JPH0387670A - Device for measuring electric field by optical system - Google Patents
Device for measuring electric field by optical systemInfo
- Publication number
- JPH0387670A JPH0387670A JP1224972A JP22497289A JPH0387670A JP H0387670 A JPH0387670 A JP H0387670A JP 1224972 A JP1224972 A JP 1224972A JP 22497289 A JP22497289 A JP 22497289A JP H0387670 A JPH0387670 A JP H0387670A
- Authority
- JP
- Japan
- Prior art keywords
- electro
- electric field
- mirror
- wavelength plate
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005684 electric field Effects 0.000 title claims abstract description 19
- 230000003287 optical effect Effects 0.000 title claims abstract description 7
- 239000013078 crystal Substances 0.000 claims abstract description 19
- 230000000694 effects Effects 0.000 claims description 6
- 238000005259 measurement Methods 0.000 claims description 2
- 230000010287 polarization Effects 0.000 abstract description 3
- 239000010408 film Substances 0.000 abstract 1
- 239000002184 metal Substances 0.000 abstract 1
- 239000010453 quartz Substances 0.000 abstract 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 1
- 239000010409 thin film Substances 0.000 abstract 1
- 238000007740 vapor deposition Methods 0.000 abstract 1
- 230000005374 Kerr effect Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Landscapes
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Abstract
Description
【発明の詳細な説明】
(発明の技術分野)
本発明は、電気光学結晶のボッケルス効果を利用して電
界を測定する光方式の電界測定装置に関する。DETAILED DESCRIPTION OF THE INVENTION (Technical Field of the Invention) The present invention relates to an optical electric field measuring device that measures an electric field using the Bockels effect of an electro-optic crystal.
(発明の技術的背景とその問題点)
一般に、物質に電界を加えると、その光学的性質が変化
する。この現象は、広く電気光学効果と呼ばれ、ボッケ
ルス効果、カー効果等がよく知られている。この場合、
結晶の屈折率nは次式で与えられる。(Technical background of the invention and its problems) Generally, when an electric field is applied to a substance, its optical properties change. This phenomenon is widely called the electro-optic effect, and the Bockels effect, Kerr effect, etc. are well known. in this case,
The refractive index n of the crystal is given by the following equation.
n=no+aE+bE2+ −−−
ここでno:電界印加前の屈折率
E:印加電界
ここで、電界Eの1次の係数aをボッケルス係数、2次
の係数すをカー係数という。n=no+aE+bE2+ --- where no: refractive index before electric field application E: applied electric field Here, the first-order coefficient a of the electric field E is called the Bockels coefficient, and the second-order coefficient is called the Kerr coefficient.
そして、このような電気光学効果を有する媒質(以下電
気光学結晶と称す)と光ファイバを絹み合わせた電界、
電圧測定装置が開発され、このような装置の電気光学結
晶では屈折率が電界の1次の項に比例するボッケルス効
果を利用している。Then, an electric field created by interweaving a medium with such an electro-optic effect (hereinafter referred to as an electro-optic crystal) and an optical fiber,
Voltage measurement devices have been developed that utilize the Bockels effect in which the refractive index of an electro-optic crystal is proportional to the first order term of the electric field.
すなわち、複屈折性の電気光学結晶中の常光線と異常光
線との間の位相変化は、入射する直線偏光の偏光面がこ
の結晶媒質を通る間に、ある角度回転することを利用し
ている。たとえば、円偏光の入射光は結晶の出射面では
楕円偏光となる。In other words, the phase change between ordinary and extraordinary rays in a birefringent electro-optic crystal utilizes the fact that the polarization plane of incident linearly polarized light rotates by a certain angle while passing through this crystal medium. . For example, incident circularly polarized light becomes elliptically polarized light at the exit surface of the crystal.
したがって、測定すべき電界中に電気光学結晶を置いて
、電界の変化にしたがってその結晶中に誘起される複屈
折変化を、偏光子、検光子等を用いて光1?!号の強度
の変化として検出することにより電界の変化を測定する
ことができる。Therefore, an electro-optic crystal is placed in the electric field to be measured, and the change in birefringence induced in the crystal as the electric field changes is measured using a polarizer, analyzer, etc. ! Changes in the electric field can be measured by detecting changes in the signal strength.
Claims (1)
光学的な変化から電界を測定する反射型の電界測定装置
において、 光源と、 この光源からの光をビームスプリッタおよび偏光子を介
して入射させる電気光学結晶と、この電気光学結晶に設
けた測定すべき電界を印加する電極と、 上記電気光学結晶を透過した光を波長板および検光子を
介して再び上記光源へ向けて反射するミラーと、 ミラーで反射され上記電気光学結晶を透過した光を上記
ビームスプリッタで分離して光学的な変化から上記電界
を測定する電界測定部と、 を具備するものにおいて、 波長板の出射側板面に形成した反射膜からなるミラーを
設けたことを特徴とする光方式の電界測定装置。[Claims] A reflection-type electric field measuring device that measures an electric field from an optical change due to the Bockels effect of a light beam transmitted through an electro-optic crystal, comprising: a light source; and light from the light source is transmitted through a beam splitter and a polarizer. an electro-optic crystal that is incident on the electro-optic crystal, an electrode provided on the electro-optic crystal that applies an electric field to be measured, and a light that has passed through the electro-optic crystal that is reflected back toward the light source via a wave plate and an analyzer. a mirror; and an electric field measurement unit that separates the light reflected by the mirror and transmitted through the electro-optic crystal by the beam splitter and measures the electric field from optical changes, the output side plate surface of the wavelength plate An optical electric field measuring device characterized by being provided with a mirror made of a reflective film formed on.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1224972A JPH0387670A (en) | 1989-08-31 | 1989-08-31 | Device for measuring electric field by optical system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1224972A JPH0387670A (en) | 1989-08-31 | 1989-08-31 | Device for measuring electric field by optical system |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0387670A true JPH0387670A (en) | 1991-04-12 |
Family
ID=16822095
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1224972A Pending JPH0387670A (en) | 1989-08-31 | 1989-08-31 | Device for measuring electric field by optical system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0387670A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9199243B2 (en) | 2010-08-30 | 2015-12-01 | Ecomeca Oy | Method and apparatus for crushing mineral material |
-
1989
- 1989-08-31 JP JP1224972A patent/JPH0387670A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9199243B2 (en) | 2010-08-30 | 2015-12-01 | Ecomeca Oy | Method and apparatus for crushing mineral material |
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