JPH1049239A - System and method for correcting temperature control unit - Google Patents
System and method for correcting temperature control unitInfo
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- JPH1049239A JPH1049239A JP20198796A JP20198796A JPH1049239A JP H1049239 A JPH1049239 A JP H1049239A JP 20198796 A JP20198796 A JP 20198796A JP 20198796 A JP20198796 A JP 20198796A JP H1049239 A JPH1049239 A JP H1049239A
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- temperature
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- target point
- controllers
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Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は温度制御装置の校正
システムに関し、特に制御対象物の目標点を目標温度に
保持するために温度制御装置の設定温度を校正する温度
制御装置の校正システムと校正方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a temperature control device calibration system, and more particularly to a temperature control device calibration system and a calibration device for calibrating a set temperature of a temperature control device in order to maintain a target point of an object to be controlled at a target temperature. About the method.
【０００２】[0002]
【従来の技術】従来用いられている温度制御装置の代表
的なものとしては、例えば特開平７−２８５１５７号公
報で開示されているような、公知の技術であるＰＩＤ制
御による温度制御装置がある。2. Description of the Related Art A typical example of a conventional temperature control device is a temperature control device using PID control, which is a known technique, as disclosed in, for example, Japanese Patent Application Laid-Open No. 7-285157. .
【０００３】図４は従来例の代表的な温度制御装置のブ
ロック構成図であり、図中符号４０は制御対象物、４２
は温度調節手段、４３は温度センサ、４４は温度計測
部、４５はＰＩＤ制御器、４６は温度調節手段制御部で
ある。FIG. 4 is a block diagram of a typical temperature control device of a conventional example. In FIG.
Is a temperature control means, 43 is a temperature sensor, 44 is a temperature measurement unit, 45 is a PID controller, and 46 is a temperature control means control unit.
【０００４】この温度制御装置は、１点フィードバック
型温度制御装置であり、制御対象物４０に１組が設けら
れており、制御対象物４０に備えられた温度センサ４３
および加熱や冷却の手段である温度調節手段４２と、温
度センサ４３の出力信号から温度情報を取得するための
温度計測部４４と、計測された温度情報および制御対象
物４０の熱伝導モデルから温度調節手段４２の制御量を
求めるためのＰＩＤ制御器４５と、求めた制御量に応じ
て温度調節手段４２の出力を制御するための温度調節手
段制御部４６とから構成されている。This temperature control device is a one-point feedback type temperature control device. One set is provided for the control target 40 and a temperature sensor 43 provided on the control target 40 is provided.
A temperature adjusting unit 42 for heating and cooling, a temperature measuring unit 44 for acquiring temperature information from an output signal of a temperature sensor 43, and a temperature based on the measured temperature information and a heat conduction model of the control object 40. The PID controller 45 includes a PID controller 45 for obtaining a control amount of the adjusting unit 42 and a temperature adjusting unit control unit 46 for controlling an output of the temperature adjusting unit 42 according to the obtained control amount.
【０００５】目標温度を決めるべき箇所（以下、目標点
とする）で温度を直接測定することが動作中困難な金型
などを温度制御する場合、従来は上記の温度制御装置を
用いて目標点に近接して設けた温度センサの温度の設定
値を目標温度と同一にして制御することで近似的な制御
を行なっている。Conventionally, when temperature control is performed on a mold or the like in which it is difficult to directly measure a temperature at a place where a target temperature is to be determined (hereinafter, referred to as a target point), the above-mentioned temperature controller is used to control the target point. Approximate control is performed by controlling the temperature set value of the temperature sensor provided in close proximity to the target temperature to be the same as the target temperature.
【０００６】さらに別の代表例として、多点型温度調節
器があげられる。この温度制御装置は複数個の１点フィ
ードパック型温度調節器から構成され、それぞれの温度
調節器は、１個の温度調節手段、その温度調節手段の温
度を測定する１個の温度センサ、および温度設定値を記
憶するメモリとを持ち、温度センサの示す値とメモリの
値から、最適な温度調節手段の制御量をファジィ論理や
ＰＩＤなど公知の手法を用いて計算し、温度調節手段に
出力する機能を持つ。またそれぞれの温度調節器は独立
して動作し、他の温度調節器の状態の影響は受けない。A further typical example is a multipoint temperature controller. This temperature control device is composed of a plurality of one-point feed-pack type temperature controllers, each of which has one temperature control means, one temperature sensor for measuring the temperature of the temperature control means, and It has a memory for storing the temperature set value, calculates the optimal control amount of the temperature control means from the value indicated by the temperature sensor and the value of the memory using a known method such as fuzzy logic or PID, and outputs the calculated control amount to the temperature control means With the ability to Each temperature controller operates independently, and is not affected by the state of other temperature controllers.
【０００７】[0007]
【発明が解決しようとする課題】上述した前者の温度制
御装置は、温度調節手段の動作パラメータを決定する方
式として解析的手段を用いているために、制御器に適用
する制御方式が制御対象物の形状や材質、対象物に含ま
れる温度調節手段の配置方法、および制御対象物が用い
られる周辺雰囲気の温度や熱伝達条件などに対して強く
依存し、結果として温度調節手段の配置方法および周辺
雰囲気温度や熱伝達条件といった制御対象物の条件の変
化に対応した柔軟な設計が困難であるという問題点があ
った。The above-mentioned temperature control device uses analytical means as a method for determining the operation parameters of the temperature control means. Therefore, the control method applied to the controller is a control object. The shape and material of the object, the method of arranging the temperature adjusting means included in the object, and the temperature and heat transfer conditions of the surrounding atmosphere in which the object to be controlled is used strongly depend on the arrangement of the temperature adjusting means and the surrounding area. There has been a problem that it is difficult to design flexibly in response to changes in the conditions of the controlled object such as the ambient temperature and heat transfer conditions.
【０００８】さらに後者の場合、装置の設計は第１の装
置にくらべて単純なものの、目標点に対して影響を及ぼ
すヒータはただ１つという仮定が制御量決定の前提とな
っているために、上記の仮定を満足するためには温度調
節器の配置間隔を温度調節器と対応する温度センサとの
距離に対して十分大きくとらなければならない。これに
より、温度制御の実現精度、とりわけ目標温度分布の位
置に対する厳密さには限界があり、制御対象物の仕様、
たとえば目標温度から許容される温度の誤差や急激な外
界からの温度変化に対する追従速度の許容下限などに応
じた温度調節手段の最適な配置を実現することが困難で
あるという問題点があった。Further, in the latter case, the design of the apparatus is simpler than that of the first apparatus, but the assumption that only one heater has an effect on the target point is a premise for determining the control amount. In order to satisfy the above assumption, the arrangement intervals of the temperature controllers must be sufficiently large with respect to the distance between the temperature controllers and the corresponding temperature sensors. This limits the accuracy of temperature control, especially the strictness of the position of the target temperature distribution.
For example, there is a problem that it is difficult to realize an optimum arrangement of the temperature control means in accordance with an error in a temperature allowed from a target temperature or an allowable lower limit of a following speed with respect to a rapid temperature change from the outside.
【０００９】本発明の校正システムの目的は、これらの
問題を公知の温度制御装置を改造や改変することなく解
決し、対象物の目標点を目標温度に制御するための、温
度制御装置の校正システムと校正方法を提供することに
ある。An object of the calibration system of the present invention is to solve these problems without modifying or modifying a known temperature control device, and to calibrate the temperature control device to control a target point of an object to a target temperature. It is to provide a system and a calibration method.
【００１０】[0010]
【課題を解決するための手段】本発明の温度制御装置の
校正システムは、１個の温度検出素子と、１個の温度調
節手段と、温度検出素子から検出された温度と設定温度
との差から温度調節手段の制御量を調節する１個の温度
調節器との組み合せを複数有する温度制御装置の、各温
度調節器の設定温度を、制御対象物の制御目標点の温度
が目標温度となるように校正するための校正システムで
あって、校正システムは、制御対象物の１個以上の制御
目標点の温度を直接測定するための１個以上の目標点測
定用温度センサと、目標点測定用温度センサが示す温度
を計測するための目標点温度計測手段と、各目標点の目
標温度と、各温度調節器の設定温度と、設定温度の変化
に対応する各目標点の温度変化の関係データとを記憶す
るための記憶手段と、目標点温度計測手段で計測された
目標点の計測温度と記憶手段に記憶された目標温度とを
比較し、記憶手段に記憶された設定温度と温度変化の関
係データから、各温度調節器に新たに設定すべき設定温
度を算出するＣＰＵと、算出された新たな設定温度を各
温度調節器に指示するための設定温度設定手段とから構
成される。According to the present invention, there is provided a calibration system for a temperature control device, comprising: one temperature detecting element, one temperature adjusting means, and a difference between a temperature detected from the temperature detecting element and a set temperature. In the temperature control device having a plurality of combinations with one temperature controller for adjusting the control amount of the temperature control means, the set temperature of each temperature controller becomes the target temperature at the control target point of the control object. A calibration system comprising: at least one target point measurement temperature sensor for directly measuring the temperature of one or more control target points of a control target; and a target point measurement. Temperature measurement means for measuring the temperature indicated by the temperature sensor for use, the relationship between the target temperature of each target point, the set temperature of each temperature controller, and the temperature change of each target point corresponding to the change of the set temperature Storage means for storing data Comparing the measured temperature of the target point measured by the target point temperature measurement means with the target temperature stored in the storage means, and from the relational data of the set temperature and the temperature change stored in the storage means, to each temperature controller It comprises a CPU for calculating a set temperature to be newly set, and set temperature setting means for instructing each temperature controller of the calculated new set temperature.
【００１１】本発明の温度制御装置の校正方法は、１個
の温度検出素子と、１個の温度調節手段と、温度検出素
子から検出された温度と設定温度との差から温度調節手
段の制御量を調節する１個の温度調節器との組み合せを
複数有する温度制御装置の、各温度調節器の設定温度
を、制御対象物の制御目標点の温度が目標温度となるよ
うに校正するための前述の校正システムを用いた校正方
法であって、各温度調節器の設定温度を通常運用時に用
いている温度の設定にし、目標点に取り付けた目標点測
定用温度センサの温度が安定するまで待機し、温度が安
定したらＣＰＵが各目標点の測定温度と記憶手段に記憶
された目標温度とを比較してその差を計算し、ＣＰＵ
は、目標温度と測定温度との差が所定の値以上と判断し
た場合は、目標温度と測定温度との差を記憶手段が記憶
する各温度調節器の設定温度と、温度調節器のそれぞれ
の設定温度の変化に対応する各目標点の温度変化の関係
データと照合して各温度調節器に新たに設定すべき設定
温度を計算し、その結果得られた新たに設定すべき設定
温度を設定温度設定手段を通じて各温度調節器に設定
し、再度目標点の温度が安定するまで待機し、各目標点
の実測の温度と目標温度との差が所定の値以下になるま
で上記の動作を繰り返し、各目標点の実測の温度と目標
温度との差が所定の値以下であると判断したならば、こ
の時点での設定温度の設定値を温度調節器のメモリに保
管して、校正動作を終了し、温度調節器を運用するとき
は、メモリに保管した校正終了時点での設定温度の設定
値をそれぞれの温度調節器に設定する。[0011] The method for calibrating a temperature control device according to the present invention is characterized in that one temperature detecting element, one temperature adjusting means, and control of the temperature adjusting means based on a difference between a temperature detected from the temperature detecting element and a set temperature. A temperature control device having a plurality of combinations with one temperature controller for adjusting the amount, for calibrating the set temperature of each temperature controller so that the temperature of the control target point of the controlled object becomes the target temperature. In the calibration method using the above-mentioned calibration system, set the temperature of each temperature controller to the temperature used during normal operation, and wait until the temperature of the target point measurement temperature sensor attached to the target point stabilizes. When the temperature is stabilized, the CPU compares the measured temperature at each target point with the target temperature stored in the storage means, and calculates the difference between the measured temperatures.
If it is determined that the difference between the target temperature and the measured temperature is equal to or more than a predetermined value, the storage means stores the difference between the target temperature and the measured temperature, the set temperature of each temperature controller, and the respective temperatures of the temperature controllers. Calculates the set temperature to be newly set for each temperature controller by comparing it with the data on the change in temperature at each target point corresponding to the change in set temperature, and sets the resulting set temperature to be newly set as a result. Set to each temperature controller through the temperature setting means, wait until the temperature at the target point is stabilized again, and repeat the above operation until the difference between the measured temperature of each target point and the target temperature becomes equal to or less than a predetermined value. If it is determined that the difference between the measured temperature of each target point and the target temperature is equal to or less than the predetermined value, the set value of the set temperature at this time is stored in the memory of the temperature controller, and the calibration operation is performed. When the operation is completed and the temperature controller is Setting the set value of the set temperature in the calibration end to a respective temperature controller.
【００１２】本発明の温度制御装置の校正システムと校
正方法では、あらかじめ検証され記憶部に記憶された設
定温度の変化に対応する各目標点の温度変化の関係デー
タを使用して、制御の目標点の目標温度と測定温度の差
から設定すべき温度調節器の設定温度を算出して温度調
節器に記憶させているので、目標点の温度は目標温度で
精密に制御される。According to the calibration system and the calibration method of the temperature control device of the present invention, the control target of the control using the temperature change data of each target point corresponding to the change of the set temperature, which is verified in advance and stored in the storage unit, is used. Since the set temperature of the temperature controller to be set is calculated from the difference between the target temperature of the point and the measured temperature and stored in the temperature controller, the temperature of the target point is precisely controlled at the target temperature.
【００１３】[0013]
【発明の実施の形態】次に、本発明の実施の形態につい
て、図面を参照して詳細に説明する。図１は、本発明の
実施の形態を示す温度制御装置の校正システムのブロッ
ク構成図であり、図中符号１０は制御対象物、１１は温
度制御装置、１２-1〜１２-nは温度調節手段、１３-1〜
１３-nは温度センサ、１４-1〜１４-nは温度調節器、２
０は校正システム、２１はＣＰＵ、２２は目標点温度計
測手段、２３は設定温度設定手段、２４は設定ルール記
憶手段、２５-1〜２５-mは目標点測定用温度センサであ
る。Next, an embodiment of the present invention will be described in detail with reference to the drawings. FIG. 1 is a block diagram of a calibration system for a temperature control device according to an embodiment of the present invention. In the figure, reference numeral 10 denotes a control object, 11 denotes a temperature control device, and 12-1 to 12-n denote temperature adjustments. Means, 13-1 ~
13-n is a temperature sensor, 14-1 to 14-n are temperature controllers, 2
0 is a calibration system, 21 is a CPU, 22 is target point temperature measurement means, 23 is set temperature setting means, 24 is set rule storage means, and 25-1 to 25-m are target point measurement temperature sensors.
【００１４】本発明の校正システムの対象となる温度制
御装置１１は、前述の多点型温度制御装置と同一の構成
である。すなわち、制御対象物１０に取り付けられたｎ
個の加熱や冷却のための温度調節手段１２-1〜１２-n
と、その温度を観測するために温度調節手段１２-1〜１
２-nに近接して設けられた同数の温度センサ１３-1〜１
３-nと、それぞれの温度調節手段１２-1〜１２-nの出力
を制御するためのｎ個の温度調節器１４-1〜１４-nから
構成され、温度調節器１４-1〜１４-nは温度センサ１３
-1〜１３-nごとにあらかじめ設定された設定温度と温度
センサ１３-1〜１３-nの示す温度の値との差に応じて温
度調節手段１２-1〜１２-nの出力の制御量を決定する。The temperature control device 11 which is the object of the calibration system of the present invention has the same configuration as the above-mentioned multipoint temperature control device. That is, n attached to the control target 10
Temperature control means 12-1 to 12-n for heating and cooling
And temperature adjusting means 12-1 to 12-1 for observing the temperature.
The same number of temperature sensors 13-1 to 13-1 provided near 2-n
3-n and n temperature controllers 14-1 to 14-n for controlling the outputs of the respective temperature control means 12-1 to 12-n, and the temperature controllers 14-1 to 14-n. n is the temperature sensor 13
The control amount of the output of the temperature control means 12-1 to 12-n according to the difference between the set temperature preset for each of -1 to 13-n and the temperature value indicated by the temperature sensors 13-1 to 13-n. To determine.
【００１５】本校正システム２０は、上述のような従来
型の温度制御装置１１の温度調節器１４の設定温度を、
制御対象物１０の目標点の温度が目標温度となるように
校正するための校正システムであり、制御対象物１０の
目標点の温度分布を直接測定するためのｍ個の温度セン
サ２５-1〜２５-mと、これらの温度センサ２５-1〜２５
-mが示す温度分布を計測するための目標点温度計測手段
２２と、各温度調節器の設定温度と、設定温度の変化に
対応する各目標点の温度変化の関係データとを記憶する
ための設定ルール記憶手段２４と、校正対象の温度制御
装置１１がもつｎ個の設定温度の設定値を目標点の温度
分布および設定ルール記憶手段２４に記憶されたデータ
をもとに決定するためのＣＰＵ２１と、決定された設定
値を温度制御装置１１に指示するための設定温度設定手
段２３とから構成される。The calibration system 20 calculates the set temperature of the temperature controller 14 of the conventional temperature controller 11 as described above.
This is a calibration system for calibrating the temperature of the target point of the control target 10 to be the target temperature. The m temperature sensors 25-1 to 25 m for directly measuring the temperature distribution of the target point of the control target 10. 25-m and these temperature sensors 25-1 to 25
-m for storing the target point temperature measuring means 22 for measuring the temperature distribution indicated by -m, the set temperature of each temperature controller, and the relation data of the temperature change of each target point corresponding to the change of the set temperature. The setting rule storage means 24 and a CPU 21 for determining the set values of the n set temperatures of the temperature control device 11 to be calibrated based on the temperature distribution of the target point and the data stored in the setting rule storage means 24. And set temperature setting means 23 for instructing the temperature control device 11 of the determined set value.
【００１６】また設定ルール記憶手段２４には、目標点
の温度分布が最適になった場合の各温度調節器１４-1〜
１４-nのあらかじめ実測あるいは計算で推定された設定
値、およびあらかじめ実測により検証された温度調節器
１４-1〜１４-nのそれぞれの設定値が変動したときの各
目標点の温度に与える変化の状態の関係データが記憶さ
れている。The setting rule storage means 24 stores the temperature controllers 14-1 to 14-1 when the temperature distribution at the target point becomes optimal.
The change given to the temperature of each target point when the set values of the temperature controllers 14-1 to 14-n verified by the actual measurement or calculation in advance and the temperature controllers 14-1 to 14-n verified by the actual measurement in advance change Is stored.
