CN115290302B - Spontaneous radiation testing method and device of solid laser - Google Patents
Spontaneous radiation testing method and device of solid laser Download PDFInfo
- Publication number
- CN115290302B CN115290302B CN202211231214.0A CN202211231214A CN115290302B CN 115290302 B CN115290302 B CN 115290302B CN 202211231214 A CN202211231214 A CN 202211231214A CN 115290302 B CN115290302 B CN 115290302B
- Authority
- CN
- China
- Prior art keywords
- laser
- solid
- power
- pumping
- seed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/0014—Monitoring arrangements not otherwise provided for
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
- H01S3/16—Solid materials
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Lasers (AREA)
Abstract
The invention provides a spontaneous radiation testing method and a spontaneous radiation testing device of a solid laser, and belongs to the technical field of ultrafast lasers. The method comprises the steps of determining the current pumping power of the solid-state laser amplification system; controlling the solid laser amplification system to work under the conditions that the current pumping power and the seed laser generation system do not emit seed laser, and measuring the current output power of the solid laser; when the difference value between the current output power and the last output power of the solid laser is greater than the preset threshold value, returning to the step of determining the current pumping power of the solid laser amplification system; when the difference value between the current output power and the last output power of the solid laser is smaller than or equal to the preset threshold value, the current output power is determined as the optical power of spontaneous radiation contained in the laser power of the laser output by the solid laser, and therefore the spontaneous radiation in the laser output by the solid laser is tested.
Description
Technical Field
The invention relates to the technical field of ultrafast lasers, in particular to a spontaneous radiation testing method and a spontaneous radiation testing device of a solid laser.
Background
Ultrafast laser is a new field of solid laser development. Ultrafast pulse has the characteristics of extremely short duration, extremely high peak power, extremely wide spectrum and the like, and is widely applied to various fields of industry, environment, energy, communication and the like. The ultra-short pulse can observe the ultra-fast movement process of atoms and molecular scales, and opens up a road for exploring the micro world. Extreme physical conditions can be generated by extremely high peak power, so that extreme phenomena such as large explosion in the universe, solar central temperature, nuclear explosion and the like can be simulated. The ultrafast laser has extremely short acting time and extremely small heat affected zone, and can ensure that surrounding normal tissues are not damaged when being applied to medical treatment and treating or cutting pathological tissues. Ultrafast laser has also brought a revolution to other relevant scientific fields, has produced a series of emerging leading-edge subjects and techniques such as intense field physics, ultrafast nonlinear optics, precision metrology, hyperfine cold working.
At present, a gain medium of a solid laser mostly appears in a rod shape and the like, the gain is high, the geometric shape is regular, strong parasitic oscillation is easy to generate, and the existence of the parasitic oscillation in the solid laser enables seed laser to consume a large amount of inversion particles in advance before reaching the gain medium, so that the peak power and the extraction efficiency of the gain medium are reduced; in laser amplification, the parasitic oscillation reduces the internal energy storage of the gain medium, if the parasitic oscillation propagates in the optical path and is continuously Amplified, amplified Spontaneous Emission (ASE) is formed, and since the large-energy solid laser has high gain, the Amplified Spontaneous Emission greatly limits the energy storage density in the gain medium, thereby limiting the effective energy obtained from the gain medium.
For the output laser of the solid laser, the spontaneous emission (ASE) is equivalent to strong background noise, which significantly deteriorates the beam quality and the spot shape of the output laser, thereby affecting the improvement of the laser power, but the prior art does not disclose a method for testing the spontaneous emission (ASE) in the output laser. Therefore, the testing of spontaneous emission (ASE) is an important issue to be solved in the industry.
Disclosure of Invention
The invention provides a spontaneous radiation testing method and a spontaneous radiation testing device of a solid laser, which are used for solving the defect that spontaneous radiation in output laser cannot be tested in the prior art.
The invention provides a spontaneous radiation testing method of a solid laser, wherein the solid laser comprises a seed laser generating system and a solid laser amplifying system, the solid laser amplifying system comprises an amplifying module and at least one pumping module, the pumping light emitted by the pumping module and the seed laser emitted by the seed laser generating system are both incident to the amplifying module, and the method comprises the following steps:
determining the current pumping power of the solid laser amplification system;
controlling the solid laser amplification system to work under the conditions that the current pumping power and the seed laser generation system do not emit seed laser, and measuring the current output power of the solid laser;
when the difference value between the current output power and the last output power of the solid laser is smaller than or equal to a preset threshold value, determining the current output power as the spontaneous emission optical power contained in the laser power of the laser output by the solid laser;
and when the difference value between the current output power and the last output power of the solid laser is greater than the preset threshold value, returning to the step of determining the current pumping power of the solid laser amplification system.
According to the spontaneous emission testing method of the solid laser provided by the invention, the determining of the current pumping power of the solid laser amplification system comprises the following steps:
controlling the solid laser amplification system to work under the condition that the last pumping power and the seed laser generation system emit seed laser, and measuring the last laser power output by the solid laser;
controlling the solid laser amplification system to work under the conditions that the last pumping power and the seed laser generation system do not emit seed laser, and measuring the last output power of the solid laser;
determining a target pumping power based on the last pumping power, the last laser power and the last output power;
and determining the target pump power as the current pump power of the solid-state laser amplification system.
According to the spontaneous emission testing method of the solid laser provided by the present invention, the determining a target pumping power based on the previous pumping power, the previous laser power and the previous output power includes:
determining a target pump power based on equation (1);
where P2 denotes the target pump power, P1 denotes the previous pump power, pout denotes the previous laser power, wout denotes the previous output power, and a denotes the light-light conversion efficiency of the solid-state laser.
According to the spontaneous emission testing method of the solid laser, when the solid laser amplification system is controlled to work for the first time, the last pumping power of the solid laser amplification system is the rated pumping power.
According to the spontaneous emission testing method of the solid laser provided by the invention, the determining of the current pumping power of the solid laser amplification system comprises the following steps:
controlling the solid laser amplification system to work under the condition that the seed laser is emitted by the rated pumping power and the seed laser generation system, and acquiring the light spot form of the laser output by the solid laser;
determining whether spontaneous radiation exists in the laser output by the solid laser based on the spot shape of the laser;
and when determining that spontaneous radiation exists in the laser output by the solid laser, determining the current pumping power of the solid laser amplification system.
According to the spontaneous emission testing method of the solid laser, the amplification module comprises a gain medium, a first reflector and a second reflector, the gain medium comprises a first light-transmitting end face and a second light-transmitting end face, and the first light-transmitting end face and the second light-transmitting end face intersect after extending;
the gain medium is positioned between the first reflector and the second reflector, the first reflector is arranged adjacent to the first light-transmitting end face, and the second reflector is arranged adjacent to the second light-transmitting end face;
the seed laser emitted by the seed laser generating system is incident to the first light-transmitting end face at a preset angle.
According to the spontaneous radiation testing method of the solid laser, the at least one pumping module comprises a first pumping module and a second pumping module;
the pump light emitted by the first pump module is incident to a first light-transmitting end face of the gain medium; and the pump light emitted by the second pump module is incident to a second light-transmitting end face of the gain medium.
