FI822993A0 - Maetfoenster till refraktometer - Google Patents

Maetfoenster till refraktometer

Info

Publication number
FI822993A0
FI822993A0 FI822993A FI822993A FI822993A0 FI 822993 A0 FI822993 A0 FI 822993A0 FI 822993 A FI822993 A FI 822993A FI 822993 A FI822993 A FI 822993A FI 822993 A0 FI822993 A0 FI 822993A0
Authority
FI
Finland
Prior art keywords
maetfoenster
refraktometer
till
till refraktometer
maetfoenster till
Prior art date
Application number
FI822993A
Other languages
English (en)
Other versions
FI65496C (fi
FI65496B (fi
Inventor
Esko Kamrat
Original Assignee
K Patents Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by K Patents Oy filed Critical K Patents Oy
Priority to FI822993A priority Critical patent/FI65496C/fi
Publication of FI822993A0 publication Critical patent/FI822993A0/fi
Priority to US06/515,485 priority patent/US4571075A/en
Application granted granted Critical
Publication of FI65496B publication Critical patent/FI65496B/fi
Publication of FI65496C publication Critical patent/FI65496C/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI822993A 1982-08-30 1982-08-30 Maetfoenster foer processrefraktometer FI65496C (fi)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI822993A FI65496C (fi) 1982-08-30 1982-08-30 Maetfoenster foer processrefraktometer
US06/515,485 US4571075A (en) 1982-08-30 1983-07-20 Measuring window for a process refractometer

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI822993A FI65496C (fi) 1982-08-30 1982-08-30 Maetfoenster foer processrefraktometer
FI822993 1982-08-30

Publications (3)

Publication Number Publication Date
FI822993A0 true FI822993A0 (fi) 1982-08-30
FI65496B FI65496B (fi) 1984-01-31
FI65496C FI65496C (fi) 1984-05-10

Family

ID=8515967

Family Applications (1)

Application Number Title Priority Date Filing Date
FI822993A FI65496C (fi) 1982-08-30 1982-08-30 Maetfoenster foer processrefraktometer

Country Status (2)

Country Link
US (1) US4571075A (fi)
FI (1) FI65496C (fi)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4834104A (en) * 1985-08-01 1989-05-30 C. R. Bard, Inc. Method and apparatus for measuring specific gravity of a flowing liquid
USH1470H (en) * 1994-03-28 1995-08-01 Ewing Kenneth J Refractive index-based sensor for the discrimination of chlorinated hydrocarbons from groundwater
FR2743146B1 (fr) * 1995-12-29 1998-02-13 Gaz De France Refractometre et procede pour mesurer l'indice, ou la variation d'indice, de refraction d'un fluide ou d'un corps visqueux
US5870185A (en) * 1996-10-21 1999-02-09 C.F.C. Technology, Inc. Apparatus and method for fluid analysis
US6387705B1 (en) 2000-05-02 2002-05-14 Equilone Enterprises, Llc Alkylation process using refractive index analyzer
JP2004150923A (ja) * 2002-10-30 2004-05-27 Atago:Kk 屈折計
US20060191571A1 (en) * 2005-02-11 2006-08-31 Kattler David R Fluid concentration sensing arrangement
DE102007050731B3 (de) * 2007-10-22 2009-01-08 Flexim Flexible Industriemesstechnik Gmbh Durchlicht-Refraktometer
US20100025112A1 (en) * 2008-07-29 2010-02-04 Baker Hughes Incorporated In-situ refraction apparatus and method
US9038451B2 (en) * 2010-07-08 2015-05-26 Baker Hughes Incorporated Optical method for determining fouling of crude and heavy fuels
FI20135064L (fi) 2013-01-23 2014-07-24 Janesko Oy Menetelmä taitekertoimen mittaamiseksi ja refraktometri
US9063080B2 (en) 2013-07-26 2015-06-23 Ecolab Usa Inc. Method of deposition monitoring
FI128037B (fi) 2015-06-29 2019-08-15 Janesko Oy Sovitelma refraktometrin mittaikkunan yhteydessä ja refraktometri
DE202016101446U1 (de) 2016-03-16 2017-06-19 Flexim Flexible Industriemesstechnik Gmbh Prozessrefraktometer

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE113777C (fi) *
FR1383146A (fr) * 1963-11-14 1964-12-24 Centre Nat Rech Scient Réfractomètre à réflexion
GB1151301A (en) * 1967-05-10 1969-05-07 Mario Maselli Refractometer
US3628867A (en) * 1969-08-20 1971-12-21 Anacon Inc Refractometer
DE3038477A1 (de) * 1980-10-11 1982-05-06 Manfred Ing.(grad.) 2000 Hamburg Eickhorst Refraktometer zur edelsteinuntersuchung

Also Published As

Publication number Publication date
FI65496C (fi) 1984-05-10
FI65496B (fi) 1984-01-31
US4571075A (en) 1986-02-18

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Legal Events

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MA Patent expired

Owner name: K-PATENTS OY