IL147177A0 - Method of modifying an integrated circuit - Google Patents

Method of modifying an integrated circuit

Info

Publication number
IL147177A0
IL147177A0 IL14717700A IL14717700A IL147177A0 IL 147177 A0 IL147177 A0 IL 147177A0 IL 14717700 A IL14717700 A IL 14717700A IL 14717700 A IL14717700 A IL 14717700A IL 147177 A0 IL147177 A0 IL 147177A0
Authority
IL
Israel
Prior art keywords
modifying
integrated circuit
integrated
circuit
Prior art date
Application number
IL14717700A
Other languages
English (en)
Original Assignee
Timothy James Regan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Timothy James Regan filed Critical Timothy James Regan
Publication of IL147177A0 publication Critical patent/IL147177A0/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0207—Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/39—Circuit design at the physical level
    • G06F30/398—Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Theoretical Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
IL14717700A 1999-06-21 2000-06-21 Method of modifying an integrated circuit IL147177A0 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB9914380.2A GB9914380D0 (en) 1999-06-21 1999-06-21 Method of scaling an integrated circuit
PCT/GB2000/002256 WO2000079595A1 (en) 1999-06-21 2000-06-21 Method of modifying an integrated circuit

Publications (1)

Publication Number Publication Date
IL147177A0 true IL147177A0 (en) 2002-08-14

Family

ID=10855703

Family Applications (1)

Application Number Title Priority Date Filing Date
IL14717700A IL147177A0 (en) 1999-06-21 2000-06-21 Method of modifying an integrated circuit

Country Status (10)

Country Link
US (1) US6756242B1 (ja)
EP (1) EP1188186A1 (ja)
JP (1) JP2003502769A (ja)
KR (1) KR20020027363A (ja)
CN (1) CN1369114A (ja)
AU (1) AU5543600A (ja)
CA (1) CA2374211A1 (ja)
GB (1) GB9914380D0 (ja)
IL (1) IL147177A0 (ja)
WO (1) WO2000079595A1 (ja)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7036103B2 (en) * 1999-10-14 2006-04-25 Synopsys, Inc. Detailed placer for optimizing high density cell placement in a linear runtime
US6985843B2 (en) * 2001-06-11 2006-01-10 Nec Electronics America, Inc. Cell modeling in the design of an integrated circuit
US7089524B1 (en) * 2002-01-22 2006-08-08 Cadence Design Systems, Inc. Topological vias route wherein the topological via does not have a coordinate within the region
US7149991B2 (en) * 2002-05-30 2006-12-12 Nec Electronics America, Inc. Calibrating a wire load model for an integrated circuit
US6904575B2 (en) * 2002-06-11 2005-06-07 International Business Machines Corporation Method for improving chip yields in the presence of via flaring
US7363236B2 (en) * 2003-03-14 2008-04-22 Chartered Semiconductor Manufacturing Ltd. System, apparatus and method for reticle grade and pricing management
US7069533B2 (en) * 2003-03-14 2006-06-27 Chatered Semiconductor Manufacturing, Ltd System, apparatus and method for automated tapeout support
US7055114B2 (en) * 2003-10-08 2006-05-30 Hewlett-Packard Development Company, L.P. Systems and processes for asymmetrically shrinking a VLSI layout
US7093211B1 (en) * 2003-11-03 2006-08-15 General Electric Company Techniques for modeling current spreading uniformity in light emitting diodes
US20050114808A1 (en) * 2003-11-24 2005-05-26 Mcbride John G. Framework for accurate design rule checking
US7120887B2 (en) * 2004-01-16 2006-10-10 International Business Machines Corporation Cloned and original circuit shape merging
US7448012B1 (en) 2004-04-21 2008-11-04 Qi-De Qian Methods and system for improving integrated circuit layout
US7363601B2 (en) 2004-10-15 2008-04-22 International Business Machines Corporation Integrated circuit selective scaling
US7302651B2 (en) 2004-10-29 2007-11-27 International Business Machines Corporation Technology migration for integrated circuits with radical design restrictions
JP4377342B2 (ja) * 2005-01-18 2009-12-02 Ｎｅｃエレクトロニクス株式会社 半導体集積回路、レイアウト方法、レイアウト装置及びレイアウトプログラム
US7406671B2 (en) * 2005-10-05 2008-07-29 Lsi Corporation Method for performing design rule check of integrated circuit
JP4674164B2 (ja) * 2006-01-11 2011-04-20 富士通セミコンダクター株式会社 レイアウト方法、ｃａｄ装置、プログラム及び記憶媒体
US20080022250A1 (en) * 2006-07-20 2008-01-24 Charudhattan Nagarajan Chip finishing using a library based approach
US7823103B2 (en) * 2006-10-24 2010-10-26 International Business Machines Corporation Method and system of introducing hierarchy into design rule checking test cases and rotation of test case data
US20080201677A1 (en) * 2007-02-21 2008-08-21 Faye Baker Integrated Circuit (IC) Chip Input/Output (I/O) Cell Design Optimization Method And IC chip With Optimized I/O Cells
US7818692B2 (en) * 2007-11-29 2010-10-19 International Business Machines Corporation Automated optimization of device structure during circuit design stage
US8013400B1 (en) * 2008-04-21 2011-09-06 National Semiconductor Corporation Method and system for scaling channel length
JP2010021187A (ja) * 2008-07-08 2010-01-28 Nec Electronics Corp 半導体集積回路の設計方法、設計プログラム、及び半導体集積回路の製造方法
US8775979B2 (en) * 2010-01-30 2014-07-08 Synopsys. Inc. Failure analysis using design rules
US8504965B2 (en) * 2010-09-30 2013-08-06 Taiwan Semiconductor Manufacturing Company, Ltd. Method for non-shrinkable IP integration
US8627247B1 (en) * 2012-07-11 2014-01-07 International Business Machines Corporation Systems and methods for fixing pin mismatch in layout migration
US9070551B2 (en) * 2013-06-18 2015-06-30 Qualcomm Incorporated Method and apparatus for a diffusion bridged cell library
US9292649B2 (en) * 2013-11-18 2016-03-22 Taiwan Semiconductor Manufacturing Co., Ltd. Different scaling ratio in FEOL / MOL/ BEOL
US9940428B2 (en) * 2014-10-07 2018-04-10 Mentor Graphics Corporation Hierarchical fill in a design layout
CN105989202B (zh) * 2015-02-04 2019-04-09 中芯国际集成电路制造(上海)有限公司 一种对版图进行drc验证的方法
US9594864B2 (en) 2015-04-22 2017-03-14 Qualcomm Incorporated Method for asymmetrical geometrical scaling
DE102017127276A1 (de) * 2017-08-30 2019-02-28 Taiwan Semiconductor Manufacturing Co., Ltd. Standardzellen und abwandlungen davon innerhalb einer standardzellenbibliothek
US10552567B2 (en) 2018-01-17 2020-02-04 Globalfoundries Inc. Automated redesign of integrated circuits using relaxed spacing rules

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4630219A (en) * 1983-11-23 1986-12-16 International Business Machines Corporation Element placement method
JPH03142934A (ja) 1989-10-30 1991-06-18 Mitsubishi Electric Corp 半導体集積回路装置の配線接続構造
JP2863239B2 (ja) 1990-01-17 1999-03-03 富士通株式会社 半導体集積回路のシミュレーション方法
US5862260A (en) * 1993-11-18 1999-01-19 Digimarc Corporation Methods for surveying dissemination of proprietary empirical data
US5625568A (en) 1993-12-22 1997-04-29 Vlsi Technology, Inc. Method and apparatus for compacting integrated circuits with standard cell architectures
US5856754A (en) 1996-01-16 1999-01-05 Matsushita Electric Industrial Co., Ltd. Semiconductor integrated circuit with parallel/serial/parallel conversion
US5936868A (en) * 1997-03-06 1999-08-10 Harris Corporation Method for converting an integrated circuit design for an upgraded process
US6279142B1 (en) * 1998-10-02 2001-08-21 International Business Machines Corporation Method of on-chip interconnect design
US6381730B1 (en) * 1999-07-09 2002-04-30 Sequence Design, Inc. Method and system for extraction of parasitic interconnect impedance including inductance

Also Published As

Publication number Publication date
WO2000079595A1 (en) 2000-12-28
JP2003502769A (ja) 2003-01-21
CN1369114A (zh) 2002-09-11
EP1188186A1 (en) 2002-03-20
GB9914380D0 (en) 1999-08-18
US6756242B1 (en) 2004-06-29
AU5543600A (en) 2001-01-09
CA2374211A1 (en) 2000-12-28
KR20020027363A (ko) 2002-04-13

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