DE69423023D1 - Zerstörungsfreie Testvorrichtung mit magnetischem Sensor vom SQUID-Typ - Google Patents
Zerstörungsfreie Testvorrichtung mit magnetischem Sensor vom SQUID-TypInfo
- Publication number
- DE69423023D1 DE69423023D1 DE69423023T DE69423023T DE69423023D1 DE 69423023 D1 DE69423023 D1 DE 69423023D1 DE 69423023 T DE69423023 T DE 69423023T DE 69423023 T DE69423023 T DE 69423023T DE 69423023 D1 DE69423023 D1 DE 69423023D1
- Authority
- DE
- Germany
- Prior art keywords
- magnetic sensor
- test device
- destructive test
- squid type
- squid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/035—Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/022—Measuring gradient
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/035—Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
- G01R33/0354—SQUIDS
- G01R33/0358—SQUIDS coupling the flux to the SQUID
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S505/00—Superconductor technology: apparatus, material, process
- Y10S505/825—Apparatus per se, device per se, or process of making or operating same
- Y10S505/842—Measuring and testing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S505/00—Superconductor technology: apparatus, material, process
- Y10S505/825—Apparatus per se, device per se, or process of making or operating same
- Y10S505/842—Measuring and testing
- Y10S505/843—Electrical
- Y10S505/845—Magnetometer
- Y10S505/846—Magnetometer using superconductive quantum interference device, i.e. squid
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Electrochemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Measuring Magnetic Variables (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19512593 | 1993-07-12 | ||
JP34883793 | 1993-12-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69423023D1 true DE69423023D1 (de) | 2000-03-23 |
DE69423023T2 DE69423023T2 (de) | 2000-10-19 |
Family
ID=26508937
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69423023T Expired - Fee Related DE69423023T2 (de) | 1993-07-12 | 1994-07-12 | Zerstörungsfreie Testvorrichtung mit magnetischem Sensor vom SQUID-Typ |
Country Status (3)
Country | Link |
---|---|
US (2) | US5589772A (de) |
EP (1) | EP0634663B1 (de) |
DE (1) | DE69423023T2 (de) |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19546670C2 (de) * | 1995-12-14 | 2001-08-30 | Inst Luft Kaeltetech Gem Gmbh | Mobiles SQUID-System |
ES2112788B1 (es) * | 1996-04-01 | 1999-01-01 | Grupo Rayma S A | Instalacion y metodo para medir campos magneticos muy pequeños. |
JPH1010091A (ja) * | 1996-06-21 | 1998-01-16 | Sumitomo Electric Ind Ltd | 磁性体微粉の検出装置 |
RU2124755C1 (ru) * | 1997-05-16 | 1999-01-10 | Акционерное общество закрытого типа "Тетра" | Способ записи и считывания информации |
WO2000057200A1 (en) * | 1999-03-24 | 2000-09-28 | Case Western Reserve University | Apparatus and method for determining magnetic susceptibility |
US6320375B1 (en) | 1999-09-21 | 2001-11-20 | The Boeing Company | Method for detection of rare earth metal oxide inclusions in titanium and other non-magnetic or metal alloy castings |
JP2001255358A (ja) * | 2000-03-10 | 2001-09-21 | Sumitomo Electric Ind Ltd | 磁気センサ |
AU2001270299A1 (en) * | 2000-07-03 | 2002-01-14 | Kodiak Technologies, Inc. | Thermal container with data monitoring system |
US6400146B1 (en) | 2000-09-12 | 2002-06-04 | Her Majesty The Queen In Right Of Canada As Represented By The Ministry Of Natural Resources | Sensor head for ACFM based crack detection |
GB2425610A (en) * | 2005-04-29 | 2006-11-01 | Univ London | Magnetic properties sensing system |
WO2007038820A1 (en) * | 2005-10-06 | 2007-04-12 | Technological Resources Pty Limited | Gravity gradiometer |
AU2007249127A1 (en) | 2006-11-20 | 2008-06-05 | Technological Resources Pty. Limited | A gravity gradiometer |
CA2690886A1 (en) * | 2006-11-20 | 2008-05-29 | Technological Resources Pty Limited | A gravity gradiometer |
CA2690958C (en) * | 2006-11-20 | 2015-06-30 | Technological Resources Pty Limited | A gravity gradiometer |
WO2008061273A1 (en) * | 2006-11-20 | 2008-05-29 | Technological Resources Pty Limited | A gravity gradiometer |
CA2691032A1 (en) | 2006-11-20 | 2008-05-29 | Technological Resources Pty Limited | A gravity gradiometer |
CA2690893A1 (en) * | 2006-11-20 | 2008-05-29 | Technological Resources Pty Limited | A gravity gradiometer |
ZA200710809B (en) * | 2006-11-23 | 2009-03-25 | Tech Resources Pty Ltd | Gravity gradiometer |
JP2010510496A (ja) * | 2006-11-23 | 2010-04-02 | テクノロジカル リソーシーズ プロプライエタリー リミテッド | 重力グラジオ・メータ |
ZA200710808B (en) | 2006-11-23 | 2009-03-25 | Tech Resources Pty Ltd | Gravity gradiometer |
EP1949140A4 (de) * | 2006-11-23 | 2010-12-08 | Tech Resources Pty Ltd | Schwerkraftgradientenmesser |
