PT897524E - Dispositivo para medicao sem contacto de uma superficie tridimensional - Google Patents
Dispositivo para medicao sem contacto de uma superficie tridimensionalInfo
- Publication number
- PT897524E PT897524E PT97923781T PT97923781T PT897524E PT 897524 E PT897524 E PT 897524E PT 97923781 T PT97923781 T PT 97923781T PT 97923781 T PT97923781 T PT 97923781T PT 897524 E PT897524 E PT 897524E
- Authority
- PT
- Portugal
- Prior art keywords
- pct
- axis
- rotation
- strip structure
- sec
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2504—Calibration devices
Landscapes
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Media Introduction/Drainage Providing Device (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19618140A DE19618140A1 (de) | 1996-05-06 | 1996-05-06 | 3D-Meßanordnung zur Ganzkörpererfassung und Einmessung einer entsprechenden Meßanordnung |
Publications (1)
Publication Number | Publication Date |
---|---|
PT897524E true PT897524E (pt) | 2002-08-30 |
Family
ID=7793477
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PT97923781T PT897524E (pt) | 1996-05-06 | 1997-04-30 | Dispositivo para medicao sem contacto de uma superficie tridimensional |
Country Status (9)
Country | Link |
---|---|
US (1) | US6055056A (pt) |
EP (1) | EP0897524B1 (pt) |
JP (1) | JP2000509505A (pt) |
AT (1) | ATE214157T1 (pt) |
DE (2) | DE19618140A1 (pt) |
DK (1) | DK0897524T3 (pt) |
ES (1) | ES2174258T3 (pt) |
PT (1) | PT897524E (pt) |
WO (1) | WO1997042464A1 (pt) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19642293C2 (de) * | 1996-10-14 | 1998-07-16 | Zeiss Carl Jena Gmbh | Koordinatenmeßgerät |
DE59914224D1 (de) * | 1998-09-14 | 2007-04-12 | Betr Forsch Inst Angew Forsch | Verfahren zum Messen der Geometrie und Planheit von bewegtem Metallband |
FR2796458B1 (fr) * | 1999-07-12 | 2001-09-21 | Cogema | Procede et installation de mesure de relief sur une face d'une piece axisymetrique |
DE10001429A1 (de) * | 2000-01-15 | 2001-07-19 | Volkswagen Ag | Vorrichtung zur Kalibrierung optischer Meßsysteme und Verfahren zur Herstellung der Vorrichtung |
US6504605B1 (en) | 2000-10-24 | 2003-01-07 | The Regents Of The University Of California | Method and apparatus for determining the coordinates of an object |
US6369879B1 (en) | 2000-10-24 | 2002-04-09 | The Regents Of The University Of California | Method and apparatus for determining the coordinates of an object |
JP5103697B2 (ja) * | 2001-04-19 | 2012-12-19 | 株式会社島津製作所 | 3次元光学カメラ |
CN1437000A (zh) * | 2002-02-09 | 2003-08-20 | 沈阳同联集团高新技术有限公司 | 投影栅线测量物体三维表面形状的方法和装置 |
DE10219054B4 (de) * | 2002-04-24 | 2004-08-26 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren und Vorrichtung zur Bestimmung der räumlichen Koordinaten eines Gegenstandes |
ATE494561T1 (de) * | 2002-11-15 | 2011-01-15 | Leica Geosystems Ag | Verfahren und vorrichtung zur kalibrierung eines messsystems |
US20050068523A1 (en) * | 2003-08-11 | 2005-03-31 | Multi-Dimension Technology, Llc | Calibration block and method for 3D scanner |
US7342668B2 (en) * | 2003-09-17 | 2008-03-11 | D4D Technologies, Llc | High speed multiple line three-dimensional digitalization |
DE102005006069A1 (de) * | 2005-02-10 | 2006-08-24 | Hubert Kammer | Verfahren und Vorrichtung zum dreidimensionalen Scannen von Objekten |
JP4786923B2 (ja) * | 2005-03-31 | 2011-10-05 | 富士フイルム株式会社 | 縞計測装置の変換係数較正方法および装置ならびに該変換係数較正装置を備えた縞計測装置 |
JP4230525B2 (ja) * | 2005-05-12 | 2009-02-25 | 有限会社テクノドリーム二十一 | 3次元形状計測方法およびその装置 |
US7701564B2 (en) | 2005-05-18 | 2010-04-20 | Hitachi Global Storage Technologies Netherlands B.V. | System and method for angular measurement |
JP4372759B2 (ja) * | 2006-02-10 | 2009-11-25 | 株式会社ミツトヨ | 形状測定装置、形状測定方法及び形状測定プログラム |
GB0615956D0 (en) * | 2006-08-11 | 2006-09-20 | Univ Heriot Watt | Optical imaging of physical objects |
JP4924042B2 (ja) * | 2007-01-11 | 2012-04-25 | オムロン株式会社 | 三次元形状計測装置及びその校正方法、プログラム、並びにコンピュータ読み取り可能な記録媒体 |
JP4802134B2 (ja) * | 2007-03-29 | 2011-10-26 | 富士フイルム株式会社 | 姿勢変化測定方法および装置 |
JP5485889B2 (ja) * | 2007-08-17 | 2014-05-07 | レニショウ パブリック リミテッド カンパニー | 位相解析測定を行う装置および方法 |
JP4922905B2 (ja) * | 2007-12-05 | 2012-04-25 | 富士フイルム株式会社 | 回転中心線の位置変動測定方法および装置 |
