JPS61182049U - - Google Patents

Info

Publication number
JPS61182049U
JPS61182049U JP6584585U JP6584585U JPS61182049U JP S61182049 U JPS61182049 U JP S61182049U JP 6584585 U JP6584585 U JP 6584585U JP 6584585 U JP6584585 U JP 6584585U JP S61182049 U JPS61182049 U JP S61182049U
Authority
JP
Japan
Prior art keywords
semiconductor substrate
guard ring
conductivity type
recess
diffusion depth
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6584585U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6584585U priority Critical patent/JPS61182049U/ja
Publication of JPS61182049U publication Critical patent/JPS61182049U/ja
Pending legal-status Critical Current

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  • Electrodes Of Semiconductors (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例によるシヨツトキー
バリアーダイオードの断面図、第2図は従来の技
術によるシヨツトキーバリアーダイオードの断面
図である。 1……高濃度N型シリコン基板、2……低濃度
N型エピタキシアル層、3……P型ガードリング
層、4……シリコン酸化膜、5……シヨツトキー
電極、6……凹部、12……裏面電極。
FIG. 1 is a sectional view of a shot key barrier diode according to an embodiment of the present invention, and FIG. 2 is a sectional view of a shot key barrier diode according to the prior art. DESCRIPTION OF SYMBOLS 1...High concentration N type silicon substrate, 2...Low concentration N type epitaxial layer, 3...P type guard ring layer, 4...Silicon oxide film, 5...Shot key electrode, 6...Recessed portion, 12... ...Back electrode.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 一導電型の半導体基板と、該半導体基板の一表
面に形成された他の導電型のガードリングと、該
ガードリングで囲まれた前記半導体基板表面に前
記ガ―ドリングの拡散深さを越えない範囲で形成
された凹部と、該凹部内の前記半導体基板表面に
形成されたシヨツトキー電極とを有する事を特徴
とするシヨツトキーバリアーダイオード。
A semiconductor substrate of one conductivity type, a guard ring of another conductivity type formed on one surface of the semiconductor substrate, and a diffusion depth of the semiconductor substrate surrounded by the guard ring that does not exceed the diffusion depth of the guard ring. 1. A Schottky barrier diode comprising: a recess formed in an area; and a Schottky electrode formed on the surface of the semiconductor substrate within the recess.
JP6584585U 1985-05-02 1985-05-02 Pending JPS61182049U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6584585U JPS61182049U (en) 1985-05-02 1985-05-02

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6584585U JPS61182049U (en) 1985-05-02 1985-05-02

Publications (1)

Publication Number Publication Date
JPS61182049U true JPS61182049U (en) 1986-11-13

Family

ID=30598198

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6584585U Pending JPS61182049U (en) 1985-05-02 1985-05-02

Country Status (1)

Country Link
JP (1) JPS61182049U (en)

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