CN217820801U - Plane wave generating device and plane wave generating device testing system - Google Patents
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Abstract
The application provides a plane wave generating device and a plane wave generating device testing system. The plane wave generating device comprises a shielding darkroom, an antenna array assembly and an antenna assembly to be tested; the antenna array assembly and the antenna assembly to be tested are positioned in the shielding darkroom; the antenna array assembly comprises an antenna array and an analog phase shifter; the antenna array comprises N array elements, wherein N is an integer greater than or equal to 2; the analog phase shifter comprises L phase shifter groups, wherein L is an integer greater than or equal to 1; each array element in the N array elements is connected with a feed circuit of a corresponding sub-phase shifter in the L phase shifter groups; the power difference of the corresponding feed circuits of any two sub phase shifters in each of the L phase shifter groups is less than or equal to a preset threshold value. The method and the device have the advantages that the amplitude-phase control circuit is realized in an analog mode, the number of antennas and the complexity of a feed network circuit are effectively reduced by utilizing array sparseness, the cost is effectively reduced while the precision of a test system is ensured, and the method and the device have the characteristics of high precision and low cost.
Description
Technical Field
The utility model relates to an antenna measurement technical field, in particular to plane wave generates device and plane wave generates device test system.
Background
As the applications of radio technology equipment become more widespread, the research on the related aspects thereof is also more and more important, and in radio technology equipment, signal transmission is generally performed on the basis of electromagnetic waves, while the device capable of generating radiation is an antenna, which is seen to be an important part of radio signal transmission.
It is also important to determine the main performance parameter index of the antenna, and in general, the antenna can be measured based on the following three ways. The first is far-field method, a wave with basically plane polarization is sent to a receiving antenna by a far-place transmitter, the amplitude and phase of a signal received by the receiving antenna are recorded by people or instruments, and a far-field directional pattern of the receiving antenna is obtained by changing the incidence angle of a quasi-plane wave; the second is a compact field measurement method, which utilizes a microwave lens or a parabolic reflector to convert spherical wave front generated by a probe into planar wave front at an antenna to be tested, thereby reducing the requirement on the test distance, the measurement can be carried out in a microwave darkroom, and the defects of a far field method are avoided, but in order to generate planar wave with better precision and reduce the edge diffraction interference of the parabolic antenna, the requirement on the manufacturing process of the parabolic antenna is very high, the later maintenance cost is high, the construction cost is higher, and the test efficiency of a directional pattern is lower; the third is the near field approach, which replaces the compact field with an array of appropriately excited probes to provide a higher degree of control over the field in the test area and is suitable for low frequency applications. However, depending on the size of the plane wave region and the measurement distance, we often need a very large number of probes, each of which is applied with an amplitude-phase excitation considering mutual coupling, and this method has incomplete back lobe data acquisition and cannot directly measure radio frequency indexes such as Equivalent Isotropic Radiated Power (EIRP), error Vector Magnitude (EVM), electrochemical Impedance Spectroscopy (EIS), and the like.
The three modes have certain limitations, and the test system adopting the plane wave generating device can realize the formation of a quasi-plane wave in the array near-field range by adjusting and controlling the position, the number and the excitation (the amplitude and the phase) of the array units to form a far-field condition for testing the antenna to be tested, thereby effectively reducing the size of an antenna measurement field, and having the advantages of compact size, proper manufacturing cost, capability of directly measuring 5G base station radio frequency and service signals and the like. Therefore, PWG will be more and more widely used in antenna testing.
Because the antenna array in the plane wave generating device in the prior art is often a dense array, and the rear end of each antenna unit is connected with a corresponding amplitude and phase control circuit. Making the system complex and costly.
SUMMERY OF THE UTILITY MODEL
The utility model discloses it is the complicated and with high costs problem of prior art midplane wave generation device structure to solve.
In order to solve the technical problem, the application discloses a plane wave generating device which comprises a shielding darkroom, an antenna array assembly and an antenna assembly to be tested;
the antenna array assembly and the antenna assembly to be tested are positioned in the shielding darkroom;
the antenna array assembly comprises an antenna array and an analog phase shifter;
the antenna array comprises N array elements, wherein N is an integer greater than or equal to 2;
the analog phase shifter comprises L phase shifter groups, wherein L is an integer greater than or equal to 1;
each array element in the N array elements is connected with the feed circuit of a corresponding sub-phase shifter in the L phase shifter groups;
the power difference of the corresponding feed lines of any two sub-phase shifters in each of the L phase shifter groups is less than or equal to a preset threshold value.
Optionally, the antenna array assembly further includes M power dividers, and M = L +1;
one power divider of the M power dividers is respectively connected with the rest M-1 power dividers;
the power divider is respectively connected with the computer and the loss network analyzer;
each power divider in the remaining M-1 power dividers is connected with all the sub-phase shifters in the corresponding phase shifter group in the L phase shifter groups through a feed line.
Optionally, the power divider includes a wilkinson power divider.
Optionally, the length of the feeding line and the phase of the plane wave output by each array element have the following relationship:
wherein,
outputting the phase of the plane wave for each array element, wherein lambda is the wavelength, and iota is the length of the feed line;
the sub phase shifter is used for controlling the phase of the plane wave output by each array element through the feed lines with different lengths.
Optionally, the antenna assembly to be tested includes a rotating shaft structure, a supporting plate and an antenna to be tested;
the bottom of the rotating shaft structure is arranged at the bottom of the shielding darkroom;
the rotating shaft structure is rotatably connected with the supporting plate;
the antenna to be tested is arranged on the supporting plate, and the supporting plate is positioned in a quiet area formed by the antenna array assembly.
Optionally, the output phase of each sub phase shifter is the same.
Optionally, the sparsification type of the antenna array includes equal-opening-angle non-uniform sparsification or density-taper sparsification.
Optionally, the sparsification parameter of the antenna array is determined by using an orthogonal matching extraction algorithm.
The application also discloses a test system of the plane wave generating device in another aspect, which comprises the plane wave generating device.
Optionally, the system further comprises a vector network analyzer and a computer which are connected;
the vector network analyzer is respectively connected with the analog phase shifter, the antenna assembly to be tested and the computer; the vector network analyzer is used for generating a Hertz signal, sending the Hertz signal to the antenna array assembly, receiving a data signal sent by the antenna assembly to be tested, determining a comparison result according to the Hertz signal and the data signal, and sending the comparison result to the computer;
the computer is respectively connected with the analog phase shifter and the antenna component to be tested; the computer is used for adjusting the rotation angle of the antenna assembly to be tested, controlling the amplitude phase of the plane wave emitted by the antenna array assembly, and determining the parameters of the antenna to be tested in the antenna assembly to be tested according to the received comparison result.
Adopt above-mentioned technical scheme, the plane wave generating device that this application provided has following beneficial effect:
the application discloses a plane wave generating device which comprises a shielding darkroom, an antenna array assembly and an antenna assembly to be tested; the antenna array assembly and the antenna assembly to be tested are positioned in the shielding darkroom; the antenna array assembly comprises an antenna array and an analog phase shifter; the antenna array comprises N array elements, wherein N is an integer greater than or equal to 2; the analog phase shifter comprises L phase shifter groups, wherein L is an integer greater than or equal to 1; each array element in the N array elements is connected with a feed circuit of a corresponding sub-phase shifter in the L phase shifter groups; the power difference of the corresponding feed lines of any two sub-phase shifters in each of the L phase shifter groups is less than or equal to a preset threshold value. In this case, the phase shifters are grouped, so that a group of phase shifters can be subsequently controlled based on one power divider, and thus, the number of power dividers in the above embodiment can be subsequently reduced, the complexity of the plane wave generating device is further reduced, and the cost of the plane wave generating device is further reduced.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the description below are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
Fig. 1 is a schematic structural diagram of an alternative plane wave generating device according to the present application;
FIG. 2 is a schematic diagram of an alternative phase controller according to the present application;
FIG. 3 is a schematic structural diagram of an alternative plane wave generating device of the present application;
FIG. 4 is a schematic diagram of an alternative antenna assembly under test according to the present application;
FIG. 5 is an alternative iso-field non-uniform sparsification array of the present application;
FIG. 6 is an alternative density taper thinning array of the present application;
fig. 7 is a schematic structural diagram of an alternative test system for a plane wave generating device according to the present application.
The following figures are provided to supplement the description:
1-shielding a darkroom; 2-an antenna array assembly; 21-an antenna array; 22-amplitude phase controller; 221-analog phase shifter; 222-a power divider; 3-an antenna component to be tested; 31-a rotating shaft structure; 311-a support table; 312-a rotating shaft; 32-a support plate; 33-an antenna to be tested; 4-quiet zone; 5-a vector network analyzer; 6-a computer.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. It should be apparent that the described embodiments are only a few embodiments of the present application, and not all embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application without making creative efforts shall fall within the protection scope of the present application.
Reference herein to "one embodiment" or "an embodiment" means that a particular feature, structure, or characteristic may be included in at least one implementation of the present application. In the description of the present application, it is to be understood that the terms "upper", "lower", "top", "bottom", and the like, are used in an orientation or positional relationship based on that shown in the figures, which is for convenience in describing the present application and to simplify the description, and are not intended to indicate or imply that the device or element so referred to must have a particular orientation, be constructed in a particular orientation, and be operated in a particular manner, and thus, are not to be construed as limiting the present application. Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. Moreover, the terms "first," "second," and the like are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are capable of operation in sequences other than those illustrated or described herein.
Referring to fig. 1-2, fig. 1 is a schematic structural diagram of an alternative plane wave generating device according to the present application. Fig. 2 is a schematic structural diagram of an alternative amplitude controller according to the present application, in which the sub-phase shifter 11 in fig. 2 refers to a first sub-phase shifter belonging to a first phase shifter group, and similarly, the sub-phase shifter 12 refers to a second sub-phase shifter belonging to the first phase shifter group; sub-phase shifter 1x refers to the x-th sub-phase shifter belonging to the first phase shifter group, where x is smaller than n. The analog phase shifter 221 includes L phase shifter groups, where L is an integer greater than or equal to 1; the power difference of the corresponding feed circuits of any two sub-phase shifters in each of the L phase shifter groups is less than or equal to a preset threshold value; the phase shifters are grouped, so that a group of phase shifters can be subsequently controlled based on one power divider 222, thereby subsequently reducing the number of the power dividers 222 in the above embodiment, further reducing the complexity of the plane wave generating device, and further reducing the cost of the plane wave generating device.
In one possible embodiment, the antenna array assembly further includes M power dividers 222, and M = L +1; the M power dividers 222 and the L phase shifter groups form an amplitude-phase controller 22; one power divider 222 of the M power dividers 222 is connected to the remaining M-1 power dividers 222, respectively; the power divider 222 is respectively connected with the computer 6 and the loss network analyzer; each power divider 222 of the remaining M-1 power dividers 222 is connected to all sub-phase shifters in a corresponding one of the L phase shifter groups through a feeding line; for example, if L is 3, the number of the power dividers 222 is 4, one of the power dividers 222 serves as a total power divider, and the other 3 power dividers are respectively connected to each sub-phase shifter in one phase shifter group, and since the power of each feed line in each phase shifter group is not much, the power dividers are divided into one group and divided by one function, and in the case of effectively reducing the number of the power dividers 222, the power dividing requirement on the power dividers 222 is not high, and the cost is reduced.
In a possible embodiment, the power divider 222 includes a wilkinson power divider, and further, in order to further reduce the requirement for the power divider 222 and the subsequent data processing, the power divider 222 may be an equal power divider, that is, an amplitude attenuator with high price is avoided, thereby effectively reducing the cost.
In a possible embodiment, referring to fig. 3, fig. 3 is a schematic structural diagram of another alternative plane wave generating apparatus according to the present application. Each array element in the N array elements is connected with a feed line of a corresponding sub-phase shifter in the N sub-phase shifters, and the length of the feed line and the phase of a plane wave output by each array element have the following relations:
wherein,
outputting the phase of plane wave for each array element, λ is wavelength, and iota is length of feed line, and the sub-phase shifter is used for realizing feed line with different lengthsThe phase of the plane wave output by each array element is controlled, and because the control of different phases is realized based on the feed circuit, the requirements on the precision and the cost of the phase shifter are not high, namely a digital phase shifter with high price is avoided; the original phase of the output of the sub-phase shifter can even be made the same, only requiring adjustment based on the length of the feed line.
The wavelength is a plane wave wavelength, and the power divider 222 may be located inside the shielded darkroom or outside the shielded darkroom 1.
In a possible embodiment, referring to fig. 4, fig. 4 is a schematic structural diagram of an alternative antenna element 3 to be tested according to the present application. The antenna assembly to be tested 3 comprises a rotating shaft structure 31, a supporting plate 32 and an antenna to be tested 33, wherein the bottom of the rotating shaft structure 31 is arranged at the bottom of the shielding darkroom 1, the rotating shaft structure 31 is rotatably connected with the supporting plate 32, the antenna to be tested 33 is arranged on the supporting plate 32, and the supporting plate 32 is positioned in a dead zone 4 formed by the antenna array assembly; in another possible embodiment, the rotating shaft structure 31 is fixedly connected to the supporting plate 32, and the rotating shaft structure 31 is rotatably connected to the bottom of the dark shielding room 1.