CA2612860C (en) | 2006-11-23 | 2015-02-03 | Technological Resources Pty Limited | Gravity gradiometer |
ZA200710807B (en) | 2006-11-23 | 2009-09-30 | Tech Resources Pty Ltd | Gravity gradiometer |
WO2008061283A1 (en) * | 2006-11-23 | 2008-05-29 | Technological Resources Pty. Limited | Compensation for unwanted accelerations in a gravity gradiometer |
US8802331B2 (en) * | 2010-11-30 | 2014-08-12 | Bloom Energy Corporation | Non-destructive testing methods for fuel cell interconnect manufacturing |
ITMI20112451A1 (it) * | 2011-12-30 | 2013-07-01 | Eni Spa | Apparato e metodo per monitorare l'integrita' strutturale di una condotta mediante magnete superconduttore |
WO2014053047A1 (en) | 2012-10-04 | 2014-04-10 | Her Majesty The Queen In Right Of Canada As Represented By The Minister Of Natural Resources Canada | Measurement of lay length of wire rope |
US9618458B2 (en) | 2013-01-08 | 2017-04-11 | Bloom Energy Corporation | Optical measurement method and apparatus for fuel cell components |
US9678501B2 (en) | 2013-01-08 | 2017-06-13 | Bloom Energy Corporation | Serialization of fuel cell components |
US9958406B1 (en) | 2013-12-06 | 2018-05-01 | Bloom Energy Corporation | Method of measurement and estimation of the coefficient of thermal expansion in components |
US9678169B2 (en) * | 2014-07-09 | 2017-06-13 | Voltafield Technology Corp. | Testing assembly for testing magnetic sensor and method for testing magnetic sensor |
US9945815B2 (en) | 2014-07-10 | 2018-04-17 | Bloom Energy Corporation | Methods and systems for detecting defects in a fuel cell stack |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5441187A (en) * | 1977-09-08 | 1979-04-02 | Nippon Kokan Kk | Device for detecting surface flaw of columnar or cylindrical metal |
US4613816A (en) * | 1984-04-03 | 1986-09-23 | Geo-Sensors Corporation | Cryogenic magnetic probe having new substrate |
GB2166248B (en) * | 1984-10-30 | 1988-01-20 | British Gas Corp | Detecting resistance faults |
DE3515199A1 (de) * | 1985-04-26 | 1986-11-06 | Siemens AG, 1000 Berlin und 8000 München | Vorrichtung zur messung schwacher magnetfelder mit mehreren gradiometern |
DE3532654A1 (de) * | 1985-09-13 | 1987-03-26 | Thyssen Industrie | Oberflaechenpruefeinrichtung mit konturnachform-fuehrungssystem |
US5059903A (en) * | 1987-09-21 | 1991-10-22 | Hitachi, Ltd. | Method and apparatus utilizing a magnetic field for detecting degradation of metal material |
US4906607A (en) * | 1988-04-06 | 1990-03-06 | Drexel University | Sensor and method for indicating the presence of a low magnetic field using high critical temperature superconductor ceramic material to absorb electromagnetic energy |
US4982158A (en) * | 1988-06-23 | 1991-01-01 | Electric Power Research Institute, Inc. | Method and apparatus for magnetic detection of flaws |
JP2613275B2 (ja) * | 1988-09-16 | 1997-05-21 | 株式会社日立製作所 | 超電導量子干渉素子を用いた磁束計 |
US5004724A (en) * | 1989-03-09 | 1991-04-02 | International Superconductor Corp. | Superconductive quantum interference device for the non-destructive evaluation of metals |
JPH0614111B2 (ja) * | 1989-03-17 | 1994-02-23 | 新技術事業団 | 磁束分布測定装置 |
USH879H (en) * | 1989-06-30 | 1991-01-01 | The United States Of America As Represented By The Secretary Of The Navy | Method and device for inspecting circumferentially conducting materials |
US5331278A (en) * | 1990-09-11 | 1994-07-19 | Hitachi, Ltd. | Apparatus for inspecting degradation/damage of a material using an AC magnet, a superconducting DC magnet and a SQUID sensor |
US5109196A (en) * | 1991-03-05 | 1992-04-28 | Vanderbilt University | Method and apparatus for magnetic identification and localization of flaws in conductors by canceling the field about the conductor with the field about a flawless conductor |
US5293119A (en) * | 1992-02-20 | 1994-03-08 | Sqm Technology, Inc. | Electromagnetic microscope for evaluation of electrically conductive and magnetic materials |
US5430376A (en) * | 1993-06-09 | 1995-07-04 | General Electric Company | Combined thermoelectric and eddy-current method and apparatus for nondestructive testing of metallic of semiconductor coated objects |
-
1994
- 1994-07-12 EP EP94110840A patent/EP0634663B1/de not_active Expired - Lifetime
- 1994-07-12 US US08/273,947 patent/US5589772A/en not_active Expired - Fee Related
- 1994-07-12 DE DE69423023T patent/DE69423023T2/de not_active Expired - Fee Related
-
1996
- 1996-05-24 US US08/653,328 patent/US5990678A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US5589772A (en) | 1996-12-31 |
US5990678A (en) | 1999-11-23 |
EP0634663A1 (de) | 1995-01-18 |
DE69423023T2 (de) | 2000-10-19 |
EP0634663B1 (de) | 2000-02-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |