergent beam of light from a monochromatic source. In the reflected (or refracted) light, two boundaries are observed, corresponding to the limiting angles for n, and Og. In this case, it is necessary to measure two angles and measurements are limited by highly refractive (P72.5) crystals. Decrease in optical quality of crystals
10 приводит к снижению точности измерений .10 leads to a decrease in measurement accuracy.
Наиболее близким к предлагаемому вл етс способ контрол главных показателей преломлени одноосных крис15 таллов, заключающийс в том, что из сход щегос пучка света, направленного на поверхность кристалла, выдел ют два луча, идущих под различнымиThe closest to the present invention is a method for monitoring the main refractive indices of uniaxial crystals of tal, which consists in that two beams are emitted from a converging beam of light directed at the surface of the crystal under different
20 углами, после отражени от кристалла лучи развод т по двум каналам, измер ют коэффициенты отражени кристалла в каждом канале и по измеренным коэффициентам отражени вычисл ют искомые показатели преломлени иссле25 дуемых кристаллов 33. .20 angles, after reflection from the crystal, the rays are separated in two channels, the reflection coefficients of the crystal in each channel are measured, and the refractive indices of the investigated crystals 33 are calculated from the measured reflection coefficients.
Claims (3)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU802957483A SU989403A1 (en) | 1980-07-14 | 1980-07-14 | Method of checking main refractive indices of single axis crystals |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU802957483A SU989403A1 (en) | 1980-07-14 | 1980-07-14 | Method of checking main refractive indices of single axis crystals |
Publications (1)
Publication Number | Publication Date |
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SU989403A1 true SU989403A1 (en) | 1983-01-15 |
Family
ID=20908674
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SU802957483A SU989403A1 (en) | 1980-07-14 | 1980-07-14 | Method of checking main refractive indices of single axis crystals |
Country Status (1)
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SU (1) | SU989403A1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0244716A2 (en) * | 1986-05-03 | 1987-11-11 | BROWN, BOVERI & CIE Aktiengesellschaft | Measuring device |
EP0724147A3 (en) * | 1995-01-27 | 1997-05-07 | Canon Kk | Apparatus and method for measuring optical anisotropy |
EP0811835A1 (en) * | 1996-06-05 | 1997-12-10 | Canon Kabushiki Kaisha | Apparatus and method for measuring optical anisotropy |
-
1980
- 1980-07-14 SU SU802957483A patent/SU989403A1/en active
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0244716A2 (en) * | 1986-05-03 | 1987-11-11 | BROWN, BOVERI & CIE Aktiengesellschaft | Measuring device |
EP0244716A3 (en) * | 1986-05-03 | 1988-07-27 | BROWN, BOVERI & CIE Aktiengesellschaft | Measuring device |
EP0724147A3 (en) * | 1995-01-27 | 1997-05-07 | Canon Kk | Apparatus and method for measuring optical anisotropy |
US5838453A (en) * | 1995-01-27 | 1998-11-17 | Canon Kabushiki Kaisha | Apparatus and method for measuring optical anisotropy |
EP0811835A1 (en) * | 1996-06-05 | 1997-12-10 | Canon Kabushiki Kaisha | Apparatus and method for measuring optical anisotropy |
US6088115A (en) * | 1996-06-05 | 2000-07-11 | Canon Kabushiki Kaisha | Apparatus and method for measuring optical anisotropy |
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