DE69423023D1 - Zerstörungsfreie Testvorrichtung mit magnetischem Sensor vom SQUID-Typ - Google Patents

Zerstörungsfreie Testvorrichtung mit magnetischem Sensor vom SQUID-Typ

Info

Publication number
DE69423023D1
DE69423023D1 DE69423023T DE69423023T DE69423023D1 DE 69423023 D1 DE69423023 D1 DE 69423023D1 DE 69423023 T DE69423023 T DE 69423023T DE 69423023 T DE69423023 T DE 69423023T DE 69423023 D1 DE69423023 D1 DE 69423023D1
Authority
DE
Germany
Prior art keywords
magnetic sensor
test device
destructive test
squid type
squid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69423023T
Other languages
English (en)
Other versions
DE69423023T2 (de
Inventor
Hirokazu Kugai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Application granted granted Critical
Publication of DE69423023D1 publication Critical patent/DE69423023D1/de
Publication of DE69423023T2 publication Critical patent/DE69423023T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/035—Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/022—Measuring gradient
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/035—Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
    • G01R33/0354—SQUIDS
    • G01R33/0358—SQUIDS coupling the flux to the SQUID
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/825—Apparatus per se, device per se, or process of making or operating same
    • Y10S505/842—Measuring and testing
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/825—Apparatus per se, device per se, or process of making or operating same
    • Y10S505/842—Measuring and testing
    • Y10S505/843—Electrical
    • Y10S505/845—Magnetometer
    • Y10S505/846—Magnetometer using superconductive quantum interference device, i.e. squid

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measuring Magnetic Variables (AREA)
DE69423023T 1993-07-12 1994-07-12 Zerstörungsfreie Testvorrichtung mit magnetischem Sensor vom SQUID-Typ Expired - Fee Related DE69423023T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP19512593 1993-07-12
JP34883793 1993-12-27

Publications (2)

Publication Number Publication Date
DE69423023D1 true DE69423023D1 (de) 2000-03-23
DE69423023T2 DE69423023T2 (de) 2000-10-19

Family

ID=26508937

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69423023T Expired - Fee Related DE69423023T2 (de) 1993-07-12 1994-07-12 Zerstörungsfreie Testvorrichtung mit magnetischem Sensor vom SQUID-Typ

Country Status (3)

Country Link
US (2) US5589772A (de)
EP (1) EP0634663B1 (de)
DE (1) DE69423023T2 (de)

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DE19546670C2 (de) * 1995-12-14 2001-08-30 Inst Luft Kaeltetech Gem Gmbh Mobiles SQUID-System
ES2112788B1 (es) * 1996-04-01 1999-01-01 Grupo Rayma S A Instalacion y metodo para medir campos magneticos muy pequeños.
JPH1010091A (ja) * 1996-06-21 1998-01-16 Sumitomo Electric Ind Ltd 磁性体微粉の検出装置
RU2124755C1 (ru) * 1997-05-16 1999-01-10 Акционерное общество закрытого типа "Тетра" Способ записи и считывания информации
WO2000057200A1 (en) * 1999-03-24 2000-09-28 Case Western Reserve University Apparatus and method for determining magnetic susceptibility
US6320375B1 (en) 1999-09-21 2001-11-20 The Boeing Company Method for detection of rare earth metal oxide inclusions in titanium and other non-magnetic or metal alloy castings
JP2001255358A (ja) * 2000-03-10 2001-09-21 Sumitomo Electric Ind Ltd 磁気センサ
AU2001270299A1 (en) * 2000-07-03 2002-01-14 Kodiak Technologies, Inc. Thermal container with data monitoring system
US6400146B1 (en) 2000-09-12 2002-06-04 Her Majesty The Queen In Right Of Canada As Represented By The Ministry Of Natural Resources Sensor head for ACFM based crack detection
GB2425610A (en) * 2005-04-29 2006-11-01 Univ London Magnetic properties sensing system
WO2007038820A1 (en) * 2005-10-06 2007-04-12 Technological Resources Pty Limited Gravity gradiometer
AU2007249127A1 (en) 2006-11-20 2008-06-05 Technological Resources Pty. Limited A gravity gradiometer
CA2690886A1 (en) * 2006-11-20 2008-05-29 Technological Resources Pty Limited A gravity gradiometer
CA2690958C (en) * 2006-11-20 2015-06-30 Technological Resources Pty Limited A gravity gradiometer
WO2008061273A1 (en) * 2006-11-20 2008-05-29 Technological Resources Pty Limited A gravity gradiometer
CA2691032A1 (en) 2006-11-20 2008-05-29 Technological Resources Pty Limited A gravity gradiometer
CA2690893A1 (en) * 2006-11-20 2008-05-29 Technological Resources Pty Limited A gravity gradiometer
ZA200710809B (en) * 2006-11-23 2009-03-25 Tech Resources Pty Ltd Gravity gradiometer
JP2010510496A (ja) * 2006-11-23 2010-04-02 テクノロジカル リソーシーズ プロプライエタリー リミテッド 重力グラジオ・メータ
ZA200710808B (en) 2006-11-23 2009-03-25 Tech Resources Pty Ltd Gravity gradiometer
EP1949140A4 (de) * 2006-11-23 2010-12-08 Tech Resources Pty Ltd Schwerkraftgradientenmesser
CA2612860C (en) 2006-11-23 2015-02-03 Technological Resources Pty Limited Gravity gradiometer
ZA200710807B (en) 2006-11-23 2009-09-30 Tech Resources Pty Ltd Gravity gradiometer
WO2008061283A1 (en) * 2006-11-23 2008-05-29 Technological Resources Pty. Limited Compensation for unwanted accelerations in a gravity gradiometer
US8802331B2 (en) * 2010-11-30 2014-08-12 Bloom Energy Corporation Non-destructive testing methods for fuel cell interconnect manufacturing
ITMI20112451A1 (it) * 2011-12-30 2013-07-01 Eni Spa Apparato e metodo per monitorare l'integrita' strutturale di una condotta mediante magnete superconduttore
WO2014053047A1 (en) 2012-10-04 2014-04-10 Her Majesty The Queen In Right Of Canada As Represented By The Minister Of Natural Resources Canada Measurement of lay length of wire rope
US9618458B2 (en) 2013-01-08 2017-04-11 Bloom Energy Corporation Optical measurement method and apparatus for fuel cell components
US9678501B2 (en) 2013-01-08 2017-06-13 Bloom Energy Corporation Serialization of fuel cell components
US9958406B1 (en) 2013-12-06 2018-05-01 Bloom Energy Corporation Method of measurement and estimation of the coefficient of thermal expansion in components
US9678169B2 (en) * 2014-07-09 2017-06-13 Voltafield Technology Corp. Testing assembly for testing magnetic sensor and method for testing magnetic sensor
US9945815B2 (en) 2014-07-10 2018-04-17 Bloom Energy Corporation Methods and systems for detecting defects in a fuel cell stack

Family Cites Families (16)

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Publication number Priority date Publication date Assignee Title
JPS5441187A (en) * 1977-09-08 1979-04-02 Nippon Kokan Kk Device for detecting surface flaw of columnar or cylindrical metal
US4613816A (en) * 1984-04-03 1986-09-23 Geo-Sensors Corporation Cryogenic magnetic probe having new substrate
GB2166248B (en) * 1984-10-30 1988-01-20 British Gas Corp Detecting resistance faults
DE3515199A1 (de) * 1985-04-26 1986-11-06 Siemens AG, 1000 Berlin und 8000 München Vorrichtung zur messung schwacher magnetfelder mit mehreren gradiometern
DE3532654A1 (de) * 1985-09-13 1987-03-26 Thyssen Industrie Oberflaechenpruefeinrichtung mit konturnachform-fuehrungssystem
US5059903A (en) * 1987-09-21 1991-10-22 Hitachi, Ltd. Method and apparatus utilizing a magnetic field for detecting degradation of metal material
US4906607A (en) * 1988-04-06 1990-03-06 Drexel University Sensor and method for indicating the presence of a low magnetic field using high critical temperature superconductor ceramic material to absorb electromagnetic energy
US4982158A (en) * 1988-06-23 1991-01-01 Electric Power Research Institute, Inc. Method and apparatus for magnetic detection of flaws
JP2613275B2 (ja) * 1988-09-16 1997-05-21 株式会社日立製作所 超電導量子干渉素子を用いた磁束計
US5004724A (en) * 1989-03-09 1991-04-02 International Superconductor Corp. Superconductive quantum interference device for the non-destructive evaluation of metals
JPH0614111B2 (ja) * 1989-03-17 1994-02-23 新技術事業団 磁束分布測定装置
USH879H (en) * 1989-06-30 1991-01-01 The United States Of America As Represented By The Secretary Of The Navy Method and device for inspecting circumferentially conducting materials
US5331278A (en) * 1990-09-11 1994-07-19 Hitachi, Ltd. Apparatus for inspecting degradation/damage of a material using an AC magnet, a superconducting DC magnet and a SQUID sensor
US5109196A (en) * 1991-03-05 1992-04-28 Vanderbilt University Method and apparatus for magnetic identification and localization of flaws in conductors by canceling the field about the conductor with the field about a flawless conductor
US5293119A (en) * 1992-02-20 1994-03-08 Sqm Technology, Inc. Electromagnetic microscope for evaluation of electrically conductive and magnetic materials
US5430376A (en) * 1993-06-09 1995-07-04 General Electric Company Combined thermoelectric and eddy-current method and apparatus for nondestructive testing of metallic of semiconductor coated objects

Also Published As

Publication number Publication date
US5589772A (en) 1996-12-31
US5990678A (en) 1999-11-23
EP0634663A1 (de) 1995-01-18
DE69423023T2 (de) 2000-10-19
EP0634663B1 (de) 2000-02-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee