CN117517800A - Antenna array near field test method - Google Patents

Antenna array near field test method Download PDF

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Publication number
CN117517800A
CN117517800A CN202311408359.8A CN202311408359A CN117517800A CN 117517800 A CN117517800 A CN 117517800A CN 202311408359 A CN202311408359 A CN 202311408359A CN 117517800 A CN117517800 A CN 117517800A
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China
Prior art keywords
antenna
pattern
test
near field
probe
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Pending
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CN202311408359.8A
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Chinese (zh)
Inventor
杨顺平
李路同
雷培林
何海丹
杜艳
袁立
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CETC 10 Research Institute
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CETC 10 Research Institute
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Priority to CN202311408359.8A priority Critical patent/CN117517800A/en
Publication of CN117517800A publication Critical patent/CN117517800A/en
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of antennas
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0892—Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Variable-Direction Aerials And Aerial Arrays (AREA)

Abstract

The invention discloses a near field test method of an antenna array, which comprises the steps of shifting the phase of probe data according to the frequency shift theorem of Fourier transform, and then synthesizing sampling signals to obtain a far field pattern of a tested antenna, wherein the far field characteristic of the antenna can be tested and simulated in the radiation near field of the antenna because the interpolation of the Fourier transform is not performed any more, and two main functions can be realized by utilizing the characteristic: 1. and the far-field pattern and the gain of the antenna are measured. 2. And performing far field system association test in the radiation near field region of the antenna.