In order to facilitate the follow-up test of the antenna to be tested, the test efficiency is improved. In a possible embodiment, referring to fig. 4, the shaft structure 31 includes a supporting platform 311 and a shaft 312 connected together, the supporting platform 311 is located at the bottom of the shadow mask 1; the supporting plate 32 is rotatably connected to the rotating shaft 312; the rotating shaft 312 is fixedly connected to the supporting platform 311; in another optional embodiment, the rotating shaft 312 is rotatably connected to the supporting plate 32, the supporting plate 32 is fixedly connected to the rotating shaft 312, and certainly, the connection mode between the supporting table 311 and the shielding dark room 1 may be changed to be a rotating connection, and correspondingly, the connection relationship between other joints is a fixed connection, that is, the present application only needs to ensure that any one of the three joints is a rotating connection, as long as the control of the rotation angle of the supporting plate 32 can be implemented.
To further reduce the requirements on the sub-phase shifters and thus the cost of the generator; in a possible embodiment, the output phase of each sub-phase shifter is the same, and then only the feeding lines with different lengths are needed to change the phase of the plane wave.
It should be noted that the amplitude controller 22, i.e., the phase shifter and the power divider 222, and the antenna array are configured to synthesize a plane wave, and the antenna array is configured to transmit the synthesized plane wave, so as to form a quiet zone 4 at a preset distance, where the antenna 33 to be tested is located in the quiet zone 4, and the antenna 33 to be tested receives the plane wave; in the process of generating plane waves by adopting the grouping manner, the amplitudes in the feeder circuits in one group can be averaged, and then the corresponding plane waves are synthesized based on the fixed power, so that the phase in the feeder circuit corresponding to each feeder circuit is obtained.
The feed circuit here is a circuit formed by connecting one sub-phase shifter and the corresponding power divider 222, and since this circuit is connected to an external direct device (for example, an antenna array or the subsequent vector network analyzer 5), the length of the corresponding feed line is different depending on the configuration of the feed circuit.
The power divider 222 may not be disposed in the plane wave shielded darkroom 1, that is, it may be disposed outside the shielded darkroom 1.
In order to improve the flexibility of the application range of the plane wave generating device; in one possible embodiment, referring to fig. 5 and 6, fig. 5 is an alternative iso-field angle non-uniform sparsification array of the present application; FIG. 6 is an alternative density tapered sparse array of the present application. The sparsification type of the antenna array comprises equal-opening-angle non-uniform sparsification or density taper sparsification.
In one possible embodiment, the method of forming the above-described factorized array may be determined based on an orthogonal matching decimation algorithm; in this embodiment, the method can be implemented based on the following steps:
1) Initialization: setting the iteration times T =1, setting a first position set T, wherein T is an empty set, and when the position parameter selected in each subsequent iteration is added into the subset as a new column), a residual r 0 ＝E 0 (E 0 A plane wave field intensity distribution); initializing all elements in the sparse coefficient set I to be zero;
2) Finding the sum residual r in the position set T t-1 The position h with the largest inner product i ,h i ＝arg max{|<r t-1 ,h j >||1≤j≤K P }; h is to be i Adding into T, and removing h from T i ；
3) Calculation of E 0 = T9633l, least square solution of I, i.e. I = (T) H T) -1 T H □E 0 ；
4) Updating the residual r t ＝E 0 -T \9633I; update t = t +1;
5) And judging whether an iteration termination condition is reached. If yes, finishing the algorithm and outputting a sparse coefficient I; if not, step 2) until an iteration termination condition is reached, optionally, the iteration termination condition may be r t Less than or equal to a preset threshold, which may be 0, or 0.01,0.1, etc.
Referring to fig. 7, fig. 7 is a schematic structural diagram of an alternative test system for a plane wave generator according to the present invention. The application also discloses a test system of the plane wave generating device in another aspect, which comprises the plane wave generating device.
In a possible embodiment, referring to fig. 7, the plane wave generating device testing system further comprises a vector network analyzer 5 and a computer 6 connected; the vector network analyzer 5 is respectively connected with the analog phase shifter 221, the antenna component 3 to be tested and the computer 6; the vector network analyzer 5 is configured to generate a hertz signal, send the hertz signal to the antenna array assembly, receive a data signal sent by the antenna assembly 3 to be tested, determine a comparison result according to the hertz signal and the data signal, and send the comparison result to the computer 6; the computer 6 is respectively connected with the analog phase shifter 221 and the antenna component 3 to be tested; the computer 6 is configured to adjust a rotation angle of the antenna assembly 3 to be measured, control an amplitude phase of a plane wave emitted by the antenna array assembly, and determine a parameter of the antenna 33 to be measured in the antenna assembly 3 to be measured according to the received comparison result.
