JP2011222877A - Chuck for substrate with bumps and method for grinding rear surface of substrate with bumps by using the same - Google Patents

Chuck for substrate with bumps and method for grinding rear surface of substrate with bumps by using the same Download PDF

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JP2011222877A
JP2011222877A JP2010092741A JP2010092741A JP2011222877A JP 2011222877 A JP2011222877 A JP 2011222877A JP 2010092741 A JP2010092741 A JP 2010092741A JP 2010092741 A JP2010092741 A JP 2010092741A JP 2011222877 A JP2011222877 A JP 2011222877A
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substrate
bumps
chuck
bump
grinding
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Eiichi Yamamoto
栄一 山本
Takahiko Mitsui
貴彦 三井
Rito Ito
利東 伊東
Tomio Kubo
富美夫 久保
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Okamoto Machine Tool Works Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide a chuck for a substrate with bumps in which the rear surface of the substrate can be ground without covering the bump surface of the substrate with a protective adhesive sheet.SOLUTION: In the chuck 1 for a substrate with bumps that is used when the substrate is made thin by grinding the rear surface of the substrate with bumps w using a grinding wheel 5, a gel sheet 2 having Shore hardness A of 0-50, compression modulus of 1-7 Kgf/cm, adhesion strength of 0.01-100 gf/25 mm width, and thickness of 100-1,000 μm which is 5 μm or more thicker than the bump height is pasted to the surface of a rotary table 4 made of a rigid-body by using an adhesive 3.

Description

本発明は、バンプが形成されたシリコンウエハ(基板)の裏面を研削砥石で研削加工して基板を薄肉化する際に使用されるバンプ付き基板チャックに関する。この基板チャック上にバンプ付き基板のバンプ電極面を対向させて固定し、基板チャックを回転させながら研削砥石で基板裏面を薄肉研削加工でき、薄肉研削加工され、基板チャックから剥離されたバンプ付き基板はバンプ面を洗浄すること無く次の工程で使用できる。   The present invention relates to a substrate chuck with bumps used when a substrate is thinned by grinding a back surface of a silicon wafer (substrate) on which bumps are formed with a grinding wheel. The bump electrode surface of the substrate with bumps is fixed on the substrate chuck so as to face each other, and the back surface of the substrate can be thinly ground with a grinding wheel while rotating the substrate chuck, and the substrate with bumps peeled off from the substrate chuck is thinned and ground. Can be used in the next step without cleaning the bump surface.

バンプ付き基板のバンプ電極面を基板チャック上に対向させて固定し、基板チャックを回転させながら研削砥石でバンプ付き基板裏面を薄肉研削加工することは提案され、また、バンプ付き半導体基板製造メーカでも実施されている。必要により、薄肉研削加工されたバンプ付き基板裏面は、研磨パッドを用いて裏面を研磨加工し、研削加工により生じたダメージを除去し鏡面化することもある。 It is proposed that the bump electrode surface of the substrate with bumps is fixed on the substrate chuck so that the back surface of the substrate with bumps is thinly ground with a grinding wheel while rotating the substrate chuck. It has been implemented. If necessary, the back surface of the substrate with bumps that has been subjected to thin grinding may be polished using a polishing pad to remove the damage caused by the grinding and make a mirror surface.

上記バンプ付き基板裏面研削加工方法としては、(A)バンプ付き基板のバンプ電極間の隙間をゴムや液状樹脂で埋めてバンプ保護層を形成させ、ついで保護層側を吸着チャックに対向させて固定し、基板の裏面を研削砥石で研削加工して基板を薄肉化する方法、(B)バンプ付き基板のバンプ電極面に保護粘着シートを貼り合わせ、保護粘着シート側を吸着チャックに対向させて固定(バンプと基板間には若干の隙間が生じる)し、基板の裏面を研削砥石で研削加工して基板を薄肉化する方法、(C)バンプ付き基板のバンプ電極面の基板外周縁部にバンプ電極の高さより若干高い筒状バンプ電極保護筒を接着し、この筒状バンプ電極保護筒下面に保護粘着シートを貼り合わせ、この保護粘着シート側を吸着チャックに対向させて固定し、基板の裏面を研削砥石で研削加工して基板を薄肉化する方法、の大きく3通りに分類される。 As the above substrate back grinding method with bumps, (A) a bump protective layer is formed by filling a gap between bump electrodes of a substrate with bumps with rubber or liquid resin, and then fixed with the protective layer facing the suction chuck. (B) A protective adhesive sheet is bonded to the bump electrode surface of a substrate with bumps, and the protective adhesive sheet side is fixed to the suction chuck and fixed. (There is a slight gap between the bump and the substrate), and the back surface of the substrate is ground with a grinding wheel to reduce the thickness of the substrate. (C) Bumps on the outer peripheral edge of the bump electrode surface of the substrate with bumps Adhere a cylindrical bump electrode protection cylinder slightly higher than the electrode height, and attach a protective adhesive sheet to the bottom surface of this cylindrical bump electrode protection cylinder, and fix this protective adhesive sheet side facing the suction chuck, How to thinning the substrate back surface and grinding with a grinding wheel of the plate, it is classified into three types large.

上記(A)方法としては、特開平10−321565号公報(特許文献1)がゴムを含有する保護膜を使用する方法を、特開2007−324370号公報(特許文献2)がバンプを設けた基板の回路形成面に前記バンプの高さよりも厚く液状樹脂を塗布し、この液状樹脂を乾燥せしめて保護層とし、この保護層を介して基板をサポートプレートに取り付けて基板の裏面側を研削して薄板化し、この後、前記サポートプレートに形成した溶剤供給孔からサポートプレートと保護との間に溶剤を供給して前記保護層を溶解除去する基板の薄板化方法を、特開2008−98435号公報(特許文献3)がウエハのハイバンプが設けられた回路面面にスキージを使用して液状樹脂を塗布してハイバンプの裾を埋める樹脂層をハイバンプの高さよりも厚く設け、更に、前記樹脂層の上にテープ基材を貼り合わせ、前記テープ面を吸着チャックに対向させてハイバンプ付き基板の裏面側を研削して薄板化する方法を提案する。 As the method (A), Japanese Patent Laid-Open No. 10-321565 (Patent Document 1) uses a rubber-containing protective film, and Japanese Patent Laid-Open No. 2007-324370 (Patent Document 2) has bumps. Apply a liquid resin thicker than the bump height to the circuit formation surface of the board, dry this liquid resin to form a protective layer, attach the board to the support plate via this protective layer, and grind the back side of the board Japanese Patent Application Laid-Open No. 2008-98435 discloses a method for thinning a substrate in which a thin film is formed and then a solvent is supplied between a support plate and a protection through a solvent supply hole formed in the support plate to dissolve and remove the protective layer. According to the publication (Patent Document 3), a resin layer that fills the bottom of a high bump by applying a liquid resin to the circuit surface surface of the wafer provided with the high bump using a squeegee Thick provided, further, the above resin layer bonded to the tape substrate, the tape surface is proposed a method of thinning by grinding the back surface side of the Haibanpu coated substrate is opposed to the suction chuck.

