CN115016989A - Method and device for determining target trimming parameters - Google Patents
Method and device for determining target trimming parameters Download PDFInfo
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Abstract
The application relates to a method and a device for determining target trimming parameters, wherein the method comprises the following steps: in the process of testing the chip to be tested by using a plurality of trimming parameters, obtaining a comparison parameter corresponding to each trimming parameter, wherein the comparison parameter is used for representing the difference between an actual test value corresponding to the trimming parameter and a reference test value corresponding to the trimming parameter, and the actual test value is output by the chip to be tested in response to the trimming parameter; determining a first trimming parameter and a second trimming parameter which are adjacent in the plurality of trimming parameters, wherein a third trimming parameter exists between the first trimming parameter and the second trimming parameter, and a first actual test value corresponding to the third trimming parameter is the same as a corresponding reference test value; and determining a target trimming parameter between the first trimming parameter and the second trimming parameter. The method and the device solve the technical problem that the trimming efficiency of the chip to be tested is low.
Description
Technical Field
The application relates to the field of chip trimming, in particular to a method and a device for determining target trimming parameters.
Background
With the development of science and technology, the performance and quality requirements of chips are higher and higher, and the precision requirements of various parameters of the chips are also higher and higher, so that the chips generally need to be trimmed before being delivered to a terminal user for use, so that the performance of the chips is consistent with the expected value. In the related art, the optimal trimming value of the chip is found by referring to the ideal step value when the chip is trimmed, and the method is easy to cause the conditions of chip trimming failure or failure in finding the optimal trimming value and the like in the process of finding the optimal trimming value, so that the chip trimming efficiency is influenced.
In view of the above problems, no effective solution has been proposed.
Disclosure of Invention
The application provides a method and a device for determining a target trimming parameter, which are used for at least solving the technical problem of low trimming efficiency of a chip to be tested in the related technology.
According to an aspect of an embodiment of the present application, a method for determining a target trimming parameter is provided, including: in the process of testing a chip to be tested by using a plurality of trimming parameters, obtaining a comparison parameter corresponding to each trimming parameter, wherein the comparison parameter is used for representing the difference between an actual test value corresponding to the trimming parameter and a reference test value corresponding to the trimming parameter, and the actual test value is output by the chip to be tested in response to the trimming parameter; determining a first trimming parameter and a second trimming parameter which are adjacent in the plurality of trimming parameters, wherein a third trimming parameter exists between the first trimming parameter and the second trimming parameter, and a first actual test value corresponding to the third trimming parameter is the same as a corresponding reference test value; and determining a target trimming parameter between the first trimming parameter and the second trimming parameter, wherein a comparison parameter corresponding to the target trimming parameter is not greater than a comparison parameter corresponding to any one of the first trimming parameter and the second trimming parameter.
Optionally, determining the target trimming parameter between the first trimming parameter and the second trimming parameter comprises: acquiring a first comparison parameter corresponding to a first trimming parameter and a second comparison parameter corresponding to a second trimming parameter; and determining the target trimming parameter between the first trimming parameter and the second trimming parameter according to the first comparison parameter and the second comparison parameter.
Optionally, determining the target trimming parameter between the first trimming parameter and the second trimming parameter according to the first comparison parameter and the second comparison parameter includes: determining a first absolute value of the first comparison parameter and a second absolute value of the second comparison parameter; determining a minimum absolute value with the minimum value in the first absolute value and the second absolute value; and determining the trimming parameter corresponding to the minimum absolute value as the target trimming parameter.
Optionally, the obtaining the comparison parameter corresponding to each trimming parameter includes: acquiring a second test value output by the chip to be tested in response to the reference trimming parameter; under the condition that the second test value does not meet a target condition, adjusting the reference trimming parameters according to a preset adjusting mode to obtain a plurality of adjusted trimming parameters, wherein the target condition is that the difference value between the second test value and the corresponding reference test value is smaller than a set threshold value; configuring the trimming parameters for the chip to be tested to obtain the actual test value output by the chip to be tested in response to the trimming parameters; and determining a difference value between the actual test value and the reference test value to obtain the comparison parameter corresponding to the trimming parameter.
Optionally, adjusting the reference trimming parameter according to a preset adjustment manner includes: determining an adjustment direction when the reference trimming parameter is adjusted according to the second test value, wherein the adjustment direction comprises a forward adjustment and a backward adjustment, the forward adjustment is an adjustment mode for increasing the value of the reference trimming parameter, and the backward adjustment is an adjustment mode for decreasing the value of the reference trimming parameter; and sequentially adjusting the reference trimming parameters according to the adjustment direction according to a set adjustment value to obtain a plurality of adjusted trimming parameters, wherein the set adjustment value is a positive value.
Optionally, the obtaining the second test value output by the chip to be tested in response to the reference trimming parameter includes: acquiring an initial trimming parameter of the chip to be tested and a third test value output by the chip to be tested in response to the initial trimming parameter; determining an initial trimming adjustment value according to the third test value, wherein the initial trimming adjustment value is an integer; adjusting the initial trimming parameters based on the initial trimming adjustment values to obtain the reference trimming parameters; and configuring the reference trimming parameters for the chip to be tested to obtain the second test value output by the chip to be tested.
