JPS63243259A - Production of very thin ceramic film - Google Patents

Production of very thin ceramic film

Info

Publication number
JPS63243259A
JPS63243259A JP7903687A JP7903687A JPS63243259A JP S63243259 A JPS63243259 A JP S63243259A JP 7903687 A JP7903687 A JP 7903687A JP 7903687 A JP7903687 A JP 7903687A JP S63243259 A JPS63243259 A JP S63243259A
Authority
JP
Japan
Prior art keywords
substrate
ceramic film
thin ceramic
ultra
thin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7903687A
Other languages
Japanese (ja)
Inventor
Hiroshi Yanagihara
浩 柳原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tanaka Kikinzoku Kogyo KK
Original Assignee
Tanaka Kikinzoku Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tanaka Kikinzoku Kogyo KK filed Critical Tanaka Kikinzoku Kogyo KK
Priority to JP7903687A priority Critical patent/JPS63243259A/en
Publication of JPS63243259A publication Critical patent/JPS63243259A/en
Pending legal-status Critical Current

Links

Landscapes

  • Physical Vapour Deposition (AREA)

Abstract

PURPOSE:To obtain a lightweight, very thin ceramic film having high rigidity and suitable for use as the diaphragm of a speaker by setting a metal mask on an etchable metal substrate, forming a very thin ceramic film on the substrate and etching the substrate. CONSTITUTION:A metal mask 4 having a required pattern is set on an etchable metal substrate 3' and a very thin ceramic film 7' having 0.1-50mum thickness is formed on the substrate 3' by vapor deposition, sputtering, ion plating, chemical vapor growth or other method. The substrate 3' is then etched to obtain the very thin ceramic film 7'.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、主として中高音用スピーカーの振動板として
用いるセラミックス極薄膜の製造方法に関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method of manufacturing an ultra-thin ceramic film mainly used as a diaphragm for a speaker for medium and high frequencies.

(従来の技術) 従来、中高音用スピーカーの振動板には、A2Ti等の
金属薄膜が使われていた。
(Prior Art) Conventionally, a metal thin film such as A2Ti has been used for the diaphragm of a speaker for medium and high frequencies.

(発明が解決しようとする問題点) ところが、近時軽量で剛性の高い材料から成る振動板が
要求されているが、これまで使われているAl、Ti等
の金属薄膜は圧延により製造される為、軽量化には限界
がある。この為、A 1203、TiN等のセラミック
スが考えられるが、セラミックスは従来の研摩技術では
数100μmオーダーまでの研摩が限界であり、数10
μmオーダーの研摩は不可能であり、また任意の形状に
加工することは困難であった。
(Problem to be solved by the invention) However, in recent years, there has been a demand for diaphragms made of lightweight and highly rigid materials, but the metal thin films of Al, Ti, etc. that have been used so far are manufactured by rolling. Therefore, there is a limit to weight reduction. For this reason, ceramics such as A1203 and TiN can be considered, but conventional polishing techniques can only polish ceramics to a depth of several 100 μm.
Polishing on the μm order was impossible, and it was difficult to process into any desired shape.

(発明の目的) 本発明は、上記諸事情に鑑みなされたもので、数10μ
mオーダーのセラミックス極薄膜を得ることのできる製
造方法を提供することを目的とするものである。
(Object of the invention) The present invention was made in view of the above-mentioned circumstances.
The object of the present invention is to provide a manufacturing method capable of obtaining an ultra-thin ceramic film of m order.

(問題点を解決するための手段) 上記問題点を解決するための本発明のセラミックス極薄
膜の製造方法は、エツチング可能な金属基板にメタルマ
スクをセットして所要のパターンを得、次に蒸着、スパ
ッタリング、イオンプレーティング、CVD (化学気
相成長)等により金属基板上にセラミックスの0.1〜
50μmの極薄膜を形成し、然る後エツチングにより金
属基板を除去し、単独のセラミックス極薄膜を得ること
を特徴とするものである。
(Means for Solving the Problems) In order to solve the above problems, the method for manufacturing ultra-thin ceramic films of the present invention involves setting a metal mask on an etched metal substrate to obtain a desired pattern, and then depositing Ceramics of 0.1 to
The method is characterized in that an extremely thin film of 50 μm is formed, and then the metal substrate is removed by etching to obtain a single extremely thin ceramic film.