According to the spontaneous emission testing method of the solid laser, the pumping module comprises a pumping source and a pumping shaping lens group, and the pumping shaping lens group comprises a pumping shaping ball lens, a first pumping shaping cylindrical lens, a second pumping shaping cylindrical lens and a third pumping shaping cylindrical lens which are sequentially arranged on an emergent light path of pumping light emitted by the pumping source.
According to the spontaneous emission testing method of the solid laser, the gain medium further comprises at least one end face, and heat dissipation materials are arranged on one or more end faces of the at least one end face.
The invention also provides a spontaneous radiation testing device of a solid laser, the solid laser comprises a seed laser generating system and a solid laser amplifying system, the solid laser amplifying system comprises an amplifying module and at least one pumping module, the pumping light emitted by the pumping module and the seed laser emitted by the seed laser generating system are both incident to the amplifying module, the device comprises:
the first determining unit is used for determining the current pumping power of the solid-state laser amplification system;
the control and measurement unit is used for controlling the solid laser amplification system to work under the conditions that the current pumping power and the seed laser generation system do not emit seed laser, and measuring the current output power of the solid laser;
a second determining unit, configured to determine, when a difference between a current output power and a previous output power of the solid-state laser is smaller than or equal to a preset threshold, the current output power as a light power of spontaneous radiation included in a laser power of laser light output by the solid-state laser;
and the returning unit is used for returning to the step of determining the current pumping power of the solid laser amplification system when the difference value between the current output power and the last output power of the solid laser is greater than the preset threshold value.
The invention also provides an electronic device comprising a memory, a processor and a computer program stored on the memory and operable on the processor, wherein the processor executes the program to implement the spontaneous emission testing method of the solid-state laser as described in any one of the above.
The present invention also provides a non-transitory computer-readable storage medium having stored thereon a computer program which, when executed by a processor, implements a method of spontaneous emission testing of a solid state laser as described in any of the above.
The present invention also provides a computer program product comprising a computer program which, when executed by a processor, implements a method of spontaneous emission testing of a solid state laser as described in any one of the above.
The spontaneous radiation testing method and the spontaneous radiation testing device of the solid laser provided by the invention have the advantages that the current output power of the solid laser is measured by controlling the solid laser amplification system to work under the conditions that the current pumping power and the seed laser generation system do not emit seed laser, whether the current output power meets the preset condition or not is determined on the basis of the current output power and the last output power of the solid laser measured under the conditions that the last pumping power and the seed laser generation system do not emit seed laser of the solid laser amplification system, and when the difference value between the current output power and the last output power is determined to be smaller than or equal to the preset threshold value, the current output power is determined to be the optical power of spontaneous radiation contained in the laser power of the laser output by the solid laser, so that the spontaneous radiation testing of the laser output by the solid laser is realized.
Drawings
In order to more clearly illustrate the technical solutions of the present invention or the prior art, the drawings needed for the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and those skilled in the art can also obtain other drawings according to the drawings without creative efforts.
FIG. 1 is a schematic flow chart of a spontaneous emission testing method of a solid laser provided by the present invention;
FIG. 2 is a schematic diagram of a solid-state laser according to the present invention;
FIG. 3 is a second schematic flow chart of a spontaneous emission testing method of a solid-state laser according to the present invention;
FIG. 4 is a second schematic structural diagram of a solid-state laser according to the present invention;
FIG. 5 is a schematic structural diagram of a spontaneous emission testing apparatus of a solid-state laser provided by the present invention;
FIG. 6 is a schematic structural diagram of an electronic device provided by the present invention;
reference numerals:
100. a seed laser generation system; 200. a solid state laser amplification system; 300. an amplifying module; 400. a pumping module;
1. a seed source; 2. an isolator; 3. a first sub-shaping ball lens; 4. a second seed-shaping ball lens; 5. a third reflector; 6. a third sub-shaping ball lens; 7. a first seed-shaping cylindrical lens; 8. a second seed-shaping cylindrical lens; 9. a fourth mirror; 10. a gain medium; 11. a fifth mirror; 12. a first output shaping cylindrical lens; 13. a second output shaping cylindrical lens; 14. a first output shaping ball lens; 15. a second output shaping ball lens; 16. a beam splitter; 17. a light spot quality analyzer; 18. a power meter; 19. a first reflector; 20. a second reflector; 21. a pump source; 22. a pump shaping ball lens; 23. a first pump shaping cylindrical lens; 24. a second pump shaping cylindrical lens; 25. and a third pump shaping cylindrical lens.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without inventive step based on the embodiments of the present invention, are within the scope of protection of the present invention.
The technical scheme provided by the embodiment of the invention can be applied to a solid laser, particularly a high-energy solid laser, and the Amplified Spontaneous Emission (ASE) greatly limits the energy storage density in a gain medium because the high-energy solid laser has high gain, so that the effective energy obtained from the gain medium is limited. Generally, the high gain characteristic of the gain medium enables the gain medium to obtain only a small amount of population inversion, once the gain reaches a certain level, the amplification of the spontaneous radiation consumes a large amount of particles at the upper level, thereby affecting the extraction efficiency and power promotion of the solid laser; in addition, spontaneous emission (ASE) also has an influence on the temporal characteristics of pulses, and therefore, the testing of the spontaneous emission (ASE) is of great significance to solid-state lasers. Based on this, the present invention tests spontaneous emission of solid state lasers.
The spontaneous emission test method of the solid-state laser of the present invention is described below with reference to fig. 1 to 4.
Fig. 1 is one of schematic flow charts of a spontaneous emission testing method of a solid-state laser provided by the present invention, wherein the solid-state laser includes a seed laser generating system 100 and a solid-state laser amplifying system 200, the solid-state laser amplifying system 200 includes an amplifying module 300 and at least one pumping module 400, both the pumping light emitted by the pumping module 400 and the seed laser emitted by the seed laser generating system 100 are incident on the amplifying module 300, as shown in fig. 1, the spontaneous emission testing method of the solid-state laser includes the following steps:
Fig. 2 is a schematic structural diagram of a solid-state laser provided in the present invention, and as shown in fig. 2, the solid-state laser includes a seed laser generating system 100 and a solid-state laser amplifying system 200, the solid-state laser amplifying system 200 includes an amplifying module 300 and at least one pumping module 400, and fig. 2 shows one pumping module 400; the amplification module 300 may include a gain medium and an optical component, the pumping light emitted by the pumping module 400 is incident to the gain medium of the amplification module 300, the pumping light excites an atomic system of the gain medium to increase the number of particles at an upper energy level, so that the number of particles in the gain medium is reversed, the seed laser emitted by the seed laser generation system 100 is incident to the gain medium of the amplification module 300, the seed laser performs pumping coupling amplification on the gain medium under the action of the pumping light, and the optical component is utilized to fold back the light path of the emergent laser of the gain medium, so as to realize multiple amplification, thereby outputting the amplified high-energy laser.
It should be noted that the pump source of the pump module 400 may be a semiconductor laser pump source, and the adjustment of the pump power output by the pump module 400 may be implemented by a constant current laser power supply connected to the pump module 400; specifically, the constant current laser power supply provides electric energy for the semiconductor laser pumping source, and a pumping power variation data curve (P-I curve) of the pumping module 400 along with the current can be obtained in advance; when the required pumping power output by the pumping module 400 is determined, the P-I curve may be queried to obtain a current corresponding to the required pumping power, and the pumping module 400 outputs the required pumping power by adjusting the constant current laser power supply to the current value.