DE102009017694B3 (de) * | 2009-04-15 | 2010-12-02 | Göpel electronic GmbH | Anordnung einer rotatorischen Bildaufnahmeeinheit für die Abbildung von Objekten auf Leiterplatten unter einem polaren Betrachtungswinkel von 45° |
GB0915904D0 (en) | 2009-09-11 | 2009-10-14 | Renishaw Plc | Non-contact object inspection |
JP5273091B2 (ja) * | 2010-05-14 | 2013-08-28 | パルステック工業株式会社 | 3次元形状測定装置及び3次元形状測定方法 |
DE102010050445B4 (de) * | 2010-11-04 | 2014-02-20 | Göpel electronic GmbH | Anordnung und Verfahren zur Korrektur von Messpositionen von zur Inspektion elektronischer Flachbaugruppen aufgenommener Messbilder |
US20130208278A1 (en) * | 2012-02-14 | 2013-08-15 | Sahag DARDARIAN | Alignment apparatus and method |
DE102012220048B4 (de) * | 2012-11-02 | 2018-09-20 | Sirona Dental Systems Gmbh | Kalibrierungsvorrichtung und Verfahren zur Kalibrierung einer dentalen Kamera |
TWI485361B (zh) * | 2013-09-11 | 2015-05-21 | Univ Nat Taiwan | 三維形貌輪廓量測裝置及其方法 |
US10145670B2 (en) * | 2016-01-12 | 2018-12-04 | The Boeing Company | Systems and methods for projected grid-based location tracking |
CN106289071B (zh) * | 2016-08-18 | 2018-10-19 | 温州大学 | 一种结构三维位移单目摄像测量方法 |
IT201700032323U1 (it) * | 2017-03-23 | 2018-09-23 | V Ger S R L | Apparato per scannerizzare un rispettivo oggetto tridimensionale. |
CN108225218A (zh) * | 2018-02-07 | 2018-06-29 | 苏州镭图光电科技有限公司 | 基于光学微机电***的三维扫描成像方法及成像装置 |
FR3082934B1 (fr) * | 2018-06-26 | 2021-10-08 | Safran Nacelles | Dispositif et procede de projection laser pour fabrication de pieces en materiau composite par drapage |
JP2022190856A (ja) * | 2021-06-15 | 2022-12-27 | 株式会社ディスコ | 測定治具、動作精度測定システム、及び動作精度測定方法 |
CN113432551A (zh) * | 2021-06-25 | 2021-09-24 | 哈尔滨工业大学 | 基于多轴精密运动机构的微小零件三维形貌测量方法 |
CN114236585B (zh) * | 2021-12-09 | 2023-04-14 | 国网思极位置服务有限公司 | 基于北斗导航卫星***的目标运动监测方法及存储介质 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4286852A (en) * | 1979-05-23 | 1981-09-01 | Solid Photography, Inc. | Recording images of a three-dimensional surface by focusing on a plane of light irradiating the surface |
JPS60200111A (ja) * | 1984-03-26 | 1985-10-09 | Hitachi Ltd | 3次元物体認識装置 |
US4682894A (en) * | 1985-03-21 | 1987-07-28 | Robotic Vision Systems, Inc. | Calibration of three-dimensional space |
US5085502A (en) * | 1987-04-30 | 1992-02-04 | Eastman Kodak Company | Method and apparatus for digital morie profilometry calibrated for accurate conversion of phase information into distance measurements in a plurality of directions |
US4925308A (en) * | 1988-08-09 | 1990-05-15 | Robotic Vision System, Inc. | Calibration of three-dimensional space |
US5260770A (en) * | 1991-05-01 | 1993-11-09 | Honda Giken Kogyo Kabushiki Kaisha | System for detecting the position of observation spot |
DE4416108C2 (de) * | 1994-05-06 | 2000-05-11 | Fraunhofer Ges Forschung | Vorrichtung zum berührungsfreien Vermessen einer Objektoberfläche |
US5557410A (en) * | 1994-05-26 | 1996-09-17 | Lockheed Missiles & Space Company, Inc. | Method of calibrating a three-dimensional optical measurement system |
US5838428A (en) * | 1997-02-28 | 1998-11-17 | United States Of America As Represented By The Secretary Of The Navy | System and method for high resolution range imaging with split light source and pattern mask |
-
1996
- 1996-05-06 DE DE19618140A patent/DE19618140A1/de not_active Withdrawn
-
1997
- 1997-04-30 JP JP9539429A patent/JP2000509505A/ja active Pending
- 1997-04-30 DE DE59706560T patent/DE59706560D1/de not_active Expired - Lifetime
- 1997-04-30 AT AT97923781T patent/ATE214157T1/de active
- 1997-04-30 ES ES97923781T patent/ES2174258T3/es not_active Expired - Lifetime
- 1997-04-30 DK DK97923781T patent/DK0897524T3/da active
- 1997-04-30 US US09/180,344 patent/US6055056A/en not_active Expired - Lifetime
- 1997-04-30 PT PT97923781T patent/PT897524E/pt unknown
- 1997-04-30 WO PCT/DE1997/000896 patent/WO1997042464A1/de active IP Right Grant
- 1997-04-30 EP EP97923781A patent/EP0897524B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
ATE214157T1 (de) | 2002-03-15 |
DE19618140A1 (de) | 1997-11-13 |
DK0897524T3 (da) | 2002-06-24 |
EP0897524A1 (de) | 1999-02-24 |
ES2174258T3 (es) | 2002-11-01 |
JP2000509505A (ja) | 2000-07-25 |
WO1997042464A1 (de) | 1997-11-13 |
DE59706560D1 (de) | 2002-04-11 |
EP0897524B1 (de) | 2002-03-06 |
US6055056A (en) | 2000-04-25 |
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