(作用) 上記のように本発明のセラミックス極薄膜の製造方法は
従来のメタルマスクをセットし、真空中における薄膜作
成法を利用して、セラミックスの極薄膜を作成するので
あるから、軽量で剛性の高いセラミックス極薄膜を容易
に得ることができる。
(Function) As mentioned above, the method for producing an ultra-thin ceramic film of the present invention involves setting a conventional metal mask and using a thin film production method in vacuum to create an ultra-thin ceramic film, which is lightweight and rigid. It is possible to easily obtain ultra-thin ceramic films with high

(実施例) 本発明のセラミックス極薄膜の製造方法の第1実施例を
第1図及び第2図によって説明する。第1図に示す如(
スパッタリング装置1内のテーブル2に、酸、アルカリ
でエツチング可能なAj2、Cu、SUS等の金属、本
例ではC’uより成る縦6(1+m、横60鰭、厚さ0
.05mmより成る基板3をセットし、このCu基板3
上に縦80龍、横80酊の外側形状、直径30龍の内側
形状で厚さ0.1mmの5US314より成る枠状のメ
タルマスク4をセントして所要のパターンを得た。次に
Cu基板3に対向してテーブル5にターゲットとして直
径152.4mm、厚さ5 mmの、l!203板6を
セントし、Cu基板3とAl2O3板6との間隔を90
龍となした後、スパッタリング装置1内を5 xto−
”r o r rまで真空線引きした後1.0×l0−
3T o r rのArガス雰囲気になし、Al2O3
をRF3に−で10時間スパッターして、メタルマスク
4内のCu5板3上のパターンにAl2O3をコーティ
ングして20μmの極薄膜7を形成した。冷却後、スパ
ッタリング装置1内よりCu基板3を取り出し、Cu基
板3上のメタルマスク4を外し、第2図に示す如<Cu
基板3を槽8内のエツチング液9、本例では21に30
分間浸漬し、Cu基板3を溶解除去し、直径30龍、厚
さ20μmの円形の単独のAl2O3極薄膜7を得た。
(Example) A first example of the method for manufacturing an ultra-thin ceramic film of the present invention will be described with reference to FIGS. 1 and 2. As shown in Figure 1 (
On the table 2 in the sputtering apparatus 1, there are 6 vertical (1 + m, 60 fins, 0 thickness) made of metal such as Aj2, Cu, SUS, etc., which can be etched with acid or alkali, in this example C'u.
.. Set the substrate 3 made of 0.05 mm, and
A frame-shaped metal mask 4 made of 5US314 with a thickness of 0.1 mm and an outer shape of 80 mm in length and 80 mm in width and an inner shape of 30 mm in diameter was placed on top to obtain the desired pattern. Next, a target with a diameter of 152.4 mm and a thickness of 5 mm was placed on the table 5 facing the Cu substrate 3. 203 plate 6, and set the distance between Cu substrate 3 and Al2O3 plate 6 to 90 mm.
After forming a dragon, the inside of the sputtering device 1 was heated to 5xto-
” After vacuum drawing to r o r r 1.0×l0-
Al2O3 without Ar gas atmosphere of 3T o r r
was sputtered with RF3 for 10 hours to coat the pattern on the Cu5 plate 3 in the metal mask 4 with Al2O3 to form an ultra-thin film 7 of 20 μm. After cooling, the Cu substrate 3 is taken out from inside the sputtering apparatus 1, the metal mask 4 on the Cu substrate 3 is removed, and the
The substrate 3 is placed in an etching solution 9 in a bath 8, in this example 21 to 30.
After dipping for a minute, the Cu substrate 3 was dissolved and removed to obtain a single circular Al2O3 ultrathin film 7 with a diameter of 30 mm and a thickness of 20 μm.

次に第2実施例を第3図及び第4図によって説明する。Next, a second embodiment will be explained with reference to FIGS. 3 and 4.