And 102, controlling the solid laser amplification system 200 to work under the conditions of the current pumping power and the condition that the seed laser generation system 100 does not emit seed laser, and measuring the current output power of the solid laser.
Illustratively, after determining the current pump power of the solid-state laser amplification system 200, the pump power output by the pump module 400 of the solid-state laser amplification system 200 is controlled to be the current pump power determined in step 101, and the seed laser generation system 100 does not operate, that is, the seed laser generation system 100 does not emit seed laser, and the output power of the solid-state laser is measured, and then the power is the current output power output by the solid-state laser.
It should be noted that, the measurement of the output power of the solid-state laser may be to arrange a power measurement device at the output end of the solid-state laser, specifically, to arrange a power meter on the output optical path of the solid-state laser, where the power value measured by the power meter is the output power of the solid-state laser; for example, when the current pumping power and the seed laser generating system 100 of the solid laser do not work, the power value measured by the power meter is the current output power output by the solid laser; under the condition that the last pumping power of the solid laser and the seed laser generating system 100 do not work, the power value measured by the power meter is the last output power output by the solid laser; under the condition that the solid laser generates the first pumping power and the seed laser generating system 100 does not work, the power value measured by the power meter is the first output power output by the solid laser amplifying system 200.
It should be noted that, the measurement of the pump power output by the pump module 400 of the solid-state laser amplification system 200 may be to arrange a measurement element on the output optical path of the pump module 400, where the power value measured by the measurement element is the pump power output by the pump module 400, and the measurement element may also adopt a power meter; in order to avoid the influence of the measuring element on the optical path of the solid laser; preferably, a 45 ° tilted beam splitter is disposed on an output light path of the pumping module 400, the measuring element is located on a reflection light path of the beam splitter, the pumping light emitted by the pumping module 400 is transmitted by the beam splitter and then enters the amplification module 300, and the pumping light is reflected by the beam splitter and then enters the measuring element, and the measuring element is used for measuring the pumping power output by the pumping module 400.
It should be noted that after the current output power of the solid-state laser is obtained, it needs to determine whether the current output power meets the preset condition based on the difference between the current output power and the previous output power.
The last output power is the power output by the solid-state laser, which is measured by controlling the solid-state laser amplification system 200 to measure the last pump power and the power output by the seed laser generation system 100 without emitting seed laser; the last pump power and the current pump power have different values.
Specifically, the difference between the current output power and the previous output power is compared with a preset threshold, and based on the difference between the comparison results of the difference and the preset threshold, the following steps are also different, and when it is determined that the difference is smaller than or equal to the preset threshold, step 103 is executed; when it is determined that the difference is greater than the preset threshold, step 104 is performed.
And 103, when the difference value between the current output power and the last output power of the solid laser is smaller than or equal to a preset threshold value, determining the current output power as the spontaneous emission optical power contained in the laser power of the laser output by the solid laser.
And the size of the difference value between the current output power and the last output power represents the stability of the output power output by the solid laser.
For example, when the difference between the current output power of the solid-state laser and the previous output power of the solid-state laser is smaller than or equal to the preset threshold, it indicates that the solid-state laser amplification system 200 is under different pumping powers, and the seed laser generation system 100 does not work, and the output power output by the solid-state laser tends to be stable, and it is determined that the current output power meets the preset condition, and the current output power may be regarded as the optical power of spontaneous radiation in the laser power output by the solid-state laser, that is, the self-laser power in the laser power output by the solid-state laser.
Note that the optical power of the spontaneous emission is also the self-laser power.
And step 104, when the difference between the current output power and the last output power of the solid-state laser is greater than the preset threshold, returning to the step of determining the current pumping power of the solid-state laser amplification system 200.
Illustratively, when it is determined that the difference between the current output power and the previous output power of the solid-state laser is greater than the preset threshold, which indicates that the solid-state laser amplification system 200 is under different pumping powers and the seed laser generation system 100 does not work, the difference between the current output power and the previous output power output by the solid-state laser is large, which indicates that the output power output by the solid-state laser does not tend to be stable, it is determined that the current output power does not satisfy the preset condition, and the step 101 of determining the current pumping power of the solid-state laser amplification system 200 is returned to, and a new current pumping power is re-determined until the difference between the new current output power corresponding to the new current pumping power and the previous output power thereof is less than or equal to the preset threshold, so as to determine the spontaneously-radiated optical power in the output laser powers.
It should be noted that, each time the step of determining the current pump power of the solid-state laser amplification system 200 is returned, where the step of determining the current pump power is followed by determining a new current pump power, and the last pump power on which the new current pump power is determined to be the previous current pump power, the previous current pump power is used as the previous pump power of the new current pump power.
In the spontaneous emission testing method of the solid-state laser provided in the embodiment of the present invention, the solid-state laser amplification system 200 is controlled to operate under the conditions that the current pumping power and the seed laser generation system 100 do not emit seed laser, the current output power of the solid-state laser is measured, whether the current output power meets the preset condition is determined based on the current output power and the last output power of the solid-state laser measured under the conditions that the last pumping power and the seed laser generation system 100 do not emit seed laser of the solid-state laser amplification system 200, and when the difference between the current output power and the last output power is determined to be less than or equal to the preset threshold, the current output power meets the preset condition, and the current output power is determined to be the optical power of spontaneous emission contained in the laser power of the laser output by the solid-state laser, so that the spontaneous emission testing in the laser output by the solid-state laser is realized.
Optionally, fig. 3 is a second schematic flow chart of the spontaneous emission testing method of the solid-state laser provided by the present invention, and as shown in fig. 3, the step 101 may be specifically implemented by the following steps:
And 1012, controlling the solid-state laser amplification system 200 to work under the conditions of the last pumping power and the seed laser generation system 100 not emitting the seed laser, and measuring the last output power of the solid-state laser.
Illustratively, the solid-state laser amplification system 200 operates at the last pump power and the seed laser generation system 100 emits the seed laser, and measures the last laser power output by the solid-state laser; then, the seed laser generating system 100 is turned off, and the solid-state laser operates at the last pumping power and without the seed laser generating system 100 emitting the seed laser, and the last output power output by the solid-state laser is measured.
It should be noted that the control of the seed laser generation system 100 to emit the seed laser may be implemented by a laser shutter; specifically, a laser shutter is disposed between the seed laser generating system 100 and the amplifying module 300, and the seed laser generating system 100 emits the seed laser and does not emit the seed laser by opening and closing the laser shutter.
And 1013, determining a target pumping power based on the last pumping power, the last laser power and the last output power.
Exemplarily, the target pump power is determined based on formula (1);
where P2 denotes a target pump power, P1 denotes a previous pump power, pout denotes a previous laser power, wout denotes a previous output power, and a denotes the light-light conversion efficiency of the solid-state laser.
Note that the light-light conversion efficiency a of the solid-state laser may be obtained in advance before the spontaneous emission test is performed.
And 1014, determining the target pumping power as the current pumping power of the solid laser.
Illustratively, the calculated target pump power is used as the current pump power of the solid laser, which is determined based on the last pump power.
Optionally, when the solid-state laser amplification system 200 is controlled to operate for the first time, the last pump power of the solid-state laser amplification system 200 is the rated pump power.
The current pumping power of the solid-state laser amplification system 200 is determined based on the last pumping power of the solid-state laser amplification system 200, if the solid-state laser amplification system 200 works for the first time in a rated pumping power state, the solid-state laser amplification system 200 is controlled to work for the first time, that is, the pumping power of the solid-state laser amplification system 200 is adjusted for the first time to determine the first current pumping power, and when the first current pumping power is determined, the corresponding last pumping power is the rated pumping power of the solid-state laser amplification system 200; that is, the first current pump power when the solid state laser is first controlled to operate is determined based on the rated pump power.
Specifically, the spontaneous emission testing method of the solid laser provided by the embodiment of the invention is specifically realized by the following steps:
s1, the solid laser amplification system 200 is in a full-power working state, the seed laser generation system 100 emits seed laser, the first laser power Pout1 output by the solid laser is tested through a power meter, and in the working state, the pump power corresponding to the solid laser amplification system 200 is the rated pump power Ppump1; then, the laser shutter is closed, the seed laser generation system 100 does not emit the seed laser, and the power meter measures the first output power Wout1 output by the solid-state laser, where the first output power Wout1 is the pump power Ppump1 and complete self-excitation is performed in a state where no signal light is present (the seed laser generation system 100 is not operated). The solid-state laser amplification system 200 is in a full-power operating state, that is, the solid-state laser amplification system 200 is in a rated-power operating state.
S2, calculating a secondary laser power Pjump 2 through a formula (2);
where, ppump2 represents the secondary laser power, ppump1 represents the rated pump power, pout1 represents the primary laser power, and Wout1 represents the primary output power.
In addition, ppump2 is the corresponding pump power when the pump light of the solid-state laser is completely converted into the laser state in the full-power operating state.
S3, inquiring a P-I curve, determining a current corresponding to a secondary pumping power Pjump 2, adjusting the current of a semiconductor laser pumping source to the current corresponding to the Pjump 2, adjusting the solid laser amplification system 200 to the working state of the secondary pumping power Pjump 2, enabling the seed laser generation system 100 to emit seed laser, and testing the secondary laser power Pout2 output by the solid laser amplification system 200 through a power meter, wherein the pumping power corresponding to the solid laser amplification system 200 is Pjump 2 in the working state; then, the seed laser generating system 100 is turned off (the seed laser generating system 100 does not emit seed laser), and the output power Wout2 of the second time output by the solid-state laser amplifying system 200 is tested by the power meter, where the output power Wout2 of the second time is the pump power Ppump2 and complete self-excitation light is generated in a state of no signal light (the seed laser generating system 100 does not operate).
S4, calculating a difference value between the first output power Wout1 and the second output power Wout 2; when the difference between the first output power Wout1 and the second output power Wout2 is less than or equal to the preset threshold, it indicates that the output power output by the solid-state laser tends to be stable, and the second output power Wout2 is regarded as the self-excited light power in the output laser power Pout1 in the full-power operating state of the solid-state laser, and the operation is ended; when the difference between the first-time output power Wout1 and the second-time output power Wout2 is greater than the preset threshold value, the following step S5 is performed;
s5, calculating third laser power Pjump 3 through a formula (3);
where, ppump3 represents the third laser power, pout2 represents the second laser power, and Wout2 represents the second output power.
It should be noted that Ppump3 is a corresponding pump power when the pump light of the solid-state laser is completely converted into the laser state in the second laser power operation state.
And S6, repeatedly executing the steps S3 to S5, and continuously adjusting the pumping power of the solid laser amplification system 200 until the difference value between the Nth output power Wout N and the N-1 th output power Wout (N-1) is smaller than or equal to a preset threshold value, namely the output power output by the solid laser tested by the power meter is stable, wherein the Nth output power Wout N can be regarded as the self-excited light power in the output laser power Pout1 under the full-power working state of the solid laser.
It should be noted that a feedback control module may be connected between the power measurement device and the constant current laser power supply, and the feedback control module may adjust the current of the semiconductor laser pump source in real time based on the power value obtained by the power measurement device.
Optionally, the step 101 may be specifically implemented by the following steps:
firstly, the solid-state laser amplification system 200 is controlled to operate under the conditions of a rated pumping power and the seed laser generation system 100 emitting the seed laser, and the spot form of the laser output by the solid-state laser is obtained.
Illustratively, before determining the current pump power of the solid-state laser amplification system 200, that is, adjusting the pump power of the solid-state laser amplification system 200 for the first time, the solid-state laser amplification system 200 is controlled to operate at the rated pump power and the seed laser generation system 100 emits the seed laser, and the spot shape of the laser output by the solid-state laser is tested by the spot quality analyzer.
Secondly, whether spontaneous emission exists in the laser output by the solid laser is determined based on the spot shape of the laser.
Comparing the spot form of the laser output by the solid laser with a preset spot form, determining that spontaneous radiation exists in the laser output by the solid laser when the spot form of the laser does not meet the preset spot form, and testing the optical power of the spontaneous radiation in the laser output by the solid laser after determining that the spontaneous radiation exists in the laser output by the solid laser; and when the laser spot shape meets the preset laser spot shape, determining that spontaneous radiation does not exist in the laser output by the solid laser.
It should be noted that, the basis for the judgment is whether the laser spot shape meets the preset spot shape, that is, whether the laser spot shape output by the solid laser is distorted compared with the preset spot shape; when the spot form of the laser output by the solid laser is not distorted, the spot form of the laser output by the solid laser meets the preset spot form, and no spontaneous radiation exists in the laser output by the solid laser; and the spot form of the laser output by the solid laser is distorted, and the spot form of the laser output by the solid laser does not meet the preset spot form, so that the spontaneous radiation exists in the laser output by the solid laser.
Finally, when determining that spontaneous emission exists in the laser light output by the solid-state laser, determining the current pump power of the solid-state laser amplification system 200.
Illustratively, in determining that there is spontaneous emission in the laser light output by the solid-state laser, the step of determining the pump power of the current time of the solid-state laser amplification system 200, that is, the above-mentioned step 1011 (test of spontaneous emission in the laser power output by the solid-state laser amplification system 200) is performed; when it is determined that there is no spontaneous emission in the laser light output from the solid-state laser, this is ended.
Before determining the current pumping power of the solid laser amplification system 200, determining whether spontaneous radiation exists in the laser output by the solid laser according to the spot form of the laser output by the solid laser, and performing spontaneous radiation test when determining that spontaneous radiation exists in the laser output by the solid laser; when it is determined that there is no spontaneous emission in the laser light output from the solid state laser, there is no need to perform a spontaneous emission test, thereby avoiding unnecessary spontaneous emission test work due to the absence of spontaneous emission.
In the prior art, whether spontaneous emission exists in the solid laser is judged according to the form of a light spot of laser output by the solid laser, and the judgment of the existence of the spontaneous emission is only carried out, so that a quantitative test of the spontaneous emission cannot be carried out. In addition, since the spot shape of the laser light output from the solid-state laser may be distorted due to the optical device of the solid-state laser itself, there is an error in determining whether there is spontaneous emission in the solid-state laser according to the spot shape in the related art.