Description

Antenna array near field test method
Technical Field
The invention relates to the technical field of information, in particular to a near field test method for an antenna array.
Background
Near field measurement includes planar near field, spherical near field, cylindrical near field, compact;
the planar near field measurement system samples the radiation near field of the antenna in a probe moving mode, a far field pattern is calculated from near field data through data processing, and the test process requires mechanical movement of the probe, as shown in fig. 11;
the spherical near field measurement system realizes the sampling of the antenna radiation near field by moving the probe, and obtains a far field pattern by data processing and calculation from near field data, wherein the test process requires the mechanical movement of the probe, the sampling surface of the probe is shown in fig. 12, and the implementation forms are various; as shown in fig. 13, in a typical single-probe spherical near-field test system, sampling of measurement points is realized through azimuth and roll two-dimensional motions, polarization is switched by 0 and 90 degrees through one polarization rotating shaft, three axes are all used, and sampling point position switching of the whole test process is completed through mechanical motions; in order to speed up the test, FIG. 14 is a multi-probe spherical near field test system, which reduces one-dimensional motion but is still azimuthally mechanically motion, as compared to a single-probe spherical near field test system; fig. 15 is a spherical near field test system based on a robotic arm, pitch and roll being implemented with a universal robotic arm, reduced development of specialized equipment, but with lower test efficiency than a typical single probe test system.
Compact range is a kind of near field measurement, and has the main advantage that various antenna measurements and researches can be performed in a small microwave dark room by using conventional far field test equipment and methods. As in the compact range of fig. 16, as in the conventional far field, a test turret is required, and thus the test time is the same as in the far field test method;
the quasi plane wave simulator is used as a new test technology, and the antenna array simulates a compact field reflecting surface system to realize plane wave distribution of an electric field formed in a test dead zone, so that the antenna can be placed in the test dead zone for testing. The quasi plane wave simulator can meet far field conditions in a short distance, and has the advantages of small structural size, low cost, flexible installation and use and multiple application scenes; from the viewpoint of test efficiency, the quasi-plane wave simulator still needs to be rotated by the brick bed to acquire the antenna pattern, so its test efficiency is substantially consistent with the conventional far field, as shown in fig. 17.
The multi-probe near field test method realizes scanning in one direction in a planar two-dimensional coordinate system by arranging a plurality of probes, utilizing a multiplexing combined network system and a sequential electronic modulation technology and replacing slow mechanical scanning with fast electronic scanning sampling. Compared with the traditional two-dimensional far-field test method, the method greatly improves the measurement speed and precision. But the cost of the field and equipment required by the test is expensive, the calibration of the test probe is more strict than the calibration of the loudspeaker in the far field, and meanwhile, the test probe has the limitation in the application frequency band: the test frequency is too high, which can affect the accuracy of the phase test; too low a test frequency will result in increased costs of the wave absorbing material and a larger test site will be required.
Disclosure of Invention
The invention aims to provide the antenna plane near field test method aiming at the defects, solves the problems that the field and equipment required by the test in the multi-probe near field test method are expensive, the calibration of the test probe is more strict than the calibration of the far field to the loudspeaker, and meanwhile, the application frequency band is limited: the test frequency is too high, which can affect the accuracy of the phase test; too low a test frequency will result in increased costs of the wave absorbing material and also in the need for larger test sites.
The invention is realized by the following scheme:
an antenna array near field test method, comprising the steps of:
the method comprises the following steps:
(1) Arranging a detecting antenna and a detected antenna on a preset horizontal position, wherein the distance between the plane of the detecting antenna and the detected antenna is Z 0 The method comprises the steps of carrying out a first treatment on the surface of the Constructing a correlation expression of the propagation vector;
(2) Arranging a measured antenna and a detection antenna in a preset space position, and respectively arranging M and N probes along an x axis and a y axis at dx and dy intervals; the (m, n) th probe receives a signal level of P B (z 0 ,mΔy,nΔx)；
(3) By rotating the antenna to be tested or the detecting antenna, a preset included angle is formed between the detecting antenna and the antenna to be tested, and the direction of the angle is expressed asThe test signal is +.>
(4) The probe performs two polarization tests of H (horizontal) and V (vertical) according to the process to obtainAnd
(5) Calculating through a directional diagram calculation formula;
(6) And (5) performing a receiving antenna pattern test and a transmitting antenna pattern test according to the formula in (5).
The related expression for constructing the propagation vector in (1) is specifically:
setting upFor propagation vector, there is->Where k is the propagation constant, ">In units of propagation vector, k x 、k y 、k z Components of the propagation vector in the x, y, z directions; />Unit vectors representing x, y, z directions:
wherein the method comprises the steps of(wavelength of signal used in lambda test)
Then:
k z ＝k·cosθ
wherein theta is the pitch angle and the angle of the lens,is azimuth.
The pattern calculation formula in (5) is:
order the
Wherein:
the θ component pattern when polarized for the unit probe V is +.>A pattern value at the pointing angle;
the θ component pattern when polarized for the unit probe H is +.>A pattern value at the pointing angle;
for polarization of unit probe V>Component pattern is at->A pattern value at the pointing angle;
for polarization of unit probe H +.>Component pattern is at->A pattern value at the pointing angle;
the pattern formula is:
wherein: c 1 Is a proportionality constant.
And carrying out the receiving antenna pattern test by adopting the result value of the method.
And carrying out the transmitting antenna pattern test by adopting the result value of the method.
And carrying out a transmitting antenna gain test by adopting a result value of the method.
And carrying out a receiving antenna gain test by adopting the result value of the method.
In summary, due to the adoption of the technical scheme, the beneficial effects of the invention are as follows:
1. by adopting the scheme to radiate the near-field region to realize far-field simulation, the joint test wireless environment of a far-field system can be constructed;
2. the far-field pattern level value of the corresponding angle of the antenna is directly obtained by adopting the radiation near-field region of the scheme;
3. the scheme does not need the phase of the test signal,
4. The test process adopting the scheme is fully electronic, mechanical equipment is not involved, the installation process is simplified, and the test speed is greatly improved.