また、(B)方法としては、特開2006−335787号公報(特許文献4)がバンプ付き基板のバンプ電極面に貼り合わせる保護粘着シートとして補強層、軟質層、中間層、粘着剤層の順に積層される粘着シートであって、補強層がショアD硬度40〜90且つ厚み5〜1000μmであり、軟質層がショアA硬度20〜80且つ厚み50〜1000μmであり、中間層がショアD硬度40〜90且つ厚み5〜100μmである粘着シートを提案する。また、特開2009−239138号公報(特許文献5)は、バックグラインドテープと、架橋反応可能な樹脂と、フラックス活性を有する化合物とを含む樹脂組成物で構成されている接着剤層とが積層されてなる半導体用フィルムの接着剤層と予め半田バンプが形成された半導体ウエハの機能面とを接合する工程と、前記半導体ウエハの機能面と反対側の面を研磨する工程と、前記半導体ウエハを前記半導体用フィルムが接着された状態で個片化して半導体素子を得る工程と、前記半導体用フィルムが接着された半導体素子を前記半導体用フィルムのバックグラインドテープと接着剤層との間で剥離して、前記接着剤層を有する半導体素子をピックアップする工程と、前記接着剤層が基板と接着するように半導体素子を基板に搭載する工程とを有する半導体装置の製造方法を提案する。   In addition, as a method (B), Japanese Patent Application Laid-Open No. 2006-335787 (Patent Document 4) uses a reinforcing layer, a soft layer, an intermediate layer, and an adhesive layer in this order as a protective adhesive sheet to be bonded to the bump electrode surface of a substrate with bumps. A pressure-sensitive adhesive sheet to be laminated, wherein the reinforcing layer has a Shore D hardness of 40 to 90 and a thickness of 5 to 1000 μm, the soft layer has a Shore A hardness of 20 to 80 and a thickness of 50 to 1000 μm, and the intermediate layer has a Shore D hardness of 40 A pressure-sensitive adhesive sheet having a thickness of ˜90 and a thickness of 5 to 100 μm is proposed. JP 2009-239138 A (Patent Document 5) is a laminate of a back grind tape, an adhesive layer composed of a resin composition containing a resin capable of crosslinking reaction and a compound having flux activity. Bonding the adhesive layer of the film for semiconductor and the functional surface of the semiconductor wafer on which solder bumps have been formed in advance, polishing the surface opposite to the functional surface of the semiconductor wafer, and the semiconductor wafer And separating the semiconductor element to which the semiconductor film is adhered between the back grind tape and the adhesive layer of the semiconductor film. A step of picking up the semiconductor element having the adhesive layer, and a step of mounting the semiconductor element on the substrate so that the adhesive layer adheres to the substrate We propose a method of manufacturing a semiconductor device having a.

前記(C)方法として、特開2009−188010号公報(特許文献6)はバンプが形成された回路表面を有する半導体ウエハの外周縁にバンプ保護用支持筒を粘着剤で貼着し、このバンプ保護用支持筒の下面に粘着剤層が形成されていない開口部と該開口部を囲繞する粘着剤層とを有する表面保護用シートを貼着し、バンプが形成されている側とは反対側面の半導体ウエハ裏面を研削加工する方法を提案する。前記粘着剤層の厚みは、バンプの高さより10〜30μm厚肉の50〜105μmが好ましいと記載もされている。また、特開2009−206475号公報(特許文献7)は、表面にバンプが形成されていて該表面に表面保護フィルムが貼付けられているバンプ付きウエハ裏面を研削加工する方法において、ウエハを保持するテーブルの周りに配置された筒体の端面を所定の厚さまで研削し、ウエハの裏面を上方に向けた状態で、ウエハを筒体に配置した後、ウエハの裏面を研削加工する方法を提案する。   As the method (C), Japanese Patent Application Laid-Open No. 2009-188010 (Patent Document 6) attaches a bump protection support cylinder to the outer peripheral edge of a semiconductor wafer having a circuit surface on which a bump is formed, and this bump. A surface protective sheet having an opening in which the adhesive layer is not formed on the lower surface of the protective support cylinder and an adhesive layer surrounding the opening is attached, and the side opposite to the side on which the bump is formed A method for grinding the back surface of the semiconductor wafer is proposed. It is also described that the thickness of the pressure-sensitive adhesive layer is preferably 10 to 30 μm thick and 50 to 105 μm thicker than the bump height. Japanese Patent Application Laid-Open No. 2009-206475 (Patent Document 7) holds a wafer in a method of grinding a back surface of a wafer with bumps on which bumps are formed and a surface protective film is attached to the surface. Proposes a method of grinding the end surface of the cylinder placed around the table to a predetermined thickness, grinding the back surface of the wafer after placing the wafer on the cylinder with the back surface of the wafer facing upward .