The reason for the spot form distortion caused by the optical device of the solid-state laser may be damage of the optical device itself and/or setting deviation of the optical device; the optical device setting deviation may be an angle deviation between the optical device and the optical axis of the incident light beam, for example, an angle between the optical device and the optical axis of the incident light beam is required to be 45 ° (degrees), and due to a mounting error, an angle between the optical device and the optical axis of the incident light beam is 50 °, and the 5 ° is the optical device setting deviation.
The spontaneous radiation testing method of the solid laser provided by the invention firstly determines whether spontaneous radiation exists in the laser output by the solid laser according to the facula form of the laser output by the solid laser, and then tests the optical power of the spontaneous radiation in the laser power output by the solid laser, so that the spontaneous radiation in the laser output by the solid laser can be accurately and quantitatively tested.
Optionally, fig. 4 is a second schematic structural diagram of the solid-state laser provided by the present invention, as shown in fig. 4, the amplifying module 300 includes a multi-pass amplifying module, the multi-pass amplifying module includes a gain medium 10, a first reflecting mirror 19 and a second reflecting mirror 20, the gain medium 10 includes a first light-passing end face and a second light-passing end face, and the first light-passing end face and the second light-passing end face intersect after extending.
The gain medium 10 is located between the first reflector 19 and the second reflector 20, the first reflector 19 is disposed adjacent to the first light-passing end face, and the second reflector 20 is disposed adjacent to the second light-passing end face.
The seed laser emitted from the seed laser generating system 100 is incident on the first light-transmitting end surface at a predetermined angle.
The gain medium 10 may be a slab crystal, two opposite end faces of the gain medium 10 are light-transmitting end faces, and a certain angle is cut to the light-transmitting end faces, the cut angle of the light-transmitting end face of the gain medium 10 may be 1 to 4 °, the two light-transmitting end faces of the gain medium 10 are a first light-transmitting end face and a second light-transmitting end face respectively, and the first light-transmitting end face and the second light-transmitting end face intersect after extending.
In one embodiment, the gain medium 10 may be a neodymium-doped yttrium aluminum garnet (Nd: YAG) crystal; the first mirror 19 and the second mirror 20 may both be waveguide mirrors.
Illustratively, the seed laser emitted by the seed laser generating system 100 enters the first light-passing end surface of the gain medium 10, exits from the second light-passing end surface of the gain medium 10 after being amplified by the gain medium 10 and enters the second reflector 20, enters the second light-passing end surface of the gain medium 10 after being reflected by the second reflector 20, exits from the first light-passing end surface of the gain medium 10 after being amplified again by the gain medium 10 and enters the first reflector 19, and enters the gain medium 10 after being reflected by the first reflector 19, so that the seed laser enters the gain medium 10 for multiple times under the action of the first reflector 19 and the second reflector 20 to be amplified multiple times.
In the solid laser provided in the embodiment of the present invention, the first light-passing end surface and the second light-passing end surface of the gain medium 10 both have a chamfer, so as to prevent oscillation generated by end surface reflection of the gain medium 10, and the first reflecting mirror 19 and the second reflecting mirror 20 reflect the seed laser output by the gain medium 10 multiple times, so as to realize that the seed laser enters the gain medium 10 multiple times for amplification, thereby increasing the pumping coupling optical path and improving the utilization efficiency of the pumping light.
Optionally, the at least one pump module 400 comprises a first pump module and a second pump module.
The pump light emitted by the first pump module is incident on the first light-transmitting end face of the gain medium 10; the pump light emitted by the second pump module is incident to the second light-transmitting end face of the gain medium 10.
For example, as shown in fig. 4, two pumping modules 400 of the solid-state laser amplification system 200 may be a first pumping module and a second pumping module, where the first pumping module and the second pumping module are respectively located at two sides of the amplification module 300, and then the pumping light emitted by the first pumping module is incident on the first light-transmitting end face of the gain medium 10; the pump light emitted by the second pump module is incident on the second light-transmitting end face of the gain medium 10.
The solid laser provided by the embodiment of the invention comprises two pumping modules 400, and pumping energy can be improved, so that the power of laser output by the solid laser is improved, and high-energy laser output is realized.
Optionally, the seed laser generating system 100 comprises a seed source 1 and a seed light shaping lens group; the seed light shaping lens group is used for shaping seed laser emitted by the seed source 1.
For example, in a solid laser, in order to achieve large-energy laser output, multiple stages of amplification may be performed before seed laser emitted from the seed source 1 enters the gain medium 10, and then the seed laser generating system 100 includes the seed source 1, at least one amplifying structure and at least one seed light shaping lens set, where the at least one amplifying structure is sequentially disposed on an outgoing light path of the seed laser emitted from the seed source 1, and a seed light shaping lens set may be disposed on an outgoing light path of each amplifying structure, or only a seed light shaping lens set may be disposed on an outgoing light path of the last amplifying structure.
Specifically, as shown in fig. 4, the seed light shaping lens group includes an isolator 2, a first seed shaping ball lens 3, a second seed shaping ball lens 4, a third seed shaping ball lens 6, a first seed shaping cylindrical lens 7, and a second seed shaping cylindrical lens 8, which are arranged in this order along the light beam transmission direction.
Further, in order to realize the miniaturization of the solid laser, as shown in fig. 4, a third reflecting mirror 5 may be disposed on the optical path between the second seed shaping ball lens 4 and the third seed shaping ball lens 6, a fourth reflecting mirror 9 may be disposed between the second seed shaping cylindrical lens 8 and the gain medium 10, and both the third reflecting mirror 5 and the fourth reflecting mirror 9 may be used for the folding of the optical path.
According to the solid laser provided by the embodiment of the invention, the seed laser emitted by the seed source 1 is shaped by the seed optical shaping lens group, so that the energy distribution of the facula of the seed laser emitted by the seed laser generating system 100 is uniform, the coupling efficiency of the seed laser and the pump light and the utilization rate of the seed laser are improved, higher laser gain is realized, and thus laser with higher energy is output.
Optionally, the pumping module 400 includes a pumping source 21 and a pumping shaping lens group, and the pumping shaping lens group includes a pumping shaping ball lens 22, a first pumping shaping cylinder lens 23, a second pumping shaping cylinder lens 24, and a third pumping shaping cylinder lens 25, which are sequentially disposed on an exit optical path of pumping light emitted by the pumping source 21.
As shown in fig. 4, the pump shaping lens group is used to shape the pump light emitted by the pump source 21, and according to the embodiment of the present invention, the pump shaping lens group includes a pump shaping ball lens 22, a first pump shaping cylindrical lens 23, a second pump shaping cylindrical lens 24, and a third pump shaping cylindrical lens 25, which are sequentially disposed on the exit optical path of the pump light.
In the solid laser provided by the embodiment of the invention, the pump shaping lens group shapes the pump light emitted by the pump source 21 into the strip-shaped light spot with uniformly distributed energy, so that the coupling efficiency of the pump light and the seed laser and the utilization rate of the pump light are improved, and higher laser gain is further realized.
Optionally, the solid-state laser further comprises an output shaping lens group, and the output shaping lens group comprises a first output shaping cylindrical lens 12, a second output shaping cylindrical lens 13, a first output shaping spherical lens 14 and a second output shaping spherical lens 15 which are sequentially arranged on the output optical path of the gain medium 10.
Illustratively, as shown in fig. 4, an output shaping lens group is disposed in the output optical path of the gain medium 10, and the laser light output from the gain medium 10 is shaped by the output shaping lens group, and specifically, the output shaping lens group may include a first output shaping cylindrical lens 12, a second output shaping cylindrical lens 13, a first output shaping ball lens 14, and a second output shaping ball lens 15, which are disposed in this order on the output optical path of the gain medium 10.
Further, in order to realize miniaturization of the solid laser, a fifth reflecting mirror 11 is provided on the optical path between the gain medium 10 and the first output shaping cylindrical lens 12 for folding the optical path.
Further, a power meter 18 and a spot quality analyzer 17 are arranged on an output light path of the solid laser, the spot quality analyzer 17 is used for testing the form of the laser output spot, and the power meter 18 is used for testing the output laser power.
Specifically, a beam splitter 16 is disposed on an output light path of the second output shaping ball lens 15, and a spot quality analyzer 17 and a power meter 18 are disposed on two output light paths of the beam splitter 16, respectively. According to the embodiment of the invention, the light spot quality analyzer 17 can be positioned on the transmission light path of the spectroscope 16, and the power meter 18 can be positioned on the reflection light path of the spectroscope 16.
Further, the gain medium 10 further includes at least one end surface, and a heat dissipation material is disposed on one or more end surfaces of the at least one end surface.
When the gain medium 10 is in a slab structure, the end face connecting the first light-transmitting end face and the second light-transmitting end face includes four end faces, and a heat dissipation material may be disposed on one or more of the four end faces, and the end face on which the heat dissipation material is disposed is a heat dissipation surface of the gain medium 10, and is preferably gold-plated on the heat dissipation surface of the gain medium 10.
In the solid-state laser provided by the embodiment of the present invention, the heat dissipation material is disposed on one or more end surfaces of the gain medium 10, so as to increase the contact performance between the gain medium 10 and an external heat sink, and ensure the heat dissipation requirement of the gain medium 10.
Furthermore, an antireflection film and a high-reflection film are arranged on an optical lens of the solid laser so as to improve the coupling efficiency of the pump light and the seed laser and the utilization rate of the pump light.
Taking 1064nm seed laser and 808nm pump light as examples, surfaces of the first seed shaping ball lens 3, the second seed shaping ball lens 4, the third seed shaping ball lens 6, the first seed shaping cylindrical lens 7 and the second seed shaping cylindrical lens 8 are all plated with 1064nm antireflection films; the third reflector 5, the fourth reflector 9 and the fifth reflector 11 are all plated with 1064nm high-reflection films; the front end surfaces (the planes close to the gain medium 10) of the first reflecting mirror 19 and the second reflecting mirror 20 are both plated with 1064nm high-reflection 808nm antireflection films, and the rear end surfaces (the planes far away from the gain medium 10) of the first reflecting mirror 19 and the second reflecting mirror 20 are both plated with 808nm antireflection films; the pump shaping ball lens 22, the first pump shaping cylindrical lens 23, the second pump shaping cylindrical lens 24 and the third pump shaping cylindrical lens 25 are all plated with an antireflection film of 808 nm.
According to the embodiment of the present invention, the size of the gain medium 10 may be 31mm × 12mm × 1.5mm, two light-passing end surfaces of the gain medium 10 are cut at a certain angle, and 1064nm and 808nm antireflection films are respectively plated on the first light-passing end surface and the second light-passing end surface of the gain medium 10, so as to prevent the end surface of the gain medium 10 from reflecting to generate parasitic oscillation, thereby reducing the generation of spontaneous emission (ASE).
It should be noted that the spontaneous emission testing method of the solid laser of the present invention can test the spontaneous emission optical power (self-laser power) in the laser output by the solid laser, and can perform corresponding improvement measures on the solid laser according to the proportion of the spontaneous emission optical power (self-laser power) in the tested output laser, so as to reduce the self-laser, thereby increasing the signal-to-noise ratio of the output laser of the solid laser, and improving the beam quality.
It should be noted that, the setting position and parameters of the optical device can be adjusted by performing corresponding improvement measures on the solid-state laser, and the present invention is not limited to this.
The following describes a spontaneous emission testing apparatus of a solid-state laser provided by the present invention, and the spontaneous emission testing apparatus of a solid-state laser described below and the spontaneous emission testing method of a solid-state laser described above may be referred to correspondingly.
Fig. 5 is a schematic structural diagram of a spontaneous emission testing apparatus of a solid-state laser provided by the present invention, the solid-state laser includes a seed laser generating system 100 and a solid-state laser amplifying system 200, the solid-state laser amplifying system 200 includes an amplifying module 300 and at least one pumping module 400, and both the pumping light emitted by the pumping module 400 and the seed laser emitted by the seed laser generating system 100 are incident on the amplifying module 300; as shown in fig. 5, the spontaneous emission test apparatus of the solid laser includes a first determination unit 501, a control and measurement unit 502, a second determination unit 503, and a return unit 504; wherein:
a first determining unit 501, configured to determine a current pump power of the solid-state laser amplification system 200;
a control and measurement unit 502, configured to control the solid-state laser amplification system 200 to operate under the current pumping power and the condition that the seed laser generation system 100 does not emit seed laser, and measure the current output power of the solid-state laser;
a second determining unit 503, configured to determine, when a difference between a current output power and a previous output power of the solid-state laser is smaller than or equal to a preset threshold, the current output power as a light power of spontaneous radiation included in a laser power of laser light output by the solid-state laser;
a returning unit 504, configured to return to the step of determining the current pumping power of the solid-state laser amplification system 200 when a difference between the current output power and the last output power of the solid-state laser is greater than the preset threshold.
The spontaneous radiation testing device of the solid laser provided by the invention measures the current output power of the solid laser by controlling the solid laser amplifying system 200 to work under the conditions that the current pumping power and the seed laser generating system 100 do not emit seed laser, and determines whether the current output power meets the preset condition or not based on the current output power and the last output power of the solid laser measured under the conditions that the solid laser amplifying system 200 does not emit seed laser and the last pumping power and the last output power of the solid laser generating system 100 do not emit seed laser.
Based on any of the above embodiments, the first determining unit 501 is specifically configured to:
controlling the solid laser amplification system 200 to work under the condition of last pumping power and the seed laser generation system 100 emitting seed laser, and measuring the last laser power output by the solid laser;
controlling the solid laser amplification system 200 to work under the conditions of last pumping power and no seed laser emission of the seed laser generation system 100, and measuring last output power of the solid laser;
determining a target pumping power based on the last pumping power, the last laser power and the last output power;
the target pump power is determined as the current pump power of the solid-state laser amplification system 200.
Based on any of the above embodiments, the first determining unit 501 is further specifically configured to:
determining a target pump power based on equation (1);
where P2 denotes the target pump power, P1 denotes the previous pump power, pout denotes the previous laser power, wout denotes the previous output power, and a denotes the light-light conversion efficiency of the solid-state laser.
Based on any of the above embodiments, the first determining unit 501 is further specifically configured to:
when the solid-state laser amplification system 200 is controlled to work for the first time, the last pumping power of the solid-state laser amplification system 200 is the rated pumping power.
Based on any of the above embodiments, the first determining unit 501 is further specifically configured to:
controlling the solid laser amplification system 200 to work under the conditions of rated pumping power and seed laser emission of the seed laser generation system 100, and obtaining the light spot form of the laser output by the solid laser;
determining whether spontaneous radiation exists in the laser output by the solid laser based on the spot shape of the laser;
when it is determined that there is spontaneous emission in the laser light output from the solid-state laser, the current pump power of the solid-state laser amplification system 200 is determined.