【００１７】図２は本発明の実施の形態の温度制御装置
の校正方法の動作のフローチャートであり、Ｓ２１〜Ｓ
２９は動作の各ステップを示す。本発明の動作につい
て、図１のブロック図および図２のフローチャートを用
いて説明する。動作がスタートすると（Ｓ２１）、まず
温度調節器１４-1〜１４-nの設定温度を通常運用時に用
いている設定温度に設定し（Ｓ２２）、目標点に取り付
けた目標点測定用温度センサ２５-1〜２５-mの温度が安
定するまで待機する（Ｓ２３）。温度が安定したらＣＰ
Ｕ２１は各目標点の実測の温度と校正者が指定した目標
温度とを比較し、その差を計算する（Ｓ２４）。目標値
との差が規定値以上と判断したならば、その差を設定ル
ール記憶手段２４の温度調節器１４-1〜１４-nのそれぞ
れの設定値が変動したときの各目標点の温度に与える変
化の状態の関係データと照合して各温度調節器１４-1〜
１４-nの温度設定値の変更すべき値を計算する（Ｓ２
６）。その結果得られた変更後の温度設定値を設定温度
設定手段２３を通じて各々の温度調節器１４-1〜１４-n
にフィードパックする（Ｓ２７）。FIG. 2 is a flowchart of the operation of the method for calibrating the temperature control device according to the embodiment of the present invention.
Reference numeral 29 denotes each step of the operation. The operation of the present invention will be described with reference to the block diagram of FIG. 1 and the flowchart of FIG. When the operation starts (S21), first, the set temperatures of the temperature controllers 14-1 to 14-n are set to the set temperatures used during normal operation (S22), and the target point measuring temperature sensor 25 attached to the target point. It waits until the temperature of -1 to 25-m is stabilized (S23). CP when temperature is stable
U21 compares the measured temperature of each target point with the target temperature designated by the proofreader, and calculates the difference (S24). If it is determined that the difference from the target value is equal to or greater than the specified value, the difference is set to the temperature of each target point when the set value of each of the temperature controllers 14-1 to 14-n of the setting rule storage unit 24 fluctuates. Each temperature controller 14-1 ~
The value to be changed of the 14-n temperature set value is calculated (S2).
6). The changed temperature set values obtained as a result are set to the respective temperature controllers 14-1 to 14-n through the set temperature setting means 23.
(S27).
【００１８】そして再度目標点の温度が安定するまで待
機し（Ｓ２３に戻る）、各目標点の実測の温度と校正者
が指定した目標温度との差が規定値以下になるまで上述
の動作（Ｓ２３、２４、２５、２６、２７）を繰り返
す。各目標点の差が規定値以内にあると判断したならば
（Ｓ２５）、校正は終了したとしてこの時点での設定温
度の設定値を温度調節器１４-1〜１４-nのメモリに保管
して（Ｓ２８）、終了する（２９）。Then, the operation waits until the temperature of the target point is stabilized again (return to S23), and the above-mentioned operation (until the difference between the actually measured temperature of each target point and the target temperature specified by the proofreader becomes equal to or less than the specified value) S23, 24, 25, 26, 27) are repeated. If it is determined that the difference between the respective target points is within the specified value (S25), it is determined that the calibration has been completed, and the set value of the set temperature at this time is stored in the memory of the temperature controllers 14-1 to 14-n. (S28), and ends (29).
【００１９】温度調節器を運用するときは、保管した校
正終了時点での設定温度の設定値をそれぞれの温度調節
器１４-1〜１４-nに設定することで、目標点の温度を最
終的に求めた目標温度で安定させることができる。When operating the temperature controller, the set value of the set temperature at the end of the stored calibration is set in each of the temperature controllers 14-1 to 14-n, so that the temperature at the target point is finally set. Can be stabilized at the target temperature determined.
【００２０】また、目標点に取り付けた目標点測定用温
度センサ２５-1〜２５-mが制御対象物１０の運用時に支
障となるときには取り外してかまわない。The target point measuring temperature sensors 25-1 to 25-m attached to the target points may be removed if they hinder the operation of the controlled object 10.
【００２１】[0021]
【実施例】次に、本発明の実施の形態の一実施例の動作
を詳細に説明する。図３は本発明の制御対象が金型の場
合の実施例のヒータおよびセンサの配置を示す斜視図で
あり、図中符号３２-1〜３２-nはヒータ、３３-1〜３３
-nは温度センサ、３５-1〜３５-nは目標点測定用温度セ
ンサ、３６は金型上部、３７は金型下部、３８-1〜３８
-nはヒータ取り付け穴である。Next, the operation of one embodiment of the present invention will be described in detail. FIG. 3 is a perspective view showing the arrangement of heaters and sensors according to the embodiment when the object to be controlled according to the present invention is a mold.
-n is a temperature sensor, 35-1 to 35-n are target point measuring temperature sensors, 36 is a mold upper part, 37 is a mold lower part, 38-1 to 38-38.
-n is a heater mounting hole.
【００２２】図１における制御対象物１０が射出成形機
用の金型上部３６であり、温度調節手段１３は電熱式ヒ
ータ（以下、ヒータ）３２-1〜３２-nであり、温度セン
サ３３-1〜３３-nとともに図３のように金型の上部から
見てそれぞれ格子状に、かつ高さ５０ｃｍの金型上部３
６の上面から約２０ｃｍの深さの穴３８-1〜３８-nの内
部に配置されており、校正用の目標点測定用温度センサ
３５-1〜３５-nは金型下部３７の接触面上でかつヒータ
３２-1〜３２-nの真下にヒータと同様格子状に同数配置
されている。ただし金型の運用時には、目標点測定用温
度センサ３５-1〜３５-nの取り付け位置では樹脂が流動
するため、これらの校正用の目標点測定用温度センサ３
５-1〜３５-nは取り外される。The object to be controlled 10 in FIG. 1 is a mold upper part 36 for an injection molding machine, the temperature adjusting means 13 is electric heaters (hereinafter referred to as heaters) 32-1 to 32-n, and a temperature sensor 33-. As shown in FIG. 3, the upper part of the mold 3 has a lattice shape and a height of 50 cm together with 1-33-n.
6 are arranged inside holes 38-1 to 38-n having a depth of about 20 cm from the upper surface of the mold 6, and the temperature sensors 35-1 to 35-n for measuring the target points for calibration are in contact with the lower surface 37 of the mold. The same number is arranged in a grid pattern on the upper side and immediately below the heaters 32-1 to 32-n. However, during operation of the mold, the resin flows at the mounting positions of the target point measuring temperature sensors 35-1 to 35-n.
5-1 to 35-n are removed.
【００２３】校正対象の温度制御装置１１が有する温度
調節器１４-1〜１４-nのそれぞれは、１箇所の温度セン
サ３３-1〜３３-nからの入力に対して同じ１箇所のヒー
タ３２-1〜３２-nへの制御電圧を出力する機能を有す
る。また、設定ルール記憶手段２４に記憶される内容と
して、目標点の目標温度ｓ（１）〜ｓ（ｎ）に対応する
ヒータ温度の設定値ｔ（１）〜ｔ（ｎ）の他に、ｙ番目
の温度調節器の設定値が１℃変化したときのｘ番目の目
標点の温度変化Ａ（ｘ，ｙ）がすべて記憶されている。Each of the temperature controllers 14-1 to 14-n of the temperature controller 11 to be calibrated has the same heater 32 in response to an input from one of the temperature sensors 33-1 to 33-n. It has a function of outputting control voltages to -1 to 32-n. The contents stored in the setting rule storage unit 24 include, in addition to the heater temperature set values t (1) to t (n) corresponding to the target temperatures s (1) to s (n) at the target point, y All the temperature changes A (x, y) at the x-th target point when the set value of the temperature controller changes by 1 ° C. are stored.
【００２４】図２のＳ２４で目標点の温度と最適値との
差Δｓ（１）〜Δｓ（ｎ）が得られたら、設定ルール記
憶手段２４に記憶された目標点の温度変化Ａを参照し
（Ｓ２６に対応）、Ａの性質から以下の行列式の方程式
をΔｔ（１）〜Δｔ（ｎ）について解く。When the differences Δs (1) to Δs (n) between the temperature of the target point and the optimum value are obtained in S24 of FIG. 2, the temperature change A of the target point stored in the setting rule storage means 24 is referred to. (Corresponding to S26), the following determinant equation is solved for Δt (1) to Δt (n) from the property of A.
【００２５】 Δｓ＝Ａ＊Δｔ （１−１） Δｔ＝［Δｔ（１），．．．，Δｔ（ｎ）］ （１−２） Δｓ＝［Δｓ（１），．．．，Δｓ（ｎ）］ （１−３） Ａ＝［Ａ（ｘ，ｙ）］、 １≦ｘ≦ｎ， １≦ｙ≦ｎ （１−４） このようにして得られたΔｔ（１）〜Δｔ（ｎ）を、現
在の設定値ｔ（１）〜ｔ（ｎ）に加え、あらたなヒータ
温度の設定値として各温度調節器１４-1〜１４-nにフィ
ードパックする（Ｓ２７に対応）。Δs = A * Δt (1-1) Δt = [Δt (1),. . . , Δt (n)] (1-2) Δs = [Δs (1),. . . , Δs (n)] (1-3) A = [A (x, y)], 1 ≦ x ≦ n, 1 ≦ y ≦ n (1-4) Δt (1) to Δt (n) is added to the current set values t (1) to t (n), and a new heater temperature set value is fed to each of the temperature controllers 14-1 to 14-n (corresponding to S27). .
【００２６】このようにしてヒータ温度の設定値が決定
したら、目標点測定用温度センサ３５-1〜３５-nを取り
外し、最終的に決定した設定値にもとづいて温度調節器
１４-1〜１４-nによる制御をおこなうことによって目標
点における温度を校正時の通りに実現することができ
る。When the set value of the heater temperature is determined in this manner, the temperature sensors 35-1 to 35-n for measuring the target point are removed, and the temperature controllers 14-1 to 14-14 are determined based on the finally determined set value. By performing control with -n, the temperature at the target point can be realized as at the time of calibration.
【００２７】[0027]
【発明の効果】以上述ベたように、本発明の温度制御装
置の校正システムと校正方法は、温度調節器の温度測定
点と目標点とが異なる制御対象物の目標点の目標温度制
御を、公知の温度制御装置を用いて高精度かつ安価に実
現することができるという効果がある。As described above, the calibration system and the calibration method of the temperature control device according to the present invention perform the target temperature control of the target point of the control object having the temperature measurement point of the temperature controller different from the target point. There is an effect that it can be realized with high accuracy and low cost by using a known temperature control device.
【図１】本発明の実施の形態を示す温度制御装置の校正
システムのブロック構成図である。FIG. 1 is a block diagram of a calibration system for a temperature control device according to an embodiment of the present invention.
【図２】本発明の実施の形態の温度制御装置の校正方法
の動作のフローチャートである。FIG. 2 is a flowchart of an operation of a calibration method of the temperature control device according to the embodiment of the present invention.
【図３】本発明の制御対象が金型の場合の実施例のヒー
タおよびセンサの配置を示す斜視図である。FIG. 3 is a perspective view illustrating an arrangement of a heater and a sensor according to the embodiment when a control target of the present invention is a mold.
【図４】従来例の代表的な温度制御装置のブロック構成
図である。FIG. 4 is a block diagram of a typical temperature control device of a conventional example.
１０、４０ 制御対象物 １１ 温度制御装置 １２-1〜１２-n、４２ 温度調節手段 １３-1〜１３-n、３３-1〜３３-n、４３ 温度センサ １４-1〜１４-n 温度調節器 ２０ 校正システム ２１ ＣＰＵ ２２ 目標点温度計測手段 ２３ 設定温度設定手段 ２４ 設定ルール記憶手段 ２５-1〜２５-m、３５-1〜３５-n 目標点測定用温度
センサ ３２-1〜３２-n ヒータ ３６ 金型上部 ３７ 金型下部 ３８-1〜３８-n ヒータ取り付け穴 ４４ 温度計測部 ４５ ＰＩＤ制御器 ４６ 温度調節手段制御部 Ｓ２１〜Ｓ２９ 動作の各ステップ10, 40 Control object 11 Temperature control device 12-1 to 12-n, 42 Temperature control means 13-1 to 13-n, 33-1 to 33-n, 43 Temperature sensor 14-1 to 14-n Temperature control 20 Calibration system 21 CPU 22 Target point temperature measuring means 23 Set temperature setting means 24 Setting rule storage means 25-1 to 25-m, 35-1 to 35-n Target point measuring temperature sensors 32-1 to 32-n Heater 36 Mold upper part 37 Mold lower part 38-1 to 38-n Heater mounting hole 44 Temperature measuring unit 45 PID controller 46 Temperature control unit control unit S21 to S29 Operation steps
Claims (2)
手段と、前記温度検出素子から検出された温度と設定温
度との差から前記温度調節手段の制御量を調節する１個
の温度調節器との組み合せを複数有する温度制御装置
の、各前記温度調節器の前記設定温度を、制御対象物の
制御目標点の温度が目標温度となるように校正するため
の校正システムであって、 前記校正システムは、 前記制御対象物の１個以上の制御目標点の温度を直接測
定するための１個以上の目標点測定用温度センサと、 前記目標点測定用温度センサが示す温度を計測するため
の目標点温度計測手段と、 各目標点の目標温度と、各前記温度調節器の前記設定温
度と、該設定温度の変化に対応する各目標点の温度変化
の関係データとを記憶するための記憶手段と、 前記目標点温度計測手段で計測された目標点の計測温度
と前記記憶手段に記憶された前記目標温度とを比較し、
前記記憶手段に記憶された前記設定温度と前記温度変化
の関係データから、各前記温度調節器に新たに設定すべ
き設定温度を算出するＣＰＵと、 算出された新たな設定温度を各前記温度調節器に指示す
るための設定温度設定手段とから構成される、ことを特
徴とする温度制御装置の校正システム。1. One temperature detecting element, one temperature adjusting means, and one temperature adjusting means for adjusting a control amount of the temperature adjusting means from a difference between a temperature detected by the temperature detecting element and a set temperature. A calibration system for calibrating a temperature control device having a plurality of combinations with a temperature controller, wherein the set temperature of each of the temperature controllers is calibrated so that a temperature of a control target point of a control target becomes a target temperature. The calibration system includes: one or more target point measurement temperature sensors for directly measuring the temperature of one or more control target points of the control target; and measuring the temperature indicated by the target point measurement temperature sensor. And a target point temperature measuring means for storing the target temperature of each target point, the set temperature of each of the temperature controllers, and relation data of a temperature change of each target point corresponding to the change of the set temperature. Means for storing, and the target Stored in said measured temperature and said storage means of the target point measured by the temperature measurement means is compared with the target temperature,
A CPU for calculating a set temperature to be newly set in each of the temperature controllers from the relationship data between the set temperature and the temperature change stored in the storage means; and And a set temperature setting means for instructing the temperature control device.