特開平10−321565号公報JP-A-10-321565 特開2007−324370号公報JP 2007-324370 A 特開2008−98435号公報JP 2008-98435 A 特開2006−335787号公報JP 2006-335787 A 特開2009−239138号公報JP 2009-239138 A 特開2009−188010号公報JP 2009-188010 A 特開2009−206475号公報JP 2009-206475 A

上記(A)、(B)および(C)方法のバンプ付き基板の基板裏面研削加工方法による薄肉化方法は、いずれもバンプ付き基板のバンプ面側に保護粘着シートを設ける工程、基板裏面の研削加工工程、研削加工されたバンプ付き基板より前記保護粘着シートを取り除く工程、および、保護粘着シートが取り除かれたバンプ面に付着したゴムや粘着剤を溶剤で溶解させ、ついで、水で洗浄する洗浄工程が必要である。 The methods (A), (B), and (C) for reducing the thickness of the substrate with bumps by the substrate backside grinding method include the steps of providing a protective adhesive sheet on the bump surface side of the substrate with bumps, and grinding the backside of the substrate. Processing step, step of removing the protective adhesive sheet from the ground substrate with bumps, and cleaning by washing with water the rubber and adhesive adhering to the bump surface from which the protective adhesive sheet has been removed, and then washing with water A process is required.

本発明は、従来のバンプ付き基板のバンプ面側に貼付する保護粘着シートを使用せず、直接バンプ付き基板の基板裏面研削加工を可能とするバンプ付き基板用チャックの提供を目的とする。 It is an object of the present invention to provide a substrate chuck with bumps that can directly grind the back surface of a substrate with bumps without using a protective adhesive sheet that is attached to the bump surface side of a conventional substrate with bumps.

請求項1の発明は、バンプ付き基板の裏面を研削砥石で研削加工して基板を薄肉化する際に使用されるバンプ付き基板用チャックであって、ショア硬度A(JIS K7312)が0〜50、圧縮弾性率(JIS K7312)が1〜7Kgf/cm、粘着強度(JIS Z0237)が0.01〜100gf/25mm幅、厚みがバンプ高さより5μm以上厚い100〜1,000μmのゲルシートを剛体製ロータリーテーブルの表面に接着剤を用いて貼着したことを特徴とする、バンプ付き基板裏面研削加工用のバンプ付き基板用チャックを提供するものである。 The invention of claim 1 is a substrate chuck with bumps used when the back surface of the substrate with bumps is ground with a grinding wheel to reduce the thickness of the substrate, and the Shore hardness A (JIS K7312) is 0-50. A gel sheet having a compression elastic modulus (JIS K7312) of 1 to 7 Kgf / cm 2 , an adhesive strength (JIS Z0237) of 0.01 to 100 gf / 25 mm width and a thickness of 5 μm or more thicker than the bump height is made of a rigid body. The present invention provides a bumped substrate chuck for backside grinding processing of a substrate with bumps, which is adhered to the surface of a rotary table using an adhesive.

請求項2の発明は、前記バンプ付き基板用チャックのゲルシートの表面にバンプ付き基板のバンプ面をゲルシート側に対向させながら基板裏面を押圧してバンプ面をゲルシート厚み内に埋没させて固定し、ついで、砥石を用いて前記バンプ付き基板裏面を研削加工して基板厚みを減少させることを特徴とする、バンプ付き基板の裏面研削加工方法を提供するものである。 The invention of claim 2 is a method of pressing the back surface of the substrate while the bump surface of the substrate with bumps is opposed to the gel sheet side on the surface of the gel sheet of the substrate chuck with bumps, and fixing the bump surface to be buried in the gel sheet thickness, Next, a back grinding process for a substrate with bumps is provided, wherein the substrate thickness is reduced by grinding the back surface of the substrate with bumps using a grindstone.

ゲルシートのショア硬度A(JIS K7312)を0〜50、粘着強度(JIS Z0237)を0.01〜100gf/25mm幅としたことにより吸着パッドの減圧度90KPa以上でバンプ付き基板裏面を吸着パッドで吸着してチャックのゲルシート面から剥離し次工程へ移送することができる。この際、バンプへのゲル屑の付着がない。ゲルシートの圧縮弾性率(JIS K7312)が1〜7Kgf/cmであるので、バンプ付き基板裏面をゴムローラやゲルローラで押圧しながら基板とゲルシート間の空気溜まりをチャック外へ排気することができるとともに、バンプ付き基板のバンプ電極がゲルシート厚み内に埋設される。また、バンプ付き基板裏面研削加工後、砥石が基板面より遠ざかるとゲルシートの弾性回復力によりゲルシート厚みが元の厚みに戻り、バンプ付き基板のゲルシート面からの剥離を容易とする。 The back surface of the substrate with bumps is adsorbed with an adsorption pad at a vacuum degree of 90 KPa or more when the Shore hardness A (JIS K7312) of the gel sheet is 0-50 and the adhesive strength (JIS Z0237) is 0.01-100 gf / 25 mm width. Then, it can be peeled off from the gel sheet surface of the chuck and transferred to the next process. At this time, no gel dust adheres to the bumps. Since the compression elastic modulus (JIS K7312) of the gel sheet is 1 to 7 Kgf / cm 2 , an air pocket between the substrate and the gel sheet can be exhausted outside the chuck while pressing the back surface of the substrate with bumps with a rubber roller or a gel roller. The bump electrode of the substrate with bumps is embedded in the gel sheet thickness. Further, after the back surface grinding of the substrate with bumps, when the grindstone moves away from the substrate surface, the gel sheet thickness returns to the original thickness by the elastic recovery force of the gel sheet, and the separation of the substrate with bumps from the gel sheet surface is facilitated.

本発明の裏面研削加工方法は、従来の裏面研削加工方法と比較して、予めバンプ付き基板のバンプ面側に保護粘着シートを設ける工程、研削加工されたバンプ付き基板より前記保護粘着シートを取り除く工程、および、保護粘着シートが取り除かれたバンプ面に付着したゴムや粘着剤を溶剤で溶解させ、ついで、水で洗浄する洗浄工程が省略できるので、バンプ付き基板裏面の薄肉加工処理時間が短い。   The back grinding method of the present invention includes a step of providing a protective adhesive sheet on the bump surface side of the substrate with bumps in advance, and removing the protective adhesive sheet from the ground substrate with bumps, as compared with the conventional back grinding method. Process and the process of thinning the backside of the substrate with bumps can be shortened because the rubber and adhesive attached to the bump surface from which the protective adhesive sheet has been removed can be dissolved with a solvent and then washed with water. .

図1はバンプ付き基板用チャックを用いてバンプ付き基板の裏面を研削加工する状態を示す正面図である。FIG. 1 is a front view showing a state where the back surface of a bumped substrate is ground using a bumped substrate chuck.

以下、図1を用いて本発明のバンプ付き基板用チャックを説明する。
図1において、バンプ付き基板用チャック1はゲルシート2を剛体製ロータリーテーブル4の表面に接着剤3を用いて貼着した構造を採る。図1において、wはバンプ付きシリコン基板を、bはバンプを、5は研削砥石を示す。
The bumped substrate chuck according to the present invention will be described below with reference to FIG.
In FIG. 1, a bumped substrate chuck 1 has a structure in which a gel sheet 2 is adhered to the surface of a rigid rotary table 4 using an adhesive 3. In FIG. 1, w represents a silicon substrate with bumps, b represents bumps, and 5 represents a grinding wheel.

前記ゲルシート2は、ショア硬度A(JIS K7312)が0〜50、好ましくは30〜50、圧縮弾性率(JIS K7312)が1〜7Kgf/cm、好ましくは1〜2.5Kgf/cm、粘着強度(JIS Z0237)が0.01〜100gf/25mm幅、好ましくは、1〜50gf/25mm幅、厚みがバンプ高さより5μm以上厚い100〜1,000μm、好ましくは300〜600μmである。 The gel sheet 2 has a Shore hardness A (JIS K7312) of 0 to 50, preferably 30 to 50, and a compression elastic modulus (JIS K7312) of 1 to 7 kgf / cm 2 , preferably 1 to 2.5 kgf / cm 2 , adhesive. The strength (JIS Z0237) is 0.01 to 100 gf / 25 mm width, preferably 1 to 50 gf / 25 mm width, and the thickness is 100 to 1,000 μm, preferably 300 to 600 μm thicker than the bump height by 5 μm or more.