It should be noted that the vector network analyzer 5 and the computer 6 are both disposed outside the shielded darkroom 1, the comparison result obtained by the vector network analyzer 5 is mainly a result of comparing and analyzing the amplitude and the phase of the plane wave received by the antenna 33 to be measured, and the parameters finally determined by the computer 6 are mainly parameter information such as a directional pattern, gain, and beam width of some antennas 33 to be measured, so as to determine the characteristics of the antenna 33 to be measured.
The above description is only exemplary of the present application and should not be taken as limiting, as any modification, equivalent replacement, or improvement made within the spirit and principle of the present application should be included in the protection scope of the present application.
Claims (9)
1. The plane wave generation device is characterized by comprising a shielding darkroom (1), an antenna array assembly (2) and an antenna assembly (3) to be tested;
the antenna array assembly (2) and the antenna assembly (3) to be tested are positioned in the shielding darkroom (1);
the antenna array assembly (2) comprises an antenna array (21) and an analog phase shifter (221);
the antenna array (21) comprises N array elements, wherein N is an integer greater than or equal to 2;
the analog phase shifter (221) comprises L phase shifter groups, wherein L is an integer greater than or equal to 1;
each array element in the N array elements is connected with a feed circuit of a corresponding sub-phase shifter in the L phase shifter groups;
and the power difference of the corresponding feed circuits of any two sub phase shifters in each of the L phase shifter groups is less than or equal to a preset threshold value.
2. The plane wave generating apparatus of claim 1, wherein the antenna array assembly (2) further comprises M power splitters (222), and M = L +1;
one power divider (222) of the M power dividers (222) is connected with the rest M-1 power dividers (222) respectively;
the power divider (222) is respectively connected with the computer (6) and the loss network analyzer;
each power divider (222) in the remaining M-1 power dividers (222) is connected with all the sub-phase shifters in a corresponding one of the L phase shifter groups through a feed line.
3. The plane wave generating device of claim 2, wherein the power divider (222) comprises a wilkinson power divider.
4. The plane wave generating device of claim 1, wherein the length of the feeding line and the phase of each array element output plane wave have the following relationship:
wherein,
outputting the phase of the plane wave for each array element, wherein lambda is the wavelength, and l is the length of the feed line;
the sub phase shifters are used for controlling the phase of the plane wave output by each array element through the feed lines with different lengths.
5. The plane wave generating device according to claim 1, wherein the antenna assembly (3) to be tested comprises a rotating shaft structure (31), a support plate (32), and an antenna (33) to be tested;
the rotating shaft structure (31) comprises a supporting platform and a rotating shaft (312) which are connected;
the support table is positioned at the bottom of the shielding darkroom (1);
the supporting plate (32) is rotationally connected with the rotating shaft (312);
the antenna (33) to be tested is arranged on the supporting plate (32), and the supporting plate (32) is located in a quiet zone (4) formed by the antenna array assembly (2).
6. The plane wave generating apparatus as claimed in claim 1, wherein the output phase of each sub phase shifter is the same.
7. The plane wave generating apparatus as claimed in any one of claims 1-6, wherein the type of sparsification of said antenna array (21) comprises iso-angular non-uniform sparsification or density cone sparsification.
8. A plane wave generating apparatus testing system comprising the plane wave generating apparatus according to any one of claims 1 to 7.
9. The plane wave generating device testing system of claim 8, further comprising a vector network analyzer (5) and a computer (6) connected;
the vector network analyzer (5) is respectively connected with the analog phase shifter (221), the antenna component (3) to be tested and the computer (6); the vector network analyzer (5) is used for generating a Hertz signal, sending the Hertz signal to the antenna array assembly (2), receiving a data signal sent by the antenna assembly to be tested (3), determining a comparison result according to the Hertz signal and the data signal, and sending the comparison result to the computer (6);
the computer (6) is respectively connected with the analog phase shifter (221), the antenna component (3) to be tested and the antenna array component (2); and the computer (6) is used for adjusting the rotation angle of the antenna assembly (3) to be tested, controlling the amplitude phase of the plane wave emitted by the antenna array assembly (2), and determining the parameters of the antenna (33) to be tested in the antenna assembly (3) to be tested according to the received comparison result.
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| CN115753837B (en) * | 2021-10-27 | 2024-01-05 | 南京捷希科技有限公司 | Plane wave generator and plane wave generator test system |
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