CN116858858B - Turntable workpiece tip detection device and workpiece tip coordinate calculation method - Google Patents
Turntable workpiece tip detection device and workpiece tip coordinate calculation method Download PDFInfo
- Publication number
- CN116858858B CN116858858B CN202310812087.1A CN202310812087A CN116858858B CN 116858858 B CN116858858 B CN 116858858B CN 202310812087 A CN202310812087 A CN 202310812087A CN 116858858 B CN116858858 B CN 116858858B
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- tip
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- plate
- sliding
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- 238000001514 detection method Methods 0.000 title claims abstract description 32
- 238000004364 calculation method Methods 0.000 title claims description 10
- 239000000523 sample Substances 0.000 claims abstract description 11
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 238000012937 correction Methods 0.000 claims description 3
- 238000000034 method Methods 0.000 abstract description 5
- 238000007689 inspection Methods 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
Description
Claims (3)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202310812087.1A CN116858858B (en) | 2023-07-04 | 2023-07-04 | Turntable workpiece tip detection device and workpiece tip coordinate calculation method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202310812087.1A CN116858858B (en) | 2023-07-04 | 2023-07-04 | Turntable workpiece tip detection device and workpiece tip coordinate calculation method |
Publications (2)
Publication Number | Publication Date |
---|---|
CN116858858A CN116858858A (en) | 2023-10-10 |
CN116858858B true CN116858858B (en) | 2024-05-24 |
Family
ID=88224566
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN202310812087.1A Active CN116858858B (en) | 2023-07-04 | 2023-07-04 | Turntable workpiece tip detection device and workpiece tip coordinate calculation method |
Country Status (1)
Country | Link |
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CN (1) | CN116858858B (en) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105223389A (en) * | 2015-09-28 | 2016-01-06 | 大族激光科技产业集团股份有限公司 | A kind of alignment method of flying probe tester |
CN105513990A (en) * | 2015-12-07 | 2016-04-20 | 杭州长川科技股份有限公司 | Probe station image positioning device and vision alignment method |
CN114137386A (en) * | 2021-11-10 | 2022-03-04 | 河南裕展精密科技有限公司 | Test device, test method and test equipment |
CN114460442A (en) * | 2022-02-09 | 2022-05-10 | 苏州格拉尼视觉科技有限公司 | High-precision needle-off compensation method and device for flying needle test and storage medium |
-
2023
- 2023-07-04 CN CN202310812087.1A patent/CN116858858B/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105223389A (en) * | 2015-09-28 | 2016-01-06 | 大族激光科技产业集团股份有限公司 | A kind of alignment method of flying probe tester |
CN105513990A (en) * | 2015-12-07 | 2016-04-20 | 杭州长川科技股份有限公司 | Probe station image positioning device and vision alignment method |
CN114137386A (en) * | 2021-11-10 | 2022-03-04 | 河南裕展精密科技有限公司 | Test device, test method and test equipment |
CN114460442A (en) * | 2022-02-09 | 2022-05-10 | 苏州格拉尼视觉科技有限公司 | High-precision needle-off compensation method and device for flying needle test and storage medium |
Also Published As
Publication number | Publication date |
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CN116858858A (en) | 2023-10-10 |
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Legal Events
Date | Code | Title | Description |
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PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CB03 | Change of inventor or designer information |
Inventor after: Zou Yixin Inventor after: Zhang Chunyang Inventor after: Wang Zhenjie Inventor after: Yin Zhi Inventor after: Dou Guanjun Inventor after: Wang Hongmiao Inventor after: Ma Kuo Inventor after: Xiao Haiyang Inventor after: Li Yachao Inventor before: Dou Guanjun Inventor before: Wang Hongmiao Inventor before: Ma Kuo Inventor before: Xiao Haiyang Inventor before: Li Yachao |
|
CB03 | Change of inventor or designer information | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20240328 Address after: 450000 F11, Comprehensive Bonded Zone on the East Side of Chang'an Road, Hanggang District, Zhengzhou City, Henan Province Applicant after: Henan Fuchi Technology Co.,Ltd. Country or region after: China Address before: 450000 No. 9, Zone D, intelligent terminal (mobile phone) Industrial Park, Huaxia Avenue and Donghai Road, HANGGANG District, Zhengzhou City, Henan Province Applicant before: Henan Zhongchi Fulian Precision Technology Co.,Ltd. Country or region before: China |
|
TA01 | Transfer of patent application right | ||
GR01 | Patent grant | ||
GR01 | Patent grant |