CN218788048U

CN218788048U - Chip test auxiliary fixture

Info

Publication number: CN218788048U
Application number: CN202222623928.8U
Authority: CN
Inventors: 骆军瑞; 吴静; 许赛杰; 黄志成
Original assignee: Quanzhou San'an Integrated Circuit Co ltd
Current assignee: Quanzhou San'an Integrated Circuit Co ltd
Priority date: 2022-09-30
Filing date: 2022-09-30
Publication date: 2023-04-04
Anticipated expiration: 2032-09-30

Abstract

The utility model discloses a chip testing auxiliary fixture, which comprises a bracket, the operating assembly, the carriage release lever, fixed plate and contact assembly, the rotatable support of operating assembly is on the support, and articulated with the carriage release lever, the carriage release lever is connected with the fixed plate, contact assembly installs on the fixed plate, contact assembly includes middle contact assembly and peripheral contact assembly, the chip is placed on the position of predetermineeing of support, the operating assembly can drive the carriage release lever orientation and predetermine the position direction and remove, and the main part contact of contact assembly and chip in the middle of the drive, peripheral contact assembly contacts with the outer pin of chip simultaneously. The contact assembly can give different dynamics effects on the chip, and the contact uses the PI material of preventing static, effectively reduces the error that static brought, reduces the number of times of doing over again, and test mode is convenient, effectively improves the test accuracy.

Description

Chip test auxiliary fixture

Technical Field

The utility model relates to a test fixture field especially relates to a chip test auxiliary fixture.

Background

The test fixture belongs to a category under the fixture, is specially used for testing and experimenting functions, power calibration, service life, performance and the like of products, and is mainly used for testing various indexes of the products on a production line.

The existing testing jig is pressed down by a pressing head of the jig, so that pins of the chip are contacted with testing contacts of a testing board, and the performance of the chip is tested. The existing test fixture only has one pressure head and cannot be applied to a chip with an outer pin, the outer pin is not pressed by the pressure head and is difficult to contact with a test contact of a test board, and a test result has certain deviation influence and easily causes the consequence of manual rework. And current test fixture only has single mode to adjust the distance between pressure head and the test board, and the pressure head is inelastic, leads to the chip impaired easily.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to overcome the not enough of prior art existence, provide a chip testing auxiliary fixture.

In order to realize the above purpose, the technical scheme of the utility model is that:

the utility model provides a chip test auxiliary fixture, includes support, operating element, carriage release lever, fixed plate and contact assembly, operating element rotatable support in on the support, and with the carriage release lever is articulated, the carriage release lever with the fixed plate is connected, contact assembly installs on the fixed plate, contact assembly includes middle contact assembly and peripheral contact assembly, the chip place in on the preset position of support, operating element can drive the carriage release lever orientation is preset the position direction and is removed, and drives middle contact assembly with the main part contact of chip, simultaneously peripheral contact assembly with the outer pin contact of chip.

Preferably, the operation device further comprises a reinforcing plate, the reinforcing plate is fixedly connected with the support, and the operation assembly is installed on the reinforcing plate.

Preferably, the support comprises a bottom plate, a support plate and a mounting plate, the preset position is arranged on the bottom plate, the support plate is fixedly arranged on the bottom plate, the mounting plate is fixedly arranged at the top of the support plate, and the reinforcing plate can be fixed at a plurality of mounting positions with different heights on the mounting plate.

Preferably, the operating assembly comprises a pressing rod, a fixing part, a first connecting part and a second connecting part, the pressing rod is fixedly connected with the first connecting part, the fixing part is fixedly connected to the reinforcing plate, the fixing part is hinged to the first connecting part, the first connecting part is hinged to the second connecting part, and the second connecting part is hinged to the moving rod.

Preferably, when the pressing rod is pressed down, the moving rod and the contact component move towards the direction close to the bottom plate, and when the pressing rod is lifted up, the moving rod and the contact component move towards the direction far away from the bottom plate.

Preferably, the reinforcing plate is provided with a limiting part, the limiting part is provided with a first through hole for allowing the moving rod to pass through, and the moving rod passes through the first through hole to perform limiting movement.

