DE10216003B4 - Dockingvorrichtung - Google Patents
Dockingvorrichtung Download PDFInfo
- Publication number
- DE10216003B4 DE10216003B4 DE10216003A DE10216003A DE10216003B4 DE 10216003 B4 DE10216003 B4 DE 10216003B4 DE 10216003 A DE10216003 A DE 10216003A DE 10216003 A DE10216003 A DE 10216003A DE 10216003 B4 DE10216003 B4 DE 10216003B4
- Authority
- DE
- Germany
- Prior art keywords
- docking device
- docking
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Clamps And Clips (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10216003A DE10216003B4 (de) | 2002-04-11 | 2002-04-11 | Dockingvorrichtung |
US10/412,155 US6870362B2 (en) | 2002-04-11 | 2003-04-11 | Docking apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10216003A DE10216003B4 (de) | 2002-04-11 | 2002-04-11 | Dockingvorrichtung |
Publications (2)
Publication Number | Publication Date |
---|---|
DE10216003A1 DE10216003A1 (de) | 2003-11-06 |
DE10216003B4 true DE10216003B4 (de) | 2005-03-10 |
Family
ID=28798373
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE10216003A Expired - Fee Related DE10216003B4 (de) | 2002-04-11 | 2002-04-11 | Dockingvorrichtung |
Country Status (2)
Country | Link |
---|---|
US (1) | US6870362B2 (de) |
DE (1) | DE10216003B4 (de) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102012112271A1 (de) | 2012-12-14 | 2014-03-27 | Turbodynamics Gmbh | Zusammenführvorrichtung |
DE102016102836A1 (de) | 2016-02-18 | 2017-08-24 | Turbodynamics Gmbh | Vorrichtung zum Ausrichten von zwei Testeinheiten |
DE102023131555A1 (de) | 2022-11-18 | 2024-05-23 | Turbodynamics Gmbh | Modul zum Austauschen einer Schnittstelleneinheit, Testsystem mit einem solchen Modul, Verfahren zum Testen von Halbleiterelementen und zum Austauschen von Schnittstelleneinheiten |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6408500B1 (en) * | 2000-09-15 | 2002-06-25 | James Orsillo | Method of retrofitting a probe station |
DE10317341B4 (de) * | 2003-04-15 | 2014-03-20 | Andreas Maier Gmbh & Co. Kg | Schnellspannzylinder mit Führungseinrichtung |
DE102004031426A1 (de) * | 2004-06-29 | 2006-01-26 | Esmo Ag | Dockingantrieb, Verriegelungselement, Dockingsystem |
US7402018B2 (en) * | 2004-10-14 | 2008-07-22 | Kiva Systems, Inc. | Inventory system with mobile drive unit and inventory holder |
DE102005036808B4 (de) | 2005-08-04 | 2007-12-13 | Stefan Thurmaier | Druckmittelbetätigte Dockingvorrichtung |
DE102012103893A1 (de) | 2012-05-03 | 2013-11-07 | Turbodynamics Gmbh | Modul zum Austauschen einer Schnittstelleneinheit in einem Testsystem zum Testen von Halbleiterelementen und Testsystem mit einem solchen Modul |
DE102012018528B4 (de) * | 2012-09-19 | 2014-12-04 | Stark Spannsysteme Gmbh | Nullpunktspannsystem mit einem Rotationsantrieb |
EP3211727B1 (de) * | 2016-02-26 | 2019-06-26 | ODU GmbH & Co KG. | Steckverbinder mit rastelement und methoden zum verbinden und trennen |
DE102017104516B4 (de) | 2017-03-03 | 2021-06-10 | Turbodynamics Gmbh | Plattenförmiges Verbindungssystem zum Verbinden von zwei Testeinheiten sowie Verbindungseinheit und Testsystem mit jeweils einem solchen plattenförmigen Verbindungssystem |
CN108466791A (zh) * | 2018-05-18 | 2018-08-31 | 杭州南江机器人股份有限公司 | 一种agv小车与货架的对接结构 |
AT521254B1 (de) * | 2019-01-17 | 2019-12-15 | Cutpack Com Gmbh | Spannvorrichtung |
DE102021114564A1 (de) | 2021-06-07 | 2022-12-08 | Turbodynamics Gmbh | Docking-Vorrichtung und Verfahren zum Koppeln zweiter Vorrichtungen für Schnittstelleneinheiten, Dispositionssystem und Docking-Element |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0752588A2 (de) * | 1995-07-05 | 1997-01-08 | Tokyo Electron Limited | Testeinrichtung |
US6104202A (en) * | 1994-09-01 | 2000-08-15 | Aesop, Inc. | Interface apparatus for automatic test equipment |
US6271658B1 (en) * | 1998-10-19 | 2001-08-07 | St Assembly Test Services Pte, Ltd. | Universal Docking System |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4665360A (en) * | 1985-03-11 | 1987-05-12 | Eaton Corporation | Docking apparatus |
US5552701A (en) * | 1995-05-15 | 1996-09-03 | Hewlett-Packard Company | Docking system for an electronic circuit tester |
US5654631A (en) * | 1995-11-15 | 1997-08-05 | Xilinx, Inc. | Vacuum lock handler and tester interface for semiconductor devices |
US6047541A (en) * | 1998-08-26 | 2000-04-11 | The United States Of America As Represented By The Secretary Of The Air Force | HAN TEAN (xm-46) mixing gas generator propellant tank pressurizer for launch vehicles and spacecraft |
-
2002
- 2002-04-11 DE DE10216003A patent/DE10216003B4/de not_active Expired - Fee Related
-
2003
- 2003-04-11 US US10/412,155 patent/US6870362B2/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6104202A (en) * | 1994-09-01 | 2000-08-15 | Aesop, Inc. | Interface apparatus for automatic test equipment |
EP0752588A2 (de) * | 1995-07-05 | 1997-01-08 | Tokyo Electron Limited | Testeinrichtung |
US6271658B1 (en) * | 1998-10-19 | 2001-08-07 | St Assembly Test Services Pte, Ltd. | Universal Docking System |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102012112271A1 (de) | 2012-12-14 | 2014-03-27 | Turbodynamics Gmbh | Zusammenführvorrichtung |
DE102016102836A1 (de) | 2016-02-18 | 2017-08-24 | Turbodynamics Gmbh | Vorrichtung zum Ausrichten von zwei Testeinheiten |
DE102023131555A1 (de) | 2022-11-18 | 2024-05-23 | Turbodynamics Gmbh | Modul zum Austauschen einer Schnittstelleneinheit, Testsystem mit einem solchen Modul, Verfahren zum Testen von Halbleiterelementen und zum Austauschen von Schnittstelleneinheiten |
Also Published As
Publication number | Publication date |
---|---|
DE10216003A1 (de) | 2003-11-06 |
US6870362B2 (en) | 2005-03-22 |
US20030218869A1 (en) | 2003-11-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
8364 | No opposition during term of opposition | ||
R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |
Effective date: 20131101 |