5. By adopting the scheme, the antenna test efficiency can be remarkably improved, the traditional method is that one probe performs mechanical scanning, the scheme is multiple probes and an array structure is adopted, and the efficiency can be greatly improved. Meanwhile, antenna pattern and gain test can be realized in a near field region.
Drawings
FIG. 1 is a schematic diagram of the position of an antenna to be measured of a planar near field measurement probe according to the present invention;
FIG. 2 is a schematic view of the k-direction of the present invention;
FIG. 3 is a schematic diagram of spatial positions of a detected antenna and a detecting antenna according to the present invention;
FIG. 4 is a schematic view of a probe arrangement in accordance with the present invention;
fig. 5 is a receive antenna pattern test;
fig. 6 is a transmit antenna pattern test;
fig. 7 and 8 are transmit antenna gain test charts:
fig. 9 and 10 are diagrams of receive antenna gain tests;
FIG. 11 is a schematic diagram of a prior art planar near field measurement system;
FIG. 12 is a schematic diagram of a prior art spherical near field scan trajectory;
FIG. 13 is a schematic diagram of a prior art single probe sphere near field diagram;
FIG. 14 is a schematic diagram of a prior art single probe sphere near field diagram;
FIG. 15 is a schematic diagram of a single probe spherical near field based on a robotic arm of the prior art;
FIG. 16 is a schematic diagram of a prior art compact range measurement system;
FIG. 17 is a schematic diagram of a prior art quasi-plane wave simulator test system.
Detailed Description
All of the features disclosed in this specification, or all of the steps in a method or process disclosed, may be combined in any combination, except for mutually exclusive features and/or steps.
Any feature disclosed in this specification (including any accompanying claims, abstract) may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise. That is, each feature is one example only of a generic series of equivalent or similar features, unless expressly stated otherwise.
In the description of the present invention, it should be understood that the directions or positional relationships indicated by the terms "upper", "lower", "left", "right", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present invention and simplifying the description, and do not indicate or imply that the apparatus or element in question must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present invention.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first", "a second", etc. may include one or more of the feature, either explicitly or implicitly.
Example 1
The invention provides a technical scheme that:
a near field test method of antenna array includes the following steps:
(1) Arranging a detecting antenna and a detected antenna on a preset horizontal position, wherein the distance between the plane of the detecting antenna and the detected antenna is Z 0 At this time, as shown in FIG. 1, there is providedFor propagation vector, there is-> Where k is the propagation constant, ">In units of propagation vector, k x 、k y 、k z Components of the propagation vector in the x, y, z directions; />Unit vectors representing x, y, z directions:
wherein the method comprises the steps of(wavelength of signal used in lambda test)
Then:
k z ＝k·cosθ
wherein theta is the pitch angle and the angle of the lens,the schematic diagram of the k direction is shown in fig. 2.
(2) Arranging the antenna to be measured and the detection antenna in a predetermined spatial position, arranging the antenna to be measured and the detection antenna in the spatial position as shown in fig. 3, and arranging M and N probes along x-axis and y-axis at dx and dy intervals, respectively; the (m, n) th probe receives a signal level of P B (z 0 ,mΔy,nΔx)；
(3) By rotating the antenna to be detected or the detecting antenna, a certain included angle is formed between the detecting antenna and the antenna to be detected, and the direction of the included angle is expressed asAs shown in FIG. 4, the test signal is obtained as +.>
(4) The probe performs two polarization tests of H (horizontal) and V (vertical) according to the process to obtainAnd
(5) The pattern calculation formula:
order the
Wherein:
the θ component pattern when polarized for the unit probe V is +.>A pattern value at the pointing angle;
the θ component pattern when polarized for the unit probe H is +.>A pattern value at the pointing angle;
for polarization of unit probe V>Component pattern is at->Direction under pointing angleGraph values;
for polarization of unit probe H +.>Component pattern is at->A pattern value at the pointing angle;
the specific expression of the pattern is:
wherein: c 1 Is a proportionality constant.
(6) And (5) performing a receiving antenna pattern test and a transmitting antenna pattern test according to the formula in (5).
By using the present test method, the following technical effects can be obtained.
a) The antenna test efficiency is remarkably improved, and the scheme is that a plurality of probes (a probe is used for mechanical scanning and an array is used for improving the efficiency).
b) Antenna pattern and gain testing can be realized in the near field region.
Example 2
The method of example 1 was used to perform a receive antenna pattern test;
the receiving pattern test structure is as shown in FIG. 5, the signal source sends out signal, and the synthesizer outputs signal according toPhase shifting is carried out, and then signals enter a dual polarization probe arrayAnd (3) the sequence is finally transmitted to a receiver, wherein the signals in the receiver are as follows: />And->
The formula is:
wherein: c 1 Is a proportionality constant.
Can obtain the pointing angleLower antenna pattern level.
Example 3
Transmitting antenna pattern testing was performed using the method in example 1;
the pattern test structure of the transmitting antenna is shown in figure 6, and the tested antenna and the detecting antenna are according to the followingAnd (3) performing relative motion, wherein a signal source sends out a signal through the tested antenna, the signal is received by the tested antenna and then output through the dual-polarized antenna, then the signal reaches a receiver through an H-polarization power divider and a V-polarization power divider, and the signal which reaches the receiver through the tested antenna is: />And
the formula is:
wherein: c 1 Is a proportionality constant.
Can obtain the pointing angleLower antenna pattern level values.
Meanwhile, the scheme can also be used for carrying out the gain test of the transmitting antenna and the gain test of the receiving antenna;
transmitting antenna gain test:
placing the antenna to be detected right in front of the detection antenna, inputting signal power P0, receiving power P1 by the detection antenna (shown in figure 7), replacing the antenna to be detected with a standard antenna, and keeping the signal power of the input standard antenna to be P0 and the power received by the detection antenna to be P2 (shown in figure 8);
the gain of the measured antenna is:
G＝P1-P2+G std
wherein G is the measured antenna gain, G std Is the standard antenna gain value.
Receiving antenna gain test:
placing the antenna to be detected in front of the detecting antenna, inputting signal power P0 by the detecting antenna, and receiving power P1 by the antenna to be detected (shown in FIG. 9); the measured antenna is replaced by a standard antenna, the signal power of the input detection antenna is kept to be P0, and the received power of the measured antenna is P2 (shown in fig. 10).
The gain of the measured antenna is:
G＝P1-P2+G std
wherein G is the measured antenna gain, G std Is the standard antenna gain value.
The foregoing description of the preferred embodiments of the invention is not intended to be limiting, but rather is intended to cover all modifications, equivalents, and alternatives falling within the spirit and principles of the invention.