Preferably, the movable rod fixing device further comprises an adapter plate, the adapter plate is provided with a second through hole for allowing the movable rod to penetrate through, the lower end of the movable rod is provided with threads, the lower end of the movable rod penetrates through the second through hole, the movable rod is fixed on the adapter plate through the matching of upper nuts, lower nuts and threads on the upper side and the lower side of the adapter plate, the fixing position of the movable rod and the adapter plate can be adjusted, and the adapter plate is fixedly connected with the fixing plate.

Preferably, the intermediate contact assembly and the peripheral contact assembly each comprise a plunger, an elastic piece, a plunger cover, an abutting part and a contact; the fixing plate is provided with a through threaded hole, and the plunger sealing cover is fixed on the fixing plate through the threaded hole in a threaded manner; the end face of the plunger sealing cover, which is positioned below the fixing plate, is provided with a mounting hole which is coaxial with the threaded hole; one end of the plunger penetrates into the mounting hole and forms lower limiting movable connection with the plunger sealing cover, the other end of the plunger is in threaded connection with the abutting part, the elastic piece is sleeved on the plunger, and two ends of the elastic piece are respectively abutted against the plunger sealing cover and the abutting part; the contact is arranged on one end of the abutting part, which is far away from the elastic part.

Preferably, the contact is made of PI.

Preferably, the bottom surface area of the contacts of the intermediate contact assembly is greater than the bottom surface area of the contacts of the peripheral contact assembly.

Compared with the prior art, the beneficial effects of the utility model are that:

(1) The contact assembly of the chip testing auxiliary jig comprises a middle contact assembly which is used for contacting with the center of the main body of the chip and a peripheral contact assembly which is used for contacting with the outer pin of the chip, so that the electrical property test has one-to-one contraposition contact, and the electrical property test is more accurate; the contact uses the PI material of preventing static, effectively reduces the error that static brought, reduces the number of times of doing over again.

(2) The utility model discloses a reinforcing plate of chip test auxiliary jig has a plurality of different mounting heights on the mounting panel, and the keysets can be fixed in the different high position on the carriage release lever, but carriage release lever and keysets screw thread regulation are fixed, but contact module and fixed plate screw thread regulation are fixed, all have the space to adjust the contact module above and survey the distance between the board, and it is more nimble convenient to test and adjust.

(3) The utility model discloses a chip test auxiliary fixture, contact module adopt elastic design, or through adjusting butt portion, make contact module can give different dynamics effects on the chip, guarantee when above two kinds of modes all can guarantee to fully contact with the chip that the chip is difficult damaged.

Drawings

Fig. 1 is a schematic view of a chip testing auxiliary fixture according to an embodiment of the present application;

FIG. 2 is an enlarged view of portion A of FIG. 1;

FIG. 3 is a schematic diagram of a chip of an embodiment of the present application;

FIG. 4 is a schematic diagram illustrating a chip testing auxiliary fixture in a pressed state according to an embodiment of the present disclosure;

FIG. 5 is a schematic diagram illustrating a chip testing auxiliary fixture in a lifted state according to an embodiment of the present application;

reference numerals: 1. a support; 11. a base plate; 12. a support plate; 13. mounting a plate; 14. a clamping portion; 2. an operating component; 21. a pressure lever; 22. a fixed part; 23. a first connection portion; 24. a second connecting portion; 3. a reinforcing plate; 31. a limiting part; 4. an adapter plate; 5. a travel bar; 6. a fixing plate; 7. a contact assembly; 71. a plunger; 72. an elastic member; 73. a plunger sealing cover; 74. an abutting portion; 75. a contact; 76. an intermediate contact assembly; 77. a peripheral contact assembly; 8. a chip; 81. a main body; 82. and an outer pin.

Detailed Description

The invention is further explained below with reference to the drawings and the specific embodiments. The drawings of the utility model are only schematic to facilitate understanding of the utility model, and the concrete proportion can be adjusted according to the design requirements. The definitions of the top and bottom relationships of the relative elements and the front and back sides of the figures described herein are understood by those skilled in the art to refer to the relative positions of the components and thus all of the components may be flipped to present the same components and still fall within the scope of the present disclosure.