Optionally, before adjusting the reference trimming parameter according to a preset adjustment manner, the method further includes: determining a third absolute value of the difference between the second test value and the corresponding reference test value; determining that the second test value does not satisfy the target condition if the third absolute value is greater than a reference threshold; determining that the second test value three trimming parameters satisfy the target condition if the third absolute value is less than the reference threshold.
According to another aspect of the embodiments of the present application, there is also provided an apparatus for determining a target trimming parameter, including: the device comprises an acquisition module, a comparison module and a comparison module, wherein the acquisition module is used for acquiring a comparison parameter corresponding to each trimming parameter in the process of testing a chip to be tested by using a plurality of trimming parameters, the comparison parameter is used for representing the difference between an actual test value corresponding to the trimming parameter and a reference test value corresponding to the trimming parameter, and the actual test value is output by the chip to be tested in response to the trimming parameters; a first determining module, configured to determine a first trimming parameter and a second trimming parameter that are adjacent to each other in the plurality of trimming parameters, where a third trimming parameter exists between the first trimming parameter and the second trimming parameter, and a first actual test value corresponding to the third trimming parameter is the same as a corresponding reference test value; and the second determining module is used for determining a target trimming parameter between the first trimming parameter and the second trimming parameter, wherein a comparison parameter corresponding to the target trimming parameter is not greater than a comparison parameter corresponding to any one of the first trimming parameter and the second trimming parameter.
According to another aspect of the embodiments of the present application, there is also provided a storage medium including a stored program which, when executed, performs the above-described method.
According to another aspect of the embodiments of the present application, there is also provided an electronic device, including a memory, a processor, and a computer program stored on the memory and executable on the processor, wherein the processor executes the above method through the computer program.
In the embodiment of the application, in the process of testing a chip to be tested by using a plurality of trimming parameters, a comparison parameter corresponding to each trimming parameter is obtained, wherein the comparison parameter is used for representing the difference between an actual test value corresponding to the trimming parameter and a reference test value corresponding to the trimming parameter, and the actual test value is output by the chip to be tested in response to the trimming parameter; determining a first trimming parameter and a second trimming parameter which are adjacent in the plurality of trimming parameters, wherein a third trimming parameter exists between the first trimming parameter and the second trimming parameter, and a first actual test value corresponding to the third trimming parameter is the same as a corresponding reference test value; determining a target trimming parameter between a first trimming parameter and a second trimming parameter, wherein a comparison parameter corresponding to the target trimming parameter is not larger than a comparison parameter corresponding to any one of the first trimming parameter and the second trimming parameter, actual test values output by a chip under different trimming parameters are different in the trimming process of the chip, the comparison parameter in the trimming process of the chip is determined according to the difference between the actual test value corresponding to the trimming parameter of the chip and a reference test value corresponding to the trimming parameter, the adjacent two trimming parameters are selected in the process of continuously trimming the chip, a third trimming parameter exists between the adjacent two trimming parameters, the actual test value of the third trimming parameter is equal to the reference test value, and the optimal trimming parameter exists between the selected adjacent two trimming parameters, therefore, the target trimming parameter is determined between the two selected adjacent trimming parameters, the selected target trimming parameter is the optimal trimming parameter, the purpose of determining the optimal trimming parameter in the trimming process of the chip is achieved, the technical effect of improving the trimming efficiency of the chip to be tested is achieved, and the technical problem that the trimming efficiency of the chip to be tested is low is solved.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description, serve to explain the principles of the invention.
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without inventive exercise.
Fig. 1 is a flowchart of an alternative method for determining a target trimming parameter according to an embodiment of the present application;
FIG. 2 is a flow chart of an alternative chip trimming process according to an embodiment of the present application;
fig. 3 is a schematic diagram of an alternative target trimming parameter determining apparatus according to an embodiment of the present application;
fig. 4 is a block diagram of a terminal according to an embodiment of the present application.
Detailed Description
In order to make the technical solutions of the present application better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only some embodiments of the present application, and not all embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application without making any creative effort shall fall within the protection scope of the present application.
It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are capable of operation in sequences other than those illustrated or described herein. Moreover, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
According to an aspect of the embodiments of the present application, an embodiment of a method for determining a target trimming parameter is provided.
Fig. 1 is a flowchart of an alternative method for determining a target trimming parameter according to an embodiment of the present application, and as shown in fig. 1, the method may include the following steps:
step S102, in the process of testing a chip to be tested by using a plurality of trimming parameters, obtaining a comparison parameter corresponding to each trimming parameter, wherein the comparison parameter is used for representing the difference between an actual test value corresponding to the trimming parameter and a reference test value corresponding to the trimming parameter, and the actual test value is output by the chip to be tested in response to the trimming parameter;
step S104, determining a first trimming parameter and a second trimming parameter which are adjacent in the plurality of trimming parameters, wherein a third trimming parameter exists between the first trimming parameter and the second trimming parameter, and a first actual test value corresponding to the third trimming parameter is the same as a corresponding reference test value;
step S106, determining a target trimming parameter between the first trimming parameter and the second trimming parameter, wherein a comparison parameter corresponding to the target trimming parameter is not greater than a comparison parameter corresponding to any one of the first trimming parameter and the second trimming parameter.
Through the steps S102 to S106, in the chip trimming process, the actual test values output by the chip under different trimming parameters are different, the comparison parameter in the chip trimming process is determined according to the difference between the actual test value corresponding to the chip trimming parameter and the reference test value corresponding to the trimming parameter, in the continuous trimming process of the chip, the adjacent two trimming parameters are selected, a third trimming parameter exists between the adjacent two trimming parameters, the actual test value of the third trimming parameter is equal to the reference test value, so that the optimal trimming parameter exists between the selected adjacent two trimming parameters, the target trimming parameter is determined between the selected adjacent two trimming parameters, the selected target trimming parameter is the optimal trimming parameter, and the purpose of determining the optimal trimming parameter in the chip trimming process is achieved, therefore, the technical effect of improving the trimming efficiency of the chip to be tested is achieved, and the technical problem that the trimming efficiency of the chip to be tested is low is solved.
In the technical solution provided in step S102, the trimming technique of the chip to be tested may include, but is not limited to, laser trimming, fuse trimming, zener diode, electronic fuse, memory trimming, and the like.
Optionally, in the present embodiment, the trimming parameters may include, but are not limited to, a physical size of the chip, an oxide layer thickness, a metal thickness, and the like.
Optionally, in this embodiment, the reference test value is an expected output value of the chip to be tested, and the reference test value may be a fixed value determined according to a model of the chip, for example, a chip of a certain model, and the reference test values are the same, or may be determined according to trimming parameters of the chip to be tested, and the same chip to be tested corresponds to different reference test values under different trimming parameters, which is not limited in this scheme.
Optionally, in this embodiment, the test value output by the chip to be tested in response to the trimming parameter may include, but is not limited to, a reference voltage value, a current value, a frequency value, and the like.
In the technical solution provided in step S104, the third trimming parameter may be a trimming parameter located between the first trimming parameter and the second trimming parameter, and likewise, the third trimming parameter may also be equal to the first trimming parameter value, or the third trimming parameter may also be equal to the second trimming parameter value, which is not limited in this solution.
In the technical solution provided in step S106, the determining the target trimming parameter between the first trimming parameter and the second trimming parameter may be selecting one of the first trimming parameter and the second trimming parameter as the target trimming parameter, for example, determining the first trimming parameter as the target trimming parameter or determining the first trimming parameter as the target trimming parameter, or selecting a trimming parameter value between the first trimming parameter and the second trimming parameter as the target trimming parameter, which is not limited in this solution.
As an alternative embodiment, the determining the target trimming parameter between the first trimming parameter and the second trimming parameter comprises:
s11, acquiring a first comparison parameter corresponding to the first trimming parameter and a second comparison parameter corresponding to the second trimming parameter;
and S12, determining the target trimming parameter between the first trimming parameter and the second trimming parameter according to the first comparison parameter and the second comparison parameter.
Optionally, in this embodiment, the comparison parameter may be a result of calculating the measured actual test value and the measured reference test value, or may be a result of calculating the actual test value and the measured reference test value by using another device, which is not limited in this embodiment.
Optionally, in this embodiment, the method for determining the target trimming parameter may be to determine a smaller comparison parameter from the comparison parameters, and determine the corresponding trimming parameter as the target trimming parameter, or may also be to determine the value of the comparison parameter, and determine the trimming parameter corresponding to the comparison parameter smaller than a certain set threshold as the target trimming parameter, which is not limited in this embodiment.
As an alternative embodiment, the determining the target trimming parameter between the first trimming parameter and the second trimming parameter according to the first comparison parameter and the second comparison parameter comprises:
s21, determining a first absolute value of the first comparison parameter and a second absolute value of the second comparison parameter;
s22, determining the minimum absolute value with the minimum value in the first absolute value and the second absolute value;
and S23, determining the trimming parameter corresponding to the minimum absolute value as the target trimming parameter.
As an optional embodiment, the obtaining the comparison parameter corresponding to each trimming parameter includes:
s31, acquiring a second test value output by the chip to be tested in response to the reference trimming parameter;
s32, when the second test value does not satisfy a target condition, adjusting the reference trimming parameter according to a preset adjustment manner to obtain a plurality of adjusted trimming parameters, where the target condition is that a difference between the second test value and a corresponding reference test value is smaller than a set threshold;
s33, configuring the trimming parameters for the chip to be tested to obtain the actual test value output by the chip to be tested in response to the trimming parameters;
and S34, determining the difference between the actual test value and the reference test value to obtain the comparison parameter corresponding to the trimming parameter.
Optionally, in this embodiment, the set threshold may be any natural number, and a designer may design the size of the set threshold according to needs, for example, when the actual requirement is that the second test value and the reference test value are equal, the set threshold may be set to 0.
As an optional embodiment, the adjusting the reference trimming parameter according to a preset adjusting manner includes:
s41, determining an adjusting direction when the reference trimming parameter is adjusted according to the second test value, wherein the adjusting direction includes a forward adjusting mode and a reverse adjusting mode, the forward adjusting mode is an adjusting mode for increasing the value of the reference trimming parameter, and the reverse adjusting mode is an adjusting mode for decreasing the value of the reference trimming parameter;
and S42, sequentially adjusting the reference trimming parameters according to the adjustment direction according to a set adjustment value to obtain a plurality of adjusted trimming parameters, wherein the set adjustment value is a positive value.
Optionally, in this embodiment, the method for determining the adjustment direction according to the second test value may include, but is not limited to, comparing the second test value with a preset threshold, determining the adjustment direction according to whether the second test value is greater than the preset threshold, and calculating a difference between the second test value and a corresponding reference test value, and determining the adjustment direction by comparing whether the difference is greater than a preset threshold.
Optionally, in this embodiment, the adjusting the trimming parameter according to the adjustment direction according to the set trimming value may be to add or subtract the set adjustment value to or from the reference trimming parameter according to the trimming direction, for example, if the adjustment direction is a forward adjustment, the set adjustment value is sequentially added to the reference trimming parameter, so as to obtain the adjusted trimming parameter.
Alternatively, in this embodiment, the setting adjustment value may be preset by a designer, and may be enlarged or reduced according to an actual situation, for example, the setting adjustment value of the first trimming is 10, and in order to meet a requirement of reaching the optimal trimming value, the setting adjustment value of the second trimming is reduced to 5, so as to obtain the optimal trimming value.
As an optional embodiment, the obtaining the second test value output by the chip to be tested in response to the reference trimming parameter includes:
s51, acquiring an initial trimming parameter of the chip to be tested and a third test value output by the chip to be tested in response to the initial trimming parameter;
s52, determining an initial trimming adjustment value according to the third test value, wherein the initial trimming adjustment value is an integer;
s53, adjusting the initial trimming parameters based on the initial trimming adjustment values to obtain the reference trimming parameters;
s54, configuring the reference trimming parameter for the chip to be tested to obtain the second test value output by the chip to be tested.
Optionally, in this embodiment, the initial trimming parameter may be, but is not limited to, an empirical value obtained by trimming different chips in the past.
Optionally, in this embodiment, the manner of determining the initial trimming adjustment Value according to the third test Value may be calculated according to a preset calculation formula, for example, the calculation formula is obtained by calculating a formula m ═ abs (Value _ Diff)/Ideal _ Value _ Step, where m is the initial trimming adjustment Value, abs (Value _ Diff) is an absolute Value of a difference between the third test Value and a corresponding reference test Value, and Ideal _ Value _ Step is an Ideal Step Value in design, and the Ideal Step Value may be any Value; since the initial trimming parameter is an integer, the calculated initial trimming adjustment value may be rounded, and the rounding method may include, but is not limited to, rounding up, rounding down, and the like.
Optionally, in this embodiment, the method for adjusting the initial trimming parameter based on the initial trimming adjustment value may be to add the initial trimming parameter to the initial trimming adjustment value, or to subtract the initial trimming parameter from the initial trimming adjustment value.
As an optional embodiment, before adjusting the reference trimming parameter according to a preset adjustment manner, the method further includes:
s61, determining a third absolute value of the difference between the second test value and the corresponding reference test value;
s62, determining that the second test value does not satisfy the target condition if the third absolute value is greater than a reference threshold;
and S63, determining that the third trimming parameter of the second test value meets the target condition when the third absolute value is less than or equal to the reference threshold.
Optionally, in this embodiment, the reference threshold may be, but is not limited to, a fixed Value set by a tester according to a requirement or a historical test, for example, the reference threshold is set as a × Ideal _ Value _ Step, a is a coefficient obtained according to a historical test, the coefficient may be any natural number, such as 0.1, 0.01, 0.001, and the like, Ideal _ Value _ Step is a design Ideal Step Value, and the Ideal Step Value may take any Value.
Fig. 2 is a flow chart of an alternative chip trimming according to an embodiment of the present application, as shown in fig. 2:
s201, setting the initial working state of the trimming bus to be N, wherein N is determined according to the past test experience.
S202, measuring and recording a first actual test Value _ Meas1 output by the chip to be tested in the initial operating state N, where the first actual test Value may be a measured Value of a voltage or a frequency output by the chip to be tested.
S203, calculating and recording a difference Value _ Diff1 between the first actual test Value and the reference test Value _ Exp, wherein Value _ Diff1 is Value _ Meas1-Value _ Exp.
S204, calculating a trimming adjustment parameter m according to a difference Value _ Diff1 between the first actual test Value and the reference test Value _ Exp, and configuring the working state of the trimming bus to be K, thereby implementing coarse adjustment on the initial working state N, where K is N-m, m is abs (Value _ Diff1)/Ideal _ Value _ Step, abs (Value _ Diff1) is an absolute Value of the difference between the first actual test Value and the reference test Value _ Exp, Ideal _ Value _ Step is an Ideal Step Value in design, and m is an integer, so that a rounding process needs to be performed on m in calculation, and the rounding process may include, an upward rounding process, a downward rounding process, and the like.
S205, calculating and recording the difference Value _ Diff2 between the actual measurement Value _ Meas2 after coarse adjustment and the reference test Value _ Exp, wherein the Value _ Diff2 is Value _ Meas2-Value _ Exp.
S206 determines whether or not the absolute Value of Value _ Diff2 after the rough adjustment is equal to or less than 0.5 × Ideal _ Value _ Step, and if the absolute Value of Value _ Diff2 is greater than 0.5 × Ideal _ Value _ Step, Step S207 is executed, and if the absolute Value of Value _ Diff2 is equal to or less than 0.5 × Ideal _ Value _ Step, Step S213 is executed.