第3図に示す如くスパッタリング装置1内のテーブル2
に、鏡面加工したコーン状の5US314より成る基板
3′をセットし、この基板3′上に外径601Im、内
径20龍、厚さ0.1m(7) S U 5314より
成る環状のメタルマスク4′をセットして所要のパター
ンを得た。次に基板3′に対向してテーブル5にターゲ
ットとして直径152.4+nのTiN板6′をセント
し、基板3′とTiN板6′との間隔を90鶴となした
後、スパッタリング装置1内を5 xto−”r o 
r rまで真空線引きした後1.0×10−’T o 
r rのArガス雰囲気になし、TiNを500Vで1
0時間スパンターして、メタルマスク4′内の基板3′
上のパターンにTiNをコーティングして30μmの極
薄膜7′を形成した。冷却後スパッタリング装置1内よ
り基板3′を取出し、基板3′上のメタルマスク4′を
外し、第4図に示す如く基板3′を槽8内のエツチング
液9、本例では21に1時間浸漬し、基板3′溶解除去
し、直径20關、高さ20鶴の、厚さ30μmのコーン
形の単独TiN極薄膜7′を得た。
Table 2 in sputtering apparatus 1 as shown in FIG.
A substrate 3' made of mirror-finished cone-shaped 5US314 was set on the substrate 3', and an annular metal mask 4 made of S U 5314 with an outer diameter of 601 mm, an inner diameter of 20 mm, and a thickness of 0.1 m (7) was placed on the substrate 3'. ′ was set to obtain the desired pattern. Next, a TiN plate 6' with a diameter of 152.4+n is placed as a target on the table 5 facing the substrate 3', and after setting the distance between the substrate 3' and the TiN plate 6' to be 90 mm, the sputtering device 1 is placed. 5xto-”r o
After vacuum drawing to r r 1.0×10-'T o
TiN was heated at 500 V at 1 in an Ar gas atmosphere of r r.
Spunter for 0 hours and remove the substrate 3' inside the metal mask 4'.
The upper pattern was coated with TiN to form an extremely thin film 7' having a thickness of 30 μm. After cooling, the substrate 3' is taken out from inside the sputtering apparatus 1, the metal mask 4' on the substrate 3' is removed, and the substrate 3' is soaked in the etching solution 9 in the bath 8, in this example, for 1 hour at 21, as shown in FIG. The substrate 3' was immersed, and the substrate 3' was dissolved and removed to obtain a cone-shaped single TiN ultra-thin film 7' with a diameter of 20 mm, a height of 20 mm, and a thickness of 30 μm.

こうして得られた第1実施例のAl2O3極薄膜7及び
第2実施例のT i N極薄膜7′は共に軽量で剛性の
高いので中高音用スピーカーの振動板として好適なであ
る。
Both the Al2O3 ultra-thin film 7 of the first embodiment and the T i N ultra-thin film 7' of the second embodiment thus obtained are lightweight and have high rigidity, and are therefore suitable as a diaphragm for a speaker for medium and high frequencies.

(発明の効果) 以上の説明で判るように本発明のセラミックス極薄膜の
製造方法によれば、従来不可能だった0、1〜50μm
の膜厚で、所要形状のセラミ・7クスより成る軽量で剛
性の高い中高音用スピーカーの振動板として好適な極薄
膜を容易に得ることができるという効果がある。
(Effects of the Invention) As can be seen from the above explanation, according to the method for producing an ultra-thin ceramic film of the present invention, the thickness of 0.1 to 50 μm, which was previously impossible,
The present invention has the effect that it is possible to easily obtain an ultra-thin film suitable as a diaphragm for a lightweight, highly rigid mid-to-high frequency speaker made of ceramic 7x having a desired shape.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及び第2図は本発明のセラミックス極薄膜の製造
方法の第1実施例の工程を示す図、第3図及び第4図は
本発明のセラミックス極薄膜の製造方法の第2実施例の
工程を示す図である。 出願人  田中貴金属工業株式会社 第2図 第4図 7′・・・ 7iN極尋゛狭
1 and 2 are diagrams showing the steps of a first embodiment of the method for producing an ultra-thin ceramic film of the present invention, and FIGS. 3 and 4 are diagrams showing a second embodiment of the method for producing an ultra-thin ceramic film of the present invention. FIG. Applicant Tanaka Kikinzoku Kogyo Co., Ltd. Figure 2 Figure 4 7'... 7iN extremely narrow