Claims (7)

1. A near field test method of an antenna array is characterized in that: the method comprises the following steps:
(1) Arranging a detecting antenna and a detected antenna on a preset horizontal position, wherein the distance between the plane of the detecting antenna and the detected antenna is Z 0 The method comprises the steps of carrying out a first treatment on the surface of the Constructing a correlation expression of the propagation vector;
(2) Arranging a measured antenna and a detection antenna in a preset space position, and respectively arranging M and N probes along an x axis and a y axis at dx and dy intervals; the (m, n) th probe receives a signal level of P B (z 0 ,mΔy,nΔx)；
(3) By rotating the antenna to be tested or the detecting antenna, a preset included angle is formed between the detecting antenna and the antenna to be tested, and the direction of the angle is expressed asThe test signal is +.>
(4) The probe performs two polarization tests of H (horizontal) and V (vertical) according to the process to obtainAnd
(5) Calculating through a directional diagram calculation formula;
(6) And (5) performing a receiving antenna pattern test and a transmitting antenna pattern test according to the formula in (5).
2. The antenna array near field testing method of claim 1, wherein: the related expression for constructing the propagation vector in (1) is specifically:
setting upFor propagation vector, there is->Where k is the propagation constant, ">In units of propagation vector, k x 、k y 、k z Components of the propagation vector in the x, y, z directions; />Unit vectors representing x, y, z directions:
wherein the method comprises the steps of
Then:
k z ＝k·cosθ
wherein theta is the pitch angle and the angle of the lens,is azimuth.
3. A method of near field testing of an antenna array as claimed in claim 1 or 2, wherein: the pattern calculation formula in (5) is:
order the
Wherein:
the θ component pattern when polarized for the unit probe V is +.>A pattern value at the pointing angle;
the θ component pattern when polarized for the unit probe H is +.>A pattern value at the pointing angle;
for polarization of unit probe V>Component pattern is at->A pattern value at the pointing angle;
for polarization of unit probe H +.>Component pattern is at->A pattern value at the pointing angle;
the pattern formula is:
wherein: c 1 Is a proportionality constant.
4. The antenna array near field testing method of claim 1, wherein: and carrying out the receiving antenna pattern test by adopting the result value of the method.
5. The antenna array near field testing method of claim 1, wherein: and carrying out the transmitting antenna pattern test by adopting the result value of the method.
6. The antenna array near field testing method of claim 1, wherein: and carrying out a transmitting antenna gain test by adopting a result value of the method.
7. The antenna array near field testing method of claim 1, wherein: and carrying out a receiving antenna gain test by adopting the result value of the method.
CN202311408359.8A 2023-10-25 2023-10-25 Antenna array near field test method Pending CN117517800A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202311408359.8A CN117517800A (en) 2023-10-25 2023-10-25 Antenna array near field test method

Publications (1)

Publication Number Publication Date
CN117517800A true CN117517800A (en) 2024-02-06

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Application Number Title Priority Date Filing Date
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Country Status (1)

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