手段と、前記温度検出素子から検出された温度と設定温
度との差から前記温度調節手段の制御量を調節する１個
の温度調節器との組み合せを複数有する温度制御装置
の、各前記温度調節器の前記設定温度を、制御対象物の
制御目標点の温度が目標温度となるように校正するため
の請求項１に記載の校正システムを用いた校正方法であ
って、 各前記温度調節器の設定温度を通常運用時に用いている
温度の設定にし、 目標点に取り付けた前記目標点測定用温度センサの温度
が安定するまで待機し、 温度が安定したら前記ＣＰＵが各目標点の測定温度と前
記記憶手段に記憶された目標温度とを比較してその差を
計算し、 前記ＣＰＵは、前記目標温度と測定温度との差が所定の
値以上と判断した場合は、前記目標温度と測定温度との
差を前記記憶手段が記憶する各前記温度調節器の前記設
定温度と、前記温度調節器のそれぞれの設定温度の変化
に対応する各目標点の温度変化の前記関係データと照合
して各前記温度調節器に新たに設定すべき設定温度を計
算し、 その結果得られた新たに設定すべき設定温度を前記設定
温度設定手段を通じて各前記温度調節器に設定し、 再度目標点の温度が安定するまで待機し、 各目標点の実測の温度と前記目標温度との差が所定の値
以下になるまで上記の動作を繰り返し、 各目標点の実測の温度と前記目標温度との差が所定の値
以下であると判断したならば、この時点での設定温度の
設定値を前記温度調節器のメモリに保管して、校正動作
を終了し、 前記温度調節器を運用するときは、前記メモリに保管し
た校正終了時点での設定温度の前記設定値をそれぞれの
前記温度調節器に設定する、ことを特徴とする温度制御
装置の校正方法。2. One temperature detecting element, one temperature adjusting means, and one temperature adjusting means for adjusting a control amount of the temperature adjusting means from a difference between a temperature detected by the temperature detecting element and a set temperature. 2. The temperature controller according to claim 1, wherein the set temperature of each of the temperature controllers of the temperature controller having a plurality of combinations with the temperature controllers is calibrated so that the temperature of the control target point of the control target becomes the target temperature. 3. A calibration method using the calibration system of the above, wherein the set temperature of each of the temperature controllers is set to the temperature used during normal operation, and the temperature of the target point measuring temperature sensor attached to the target point is stabilized. When the temperature is stabilized, the CPU compares the measured temperature at each target point with the target temperature stored in the storage means to calculate the difference, and the CPU calculates the difference between the target temperature and the measured temperature. Is determined to be greater than In the case, the difference between the target temperature and the measured temperature is stored in the storage means, the set temperature of each of the temperature controllers, and the temperature change of each target point corresponding to the change of each set temperature of the temperature controller. A set temperature to be newly set for each of the temperature controllers is calculated by comparing with the relation data of the above, and the resulting set temperature to be newly set is obtained to each of the temperature controllers through the set temperature setting means. Wait until the temperature at the target point stabilizes again, and repeat the above operation until the difference between the measured temperature at each target point and the target temperature becomes a predetermined value or less. If it is determined that the difference between the target temperature and the target temperature is equal to or less than a predetermined value, the set value of the set temperature at this time is stored in the memory of the temperature controller, and the calibration operation is completed. When operating the device, the memory Setting storing the said set value of the set temperature of the calibration end to each of the temperature controller, the calibration method of the temperature control device, characterized in that.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20198796A JPH1049239A (en) | 1996-07-31 | 1996-07-31 | System and method for correcting temperature control unit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20198796A JPH1049239A (en) | 1996-07-31 | 1996-07-31 | System and method for correcting temperature control unit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH1049239A true JPH1049239A (en) | 1998-02-20 |
Family
ID=16450071
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP20198796A Pending JPH1049239A (en) | 1996-07-31 | 1996-07-31 | System and method for correcting temperature control unit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH1049239A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001092537A (en) * | 1999-09-22 | 2001-04-06 | Toyo Seiki Seisakusho:Kk | Method for controlling temperature of furnace body or the like and device provided with the furnace body or the like |
| JP2010170565A (en) * | 2000-09-29 | 2010-08-05 | Hitachi Kokusai Electric Inc | Thermal treating apparatus, temperature controlling method, and methods of manufacturing semiconductor device and of obtaining correction value |
| JP2017075814A (en) * | 2015-10-14 | 2017-04-20 | 株式会社島津製作所 | High temperature test device and high temperature test method |
-
1996
- 1996-07-31 JP JP20198796A patent/JPH1049239A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001092537A (en) * | 1999-09-22 | 2001-04-06 | Toyo Seiki Seisakusho:Kk | Method for controlling temperature of furnace body or the like and device provided with the furnace body or the like |
| JP2010170565A (en) * | 2000-09-29 | 2010-08-05 | Hitachi Kokusai Electric Inc | Thermal treating apparatus, temperature controlling method, and methods of manufacturing semiconductor device and of obtaining correction value |
| JP2017075814A (en) * | 2015-10-14 | 2017-04-20 | 株式会社島津製作所 | High temperature test device and high temperature test method |
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