FI822993A0 - Maetfoenster till refraktometer - Google Patents
Maetfoenster till refraktometerInfo
- Publication number
- FI822993A0 FI822993A0 FI822993A FI822993A FI822993A0 FI 822993 A0 FI822993 A0 FI 822993A0 FI 822993 A FI822993 A FI 822993A FI 822993 A FI822993 A FI 822993A FI 822993 A0 FI822993 A0 FI 822993A0
- Authority
- FI
- Finland
- Prior art keywords
- maetfoenster
- refraktometer
- till
- till refraktometer
- maetfoenster till
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI822993A FI65496C (fi) | 1982-08-30 | 1982-08-30 | Maetfoenster foer processrefraktometer |
US06/515,485 US4571075A (en) | 1982-08-30 | 1983-07-20 | Measuring window for a process refractometer |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI822993A FI65496C (fi) | 1982-08-30 | 1982-08-30 | Maetfoenster foer processrefraktometer |
FI822993 | 1982-08-30 |
Publications (3)
Publication Number | Publication Date |
---|---|
FI822993A0 true FI822993A0 (fi) | 1982-08-30 |
FI65496B FI65496B (fi) | 1984-01-31 |
FI65496C FI65496C (fi) | 1984-05-10 |
Family
ID=8515967
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI822993A FI65496C (fi) | 1982-08-30 | 1982-08-30 | Maetfoenster foer processrefraktometer |
Country Status (2)
Country | Link |
---|---|
US (1) | US4571075A (fi) |
FI (1) | FI65496C (fi) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4834104A (en) * | 1985-08-01 | 1989-05-30 | C. R. Bard, Inc. | Method and apparatus for measuring specific gravity of a flowing liquid |
USH1470H (en) * | 1994-03-28 | 1995-08-01 | Ewing Kenneth J | Refractive index-based sensor for the discrimination of chlorinated hydrocarbons from groundwater |
FR2743146B1 (fr) * | 1995-12-29 | 1998-02-13 | Gaz De France | Refractometre et procede pour mesurer l'indice, ou la variation d'indice, de refraction d'un fluide ou d'un corps visqueux |
US5870185A (en) * | 1996-10-21 | 1999-02-09 | C.F.C. Technology, Inc. | Apparatus and method for fluid analysis |
US6387705B1 (en) | 2000-05-02 | 2002-05-14 | Equilone Enterprises, Llc | Alkylation process using refractive index analyzer |
JP2004150923A (ja) * | 2002-10-30 | 2004-05-27 | Atago:Kk | 屈折計 |
US20060191571A1 (en) * | 2005-02-11 | 2006-08-31 | Kattler David R | Fluid concentration sensing arrangement |
DE102007050731B3 (de) * | 2007-10-22 | 2009-01-08 | Flexim Flexible Industriemesstechnik Gmbh | Durchlicht-Refraktometer |
US20100025112A1 (en) * | 2008-07-29 | 2010-02-04 | Baker Hughes Incorporated | In-situ refraction apparatus and method |
US9038451B2 (en) * | 2010-07-08 | 2015-05-26 | Baker Hughes Incorporated | Optical method for determining fouling of crude and heavy fuels |
FI20135064L (fi) | 2013-01-23 | 2014-07-24 | Janesko Oy | Menetelmä taitekertoimen mittaamiseksi ja refraktometri |
US9063080B2 (en) | 2013-07-26 | 2015-06-23 | Ecolab Usa Inc. | Method of deposition monitoring |
FI128037B (fi) | 2015-06-29 | 2019-08-15 | Janesko Oy | Sovitelma refraktometrin mittaikkunan yhteydessä ja refraktometri |
DE202016101446U1 (de) | 2016-03-16 | 2017-06-19 | Flexim Flexible Industriemesstechnik Gmbh | Prozessrefraktometer |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE113777C (fi) * | ||||
FR1383146A (fr) * | 1963-11-14 | 1964-12-24 | Centre Nat Rech Scient | Réfractomètre à réflexion |
GB1151301A (en) * | 1967-05-10 | 1969-05-07 | Mario Maselli | Refractometer |
US3628867A (en) * | 1969-08-20 | 1971-12-21 | Anacon Inc | Refractometer |
DE3038477A1 (de) * | 1980-10-11 | 1982-05-06 | Manfred Ing.(grad.) 2000 Hamburg Eickhorst | Refraktometer zur edelsteinuntersuchung |
-
1982
- 1982-08-30 FI FI822993A patent/FI65496C/fi not_active IP Right Cessation
-
1983
- 1983-07-20 US US06/515,485 patent/US4571075A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
FI65496C (fi) | 1984-05-10 |
FI65496B (fi) | 1984-01-31 |
US4571075A (en) | 1986-02-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MA | Patent expired |
Owner name: K-PATENTS OY |