前記ゲルシート2の素材は、オルガノポリシロキサン系ゲル、ウレタン樹脂ゲル、架橋ポリビニールアルコールゲル、鹸化エチレン・酢酸ビニル共重合体ゲル、エチレン・プロピレン・ブタジエン共重合体ゴムに極性基(アルコキシ基、アミノ基、カルボキシル基など)を有するビニルシリコン化合物をグラフト重合させて得たゴムを更に鹸化することにより得たポリオレフィン系ゲル、エチレン・プロピレン・エチリデンノルボルネン共重合体ゴムに極性基(アルコキシ基、アミノ基、カルボキシル基など)を有するビニルシリコン化合物をグラフト重合させて得たゴムを更に鹸化することにより得たポリオレフィン系ゲル、スチレン・イソプレン・スチレンブロック共重合体の水素添加物ゲル、シリコン架橋アクリル酸アルキルエステル樹脂系ゲルなどが利用できる。ゲルシート2の針入度(JIS K2207)は、一般に20〜200、アスカC硬度が3〜20度である。ゲルは、シリカやゴム成分(シリコンゴム、アクリルエラストマー、EPT、EPDM、SBRなど)を5〜35重量%含有していてもよい。また、エチレン・アクリル酸共重合体、エチレン・メタクリル酸共重合体、アビエチン酸ロジン、テルペン・フェノール共重合体、マレイン化ミルセン、石油樹脂、アロオシメン・テルペン・フェノール共重合体などの粘着剤を0.5〜1重量%含有していてもよい。 The material of the gel sheet 2 is an organopolysiloxane gel, urethane resin gel, cross-linked polyvinyl alcohol gel, saponified ethylene / vinyl acetate copolymer gel, ethylene / propylene / butadiene copolymer rubber and polar groups (alkoxy group, amino acid). Group obtained by graft polymerization of a vinyl silicon compound having a hydroxyl group, a carboxyl group, etc., and a polyolefin-based gel obtained by further saponification, an ethylene / propylene / ethylidene norbornene copolymer rubber and a polar group (alkoxy group, amino group). Polyolefin gel obtained by further saponification of rubber obtained by graft polymerization of vinyl silicon compound having a carboxyl group, etc., hydrogenated gel of styrene / isoprene / styrene block copolymer, silicon cross-linked alkyl acrylate ester Such as fat-based gel can be utilized. The penetration of the gel sheet 2 (JIS K2207) is generally 20 to 200 and the Asuka C hardness is 3 to 20 degrees. The gel may contain 5 to 35% by weight of silica and rubber components (silicon rubber, acrylic elastomer, EPT, EPDM, SBR, etc.). Also, adhesives such as ethylene / acrylic acid copolymer, ethylene / methacrylic acid copolymer, rosin abietic acid, terpene / phenol copolymer, maleated myrcene, petroleum resin, aloocimene / terpene / phenol copolymer, etc. .5 to 1% by weight may be contained.

上述のゲルシート2は、株式会社エクシールコーポレーションより“人肌ゲルシート”(商品名)、“クリアタック”(商品名:ゲル層にアクリル系粘着剤層が積層)、サカセ化学工業株式会社より“シリコンタックシート”(商品名)SRTE−3030−1GN、SRTE−3030−1BU(グレード番号)、および“ノンシリコンタックシート”(商品名)C−10H−10、C−01H−20、CH10−30(グレード番号)として販売されている。 The above-mentioned gel sheet 2 is “Human Skin Gel Sheet” (trade name), “Clear Tuck” (trade name: Acrylic adhesive layer is laminated on the gel layer) from Exceal Corporation, and “Silicon Tack” from Sakase Chemical Industries, Ltd. Sheet "(trade name) SRTE-3030-1GN, SRTE-3030-1BU (grade number), and" Non-silicone tack sheet "(trade name) C-10H-10, C-01H-20, CH10-30 (grade) Number).

ゲルシート2を剛体製ロータリーテーブル4の表面に接着させる接着剤3としては、アクリル系樹脂接着剤、アクリル系ゴム粘着剤、UV照射硬化型アクリル系樹脂接着剤、イソブチレン系ゴム接着剤、エチレン・酢酸ビニル共重合体接着剤、エチレン・アクリル酸共重合体接着剤、エチレン・メタクリル酸・アクリル酸メチル共重合体接着剤、アクリル酸メチル・2−エチルヒドロキシメタアクリレート共重合体粘着剤、液状エポキシ化ブタジエンゴム粘着剤などが使用できる。接着剤層3の厚みは、2〜20μmで充分である。接着剤層3の剛体製ロータリーテーブル4への接着力はゲルシート2の粘着強度(JIS Z0237)より高く、100〜300gf/25mm幅程度が好ましい。 The adhesive 3 for adhering the gel sheet 2 to the surface of the rigid rotary table 4 is an acrylic resin adhesive, an acrylic rubber adhesive, a UV irradiation curable acrylic resin adhesive, an isobutylene rubber adhesive, ethylene / acetic acid Vinyl copolymer adhesive, ethylene / acrylic acid copolymer adhesive, ethylene / methacrylic acid / methyl acrylate copolymer adhesive, methyl acrylate / 2-ethylhydroxymethacrylate copolymer adhesive, liquid epoxidation Butadiene rubber adhesive can be used. A thickness of 2 to 20 μm is sufficient for the adhesive layer 3. The adhesive strength of the adhesive layer 3 to the rigid rotary table 4 is higher than the adhesive strength (JIS Z0237) of the gel sheet 2 and is preferably about 100 to 300 gf / 25 mm width.

剛体製ロータリーテーブル4の素材は、ステンレス、アルミニウム、真鍮、アルミナセラミック、銅粉・エポキシ樹脂複合体などが使用できる。 The material of the rigid rotary table 4 may be stainless steel, aluminum, brass, alumina ceramic, copper powder / epoxy resin composite, or the like.

ステンレス製ロータリーチャックテーブル4上に株式会社エクシールコーポレーション製“クリアタックシート CT−03−500”(商品名:ショアA硬度1、ショアC硬度14、圧縮弾性率2.0Kgf/cm、粘着強度0.077Kgf/25mm幅、厚み300μm)をアクリル系樹脂接着剤(厚み5μm、粘着強度200gf/25mm幅)を介して接着させてバンプ付き基板用チャックを製作した。 “Clear tack sheet CT-03-500” (trade name: Shore A hardness 1, Shore C hardness 14, compression elastic modulus 2.0 Kgf / cm 2 , adhesive strength 0 on stainless steel rotary chuck table 4 manufactured by Exeal Corporation. 0.077 kgf / 25 mm width, 300 μm thickness) was bonded via an acrylic resin adhesive (thickness 5 μm, adhesive strength 200 gf / 25 mm width) to produce a bumped substrate chuck.

バンプ高さ200μm、バンプピッチ500μmでバンプを配した300mm径、厚み750μmシリコン基板のバンプ面を上述のチャックのゲルシート表面に対向させてゲルローラを用いて押圧して基板とゲルシート間の空気溜まりをチャック外へ排気しつつバンプ付き基板のバンプ電極をゲルシート厚み内に埋設させてチャック上に固定した。 Bump height of 200 μm, bump pitch of 500 μm, 300 mm diameter, 750 μm thickness Bump surface of silicon substrate facing the gel sheet surface of the above chuck and pressing with gel roller to chuck the air pocket between substrate and gel sheet While evacuating outside, the bump electrode of the substrate with bumps was embedded in the gel sheet thickness and fixed on the chuck.

このチャックを20min−1で回転させながら、直径325mm、砥番#500のダイヤモンドビトリファイドボンドカップホイール型砥石を3,000min−1で回転させながら送り速度500μmでチャック上のバンプ付きシリコン基板面に当接、摺擦させて裏面研削加工を開始し、14秒間裏面研削加工を行い、シリコン基板厚みを100μm減少させた。薄肉研削加工されたバンプ付きシリコン基板の裏面研削加工面の粗さ分布(TTV)は、3μmであった。バンプ面にはゲル屑の付着は見出されなかった。 While rotating the chuck at 20 min −1 , the diamond vitrified bond cup wheel type grindstone with a diameter of 325 mm and an abrasive number of # 500 is rotated at 3,000 min −1 at a feed rate of 500 μm to hit the bumped silicon substrate surface on the chuck. The back grinding process was started by contacting and rubbing, and the back grinding process was performed for 14 seconds to reduce the silicon substrate thickness by 100 μm. The roughness distribution (TTV) of the back-grinded surface of the silicon substrate with bumps subjected to thin grinding was 3 μm. No gel debris was found on the bump surface.