Claims (1)

【特許請求の範囲】[Claims] エッチング可能な金属基板にメタルマスクをセットして
所要のパターンを得、次に蒸着、スパッタリング、イオ
ンプレーティング、CVD(化学気相成長)等により金
属基板上にセラミックスの0.1〜50μmの極薄膜を
形成し、然る後エッチングにより金属基板を除去し単独
のセラミックス極薄膜を得ることを特徴とするセラミッ
クス極薄膜の製造方法。
A metal mask is set on an etchable metal substrate to obtain the desired pattern, and then 0.1 to 50 μm ceramic electrodes are placed on the metal substrate by vapor deposition, sputtering, ion plating, CVD (chemical vapor deposition), etc. 1. A method for producing an ultra-thin ceramic film, which comprises forming a thin film and then removing a metal substrate by etching to obtain a single ultra-thin ceramic film.
JP7903687A 1987-03-31 1987-03-31 Production of very thin ceramic film Pending JPS63243259A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7903687A JPS63243259A (en) 1987-03-31 1987-03-31 Production of very thin ceramic film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7903687A JPS63243259A (en) 1987-03-31 1987-03-31 Production of very thin ceramic film

Publications (1)

Publication Number Publication Date
JPS63243259A true JPS63243259A (en) 1988-10-11

Family

ID=13678691

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7903687A Pending JPS63243259A (en) 1987-03-31 1987-03-31 Production of very thin ceramic film

Country Status (1)

Country Link
JP (1) JPS63243259A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015151579A (en) * 2014-02-14 2015-08-24 大日本印刷株式会社 Method for manufacturing vapor deposition mask device, vapor deposition mask with substrate, and laminate
JP2019151936A (en) * 2019-06-11 2019-09-12 大日本印刷株式会社 Method for manufacturing vapor deposition mask device, vapor deposition mask having substrate, and laminate

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015151579A (en) * 2014-02-14 2015-08-24 大日本印刷株式会社 Method for manufacturing vapor deposition mask device, vapor deposition mask with substrate, and laminate
JP2019151936A (en) * 2019-06-11 2019-09-12 大日本印刷株式会社 Method for manufacturing vapor deposition mask device, vapor deposition mask having substrate, and laminate

Similar Documents

Publication Publication Date Title
US5241417A (en) Multi-layered optical filter film and production method thereof
GB1208962A (en) Method of fabricating thin films and membranes
US3945902A (en) Metallized device and method of fabrication
GB1509077A (en) Metallic iris diaphragms for corpuscular beam apparatus and to methods of manufacture of such diaphragms
JPS63243259A (en) Production of very thin ceramic film
US4913789A (en) Sputter etching and coating process
US3895671A (en) Method of manufacturing a thin sheet of beryllium or an alloy thereof
JPS6139344A (en) Shadow mask
JPS6146408B2 (en)
CN110534429B (en) Superconducting film and preparation method thereof
JPS63243258A (en) Production of very thin film
JPS59143498A (en) Diaphragm for speaker and its production
JPS6236089A (en) Manufacture of ceramic product
JPH0795506B2 (en) Method for manufacturing mask for X-ray exposure
JP2002055461A (en) Method for producing metallic mask
RU2054747C1 (en) Process of relief fabrication in dielectric substrate
JPS62109970A (en) Method for removing deposit in vacuum deposition vessel
JPS62245900A (en) Diaphragm for electroacoustic transducer
JPH01154308A (en) Production of insulating material for gap of magnetic head
JPS60186194A (en) Manufacture of diaphragm for electroacoustic transducer
CN113992175A (en) Simplified preparation method of filter chip
JPH0385100A (en) Diaphragm for speaker and its manufacture
JPS621533B2 (en)
Blosch Industrial Applications of PVD and Electrochemical Processes
KR820000815B1 (en) Multi-layer vacuum evaporation deposition method