Fig. 6 illustrates a physical structure diagram of an electronic device, which may include, as shown in fig. 6: a processor (processor) 610, a communication Interface (Communications Interface) 620, a memory (memory) 630 and a communication bus 640, wherein the processor 610, the communication Interface 620 and the memory 630 communicate with each other via the communication bus 640. The processor 610 may call logic instructions in the memory 630 to execute a spontaneous emission testing method of a solid-state laser, where the solid-state laser includes the seed laser generation system 100 and the solid-state laser amplification system 200, the solid-state laser amplification system 200 includes the amplification module 300 and at least one pumping module 400, and both the pumping light emitted by the pumping module 400 and the seed laser emitted by the seed laser generation system 100 are incident on the amplification module 300; the method comprises the following steps: determining the current pumping power of the solid-state laser amplification system 200; controlling the solid laser amplification system 200 to work under the conditions of the current pumping power and the seed laser generation system 100 not emitting the seed laser, and measuring the current output power of the solid laser; when the difference value between the current output power and the last output power of the solid laser is smaller than or equal to a preset threshold value, determining the current output power as the optical power of spontaneous radiation contained in the laser power of the laser output by the solid laser; and when the difference between the current output power and the last output power of the solid-state laser is greater than the preset threshold, returning to the step of determining the current pumping power of the solid-state laser amplification system 200.
In addition, the logic instructions in the memory 630 may be implemented in software functional units and stored in a computer readable storage medium when the logic instructions are sold or used as independent products. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
In another aspect, the present invention also provides a computer program product, which includes a computer program, the computer program being stored on a non-transitory computer-readable storage medium, and when the computer program is executed by a processor, the computer is capable of executing the spontaneous emission testing method of the solid-state laser provided by the above methods.
In yet another aspect, the present invention also provides a non-transitory computer-readable storage medium, on which a computer program is stored, the computer program being implemented by a processor to perform the spontaneous emission testing method of a solid-state laser provided by the above methods.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one position, or may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. A spontaneous emission testing method of a solid laser, wherein the solid laser comprises a seed laser generating system and a solid laser amplifying system, the solid laser amplifying system comprises an amplifying module and at least one pumping module, and both the pumping light emitted by the pumping module and the seed laser emitted by the seed laser generating system are incident on the amplifying module, the method comprises:
determining the current pumping power of the solid laser amplification system;
controlling the solid laser amplification system to work under the conditions that the current pumping power and the seed laser generation system do not emit seed laser, and measuring the current output power of the solid laser;
when the difference value between the current output power and the last output power of the solid laser is smaller than or equal to a preset threshold value, determining the current output power as the optical power of spontaneous radiation contained in the laser power of the laser output by the solid laser;
when the difference value between the current output power and the last output power of the solid laser is greater than the preset threshold value, returning to the step of determining the current pumping power of the solid laser amplification system;
wherein the determining the current pump power of the solid-state laser amplification system comprises:
controlling the solid laser amplification system to work under the condition that the last pumping power and the seed laser generation system emit seed laser, and measuring the last laser power output by the solid laser;
controlling the solid laser amplification system to work under the conditions that the last pumping power and the seed laser generation system do not emit seed laser, and measuring the last output power of the solid laser;
determining a target pumping power based on the last pumping power, the last laser power and the last output power;
and determining the target pump power as the current pump power of the solid-state laser amplification system.
2. The method for testing spontaneous emission of a solid state laser as claimed in claim 1, wherein the determining a target pump power based on the previous pump power, the previous laser power and the previous output power comprises:
determining a target pump power based on equation (1);
where P2 denotes the target pump power, P1 denotes the previous pump power, pout denotes the previous laser power, wout denotes the previous output power, and a denotes the light-light conversion efficiency of the solid-state laser.
3. The method for testing spontaneous emission of a solid state laser as claimed in claim 2, wherein the last pump power of the solid state laser amplification system is the rated pump power when the solid state laser amplification system is controlled to operate for the first time.
4. The method for testing spontaneous emission of a solid state laser as claimed in claim 3, wherein the determining the current pump power of the solid state laser amplifying system comprises:
controlling the solid laser amplification system to work under the conditions of rated pumping power and seed laser emission of the seed laser generation system, and acquiring the light spot form of the laser output by the solid laser;
determining whether spontaneous radiation exists in the laser output by the solid laser based on the spot shape of the laser;
and when determining that spontaneous radiation exists in the laser output by the solid laser, determining the current pumping power of the solid laser amplification system.
5. The method for testing spontaneous emission of a solid state laser as claimed in any of claims 1 to 4, wherein the amplification module comprises a gain medium, a first reflecting mirror and a second reflecting mirror, the gain medium comprises a first light-transmitting end surface and a second light-transmitting end surface, and the first light-transmitting end surface and the second light-transmitting end surface intersect after extending;
the gain medium is positioned between the first reflector and the second reflector, the first reflector is arranged adjacent to the first light-transmitting end face, and the second reflector is arranged adjacent to the second light-transmitting end face;
the seed laser emitted by the seed laser generating system is incident to the first light-transmitting end face at a preset angle.
6. The method for testing spontaneous emission of a solid state laser as claimed in claim 5, wherein the at least one pump module comprises a first pump module and a second pump module;
the pump light emitted by the first pump module is incident to a first light-transmitting end face of the gain medium; and the pump light emitted by the second pump module is incident to a second light-transmitting end face of the gain medium.
7. The method as claimed in claim 5, wherein the pumping module comprises a pumping source and a pumping shaping lens set, and the pumping shaping lens set comprises a pumping shaping ball lens, a first pumping shaping cylindrical lens, a second pumping shaping cylindrical lens and a third pumping shaping cylindrical lens which are sequentially disposed on an emergent light path of the pumping light emitted from the pumping source.
8. The method for spontaneous emission testing of a solid state laser of claim 5, wherein the gain medium further comprises at least one facet, one or more facets of the at least one facet having a heat sink material disposed thereon.
9. The utility model provides a spontaneous emission testing arrangement of solid laser, its characterized in that, solid laser includes seed laser production system and solid laser amplification system, solid laser amplification system includes amplification module and at least one pumping module, the pumping light that the pumping module sent and the seed laser that the seed laser production system sent all incide to amplification module, the device includes:
the first determining unit is used for determining the current pumping power of the solid laser amplifying system;
the control and measurement unit is used for controlling the solid laser amplification system to work under the conditions that the current pumping power and the seed laser generation system do not emit seed laser, and measuring the current output power of the solid laser;
a second determining unit, configured to determine, when a difference between a current output power and a previous output power of the solid-state laser is smaller than or equal to a preset threshold, the current output power as a light power of spontaneous radiation included in a laser power of laser light output by the solid-state laser;
a returning unit, configured to return to the step of determining the current pump power of the solid-state laser amplification system when a difference between the current output power and the last output power of the solid-state laser is greater than the preset threshold;
the first determining unit is specifically configured to control the solid-state laser amplification system to operate under the condition that the last pumping power and the seed laser generation system emit seed laser, and measure the last laser power output by the solid-state laser;
controlling the solid laser amplification system to work under the conditions that the last pumping power and the seed laser generation system do not emit seed laser, and measuring the last output power of the solid laser;
determining a target pumping power based on the last pumping power, the last laser power and the last output power;
and determining the target pump power as the current pump power of the solid-state laser amplification system.
10. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements a spontaneous emission testing method of the solid state laser according to any one of claims 1 to 8 when executing the program.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202211231214.0A CN115290302B (en) | 2022-10-10 | 2022-10-10 | Spontaneous radiation testing method and device of solid laser |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202211231214.0A CN115290302B (en) | 2022-10-10 | 2022-10-10 | Spontaneous radiation testing method and device of solid laser |
Publications (2)
Publication Number | Publication Date |
---|---|
CN115290302A CN115290302A (en) | 2022-11-04 |
CN115290302B true CN115290302B (en) | 2023-01-03 |
Family
ID=83819199
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202211231214.0A Active CN115290302B (en) | 2022-10-10 | 2022-10-10 | Spontaneous radiation testing method and device of solid laser |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN115290302B (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116067630B (en) * | 2023-03-22 | 2023-07-25 | 武汉中科锐择光电科技有限公司 | Device, system and method for evaluating spontaneous emission duty ratio with low repetition frequency |
CN118090163A (en) * | 2024-04-23 | 2024-05-28 | 安徽华创鸿度光电科技有限公司 | Signal-to-noise ratio testing method for solid laser |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1570748A (en) * | 2003-07-12 | 2005-01-26 | 华为技术有限公司 | Gain control method for erbium-doped fiber amplifier EDFA |
CN101825491A (en) * | 2010-05-18 | 2010-09-08 | 江苏大学 | Method for detecting Q-switching energy and amplified spontaneous emission simultaneously for laser |
CN103972777A (en) * | 2014-04-23 | 2014-08-06 | 中国科学院物理研究所 | Laser multi-pass amplifier |
CN114039269A (en) * | 2021-10-20 | 2022-02-11 | 安徽华创鸿度光电科技有限公司 | Method and system for suppressing amplified spontaneous emission in high-gain pulse laser amplifier |
CN114400491A (en) * | 2021-12-01 | 2022-04-26 | 华中科技大学 | Laser amplifier |
CN114518218A (en) * | 2022-02-18 | 2022-05-20 | 重庆邮电大学 | Method and device for measuring loss in solid laser cavity |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102004047623B4 (en) * | 2004-09-30 | 2021-04-29 | Xieon Networks S.À.R.L. | Method for detecting aging effects and monitoring device for this |
JP2009105255A (en) * | 2007-10-24 | 2009-05-14 | Toyota Central R&D Labs Inc | Laser design support equipment and program |
US8755649B2 (en) * | 2009-10-19 | 2014-06-17 | Lockheed Martin Corporation | In-line forward/backward fiber-optic signal analyzer |
US20130335814A1 (en) * | 2012-06-14 | 2013-12-19 | Martin Ole Berendt | Method and apparatus for control of excess pump power in optical amplifiers |
US9478931B2 (en) * | 2013-02-04 | 2016-10-25 | Nlight Photonics Corporation | Method for actively controlling the optical output of a seed laser |
KR101461053B1 (en) * | 2013-06-28 | 2014-11-11 | 부산대학교 산학협력단 | Apparatus and method for optical modal gain characteristics measurement |
CN110166138B (en) * | 2019-06-10 | 2021-10-08 | 无锡市德科立光电子技术股份有限公司 | Raman fiber amplifier ASE power calibration method |
US11476633B2 (en) * | 2020-07-20 | 2022-10-18 | Honeywell International Inc. | Apparatus and methods for stable bidirectional output from ring laser gyroscope |
-
2022
- 2022-10-10 CN CN202211231214.0A patent/CN115290302B/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1570748A (en) * | 2003-07-12 | 2005-01-26 | 华为技术有限公司 | Gain control method for erbium-doped fiber amplifier EDFA |
CN101825491A (en) * | 2010-05-18 | 2010-09-08 | 江苏大学 | Method for detecting Q-switching energy and amplified spontaneous emission simultaneously for laser |
CN103972777A (en) * | 2014-04-23 | 2014-08-06 | 中国科学院物理研究所 | Laser multi-pass amplifier |
CN114039269A (en) * | 2021-10-20 | 2022-02-11 | 安徽华创鸿度光电科技有限公司 | Method and system for suppressing amplified spontaneous emission in high-gain pulse laser amplifier |
CN114400491A (en) * | 2021-12-01 | 2022-04-26 | 华中科技大学 | Laser amplifier |
CN114518218A (en) * | 2022-02-18 | 2022-05-20 | 重庆邮电大学 | Method and device for measuring loss in solid laser cavity |
Also Published As
Publication number | Publication date |
---|---|
CN115290302A (en) | 2022-11-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN115290302B (en) | Spontaneous radiation testing method and device of solid laser | |
Chen et al. | Generation of Hermite-Gaussian modes in fiber-coupled laser-diode end-pumped lasers | |
CN110932075B (en) | Dual-wavelength pulse pair laser output method and laser | |
CN113629482B (en) | Subnanosecond green laser | |
Chen et al. | Compound cavity passively Q-switched single-longitudinal-mode diode-pumped laser | |
Yang et al. | Theoretical and experimental study of a laser-diode-pumped actively Q-switched Nd: YVO4 laser with acoustic–optic modulator | |
Dong et al. | Observation of repetitively nanosecond pulse-width transverse patterns in microchip self-Q-switched laser | |
Bai et al. | Pulsed LD side-pumped MgO: LN electro-optic cavity-dumped 1123 nm Nd: YAG laser with short pulse width and high peak power | |
CN112636146B (en) | High-power mode-locked disc laser | |
Bagini et al. | Transient states analysis of a partially coherent laser beam propagating through a Gaussian cavity | |
Sato et al. | Energy extraction in dual-wavelength Q-switched laser with a common upper laser level | |
CN203800376U (en) | High-power picosecond laser device with adjustable output frequency | |
RU189457U1 (en) | OPTICAL SCHEME OF A FEMTOSECOND RESONATOR BASED ON A CONE LIGHT GUIDE | |
CN118090163A (en) | Signal-to-noise ratio testing method for solid laser | |
Li et al. | Nonuniform pumped passively Q-switched laser using Nd: YAG/Cr4+: YAG composite crystal with high-pulse energy | |
CN115000788B (en) | Narrow pulse width microchip laser | |
Buzelis et al. | Numerical analysis and experimental investigation of beam quality of SBS compressor with multipass Nd: YAG amplifier | |
Skórczakowski et al. | Generation of two identical ns laser pulses at single s spacing by switching output mirror transmission | |
CN213401849U (en) | Pulse laser | |
Agnesi | Kerr-lens modelocking of solid-state lasers and unidirectional ring cavities | |
Meng et al. | High Repetition, TEM00 mode, Compact Sub-Nanosecond 532nm Laser | |
CN116979366A (en) | Method for improving absorption efficiency of laser and laser measuring device | |
Poulter et al. | Q-switched Nd: YAG lasers for high average-power and high peak-power operation | |
Csele | Laser modeling: a numerical approach with algebra and calculus | |
Reed et al. | The output beam quality of a Q-switched Nd: glass slab laser |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |