CN218995454U

CN218995454U - Chip testing device with limiting structure

Info

Publication number: CN218995454U
Application number: CN202223232900.8U
Authority: CN
Inventors: 江子标; 李青春
Original assignee: Shenzhen Quan Li Semiconductor Co ltd
Current assignee: Shenzhen Quan Li Semiconductor Co ltd
Priority date: 2022-11-28
Filing date: 2022-11-28
Publication date: 2023-05-09
Anticipated expiration: 2032-11-28

Abstract

The utility model relates to a chip testing device with a limiting structure, and relates to the technical field of integrated circuits. The utility model comprises an operation table, wherein a detection table is arranged above the operation table, a top plate is arranged above the operation table, the lower end of the top plate is fixedly connected with a tester, the upper end of the detection table is provided with two connecting grooves, the inner bottom walls of the two connecting grooves are provided with mounting grooves, two clamping plates are arranged above the two connecting grooves in a sliding manner, and two groups of clamping mechanisms are arranged in the mounting grooves; every fixture that sets of all includes screw rod, movable block, two springs and two connecting blocks, and movable block sliding connection is between the lateral wall of mounting groove, and fixture, grip block and detection platform cooperation, the grip block can remove and fix the chip in the upper end of detection platform, and the chip removes when preventing to detect, influences the detection effect.

Description

Chip testing device with limiting structure

Technical Field

The utility model relates to the technical field of integrated circuits, in particular to a chip testing device with a limiting structure.

Background

Integrated circuits, or microcircuits, microchips, wafers/chips, are one way in electronics to miniaturize circuits (including mainly semiconductor devices, also including passive components, etc.) and are often manufactured on semiconductor wafer surfaces.

In the prior art, when the chip is put into use, a large amount of detection and test are needed, when the chip is tested, the chip is on the test board, if the test board is subjected to external force, the chip is easy to shake, and the center position of the test board is deviated, so that the detection effect of the tester on the chip is affected.

Disclosure of Invention

According to the defects existing in the prior art, the utility model aims to provide the chip testing device with the limiting structure, which has the effects of limiting and fixing the chip at the center of the testing board and improving the testing position of the chip.

The technical aim of the utility model is realized by the following technical scheme:

the chip testing device with the limiting structure comprises an operation table, wherein a detection table is arranged above the operation table, a top plate is arranged above the operation table, a tester is fixedly connected to the lower end of the top plate, two connecting grooves are formed in the upper end of the detection table, mounting grooves are formed in the inner bottom walls of the two connecting grooves, two clamping plates are slidably arranged above the two connecting grooves, and two groups of clamping mechanisms are arranged in the mounting grooves;

each group of clamping mechanism comprises a screw, a moving block, two springs and two connecting blocks, wherein the moving block is in sliding connection between the side walls of the mounting groove, the two connecting blocks are fixedly connected to the upper ends of the moving block, the two connecting blocks are respectively in sliding connection in the two connecting grooves, the two springs are fixedly connected between the moving block and the side walls of the mounting groove, the screw is arranged on one side of the detection table, and screw threads penetrate through the side walls of the mounting groove and are propped against one side of the moving block; the four clamping plates are respectively and fixedly connected to the upper ends of the four connecting blocks.

Through adopting above-mentioned technical scheme, fixture, grip block and detection platform cooperation, the grip block can remove and fix the chip in the upper end of detection platform, and the chip removes when preventing to detect, influences the detection effect.

The present utility model may be further configured in a preferred example to: each group of clamping mechanism further comprises two limiting grooves, the two limiting grooves are formed in the inner bottom wall of the mounting groove, and the moving block is slidably connected in the two limiting grooves.

Through adopting above-mentioned technical scheme, spacing groove and movable block sliding fit can improve the removal stability of movable block.

The present utility model may be further configured in a preferred example to: the lifting groove is formed in the upper end of the operating platform, the rectangular groove is formed in the inner bottom wall of the lifting groove, a double-head screw rod is connected to one side wall of the rectangular groove in a rotating mode, two screw nuts are connected to the circumferential sides of the double-head screw rod in a threaded mode, push rods are hinged to the upper ends of the screw nuts, and the detecting platform is hinged to the upper ends of the two push rods.

Through adopting above-mentioned technical scheme, double-end lead screw, screw nut and push rod cooperation can improve the high convenience tester of detecting the platform and detect.

The present utility model may be further configured in a preferred example to: two limiting rods are fixedly connected between the side walls of the rectangular groove, and the two screw nuts are both in sliding connection with the circumferential sides of the two limiting rods.

Through adopting above-mentioned technical scheme, screw-nut and gag lever post sliding fit can make screw-nut do sharp translational motion, improves the mobility stability of detecting the platform.

The present utility model may be further configured in a preferred example to: the inner bottom wall of the lifting groove is fixedly connected with two telescopic rods, and the upper ends of the two telescopic rods are fixed with the detection table.

By adopting the technical scheme, the telescopic rod can improve the stability of the detection table.

The present utility model may be further configured in a preferred example to: one side of the operation table is hinged with a support, one side of the support is fixed with the top plate, and one side of the double-head screw rod movably penetrates through one side of the operation table and is fixedly connected with a knob.

Through adopting above-mentioned technical scheme, the knob can conveniently rotate double-end lead screw.

In summary, the present utility model includes at least one of the following beneficial technical effects:

1. be provided with tester, fixture, grip block and detection platform, rotate the screw rod, the screw rod promotes the movable block, and the spring is in tensile state, and the grip block removes along with the connecting block, and a plurality of grip blocks remove and fix the chip centre gripping in the upper end of detection platform, and the chip removes when preventing to detect, influences the detection effect.

2. The device is provided with a rectangular groove, a screw nut, a double-end screw rod, a knob, a push rod and a detection table, the knob is rotated, the knob drives the double-end screw rod to rotate, the screw nut moves on the double-end screw rod, the push rod pushes the detection table to move upwards, the detection table drives the chip to move up and down, and the chip is conveniently detected by the tester.

Drawings

Fig. 1 is a perspective view of the present embodiment;

fig. 2 is a perspective sectional view of the present embodiment;

fig. 3 is a partial enlarged view at a in fig. 2 of the present embodiment;

fig. 4 is a partial enlarged view at B in fig. 2 of the present embodiment.

In the figure, 1, an operation table; 2. a bracket; 3. a tester; 4. a detection table; 5. a clamping plate; 6. a clamping mechanism; 601. a screw; 602. a spring; 603. a limit groove; 604. a connecting block; 605. a moving block; 7. a knob; 8. rectangular grooves; 9. a screw nut; 10. a push rod; 11. double-end screw rod; 12. a limit rod; 13. a telescopic rod; 14. a mounting groove; 15. a connecting groove; 16. a lifting groove; 17. and a top plate.

Detailed Description

The present utility model will be described in further detail with reference to the accompanying drawings.

Examples:

referring to fig. 1-4, the chip testing device with the limiting structure disclosed by the utility model comprises an operation table 1, wherein a detection table 4 is arranged above the operation table 1, a top plate 17 is arranged above the operation table 1, the lower end of the top plate 17 is fixedly connected with a tester 3, two connecting grooves 15 are formed in the upper end of the detection table 4, mounting grooves 14 are formed in the inner bottom walls of the two connecting grooves 15, two clamping plates 5 are slidably arranged above the two connecting grooves 15, and two groups of clamping mechanisms 6 are arranged in the mounting grooves 14; each group of clamping mechanisms 6 comprises a screw 601, a moving block 605, two springs 602 and two connecting blocks 604, wherein the moving block 605 is slidably connected between the side walls of the mounting groove 14, the two connecting blocks 604 are fixedly connected to the upper ends of the moving block 605, the two connecting blocks 604 are respectively slidably connected in the two connecting grooves 15, the two springs 602 are fixedly connected between the moving block 605 and the side walls of the mounting groove 14, the screw 601 is arranged on one side of the detection table 4, and the screw 601 penetrates through the side walls of the mounting groove 14 in a threaded manner and abuts against one side of the moving block 605; four grip blocks 5 are fixed connection respectively in the upper end of four connecting blocks 604, every fixture of group 6 still includes two spacing grooves 603, the interior diapire in mounting groove 14 is all seted up to two spacing grooves 603, movable block 605 sliding connection is in two spacing grooves 603, spacing groove 603 and movable block 605 sliding fit, can improve movable block 605's removal stability, the screw rod 601 rotates, screw rod 601 promotes movable block 605, spring 602 is in tensile state, grip block 5 moves along with connecting block 604, a plurality of grip blocks 5 remove with the chip grip fixed in the upper end of detecting bench 4, prevent that the chip from removing during the detection, influence the detection effect.

The lifting groove 16 has been seted up to the upper end of operation panel 1, rectangular channel 8 has been seted up to the interior bottom wall of lifting groove 16, a side wall rotation of rectangular channel 8 is connected with double-end lead screw 11, the circumference side threaded connection of double-end lead screw 11 has two lead screw nuts 9, the upper end of two lead screw nuts 9 all articulates there is push rod 10, detection platform 4 articulates in the upper end of two push rods 10, double-end lead screw 11, lead screw nut 9 and push rod 10 cooperation can improve the highly convenient tester 3 of detection platform 4 and detect. Two gag levers 12 are fixedly connected between the lateral walls of the rectangular groove 8, two screw nuts 9 are all in sliding connection with the circumferential sides of the two gag levers 12, the knob 7 is rotated, the knob 7 drives the double-end screw 11 to rotate, the screw nuts 9 move on the double-end screw 11, the push rod 10 pushes the detection table 4 to move upwards, the detection table 4 drives the chip to move up and down, and the tester 3 is convenient for detecting the chip.

The inner bottom wall of the lifting groove 16 is fixedly connected with two telescopic rods 13, the upper ends of the two telescopic rods 13 are fixed with the detection table 4, and the telescopic rods 13 can improve the stability of the detection table 4. One side of the operation table 1 is hinged with a bracket 2, one side of the bracket 2 is fixed with a top plate 17, one side of the double-end screw rod 11 movably penetrates through one side of the operation table 1 and is fixedly connected with a knob 7, and the knob 7 can conveniently rotate the double-end screw rod 11.

The implementation principle of the embodiment is as follows: the screw 601 is rotated, the screw 601 promotes movable block 605, spring 602 is in tensile state, grip block 5 moves along with connecting block 604, a plurality of grip blocks 5 move with the chip centre gripping fix the upper end at detecting bench 4, prevent that the chip from moving during the detection, influence the detection effect, rotate screw 601, screw 601 promotes movable block 605, spring 602 is in tensile state, grip block 5 moves along with connecting block 604, a plurality of grip blocks 5 move with the chip centre gripping fix the upper end at detecting bench 4, prevent that the chip from moving during the detection, influence the detection effect.

What is not described in detail in this specification is prior art known to those skilled in the art.

The embodiments of the present utility model are all preferred embodiments of the present utility model, and are not intended to limit the scope of the present utility model in this way, therefore: all equivalent changes in structure, shape and principle of the utility model should be covered in the scope of protection of the utility model.

Claims

1. The utility model provides a take limit structure's chip testing device, includes operation panel (1), its characterized in that: the automatic detection device is characterized in that a detection table (4) is arranged above the operation table (1), a top plate (17) is arranged above the operation table (1), a tester (3) is fixedly connected to the lower end of the top plate (17), two connecting grooves (15) are formed in the upper end of the detection table (4), mounting grooves (14) are formed in the inner bottom walls of the two connecting grooves (15), two clamping plates (5) are slidably arranged above the two connecting grooves (15), and two groups of clamping mechanisms (6) are arranged in the mounting grooves (14);

each group of clamping mechanism (6) comprises a screw (601), a moving block (605), two springs (602) and two connecting blocks (604), wherein the moving block (605) is slidably connected between the side walls of the mounting groove (14), the two connecting blocks (604) are fixedly connected to the upper end of the moving block (605), the two connecting blocks (604) are slidably connected in the two connecting grooves (15) respectively, the two springs (602) are fixedly connected between the moving block (605) and the side walls of the mounting groove (14), the screw (601) is arranged on one side of the detection table (4), and threads of the screw (601) penetrate through the side walls of the mounting groove (14) and are propped against one side of the moving block (605); the four clamping plates (5) are respectively and fixedly connected to the upper ends of the four connecting blocks (604).

2. The chip testing device with a limiting structure according to claim 1, wherein: each group of clamping mechanisms (6) further comprises two limiting grooves (603), the two limiting grooves (603) are formed in the inner bottom wall of the mounting groove (14), and the moving block (605) is slidably connected in the two limiting grooves (603).

3. The chip testing device with a limiting structure according to claim 1, wherein: lifting groove (16) have been seted up to the upper end of operation panel (1), rectangular channel (8) have been seted up to the interior bottom wall of lifting groove (16), one side wall rotation of rectangular channel (8) is connected with double-end lead screw (11), the circumference side threaded connection of double-end lead screw (11) has two screw-nut (9), two the upper end of screw-nut (9) all articulates there is push rod (10), detection platform (4) articulates in the upper end of two push rods (10).

4. A chip testing apparatus with a limiting structure according to claim 3, wherein: two limiting rods (12) are fixedly connected between the side walls of the rectangular groove (8), and the two screw nuts (9) are both in sliding connection with the circumferential sides of the two limiting rods (12).

5. A chip testing apparatus with a limiting structure according to claim 3, wherein: the inner bottom wall of the lifting groove (16) is fixedly connected with two telescopic rods (13), and the upper ends of the two telescopic rods (13) are fixed with the detection table (4).

6. A chip testing apparatus with a limiting structure according to claim 3, wherein: one side of the operation table (1) is hinged with a support (2), one side of the support (2) is fixed with a top plate (17), and one side of the double-head screw rod (11) movably penetrates through one side of the operation table (1) and is fixedly connected with a knob (7).