PT897524E - Dispositivo para medicao sem contacto de uma superficie tridimensional - Google Patents

Dispositivo para medicao sem contacto de uma superficie tridimensional

Info

Publication number
PT897524E
PT897524E PT97923781T PT97923781T PT897524E PT 897524 E PT897524 E PT 897524E PT 97923781 T PT97923781 T PT 97923781T PT 97923781 T PT97923781 T PT 97923781T PT 897524 E PT897524 E PT 897524E
Authority
PT
Portugal
Prior art keywords
pct
axis
rotation
strip structure
sec
Prior art date
Application number
PT97923781T
Other languages
English (en)
Inventor
Peter Kuhmstedt
Wolfgang Schreiber
Gunther Notni
Original Assignee
Fraunhofer Ges Forderung Angew
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fraunhofer Ges Forderung Angew filed Critical Fraunhofer Ges Forderung Angew
Publication of PT897524E publication Critical patent/PT897524E/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504—Calibration devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Media Introduction/Drainage Providing Device (AREA)
PT97923781T 1996-05-06 1997-04-30 Dispositivo para medicao sem contacto de uma superficie tridimensional PT897524E (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19618140A DE19618140A1 (de) 1996-05-06 1996-05-06 3D-Meßanordnung zur Ganzkörpererfassung und Einmessung einer entsprechenden Meßanordnung

Publications (1)

Publication Number Publication Date
PT897524E true PT897524E (pt) 2002-08-30

Family

ID=7793477

Family Applications (1)

Application Number Title Priority Date Filing Date
PT97923781T PT897524E (pt) 1996-05-06 1997-04-30 Dispositivo para medicao sem contacto de uma superficie tridimensional

Country Status (9)

Country Link
US (1) US6055056A (pt)
EP (1) EP0897524B1 (pt)
JP (1) JP2000509505A (pt)
AT (1) ATE214157T1 (pt)
DE (2) DE19618140A1 (pt)
DK (1) DK0897524T3 (pt)
ES (1) ES2174258T3 (pt)
PT (1) PT897524E (pt)
WO (1) WO1997042464A1 (pt)

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DE19642293C2 (de) * 1996-10-14 1998-07-16 Zeiss Carl Jena Gmbh Koordinatenmeßgerät
DE59914224D1 (de) * 1998-09-14 2007-04-12 Betr Forsch Inst Angew Forsch Verfahren zum Messen der Geometrie und Planheit von bewegtem Metallband
FR2796458B1 (fr) * 1999-07-12 2001-09-21 Cogema Procede et installation de mesure de relief sur une face d'une piece axisymetrique
DE10001429A1 (de) * 2000-01-15 2001-07-19 Volkswagen Ag Vorrichtung zur Kalibrierung optischer Meßsysteme und Verfahren zur Herstellung der Vorrichtung
US6504605B1 (en) 2000-10-24 2003-01-07 The Regents Of The University Of California Method and apparatus for determining the coordinates of an object
US6369879B1 (en) 2000-10-24 2002-04-09 The Regents Of The University Of California Method and apparatus for determining the coordinates of an object
JP5103697B2 (ja) * 2001-04-19 2012-12-19 株式会社島津製作所 ３次元光学カメラ
CN1437000A (zh) * 2002-02-09 2003-08-20 沈阳同联集团高新技术有限公司 投影栅线测量物体三维表面形状的方法和装置
DE10219054B4 (de) * 2002-04-24 2004-08-26 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und Vorrichtung zur Bestimmung der räumlichen Koordinaten eines Gegenstandes
ATE494561T1 (de) * 2002-11-15 2011-01-15 Leica Geosystems Ag Verfahren und vorrichtung zur kalibrierung eines messsystems
US20050068523A1 (en) * 2003-08-11 2005-03-31 Multi-Dimension Technology, Llc Calibration block and method for 3D scanner
US7342668B2 (en) * 2003-09-17 2008-03-11 D4D Technologies, Llc High speed multiple line three-dimensional digitalization
DE102005006069A1 (de) * 2005-02-10 2006-08-24 Hubert Kammer Verfahren und Vorrichtung zum dreidimensionalen Scannen von Objekten
JP4786923B2 (ja) * 2005-03-31 2011-10-05 富士フイルム株式会社 縞計測装置の変換係数較正方法および装置ならびに該変換係数較正装置を備えた縞計測装置
JP4230525B2 (ja) * 2005-05-12 2009-02-25 有限会社テクノドリーム二十一 ３次元形状計測方法およびその装置
US7701564B2 (en) 2005-05-18 2010-04-20 Hitachi Global Storage Technologies Netherlands B.V. System and method for angular measurement
JP4372759B2 (ja) * 2006-02-10 2009-11-25 株式会社ミツトヨ 形状測定装置、形状測定方法及び形状測定プログラム
GB0615956D0 (en) * 2006-08-11 2006-09-20 Univ Heriot Watt Optical imaging of physical objects
JP4924042B2 (ja) * 2007-01-11 2012-04-25 オムロン株式会社 三次元形状計測装置及びその校正方法、プログラム、並びにコンピュータ読み取り可能な記録媒体
JP4802134B2 (ja) * 2007-03-29 2011-10-26 富士フイルム株式会社 姿勢変化測定方法および装置
JP5485889B2 (ja) * 2007-08-17 2014-05-07 レニショウ パブリック リミテッド カンパニー 位相解析測定を行う装置および方法
JP4922905B2 (ja) * 2007-12-05 2012-04-25 富士フイルム株式会社 回転中心線の位置変動測定方法および装置
DE102009017694B3 (de) * 2009-04-15 2010-12-02 Göpel electronic GmbH Anordnung einer rotatorischen Bildaufnahmeeinheit für die Abbildung von Objekten auf Leiterplatten unter einem polaren Betrachtungswinkel von 45°
GB0915904D0 (en) 2009-09-11 2009-10-14 Renishaw Plc Non-contact object inspection
JP5273091B2 (ja) * 2010-05-14 2013-08-28 パルステック工業株式会社 ３次元形状測定装置及び３次元形状測定方法
DE102010050445B4 (de) * 2010-11-04 2014-02-20 Göpel electronic GmbH Anordnung und Verfahren zur Korrektur von Messpositionen von zur Inspektion elektronischer Flachbaugruppen aufgenommener Messbilder
US20130208278A1 (en) * 2012-02-14 2013-08-15 Sahag DARDARIAN Alignment apparatus and method
DE102012220048B4 (de) * 2012-11-02 2018-09-20 Sirona Dental Systems Gmbh Kalibrierungsvorrichtung und Verfahren zur Kalibrierung einer dentalen Kamera
TWI485361B (zh) * 2013-09-11 2015-05-21 Univ Nat Taiwan 三維形貌輪廓量測裝置及其方法
US10145670B2 (en) * 2016-01-12 2018-12-04 The Boeing Company Systems and methods for projected grid-based location tracking
CN106289071B (zh) * 2016-08-18 2018-10-19 温州大学 一种结构三维位移单目摄像测量方法
IT201700032323U1 (it) * 2017-03-23 2018-09-23 V Ger S R L Apparato per scannerizzare un rispettivo oggetto tridimensionale.
CN108225218A (zh) * 2018-02-07 2018-06-29 苏州镭图光电科技有限公司 基于光学微机电***的三维扫描成像方法及成像装置
FR3082934B1 (fr) * 2018-06-26 2021-10-08 Safran Nacelles Dispositif et procede de projection laser pour fabrication de pieces en materiau composite par drapage
JP2022190856A (ja) * 2021-06-15 2022-12-27 株式会社ディスコ 測定治具、動作精度測定システム、及び動作精度測定方法
CN113432551A (zh) * 2021-06-25 2021-09-24 哈尔滨工业大学 基于多轴精密运动机构的微小零件三维形貌测量方法
CN114236585B (zh) * 2021-12-09 2023-04-14 国网思极位置服务有限公司 基于北斗导航卫星***的目标运动监测方法及存储介质

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US4286852A (en) * 1979-05-23 1981-09-01 Solid Photography, Inc. Recording images of a three-dimensional surface by focusing on a plane of light irradiating the surface
JPS60200111A (ja) * 1984-03-26 1985-10-09 Hitachi Ltd ３次元物体認識装置
US4682894A (en) * 1985-03-21 1987-07-28 Robotic Vision Systems, Inc. Calibration of three-dimensional space
US5085502A (en) * 1987-04-30 1992-02-04 Eastman Kodak Company Method and apparatus for digital morie profilometry calibrated for accurate conversion of phase information into distance measurements in a plurality of directions
US4925308A (en) * 1988-08-09 1990-05-15 Robotic Vision System, Inc. Calibration of three-dimensional space
US5260770A (en) * 1991-05-01 1993-11-09 Honda Giken Kogyo Kabushiki Kaisha System for detecting the position of observation spot
DE4416108C2 (de) * 1994-05-06 2000-05-11 Fraunhofer Ges Forschung Vorrichtung zum berührungsfreien Vermessen einer Objektoberfläche
US5557410A (en) * 1994-05-26 1996-09-17 Lockheed Missiles & Space Company, Inc. Method of calibrating a three-dimensional optical measurement system
US5838428A (en) * 1997-02-28 1998-11-17 United States Of America As Represented By The Secretary Of The Navy System and method for high resolution range imaging with split light source and pattern mask

Also Published As

Publication number Publication date
ATE214157T1 (de) 2002-03-15
DE19618140A1 (de) 1997-11-13
DK0897524T3 (da) 2002-06-24
EP0897524A1 (de) 1999-02-24
ES2174258T3 (es) 2002-11-01
JP2000509505A (ja) 2000-07-25
WO1997042464A1 (de) 1997-11-13
DE59706560D1 (de) 2002-04-11
EP0897524B1 (de) 2002-03-06
US6055056A (en) 2000-04-25

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