S207, judging the fine adjustment direction of fine adjustment of the coarse adjustment result according to the Value of Value _ Diff2, when Value _ Diff2 is less than 0, executing step S210, namely forward X-level traversal adjustment, when Value _ Diff2 is more than 0, executing step S208, namely reverse Y-level traversal adjustment, wherein X/Y is the Value of fine adjustment step number, and the fine adjustment direction can be enlarged or reduced according to the actual situation.
And S208, adjusting the state of the trimming bus in a traversing way from K-1 to K-Y, namely M is K-n, n is 1, 2 and 3 … … Y, and recording and calculating difference data Value _ Diff [ n ] of the test Value and the reference test Value in real time, wherein the difference data Value _ Diff [ n ] is Value _ Meas [ n ] -Value _ Exp.
S209, determine whether Value _ Diff [ n ] satisfies Value _ Diff [ n ] > 0 and Value _ Diff [ n +1] < 0, if so, prove to find the polarity inflection point of Value _ Diff [ n ] and execute step S212, if not, prove to not find the polarity inflection point of Value _ Diff [ n ] and execute step S208.
S210, adjusting the bus state from K +1 to K + X direction, that is, M is K + n, n is 1, 2, 3 … … X, and recording and calculating difference data Value _ Diff [ n ] between the test Value and the reference test Value in real time, Value _ Diff [ n ] is Value _ Meas [ n ] -Value _ Exp.
S211, judging whether Value _ Diff [ n ] satisfies Value _ Diff [ n ] > 0 and Value _ Diff [ n +1] < 0, if the condition is satisfied, the step S212 is executed to prove that the polarity inflection point of Value _ Diff [ n ] is found, and if the condition is not satisfied, the step S208 is executed to prove that the polarity inflection point of Value _ Diff [ n ] is not found.
S212, calculate and compare the absolute Value of Value _ Diff [ n ] and the absolute Value of Value _ Diff [ n +1], find the minimum Value Min (abs (Value _ Diff [ n ]), abs (Value _ Diff [ n +1])), and determine the M Value corresponding to the minimum absolute Value as the modified bus state M after fine modification, where M is K + n when the forward traversal is performed and the Min Value is abs (Value _ Diff [ n ]), M is K + (n +1) when the forward traversal is performed and the Min Value is abs (Value _ Diff [ n +1]), M is K-n when the reverse traversal is performed and the Min Value is abs (Value _ Diff [ n ]), and M is K-n when the reverse traversal is performed and the Min Value is abs (Value _ Diff [ n + (n) +, M is K-n (K + 1).
S213, setting the state of the trimming bus as the trimmed value, measuring the measured value in the state again, and executing the step S214 to judge whether the trimming requirement is met.
S214 determines whether or not the absolute Value of Value _ Diff3 after the rough adjustment is equal to or less than 0.5 × Ideal _ Value _ Step, and if the absolute Value of Value _ Diff3 is greater than 0.5 × Ideal _ Value _ Step, Step S216 is executed, and if the absolute Value of Value _ Diff3 is equal to or less than 0.5 × Ideal _ Value _ Step, Step S215 is executed.
S215, programming an electronic fuse or a memory to finish the trimming test.
And S216, finishing the trimming test when the trimming is abnormal or fails.
It should be noted that, for simplicity of description, the above-mentioned method embodiments are described as a series of acts or combination of acts, but those skilled in the art will recognize that the present application is not limited by the order of acts described, as some steps may occur in other orders or concurrently depending on the application. Further, those skilled in the art should also appreciate that the embodiments described in the specification are preferred embodiments and that the acts and modules referred to are not necessarily required in this application.
Through the description of the foregoing embodiments, it is clear to those skilled in the art that the method according to the foregoing embodiments may be implemented by software plus a necessary general hardware platform, and certainly may also be implemented by hardware, but the former is a better implementation mode in many cases. Based on such understanding, the technical solutions of the present application may be embodied in the form of a software product, which is stored in a storage medium (e.g., ROM/RAM, magnetic disk, optical disk) and includes instructions for enabling a terminal device (e.g., a mobile phone, a computer, a server, or a network device) to execute the method according to the embodiments of the present application.
According to another aspect of the embodiment of the present application, there is also provided a device for determining a target trimming parameter, which is used for implementing the method for determining a target trimming parameter. Fig. 3 is a schematic diagram of an alternative target trimming parameter determining apparatus according to an embodiment of the present application, and as shown in fig. 3, the apparatus may include:
an obtaining module 32, configured to obtain a comparison parameter corresponding to each trimming parameter in a process of testing a chip to be tested by using a plurality of trimming parameters, where the comparison parameter is used to represent a difference between an actual test value corresponding to the trimming parameter and a reference test value corresponding to the trimming parameter, and the actual test value is output by the chip to be tested in response to the trimming parameter;
a first determining module 34, configured to determine a first trimming parameter and a second trimming parameter that are adjacent to each other in the plurality of trimming parameters, where a third trimming parameter exists between the first trimming parameter and the second trimming parameter, and a first actual test value corresponding to the third trimming parameter is the same as a corresponding reference test value;
a second determining module 36, configured to determine a target trimming parameter between the first trimming parameter and the second trimming parameter, where a comparison parameter corresponding to the target trimming parameter is not greater than a comparison parameter corresponding to any one of the first trimming parameter and the second trimming parameter.
It should be noted that the obtaining module 32 in this embodiment may be configured to execute step S102 in this embodiment, the first determining module 34 in this embodiment may be configured to execute step S104 in this embodiment, and the second determining module 36 in this embodiment may be configured to execute step S106 in this embodiment.
It should be noted here that the modules described above are the same as the examples and application scenarios implemented by the corresponding steps, but are not limited to the disclosure of the above embodiments.
Through the module, the technical problem that the trimming efficiency of the chip to be tested is low can be solved, and the technical effect of improving the trimming efficiency of the chip to be tested is achieved.
Optionally, the second determining module includes: the first acquisition unit is used for acquiring a first comparison parameter corresponding to a first trimming parameter and a second comparison parameter corresponding to a second trimming parameter; a first determining unit, configured to determine the target trimming parameter between the first trimming parameter and the second trimming parameter according to the first comparison parameter and the second comparison parameter.
Optionally, the first determining unit is configured to: determining a first absolute value of the first comparison parameter and a second absolute value of the second comparison parameter; determining a minimum absolute value with the minimum value in the first absolute value and the second absolute value; and determining the trimming parameter corresponding to the minimum absolute value as the target trimming parameter.
Optionally, the obtaining module includes: the second acquisition unit is used for acquiring a second test value output by the chip to be tested in response to the reference trimming parameter; the adjusting unit is used for adjusting the reference trimming parameters according to a preset adjusting mode under the condition that the second test value does not meet a target condition, so as to obtain a plurality of adjusted trimming parameters, wherein the target condition is that the difference value between the second test value and the corresponding reference test value is smaller than a set threshold value; the processing unit is used for configuring the trimming parameters for the chip to be tested so as to obtain the actual test value output by the chip to be tested in response to the trimming parameters; and the second determining unit is used for determining a difference value between the actual test value and the reference test value so as to obtain the comparison parameter corresponding to the trimming parameter.
Optionally, the adjusting unit is configured to: determining an adjustment direction when the reference trimming parameter is adjusted according to the second test value, wherein the adjustment direction comprises a forward adjustment and a backward adjustment, the forward adjustment is an adjustment mode for increasing the value of the reference trimming parameter, and the backward adjustment is an adjustment mode for decreasing the value of the reference trimming parameter; and adjusting the reference trimming parameters in sequence according to a set adjustment value and the adjustment direction to obtain a plurality of adjusted trimming parameters, wherein the set adjustment value is a positive value.
Optionally, the second obtaining unit is configured to: acquiring an initial trimming parameter of the chip to be tested and a third test value output by the chip to be tested in response to the initial trimming parameter; determining an initial trimming adjustment value according to the third test value, wherein the initial trimming adjustment value is an integer; adjusting the initial trimming parameters based on the initial trimming adjustment values to obtain the reference trimming parameters; and configuring the reference trimming parameters for the chip to be tested to obtain the second test value output by the chip to be tested.
Optionally, the apparatus further comprises: a third determining module, configured to determine a third absolute value of a difference between the second test value and the corresponding reference test value before adjusting the reference trimming parameter according to a preset adjustment manner; a fourth determining module for determining that the second test value does not satisfy the target condition if the third absolute value is greater than a reference threshold; a fifth determining module, configured to determine that the third trimming parameter of the second test value satisfies the target condition when the third absolute value is smaller than the reference threshold.
It should be noted here that the modules described above are the same as the examples and application scenarios implemented by the corresponding steps, but are not limited to the disclosure of the above embodiments.
According to another aspect of the embodiment of the application, a server or a terminal for implementing the method for determining the target trimming parameter is also provided.
Fig. 4 is a block diagram of a terminal according to an embodiment of the present application, and as shown in fig. 4, the terminal may include: one or more processors 401 (only one of which is shown), a memory 403, and a transmission device 405. as shown in fig. 4, the terminal may further include an input and output device 407.
The memory 403 may be used to store software programs and modules, such as program instructions/modules corresponding to the method and apparatus for determining the target trimming parameter in the embodiment of the present application, and the processor 401 executes various functional applications and data processing by running the software programs and modules stored in the memory 403, that is, the method for determining the target trimming parameter is implemented. The memory 403 may include high-speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some examples, memory 403 may further include memory located remotely from processor 401, which may be connected to the terminal over a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The transmitting device 405 is used for receiving or sending data via a network, and may also be used for data transmission between the processor and the memory. Examples of the network may include a wired network and a wireless network. In one example, the transmission device 405 includes a Network adapter (NIC) that can be connected to a router via a Network cable and other Network devices to communicate with the internet or a local area Network. In one example, the transmission device 405 is a Radio Frequency (RF) module, which is used to communicate with the internet in a wireless manner.
In particular, the memory 403 is used for storing application programs.
The processor 401 may call the application stored in the memory 403 via the transmission means 405 to perform the following steps: in the process of testing a chip to be tested by using a plurality of trimming parameters, obtaining a comparison parameter corresponding to each trimming parameter, wherein the comparison parameter is used for representing the difference between an actual test value corresponding to the trimming parameter and a reference test value corresponding to the trimming parameter, and the actual test value is output by the chip to be tested in response to the trimming parameter; determining a first trimming parameter and a second trimming parameter which are adjacent in the plurality of trimming parameters, wherein a third trimming parameter exists between the first trimming parameter and the second trimming parameter, and a first actual test value corresponding to the third trimming parameter is the same as a corresponding reference test value; and determining a target trimming parameter between the first trimming parameter and the second trimming parameter, wherein a comparison parameter corresponding to the target trimming parameter is not greater than a comparison parameter corresponding to any one of the first trimming parameter and the second trimming parameter.
The embodiment of the application provides a scheme of a method and a device for determining target trimming parameters. In the process of trimming the chip, actual test values output by the chip under different trimming parameters are different, comparison parameters in the process of trimming the chip are determined according to the difference between the actual test values corresponding to the trimming parameters of the chip and reference test values corresponding to the trimming parameters, two adjacent trimming parameters are selected in the process of continuously trimming the chip, a third trimming parameter exists between the two adjacent trimming parameters, the actual test value of the third trimming parameter is equal to the reference test value, so that the optimal trimming parameter exists between the two selected adjacent trimming parameters, a target trimming parameter is determined between the two selected adjacent trimming parameters, the selected target trimming parameter is the optimal trimming parameter, the purpose of determining the optimal trimming parameter in the process of trimming the chip is achieved, and the technical effect of improving the trimming efficiency of the chip to be tested is achieved, and then solved the lower technical problem of trimming efficiency of the chip that awaits measuring.
Optionally, the specific examples in this embodiment may refer to the examples described in the above embodiments, and this embodiment is not described herein again.
It can be understood by those skilled in the art that the structure shown in fig. 4 is only an illustration, and the terminal may be a terminal device such as a smart phone (e.g., an Android phone, an iOS phone, etc.), a tablet computer, a palm computer, and a Mobile Internet Device (MID), a PAD, etc. Fig. 4 is a diagram illustrating the structure of the electronic device. For example, the terminal may also include more or fewer components (e.g., network interfaces, display devices, etc.) than shown in FIG. 4, or have a different configuration than shown in FIG. 4.
Those skilled in the art will appreciate that all or part of the steps in the methods of the above embodiments may be implemented by a program instructing hardware associated with the terminal device, where the program may be stored in a computer-readable storage medium, and the storage medium may include: flash disks, Read-Only memories (ROMs), Random Access Memories (RAMs), magnetic or optical disks, and the like.
Embodiments of the present application also provide a storage medium. Alternatively, in this embodiment, the storage medium may be a program code for executing the method for determining the target trimming parameter.
Optionally, in this embodiment, the storage medium may be located on at least one of a plurality of network devices in a network shown in the above embodiment.
Optionally, in this embodiment, the storage medium is configured to store program code for performing the following steps: in the process of testing a chip to be tested by using a plurality of trimming parameters, obtaining a comparison parameter corresponding to each trimming parameter, wherein the comparison parameter is used for representing the difference between an actual test value corresponding to the trimming parameter and a reference test value corresponding to the trimming parameter, and the actual test value is output by the chip to be tested in response to the trimming parameter; determining a first trimming parameter and a second trimming parameter which are adjacent in the plurality of trimming parameters, wherein a third trimming parameter exists between the first trimming parameter and the second trimming parameter, and a first actual test value corresponding to the third trimming parameter is the same as a corresponding reference test value; and determining a target trimming parameter between the first trimming parameter and the second trimming parameter, wherein a comparison parameter corresponding to the target trimming parameter is not greater than a comparison parameter corresponding to any one of the first trimming parameter and the second trimming parameter.
Optionally, the specific examples in this embodiment may refer to the examples described in the above embodiments, and this embodiment is not described herein again.
Optionally, in this embodiment, the storage medium may include, but is not limited to: a U-disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic or optical disk, and other various media capable of storing program codes.
The above-mentioned serial numbers of the embodiments of the present application are merely for description and do not represent the merits of the embodiments.
The integrated unit in the above embodiments, if implemented in the form of a software functional unit and sold or used as a separate product, may be stored in the above computer-readable storage medium. Based on such understanding, the technical solutions of the present application, which are essential or part of the technical solutions contributing to the prior art, or all or part of the technical solutions, may be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for causing one or more computer devices (which may be personal computers, servers, network devices, or the like) to execute all or part of the steps of the methods described in the embodiments of the present application.
In the above embodiments of the present application, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In the several embodiments provided in the present application, it should be understood that the disclosed client may be implemented in other ways. The above-described apparatus embodiments are merely illustrative, and for example, the division of the units is only one type of logical functional division, and other divisions may be implemented in practice, for example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed coupling or direct coupling or communication connection between each other may be an indirect coupling or communication connection through some interfaces, units or modules, and may be electrical or in other forms.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one position, or may be distributed on multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit may be implemented in the form of hardware, or may also be implemented in the form of a software functional unit.
The foregoing is only a preferred embodiment of the present application and it should be noted that those skilled in the art can make several improvements and modifications without departing from the principle of the present application, and these improvements and modifications should also be considered as the protection scope of the present application.
Claims (10)
1. A method for determining target trimming parameters is characterized by comprising the following steps:
in the process of testing a chip to be tested by using a plurality of trimming parameters, obtaining a comparison parameter corresponding to each trimming parameter, wherein the comparison parameter is used for representing the difference between an actual test value corresponding to the trimming parameter and a reference test value corresponding to the trimming parameter, and the actual test value is output by the chip to be tested in response to the trimming parameter;
determining a first trimming parameter and a second trimming parameter which are adjacent in the plurality of trimming parameters, wherein a third trimming parameter exists between the first trimming parameter and the second trimming parameter, and a first actual test value corresponding to the third trimming parameter is the same as a corresponding reference test value;
and determining a target trimming parameter between the first trimming parameter and the second trimming parameter, wherein a comparison parameter corresponding to the target trimming parameter is not greater than a comparison parameter corresponding to any one of the first trimming parameter and the second trimming parameter.
2. The method of claim 1, wherein determining the target trimming parameter between the first trimming parameter and the second trimming parameter comprises:
acquiring a first comparison parameter corresponding to a first trimming parameter and a second comparison parameter corresponding to a second trimming parameter;
and determining the target trimming parameter between the first trimming parameter and the second trimming parameter according to the first comparison parameter and the second comparison parameter.
3. The method of claim 2, wherein determining the target trim parameter between the first trim parameter and the second trim parameter according to the first comparison parameter and the second comparison parameter comprises:
determining a first absolute value of the first comparison parameter and a second absolute value of the second comparison parameter;
determining a minimum absolute value with the minimum value in the first absolute value and the second absolute value;
and determining the trimming parameter corresponding to the minimum absolute value as the target trimming parameter.
4. The method of claim 1, wherein obtaining the comparison parameter corresponding to each of the trimming parameters comprises:
acquiring a second test value output by the chip to be tested in response to the reference trimming parameter;
under the condition that the second test value does not meet a target condition, adjusting the reference trimming parameters according to a preset adjusting mode to obtain a plurality of adjusted trimming parameters, wherein the target condition is that the difference value between the second test value and the corresponding reference test value is smaller than a set threshold value;
configuring the trimming parameters for the chip to be tested to obtain the actual test value output by the chip to be tested in response to the trimming parameters;
and determining a difference value between the actual test value and the reference test value to obtain the comparison parameter corresponding to the trimming parameter.
5. The method of claim 4, wherein adjusting the reference trimming parameter according to a preset adjustment manner comprises:
determining an adjustment direction when the reference trimming parameter is adjusted according to the second test value, wherein the adjustment direction comprises a forward adjustment and a backward adjustment, the forward adjustment is an adjustment mode for increasing the value of the reference trimming parameter, and the backward adjustment is an adjustment mode for decreasing the value of the reference trimming parameter;
and adjusting the reference trimming parameters in sequence according to a set adjustment value and the adjustment direction to obtain a plurality of adjusted trimming parameters, wherein the set adjustment value is a positive value.
6. The method of claim 4, wherein obtaining the second test value output by the chip under test in response to the reference trimming parameter comprises:
acquiring an initial trimming parameter of the chip to be tested and a third test value output by the chip to be tested in response to the initial trimming parameter;
determining an initial trimming adjustment value according to the third test value, wherein the initial trimming adjustment value is an integer;
adjusting the initial trimming parameters based on the initial trimming adjustment values to obtain the reference trimming parameters;
and configuring the reference trimming parameters for the chip to be tested to obtain the second test value output by the chip to be tested.
7. The method of claim 4, wherein before adjusting the reference trimming parameter according to a preset adjustment manner, the method further comprises:
determining a third absolute value of the difference between the second test value and the corresponding reference test value;
determining that the second test value does not satisfy the target condition if the third absolute value is greater than a reference threshold;
and determining that the second test value three trimming parameters meet the target condition when the third absolute value is smaller than the reference threshold.
8. An apparatus for determining a target trimming parameter, comprising:
the device comprises an acquisition module, a comparison module and a comparison module, wherein the acquisition module is used for acquiring a comparison parameter corresponding to each trimming parameter in the process of testing a chip to be tested by using a plurality of trimming parameters, the comparison parameter is used for representing the difference between an actual test value corresponding to the trimming parameter and a reference test value corresponding to the trimming parameter, and the actual test value is output by the chip to be tested in response to the trimming parameters;
a first determining module, configured to determine a first trimming parameter and a second trimming parameter that are adjacent to each other in the plurality of trimming parameters, where a third trimming parameter exists between the first trimming parameter and the second trimming parameter, and a first actual test value corresponding to the third trimming parameter is the same as a corresponding reference test value;
and the second determining module is used for determining a target trimming parameter between the first trimming parameter and the second trimming parameter, wherein a comparison parameter corresponding to the target trimming parameter is not greater than a comparison parameter corresponding to any one of the first trimming parameter and the second trimming parameter.
9. A storage medium, characterized in that the storage medium comprises a stored program, wherein the program when executed performs the method of any of the preceding claims 1 to 7.
10. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor executes the method of any of the preceding claims 1 to 7 by means of the computer program.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117931539A (en) * | 2023-12-07 | 2024-04-26 | 重庆金芯麦斯传感器技术有限公司 | Batch trimming chip configuration seeking method and device |
| CN118016132A (en) * | 2023-12-28 | 2024-05-10 | 北京显芯科技有限公司 | Chip trimming method, device, system and storage medium |
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2021
- 2021-03-03 CN CN202110237198.5A patent/CN115016989A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117931539A (en) * | 2023-12-07 | 2024-04-26 | 重庆金芯麦斯传感器技术有限公司 | Batch trimming chip configuration seeking method and device |
| CN118016132A (en) * | 2023-12-28 | 2024-05-10 | 北京显芯科技有限公司 | Chip trimming method, device, system and storage medium |
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