CN115514431A

CN115514431A - Electronic device, test system and test method

Info

Publication number: CN115514431A
Application number: CN202211138155.2A
Authority: CN
Inventors: 殷军亮
Original assignee: Guangdong Oppo Mobile Telecommunications Corp Ltd
Current assignee: Guangdong Oppo Mobile Telecommunications Corp Ltd
Priority date: 2022-09-19
Filing date: 2022-09-19
Publication date: 2022-12-23

Abstract

The embodiment of the application relates to electronic equipment, a test system and a test method. The electronic device includes: a radio frequency device configured with a first test port for transmitting a first radio frequency signal; one end of the circuit board assembly is connected with the first test port, and the circuit board assembly is used for transmitting the first radio frequency signal; and the serial bus port is connected with the other end of the circuit board assembly and is used for transmitting the first radio-frequency signal transmitted by the radio-frequency device to external test equipment and/or transmitting the first radio-frequency signal sent by the test equipment to the radio-frequency device for receiving and processing, and the first radio-frequency signal is used for testing the radio-frequency performance of the electronic equipment. Because the thickness of circuit board subassembly is all less, and the design flexibility of the shape of circuit board subassembly is higher moreover, can carry out the customization design according to the inner space of electronic equipment to the space that can significantly reduce to occupy in electronic equipment.

Description

Electronic device, test system and test method

Technical Field

The embodiment of the application relates to the technical field of radio frequency, in particular to electronic equipment, a test system and a test method.

Background

Before the electronic device leaves a factory, a manufacturer needs to test the radio frequency performance of the electronic device to ensure the communication function of the electronic device. However, with the evolution of radio frequency technology and the continuous complication of electronic device architecture, especially after the 5G era, more and more test sockets need to be arranged in the electronic device to test the radio frequency performance, and the number of the test sockets may reach 7 to 10, so that the space occupied by the antenna group is larger and larger, and the miniaturization of the electronic device is greatly hindered.

Disclosure of Invention

In view of the above, it is desirable to provide an electronic device, a test system and a test method with small volume.

In a first aspect, the present application provides an electronic device, comprising:

a radio frequency device configured with a first test port for transmitting a first radio frequency signal;

one end of the circuit board assembly is connected with the first test port, and the circuit board assembly is used for transmitting the first radio frequency signal;

and the serial bus port is connected with the other end of the circuit board assembly and is used for transmitting the first radio-frequency signal transmitted by the radio-frequency device to external test equipment and/or transmitting the first radio-frequency signal sent by the test equipment to the radio-frequency device for receiving and processing, and the first radio-frequency signal is used for testing the radio-frequency performance of the electronic equipment.

In a second aspect, the present application provides a test system comprising:

the electronic apparatus as described above;

the test equipment is configured with a second test port used for transmitting the first radio frequency signal, the second test port is connected to a first test port of a radio frequency device through a serial bus port of the electronic equipment and a circuit board assembly, and the test equipment is used for acquiring the radio frequency performance of the electronic equipment according to the first radio frequency signal.

In a third aspect, the present application provides a testing method applied to the testing system as described above, the method including:

the test equipment generates and sends a test indication signal through the second test port;

the electronic equipment responds to the test indication signal to receive and send a first radio frequency signal;

and the test equipment acquires the radio frequency performance of the electronic equipment according to the first radio frequency signal received and transmitted by the electronic equipment.

According to the electronic equipment, the test system and the test method, the circuit board assembly is connected with the radio frequency device, and the thickness of the circuit board assembly is small, the design flexibility of the shape of the circuit board assembly is high, and the circuit board assembly can be designed in a customized mode according to the internal space of the electronic equipment, so that the space occupied in the electronic equipment can be greatly reduced. Moreover, the circuit board assembly is connected with the serial bus port, the transmission of the first radio frequency signal can be realized by utilizing the inherent serial bus port of the electronic equipment, and therefore, the radio frequency device can be conveniently conducted to external test equipment. Moreover, based on the connection mode, the test in the assembly stage can be merged to the complete machine stage for execution, so that the test flow is simplified.

Drawings

In order to more clearly illustrate the embodiments of the present application or technical solutions in related arts, the drawings used in the description of the embodiments or related arts will be briefly described below, it is obvious that the drawings in the description below are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative efforts.

FIG. 1 is a schematic structural diagram of an electronic device according to an embodiment;

fig. 2 is a second schematic structural diagram of an electronic apparatus according to an embodiment;

fig. 3 is a third schematic structural diagram of an electronic apparatus according to an embodiment;

FIG. 4 is a fourth schematic view of an electronic apparatus according to an embodiment;

FIG. 5 is a fifth schematic view of a structure of an electronic apparatus according to an embodiment;

FIG. 6 is a sixth schematic structural view of an electronic apparatus according to an embodiment;

fig. 7 is a seventh schematic structural diagram of an electronic apparatus according to an embodiment;

FIG. 8 is an eighth schematic structural diagram of an electronic device according to an embodiment;

FIG. 9 is a flowchart of a testing method according to one embodiment;

FIG. 10 is a second flowchart of a testing method according to an embodiment;

fig. 11 is an internal structural diagram of an electronic device according to an embodiment.

Element number description:

a radio frequency device: 100, respectively; a second radio frequency switch: 110; a circuit board assembly: 200 of a carrier; serial bus port: 300, respectively; the first radio frequency switch: 400.

Detailed Description

In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.

It will be understood that, as used herein, the terms "first," "second," and the like may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another. For example, a first radio frequency signal may be referred to as a second radio frequency signal, and similarly, a second radio frequency signal may be referred to as a first radio frequency signal, without departing from the scope of the present application. The first radio frequency signal and the second radio frequency signal are both radio frequency signals, but they are not the same radio frequency signal.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or to implicitly indicate the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the feature. In the description of the present application, "plurality" means at least two, e.g., two, three, etc., unless explicitly specified otherwise. In the description of the present application, "a number" means at least one, such as one, two, etc., unless specifically limited otherwise.

In the related art rf performance test, a test socket or cable socket is usually disposed on the rf board. In the Surface Mount Technology (SMT) stage, a tester fastens the rf cable to a test socket or a cable socket of the motherboard, thereby performing a conduction calibration and a comprehensive test. Then, the RF board and other functional modules are assembled into a complete machine in the final assembly stage, and the antenna coupling test is performed on the complete machine by the tester. However, there is some overlap between the integrated test in the assembly stage and the antenna coupling test in the final assembly stage. Therefore, the related art radio frequency test requires a test socket with a relatively large area in the electronic device, and the test is repeated to some extent, resulting in insufficient test efficiency.

The embodiment of the application provides electronic equipment, which can reduce the space occupied by hardware for supporting radio frequency test, thereby realizing miniaturization of the electronic equipment. The electronic device according to the embodiment of the present application is an electronic device with a wireless communication function, and may be, for example, a handheld device, a vehicle-mounted device, a wearable device, a computing device or other processing devices connected to a wireless modem, and various forms of User Equipment (UE) (e.g., a Mobile phone), a Mobile Station (MS), and so on. Fig. 1 is a schematic structural diagram of an electronic device according to an embodiment, and referring to fig. 1, the electronic device includes a radio frequency device 100, a circuit board assembly 200, and a serial bus port 300.

The rf device 100 is an integrated device in which rf elements are packaged. The radio frequency components of the internal package include, for example, a Power Amplifier (PA), a Low Noise Amplifier (LNA), a filter, a radio frequency Switch (Switch), an antenna tuning Switch (Tuner), and the like. Depending on the radio frequency components of the internal package, the radio frequency device 100 may be, but is not limited to, a bifem (integrated radio frequency switch and filter), an LFEM (integrated radio frequency switch, low noise amplifier and filter), a FEMid (integrated radio frequency switch, filter and duplexer), a PAMid (integrated multimode multiband PA and FEMid), and the like. The radio frequency device 100 is configured with a first test port for transmitting a first radio frequency signal. Specifically, the first radio frequency signal is used to test the radio frequency performance of the electronic device, and the radio frequency device 100 may output the first radio frequency signal through the first test port, so as to implement a test on the transmission radio frequency performance such as the transmission power. The rf device 100 may also input a first rf signal through the first test port to test the performance of receiving rf, such as the received power.

One end of the circuit board assembly 200 is connected to the first test port, and the other end of the circuit board assembly 200 is connected to the serial bus port 300. That is, the circuit board assembly 200 is used to communicate the serial bus port 300 with the first test port of the rf device 100. The circuit board assembly 200 is used to transmit a first radio frequency signal. Specifically, the circuit board assembly 200 has a bidirectional transmission function, and can transmit the first rf signal from the rf device 100 to the serial bus port 300, and also can transmit the first rf signal from the serial bus port 300 to the rf device 100. Alternatively, the Circuit board assembly 200 may be a Flexible Printed Circuit (FPC) that can be freely bent. Therefore, the flexible circuit board can be flexibly adapted to the space in the electronic equipment, and the space utilization rate is greatly improved.

The serial bus port 300 may be a USB port, and the Type of the USB port may be, but is not limited to, type-a, type-B, type-C, miniUSB, microUSB, etc. The USB port may be used to support wired charging, wired data transmission, etc. functions of the electronic device. In this embodiment, after the electronic device is assembled into a complete machine, the serial bus port 300 is further used for connecting with a test device such as a comprehensive tester, so as to implement a radio frequency performance test in a complete machine state. Specifically, when the electronic device is tested for the performance of transmitting radio frequency, the serial bus port 300 is used to transmit the processed first radio frequency signal transmitted by the radio frequency device 100 to an external testing device. When testing the performance of receiving radio frequency signals of the electronic device, the serial bus port 300 is used to transmit a first radio frequency signal sent by the testing device to the radio frequency device 100 for receiving processing. Therefore, the serial bus port 300 can be controlled to perform corresponding signal transmission according to the test requirement. That is, the serial bus port 300 may be controlled to transmit only the transmitted first rf signal, the serial bus port 300 may also be controlled to transmit only the received first rf signal, and the serial bus port 300 may also be controlled to sequentially transmit the received first rf signal and the transmitted rf signal.

In this embodiment, a manner of connecting the circuit board assembly 200 and the rf device 100 is adopted, and since the thickness of the circuit board assembly 200 is small and the design flexibility of the shape of the circuit board assembly 200 is high, the circuit board assembly can be designed in a customized manner according to the internal space of the electronic device, so that the space occupied in the electronic device can be greatly reduced. Furthermore, by connecting the circuit board assembly 200 to the serial bus port 300, the transmission of the first rf signal can be realized by using the serial bus port 300 inherent to the electronic device, so that the rf device 100 can be conveniently conducted to an external test device. Moreover, based on the connection mode, the test in the assembly stage can be merged to the complete machine stage for execution, so that the test flow is simplified.

Fig. 2 is a second schematic structural diagram of the electronic device according to an embodiment, referring to fig. 2, the first test port is further used for connecting an antenna, and the radio frequency device 100 is further used for supporting a receiving process of a second radio frequency signal received by the antenna and/or supporting a transmitting process of the second radio frequency signal transmitted by the antenna. Specifically, when performing a radio frequency performance test, the first test port is used for transmitting a first radio frequency signal; the first test port is for transmitting a second radio frequency signal when performing regular communication of the electronic device. If the rf device 100 is a device for performing receiving processing on signals, such as an LNA Bank, the rf device 100 is only used to support receiving processing on the first rf signal and the second rf signal. If the rf device 100 is a device such as PAMid for performing transmission processing on signals, the rf device 100 is only used to support the transmission processing on the first rf signal and the second rf signal. If the rf device 100 is a device capable of performing both transmission processing and reception processing on signals, such as L-PAMid, the rf device 100 is used to support the transmission processing and reception processing on the first rf signal, and to support the transmission processing and reception processing on the second rf signal. In this embodiment, the first test port transmits the first rf signal and the second rf signal in a time-sharing manner, so that the number of ports required to be configured in the rf device 100 can be reduced on the premise of ensuring the communication function and the test function.

Fig. 3 is a third schematic structural diagram of an electronic apparatus according to an embodiment, referring to fig. 3, in one embodiment, the rf device 100 is further configured with a transceiving port RFOUT1 for connecting to a radio frequency transceiver, and the rf device 100 is configured to transmit a first rf signal and a second rf signal to the radio frequency transceiver through the transceiving port RFOUT1. The radio frequency device 100 comprises a second radio frequency switch 110, the second radio frequency switch 110 comprising a first terminal and a second terminal. The second rf switch 110 may be an independent rf switch, or may be a switch module formed by integrating a plurality of rf switches, which is not limited in this embodiment.

At least a part of the first end of the second rf switch 110 is connected to the transceiving port RFOUT1. Alternatively, the number of the first terminals of the second rf switches 110 may be equal to the number of the transceiving ports RFOUT1. When the second rf switch 110 includes only a first terminal, the rf device 100 includes a transceiver port RFOUT1. When the second rf switch 110 includes a plurality of first terminals, the rf device 100 may include a plurality of transceiver ports RFOUT1, wherein at least some of the transceiver ports RFOUT1 are used for transmitting signals in different frequency bands, and the plurality of first terminals of the second rf switch 110 are respectively connected to the plurality of transceiver ports RFOUT1 in a one-to-one correspondence manner. Optionally, the number of the first terminals of the second rf switch 110 may also be greater than the number of the transceiving ports RFOUT1, and a part of the first terminals are reserved to be connected to other devices, so as to implement other path switching functions. At least a portion of the second end of the second rf switch 110 is connected to the first test port RFIN. Alternatively, the number of the second terminals of the second radio frequency switches 110 may be equal to the number of the first test ports RFIN. When the second radio frequency switch 110 includes one second terminal, the number of the first test port RFIN and the test lines connected to the first test port RFIN are each one. In this embodiment, by providing the second rf switch 110, the signal transmission paths can be switched, so as to cut off the path of the port that does not need to perform signal transmission, thereby avoiding interference between different signal transmission paths.

Further, with continued reference to fig. 3, when the second radio frequency switch 110 includes a plurality of second terminals, the number of the first test ports RFIN and the test lines are also plural, and the circuit board assembly 200 includes a plurality of pads for connecting the test lines. The second ends of the second rf switch 110 are respectively connected to the first test ports RFIN in a one-to-one correspondence, and each test line is respectively connected to each pad of the circuit board assembly 200 in a corresponding manner. Optionally, the number of the second terminals of the second rf switch 110 may also be greater than the number of the transceiving ports RFOUT1, and a part of the second terminals are reserved to be connected to other devices, so as to implement other path switching functions. In this embodiment, since the second rf switch 110 includes a plurality of second terminals, it is able to switch to different testing lines for testing in sequence and quickly, and it is not necessary for the tester to switch the testing lines manually, so as to greatly improve the efficiency and flexibility of testing.

With continued reference to fig. 3, in one embodiment, the RF device 100 further includes a Mobile Industry Processor Interface (MIPI), and accordingly, the RF device 100 controlled by MIPI may be referred to as a MIPI radio Front-end (MIPI RF Front-end). The MIPI RFFE protocol bus consists of one power line (VIO) and two control lines (SCLK and SDATA). The SCLK control line is used to provide the clock signal and synchronization functions, and the SDATA control line is used to provide the control signal and transfer data. The power line VIO is powered up before the control line SDATA and the control line SCLK transmit signals, i.e., the voltage rises to the power voltage, which is, for example, 1.8V. In addition, the MIPI interface can also be provided with a USID port so as to realize the verification of the equipment identity information.

Fig. 4 is a fourth schematic structural diagram of an electronic device according to an embodiment, and referring to fig. 4, the rf device 100 further includes a first rf switch 400, where the first rf switch 400 includes a first terminal and two second terminals. A first terminal of the first radio frequency switch 400 is connected to the first test port RFIN of the radio frequency device 100, a second terminal of the first radio frequency switch 400 is connected to the circuit board assembly 200 via a test line, and another second terminal of the first radio frequency switch 400 is connected to an antenna via a communication line. The first rf switch 400 is used to selectively turn on the first terminal to one of the communication line and the test line. It will be appreciated that the embodiments of fig. 2 and 3 are directed to externally routing test lines over the communication lines, and thus the test lines are longer. Moreover, when the rf device 100 works normally, the test line may have a total reflection signal fed back to the communication line, thereby causing a phase error to a certain extent and affecting the communication quality of the electronic device. However, in this embodiment, by providing the first rf switch 400, the rf device 100 can be turned on to only one of the test line and the communication line at a single time, so as to separate the communication line from the test line, thereby effectively avoiding the problem of the total reflection signal and improving the communication quality of the electronic device.

In one embodiment, the number of the first test ports RFIN, the first radio frequency switches 400 and the test lines are all plural, and the circuit board assembly 200 includes a plurality of pads for connecting the test lines. The first end of each first rf switch 400 is correspondingly connected to each first test port RFIN, and each test line is correspondingly connected to each pad of the circuit board assembly 200. For example, in the embodiment shown in fig. 4, the radio frequency device 100 comprises four first test ports RFIN, the first radio frequency switch 400 comprises four second terminals, the electronic device comprises four test lines, and the circuit board assembly 200 comprises four pads. In this embodiment, since the second rf switch 110 includes a plurality of second terminals, it is able to switch to different test lines for testing in turn and quickly, and it is not necessary for the tester to switch the test lines manually, so as to greatly improve the efficiency and flexibility of testing.

Fig. 5 is a fifth schematic structural diagram of an electronic device according to an embodiment, and referring to fig. 5, in one embodiment, the radio frequency device 100 is further configured with an antenna port ANT for connecting an antenna, and the radio frequency device 100 is further configured to support a receiving process of a second radio frequency signal received by the antenna and/or support a transmitting process of the second radio frequency signal transmitted by the antenna. If the rf device 100 is a device for performing receiving processing on signals, such as an LNA Bank, the rf device 100 is only used to support receiving processing on the first rf signal and the second rf signal. If the rf device 100 is a device such as PAMid for performing transmission processing on signals, the rf device 100 is only used to support the transmission processing on the first rf signal and the second rf signal. If the rf device 100 is a device capable of performing both transmission processing and reception processing on a signal, such as L-PAMid, the rf device 100 is used to support the transmission processing and reception processing on the first rf signal, and is used to support the transmission processing and reception processing on the second rf signal. In this embodiment, because different ports are adopted to output the first radio frequency signal and the second radio frequency signal respectively, no additional radio frequency switch is required to be arranged, isolation between the communication line and the test line can also be realized, and therefore the problem of total reflection signals can be avoided on the premise of ensuring the communication function and the test function, and the communication quality of the electronic equipment is improved. Moreover, based on the above connection manner, the circuit board assembly 200 can realize transmission of all the first radio frequency signals only by arranging one pad, thereby further reducing the volume of the circuit board assembly 200.

Referring to fig. 6 to 8 in combination, in one embodiment, the electronic device includes a plurality of rf devices 100, and the plurality of rf devices 100 are connected to form an rf system to implement complex rf functions. Each rf device 100 is configured with at least one of an auxiliary input port RFOUT3 and an auxiliary output port RFOUT2, respectively, the auxiliary input port RFOUT3 of one rf device 100 being connected with the auxiliary output port RFOUT2 of another rf device 100 to transmit a first rf signal between the two connected rf devices 100. Wherein a first end of another part of the second rf switch 110 of the rf device 100 configured with the auxiliary input port RFOUT3 is connected to the auxiliary input port RFOUT3, and a second end of another part of the second rf switch 110 of the rf device 100 configured with the auxiliary output port RFOUT2 is connected to the auxiliary output port RFOUT 2. Specifically, the embodiments of fig. 6 to 8 take two rf devices 100 in an electronic apparatus as an example for explanation. The upper rf device 100 is configured with the auxiliary output port RFOUT2, the lower rf device 100 is configured with the auxiliary input port RFOUT3, and the first rf signal can be transmitted to the auxiliary input port RFOUT3 of the lower rf device 100 through the auxiliary output port RFOUT2 of the upper rf device 100. Moreover, when the signals 0 to 4 are second rf signals, the second rf signals can be transmitted to any antenna for transmission; when the signals 0 to 4 are the first rf signals, all the first rf signals can be output through the pcb assembly 200 and the serial bus port 300. Based on the above connection manner, when the number of signal ports of one rf device 100 is insufficient, a signal can be led to a signal port of another rf device 100 for output, thereby improving the flexibility of signal output. It is understood that in other embodiments, the electronic device may include a greater number of radio frequency devices 100, and the connected radio frequency devices 100 may be different radio frequency devices 100.

The embodiment of the application also provides a test system, which comprises test equipment and the electronic equipment. The test equipment is configured with a second test port for transmitting the first radio frequency signal, the second test port being connected to the first test port RFIN of the radio frequency device 100 via the serial bus port 300 of the electronic equipment, the circuit board assembly 200, the test equipment being configured to obtain radio frequency performance of the electronic equipment from the first radio frequency signal. When the second test port of the test equipment is not matched with the USB port, port conversion can be carried out through the external converter, and therefore reliable connection between the electronic equipment and the test equipment is guaranteed.

The embodiment of the application also provides a test method which is applied to the test system. FIG. 9 is one of the flow charts of the testing method of an embodiment, referring to FIG. 9, in which the testing method includes steps 902 to 906.

Step 902, the test equipment generates and sends a test indication signal via the second test port.

Specifically, the test device may be configured with a test type of the radio frequency performance that needs to be executed in advance, and the test device informs the electronic device of the test type of the radio frequency performance to be performed through the test indication signal, so that the electronic device is enabled to conduct the corresponding signal transmission path. The test type of the radio frequency performance may include a transmitting radio frequency performance and a receiving radio frequency performance. For example, if the performance of the transmitted radio frequency needs to be tested, the electronic device needs to turn on the signal transmission path where the power amplifier, the filter, and the like are located. If the performance of the received radio frequency needs to be tested, the electronic device is required to turn on a signal transmission path where a low noise amplifier, a filter and the like are located.

At step 904, the electronic device transceives a first radio frequency signal in response to the test indication signal.

Specifically, the electronic device may receive and transmit the first radio frequency signal after completing the switching of the signal transmission path in response to the test indication signal. When the electronic device needs to transmit the first radio frequency signal, the electronic device may start to transmit the first radio frequency signal immediately after the switching of the signal transmission path is completed. When the electronic device needs to receive the first radio frequency signal, the electronic device may send a signal to inform the test device that the test device may receive the first radio frequency signal after completing the switching of the signal transmission path, so that the test device transmits the first radio frequency signal.

Step 906, the test device obtains the radio frequency performance of the electronic device according to the first radio frequency signal received and transmitted by the electronic device.

The method for acquiring the radio frequency performance of the electronic device by the test device may refer to related technologies, which is not limited in this embodiment. In this embodiment, based on the foregoing test system, the radio frequency performance of the electronic device can be accurately tested.

FIG. 10 is a second flowchart of the testing method according to an embodiment, referring to FIG. 10, in which the testing method includes steps 1002 to 1012. Step 1008 to step 1010 may refer to step 902 to step 904 in the embodiment of fig. 9, and are not described in detail in this embodiment. Step 906 of the embodiment of FIG. 9 further includes step 1012 of the present embodiment.

At step 1002, the test equipment generates and sends a calibration indication signal via the second test port.

In step 1004, the electronic device disconnects the signal transmission path between the first end of the first rf switch 400 and the test line according to the calibration indication signal.

In step 1006, the test equipment obtains loss information of the test line.

Specifically, taking the embodiment of fig. 8 as an example, when the signal 0 needs to be calibrated, the signal 0 is transmitted to the antenna 0 in a default state, and at this time, the signal 0 and the test line are isolated from each other, the test equipment can be conducted to the auxiliary output port RFOUT2 of the rf device 100 above through the serial bus port 300, the circuit board assembly 200 and the rf device 100 below, and acquire information on a path as loss information of the test line. First rf switch 400 is then configured to the calibration state, i.e., signal 0 is connected to the test line for calibration. By analogy, the round robin aligns signals 0 through 4. Moreover, because the test line of each electronic device has randomness, the loss and the phase offset aiming at different frequencies fluctuate, and compared with the preset same calibration data, the calibration accuracy can be greatly improved in an instant calibration mode.

At step 1008, the test equipment generates and sends a test indication signal via the second test port.

At step 1010, the electronic device transmits and receives a first radio frequency signal in response to the test indication signal.

Step 1012, the testing device obtains the radio frequency performance of the electronic device according to the first radio frequency signal and the loss information received and transmitted by the electronic device.

In this embodiment, based on the above test method, the calibration accuracy can be ensured. Moreover, when the testing method of the embodiment is applied to the electronic devices of the embodiments of fig. 5 and 8, calibration of multiple signals can be realized through one testing line, so that the occupied space is reduced.

It should be understood that, although the steps in the flowcharts are shown in sequence as indicated by the arrows, the steps are not necessarily performed in sequence as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least a portion of the steps in the flowcharts may include multiple sub-steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, and the order of performing the sub-steps or stages is not necessarily sequential, but may be performed alternately or alternately with other steps or at least a portion of the sub-steps or stages of other steps.

In one embodiment, an electronic device is provided, which may be a terminal. The terminal can be but not limited to various personal computers, notebook computers, smart phones, tablet computers, internet of things equipment and portable wearable equipment, and the internet of things equipment can be intelligent sound boxes, intelligent televisions, intelligent air conditioners, intelligent vehicle-mounted equipment and the like. The portable wearable device can be a smart watch, a smart bracelet, a head-mounted device, and the like. Fig. 11 is an internal structural diagram of an electronic device according to an embodiment. The electronic device comprises a processor, a memory, a communication interface, a display screen and an input device which are connected through a system bus. Wherein the processor of the electronic device is configured to provide computing and control capabilities. The memory of the electronic equipment comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operating system and the computer program to run on the non-volatile storage medium. The communication interface of the electronic device is used for carrying out wired or wireless communication with an external terminal, and the wireless communication can be realized through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. The computer program is executed by a processor to implement a testing method. The display screen of the electronic equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the electronic equipment can be a touch layer covered on the display screen, a key, a track ball or a touch pad arranged on the shell of the electronic equipment, an external keyboard, a touch pad or a mouse and the like.

It will be appreciated by those skilled in the art that the structure shown in fig. 11 is a block diagram of only a portion of the structure associated with the present application, and does not constitute a limitation on the electronic devices to which the present application may be applied, and a particular electronic device may include more or fewer components than those shown in the drawings, or may combine certain components, or have a different arrangement of components.

In one embodiment, an electronic device is provided, which includes a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the above method embodiments when executing the computer program.

In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored, which computer program, when being executed by a processor, carries out the steps of the above-mentioned method embodiments.

In one embodiment, a computer program product is provided, comprising a computer program which, when executed by a processor, performs the steps of the above-described method embodiments.

It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above may be implemented by hardware instructions of a computer program, which may be stored in a non-volatile computer-readable storage medium, and when executed, may include the processes of the embodiments of the methods described above. Any reference to memory, database, or other medium used in the embodiments provided herein may include at least one of non-volatile and volatile memory. The nonvolatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical Memory, high-density embedded nonvolatile Memory, resistive Random Access Memory (ReRAM), magnetic Random Access Memory (MRAM), ferroelectric Random Access Memory (FRAM), phase Change Memory (PCM), graphene Memory, and the like. Volatile Memory can include Random Access Memory (RAM), external cache Memory, and the like. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM), for example. The databases referred to in various embodiments provided herein may include at least one of relational and non-relational databases. The non-relational database may include, but is not limited to, a block chain based distributed database, and the like. The processors referred to in the embodiments provided herein may be general purpose processors, central processing units, graphics processors, digital signal processors, programmable logic devices, quantum computing based data processing logic devices, etc., without limitation.

The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above-mentioned embodiments only express a few embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for those skilled in the art, variations and modifications can be made without departing from the concept of the embodiments of the present application, and these embodiments are within the scope of the present application. Therefore, the protection scope of the patent of the embodiment of the application shall be subject to the appended claims.

Claims

1. An electronic device, comprising:

2. The electronic device of claim 1, wherein the first test port is further configured to connect to an antenna, and wherein the radio frequency device is further configured to support a reception process of a second radio frequency signal received by the antenna and/or support a transmission process of the second radio frequency signal transmitted by the antenna.

3. The electronic device of claim 2, further comprising:

the first radio frequency switch comprises a first end and two second ends, the first end of the first radio frequency switch is connected with a first test port of the radio frequency device, one second end of the first radio frequency switch is connected with the circuit board assembly through a test wire, the other second end of the first radio frequency switch is connected with the antenna through a communication wire, and the first radio frequency switch is used for selectively conducting the first end to one of the communication wire and the test wire.

4. The electronic device of claim 3, wherein the number of the first test port, the first radio frequency switch and the test line is plural, and the circuit board assembly comprises plural pads for connecting the test line;

the first ends of the first radio frequency switches are respectively and correspondingly connected with the first test ports, and the test lines are respectively and correspondingly connected with the bonding pads of the circuit board assembly.

5. The electronic device of claim 1, wherein the radio frequency device is further configured with an antenna port for connecting an antenna, and wherein the radio frequency device is further configured to support a reception process of a second radio frequency signal received by the antenna and/or to support a transmission process of the second radio frequency signal transmitted by the antenna.

6. The electronic device of any of claims 2-5, wherein the radio frequency device is further configured with a transceiver port for connecting to a radio frequency transceiver, the radio frequency device being configured to transmit the first and second radio frequency signals to the radio frequency transceiver via the transceiver port; the radio frequency device includes:

a second rf switch, the second rf switch including a first terminal and a plurality of second terminals, at least a portion of the first terminals of the second rf switch being connected to the transceiver port, and at least a portion of the second terminals of the second rf switch being connected to the first test port.

7. The electronic device according to claim 6, wherein the electronic device comprises a plurality of the radio frequency devices, each of the radio frequency devices is configured with at least one of an auxiliary input port and an auxiliary output port, the auxiliary input port of one of the radio frequency devices is connected with the auxiliary output port of another one of the radio frequency devices to transmit the first radio frequency signal between the two connected radio frequency devices;

wherein the first end of another part of the second rf switch of the rf device configured with the auxiliary input port is connected to the auxiliary input port, and the second end of another part of the second rf switch of the rf device configured with the auxiliary output port is connected to the auxiliary output port.

8. A test system, comprising:

the electronic device of any one of claims 1-7;

9. A test method applied to the test system according to claim 8, the method comprising:

10. The method for testing of claim 9, wherein before the testing device generates and sends the test indication signal via the second test port when the electronic device comprises the first rf switch, the method further comprises:

the test equipment generates and sends a calibration indication signal through the second test port;

the electronic equipment disconnects a signal transmission path between the first end of the first radio frequency switch and a test line according to the calibration indication signal;

the test equipment acquires loss information of the test line;

the method for acquiring the radio frequency performance of the electronic equipment by the test equipment according to the first radio frequency signal received and transmitted by the electronic equipment comprises the following steps:

and the test equipment acquires the radio frequency performance of the electronic equipment according to the first radio frequency signal and the loss information which are received and transmitted by the electronic equipment.