実施例1のバンプ付きシリコン基板の裏面研削加工を連続して50回行った。いずれも薄肉研削加工されたバンプ付きシリコン基板の裏面研削加工面の粗さ分布粗さ(TTV)は、2.95〜3.04μmの数値であった。また、バンプ面にはゲル屑の付着は見出されなかった。このことは、チャックのゲルシートは、少なくとも裏面研削加工50回以上は取り替えることなく利用できることを意味する。 The back surface grinding of the silicon substrate with bumps of Example 1 was performed 50 times continuously. In each case, the roughness distribution roughness (TTV) of the back-grinded surface of the silicon substrate with bumps that had been thin-ground was 2.95 to 3.04 μm. Also, no gel dust was found on the bump surface. This means that the gel sheet of the chuck can be used without replacement at least 50 times of back grinding.

本発明のバンプ付き基板用チャックは、耐水性に富み、50回以上の裏面研削加工に耐えうる。よって、従来のバンプ付き基板裏面研削加工で1回毎に取り替えていた保護シートの消耗品枚数50枚に比較し、ゲルシートの利用は1回で済むこととなり、消耗品の節約にもなる。 The bumped substrate chuck of the present invention is rich in water resistance and can withstand back grinding of 50 times or more. Therefore, the gel sheet needs to be used only once compared to the number of consumable sheets of the protective sheet, which was replaced every time in the conventional substrate backside grinding process with bumps, which also saves consumables.

1 バンプ付き基板用チャック
2 ゲルシート
3 接着剤
4 剛体製ロータリーテーブル
5 研削砥石
w バンプ付き基板
1 Bumped substrate chuck 2 Gel sheet 3 Adhesive 4 Rigid rotary table 5 Grinding wheel w Bumped substrate

Claims (2)

バンプ付き基板の裏面を研削砥石で研削加工して基板を薄肉化する際に使用されるバンプ付き基板用チャックであって、ショア硬度A(JIS K7312)が0〜50、圧縮弾性率(JIS K7312)が1〜7Kgf/cm、粘着強度(JIS Z0237)が0.01〜100gf/25mm幅、厚みがバンプ高さより5μm以上厚い100〜1,000μmのゲルシートを剛体製ロータリーテーブルの表面に接着剤を用いて貼着したことを特徴とする、バンプ付き基板裏面研削加工用のバンプ付き基板用チャック。 A substrate chuck with bumps used when the back surface of a substrate with bumps is ground with a grinding wheel to reduce the thickness of the substrate, and has a Shore hardness A (JIS K7312) of 0 to 50 and a compression elastic modulus (JIS K7312). ) Is 1 to 7 Kgf / cm 2 , adhesive strength (JIS Z0237) is 0.01 to 100 gf / 25 mm width, and a thickness of 100 to 1,000 μm thicker than the bump height is adhesive on the surface of the rigid rotary table. A chuck for a substrate with bumps for grinding a back surface of a substrate with bumps, characterized in that it is attached using 請求項1記載のバンプ付き基板用チャックのゲルシートの表面にバンプ付き基板のバンプ面をゲルシート側に対向させながら基板裏面を押圧してバンプ面をゲルシート厚み内に埋没させて固定し、ついで、砥石を用いて前記バンプ付き基板裏面を研削加工して基板厚みを減少させることを特徴とする、バンプ付き基板の裏面研削加工方法。 The bump surface of the substrate with bumps is pressed against the gel sheet side while pressing the back surface of the substrate while the bump surface of the substrate with bumps is opposed to the gel sheet side, and the bump surface is buried in the gel sheet thickness and fixed. A method for grinding a back surface of a substrate with bumps, wherein the back surface of the substrate with bumps is ground by using a substrate to reduce the substrate thickness.
JP2010092741A 2010-04-14 2010-04-14 Chuck for substrate with bumps and method for grinding rear surface of substrate with bumps by using the same Pending JP2011222877A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016207674A (en) * 2015-04-15 2016-12-08 株式会社ディスコ Cutting method of workpiece

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016207674A (en) * 2015-04-15 2016-12-08 株式会社ディスコ Cutting method of workpiece

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