Referring to fig. 1, 2, 4 and 5, an embodiment of the present application provides a chip 8 testing jig, which includes a bracket 1, an operating assembly 2, a reinforcing plate 3, an adapter plate 4, a moving rod 5, a fixing plate 6 and a contact assembly 7, wherein the operating assembly 2 is rotatably supported on the bracket 1. Specifically, reinforcing plate 3 and support 1 fixed connection, operating element 2 is installed on reinforcing plate 3. The operating component 2 is hinged with the moving rod 5, and the rotating of the operating component 2 can drive the moving rod 5 to move. The movable rod 5 is connected with the adapter plate 4, the adapter plate 4 is connected with the fixed plate 6, the contact assembly 7 is installed on the fixed plate 6, and the fixed plate 6 and the contact assembly 7 can be driven to move through the movement of the movable rod 5. Specifically, referring to fig. 3, the chip 8 includes a body 81 and outer leads 82, and the number of the outer leads 82 is 4. The chip 8 is mounted on a test plate which can be placed in a predetermined position on the support 1. The contact assembly 7 comprises an intermediate contact assembly 76 and a peripheral contact assembly 77, wherein the number of the intermediate contact assembly 76 is 1, the number of the peripheral contact assembly 77 is several, specifically determined according to the number of the outer pins 82 of the chip 8, in the embodiment of the application, the number of the contact assemblies 7 is 5, wherein the number of the intermediate contact assemblies 76 is 1, and the number of the peripheral contact assemblies 77 is 4. The chip 8 is placed on a preset position of the support 1, the operation assembly 2 can drive the movable rod 5 to move towards the direction of the preset position, and drive the middle contact assembly 76 to contact with the main body 81 of the chip 8, and simultaneously the peripheral contact assembly 77 contacts with the outer pin 82 of the chip 8. The middle contact component 76 is abutted against the center of the main body 81 of the chip 8, and the peripheral contact component 77 is abutted against the outer pin 82 of the chip 8, so that the main body 81 and the outer pin 82 of the chip 8 are both connected with corresponding test points on the test board, poor contact of the chip 8 with the outer pin 82 during testing is avoided, and the test precision is improved. In addition, the contact assembly 7 is in elastic contact with the chip 8, so that too much pressure cannot be applied to the chip 8, and the chip 8 cannot be damaged.

In a specific embodiment, each of the middle contact assembly 76 and the peripheral contact assembly 77 of the contact assembly 7 includes a plunger 71, an elastic member 72, a plunger cover 73, an abutting portion 74 and a contact 75, the fixing plate 6 is provided with a through threaded hole, the plunger cover 73 is fixed on the fixing member 6 through the threaded hole, an end surface of the plunger cover 73 located below the fixing plate 6 is provided with a mounting hole coaxial with the threaded hole, one end of the plunger 71 penetrates into the mounting hole and forms a lower limit movement connection with the plunger cover 73, the lower limit movement connection is that after the plunger 71 is mounted on the plunger cover 73, the plunger cover 73 can limit the downward detachment of the plunger 71 and can allow the upward displacement of the plunger 71. Specifically, the lower end of the plunger cover 73 is provided with an external thread, and the plunger cover 73 can pass through the threaded hole and be in threaded connection with the threaded hole for adjusting the distance between the contact assembly 7 and the chip. The other end of the plunger 71 is screwed with the abutting portion 74, the elastic member 72 is sleeved on the plunger 71, and the two ends of the elastic member abut against the plunger cover 73 and the abutting portion 74 respectively. By controlling the amount of compression of the resilient member 72 by adjusting the position of the abutment 74 on the plunger 71, the force effect of each contact assembly 7 can be individually adjusted. The contacts 75 are mounted on the end of the abutment 74 facing away from the spring 72 for contact with the body 81 or the outer leads 82 of the chip 8. Specifically, the plunger cover 73 is screwed to the fixed plate 6, and the contact 75 of the contact assembly 7 is mounted below the abutting portion 74. Of these, the contacts 75 of the 4 peripheral contact assemblies 77 are used to press against the 4 outer pins 82 of the chip 8, and the contacts 75 of the intermediate contact assembly 76 are used to press against the center of the chip 8. Preferably, the contact 75 is made of PI material, which can prevent static electricity, so as to prevent static electricity from damaging the chip 8 or affecting the test result. The bottom surface area of the contact 75 of the middle contact assembly 76 is larger than that of the contact 75 of the peripheral contact assembly 77, so that a sufficient pressure can be provided, the whole chip 8 can be fully abutted with the test fixture for testing, and the test accuracy is improved.

In a specific embodiment, the bracket 1 includes a bottom plate 11, a support plate 12 and a mounting plate 13, the bottom plate 11 is located at the bottom of the bracket 1, the bottom plate 11 has a preset position, the support plate 12 is fixedly mounted on the bottom plate 11, the mounting plate 13 is fixedly mounted on the top of the support plate 12, and the reinforcing plate 3 can be fixed at a plurality of mounting positions with different heights on the mounting plate 13. Specifically, two parallel support plates 12 are fixed on the bottom plate 11, the mounting plate 13 is fixed on the two support plates 12, screw holes with different heights are formed in the mounting plate 13, the reinforcing plate 3 is fixed on the screw holes through screws, and the height of the reinforcing plate 3 is adjusted through the screw holes with different heights. The base plate 11 is provided with a clamping portion 14, and the clamping portion 14 is used for fixing the chip 8 at a preset position. Specifically, the clamping portions 14 are arranged on two side edges of the bottom plate 11, and can fix the position of the test board on the bottom plate 11, so that the test board and the chip 8 cannot move when the contact assembly 7 is pressed down, and the test accuracy is improved.

In a specific embodiment, the reinforcing plate 3 is provided with a limiting portion 31, the limiting portion 31 is provided with a first through hole for receiving the moving rod 5 to pass through, and the moving rod 5 passes through the first through hole for limiting movement, so that the moving rod 5 moves along the length direction of the contact assembly 7. The keysets 4 is equipped with the second through-hole that holds the carriage release lever 5 and pass, and the lower extreme of carriage release lever 5 is equipped with the screw thread, and the lower extreme of carriage release lever 5 passes the second through-hole to upper nut, lower nut and the screw-thread fit through both sides about the keysets 4 are in order to fix the carriage release lever 5 on the keysets 4, and adjustable carriage release lever 5 and keysets 4's fixed position. Specifically, an external thread is arranged below the moving rod 5, the moving rod 5 can be sleeved on a second through hole of the adapter plate 4, an upper nut and a lower nut are installed on the moving rod 5 located on the upper side and the lower side of the adapter plate 4, the fixing position of the adapter plate 4 on the moving rod 5 is determined through threaded connection, and the bottom of the adapter plate 4 is fixedly connected with the fixing plate 6.

In a specific embodiment, the operating assembly 2 includes a pressing rod 21, a fixing portion 22, a first connecting portion 23 and a second connecting portion 24, the pressing rod 21 is fixedly connected to the first connecting portion 23, the fixing portion 22 is fixedly connected to the reinforcing plate 3, the fixing portion 22 is hinged to the first connecting portion 23, the first connecting portion 23 is hinged to the second connecting portion 24, and the second connecting portion 24 is hinged to the moving rod 5. Referring to fig. 4, when the pressing rod 21 is pressed down, the moving rod 5 and the contact assembly 7 move toward the direction close to the bottom plate 11, so that the contact 75 of the middle contact assembly 76 contacts the center of the chip 8, and the peripheral contact assembly 77 contacts the outer pin 82 of the chip 8, so that the chip 8 contacts the testing board, and the electrical test is realized; referring to fig. 5, when the pressing rod 21 is lifted, the moving rod 5 and the contact member 7 move away from the bottom plate 11, and the contact member 7 does not contact the chip 8. Specifically, in the pressing process of the pressing rod 21, the hinge point of the first connecting portion 23 and the second connecting portion 24 rotates from top to bottom around the hinge point of the first connecting portion 23 and the fixing portion 22, and drives the moving rod 5 and the contact assembly 7 to move towards the bottom plate 11; in the lifting process of the pressing rod 21, the hinge point of the first connecting portion 23 and the second connecting portion 24 rotates from bottom to top around the hinge point of the first connecting portion 23 and the fixing portion 22, and drives the moving rod 5 and the contact assembly 7 to move in the direction away from the bottom plate 11.

Specifically, the bracket 1 may be made of aluminum, and the plunger 71 and the adapter plate 4 may be made of stainless steel. Through set up removal space on reinforcing plate 3, keysets 4 and contact module 7, can adopt multiple mode to adjust the distance of contact module 7 and survey test panel, adjustment test position that can be more nimble.

The above embodiments are only used to further illustrate the technical solution of the present invention, but the present invention is not limited to the embodiments, and any simple modification, equivalent change and modification made by the technical entity of the present invention to the above embodiments all fall into the protection scope of the technical solution of the present invention.

Claims

1. The utility model provides a chip test auxiliary fixture which characterized in that: including support, operating element, carriage release lever, fixed plate and contact module, operating element rotatable support in on the support, and with the carriage release lever is articulated, the carriage release lever with the fixed plate is connected, contact module installs on the fixed plate, contact module includes middle contact module and peripheral contact module, and the chip place in on the preset position of support, operating element can drive the carriage release lever is towards preset position direction removal, and drives middle contact module with the main part contact of chip, simultaneously peripheral contact module with the outer pin contact of chip.

2. The auxiliary jig for testing chips of claim 1, wherein: still include the reinforcing plate, the reinforcing plate with support fixed connection, the operating element install in on the reinforcing plate.

3. The auxiliary jig for testing chips as defined in claim 2, wherein: the support comprises a bottom plate, a supporting plate and a mounting plate, the preset position is arranged on the bottom plate, the supporting plate is fixedly arranged on the bottom plate, the mounting plate is fixedly arranged at the top of the supporting plate, and the reinforcing plate can be fixed at mounting positions with different heights on the mounting plate.

4. The auxiliary jig for testing chips of claim 3, wherein: the operation assembly comprises a pressing rod, a fixing part, a first connecting part and a second connecting part, the pressing rod is fixedly connected with the first connecting part, the fixing part is fixedly connected to the reinforcing plate, the fixing part is hinged to the first connecting part, the first connecting part is hinged to the second connecting part, and the second connecting part is hinged to the moving rod.

5. The auxiliary jig for testing chips as defined in claim 4, wherein: when the pressure lever is pressed down, the moving rod and the contact assembly move towards the direction close to the bottom plate, and when the pressure lever is lifted up, the moving rod and the contact assembly move towards the direction far away from the bottom plate.

6. The auxiliary jig for testing chips as defined in claim 2, wherein: the reinforcing plate is provided with a limiting part, the limiting part is provided with a first through hole for accommodating the moving rod to pass through, and the moving rod passes through the first through hole to perform limiting movement.

7. The auxiliary jig for testing chips of claim 1, wherein: the movable rod fixing device is characterized by further comprising an adapter plate, wherein the adapter plate is provided with a second through hole for accommodating the movable rod to pass through, threads are arranged at the lower end of the movable rod, the lower end of the movable rod passes through the second through hole, and the movable rod is fixed on the adapter plate through the matching of upper nuts, lower nuts and threads on the upper side and the lower side of the adapter plate and can be adjusted, the movable rod is fixed with the fixed position of the adapter plate, and the adapter plate is fixedly connected with the fixed plate.

8. The auxiliary jig for testing chips of claim 1, wherein: the middle contact assembly and the peripheral contact assembly respectively comprise a plunger, an elastic piece, a plunger sealing cover, a butting part and a contact; the fixing plate is provided with a through threaded hole, and the plunger sealing cover is fixed on the fixing plate through the threaded hole in a threaded manner; the end face of the plunger sealing cover, which is positioned below the fixing plate, is provided with a mounting hole which is coaxial with the threaded hole; one end of the plunger penetrates into the mounting hole and forms lower limit movable connection with the plunger sealing cover, the other end of the plunger is in threaded connection with the abutting part, the elastic piece is sleeved on the plunger, and two ends of the elastic piece are respectively abutted to the plunger sealing cover and the abutting part; the contact is arranged on one end of the abutting part, which is far away from the elastic part.

9. The auxiliary jig for testing chips of claim 8, wherein: the contact is made of PI materials.

10. The auxiliary jig for testing chips of claim 8, wherein: the bottom surface area of the contacts of the intermediate contact assembly is greater than the bottom surface area of the contacts of the peripheral contact assembly.