CN114460442A - High-precision needle-off compensation method and device for flying needle test and storage medium - Google Patents
High-precision needle-off compensation method and device for flying needle test and storage medium Download PDFInfo
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- CN114460442A CN114460442A CN202210121930.7A CN202210121930A CN114460442A CN 114460442 A CN114460442 A CN 114460442A CN 202210121930 A CN202210121930 A CN 202210121930A CN 114460442 A CN114460442 A CN 114460442A
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2803—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor
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Abstract
The invention discloses a high-precision lower probe compensation method, a high-precision lower probe compensation device and a storage medium for flying probe test, wherein the method comprises the following steps: acquiring a first elongation of the probe when the probe tip in a vertical state is in contact with a preset point on the tool correcting table; acquiring a second elongation of the probe when the tip of the probe is in contact with a preset point on the tool correcting table after rotation; acquiring a third elongation of the probe when the tip of the probe is in contact with a preset point on the tool correcting table after rotation; and establishing a relation between the rotation angle and the elongation of the probe and a relation between the rotation angle and the offset of the probe. And according to the established probe inserting model, designating the rotation angle of the probe, determining the position and the compensation parameters of the probe inserting, and inserting the probe. According to the high-precision needle inserting compensation method for the flying needle test, disclosed by the embodiment of the invention, automatic real-time identification, automatic calibration, needle correction in the Z-axis direction and needle inserting calibration in probe rotation can be carried out; the multi-angle probe descending test is realized by rotating and moving the probe, the interference generated by the flying probe test module during the test due to the fact that the distance between test points is small or other conditions is effectively avoided, the test accuracy is high, and the precision is high.
Description
Technical Field
The present invention relates to the field of flying probe testing, and more particularly, to a high-precision probe placement compensation method, device and storage medium for flying probe testing.
Background
At present, in the field of PCB testing, most flying probe testing equipment is fixed-posture lower probes, and due to the test particularity, such as small size of a pad of a PCB and small distance between testing points, interference can be generated between flying probe testing modules during direct flying probe testing. In order to meet special test requirements, the probe is required to perform a plurality of angle probe descending tests, and in order to meet test accuracy and test precision, probe descending compensation is required.
The information disclosed in this background section is only for enhancement of understanding of the general background of the invention and should not be taken as an acknowledgement or any form of suggestion that this information forms the prior art already known to a person skilled in the art.
Disclosure of Invention
The invention aims to provide a high-precision needle-off compensation method and device for a flying needle test and a storage medium, which can perform needle-off compensation on a probe in a multi-angle test and meet the test accuracy and the test precision.
In order to achieve the above object, an embodiment of the present invention provides a high-precision pin drop compensation method for a flying pin test, where the pin drop compensation method includes: acquiring a first elongation D1 of the probe when the probe tip in a vertical state is in contact with a preset point on the tool correcting table; rotating the probe according to a first angle theta 1 to obtain a second elongation D2 of the probe when the tip of the probe is in contact with a preset point on the cutter correcting table after rotation; rotating the probe according to a second angle theta 2 to obtain a third elongation D3 of the probe when the tip of the probe is in contact with the preset point on the cutter correcting table after rotation; establishing a relation between the rotation angle theta of the probe and the elongation D of the probe and a relation between the rotation angle theta of the probe and the offset delta X of the probe; and determining the lower probe compensation parameter of the probe according to the rotation angle of the probe.
In one or more embodiments of the present invention, acquiring a first elongation D1 of a probe when a probe tip in a vertical state contacts a predetermined point on a calibration table includes:
a1, enabling the probe to be in a vertical state;
a2, moving the probe to the position above a preset point on the tool correcting table; and
and a3, moving the probe downwards, and recording the first elongation D1 of the probe tip in the z-axis direction if the probe tip contacts with a preset point on the tool correcting table to form a closed loop.
In one or more embodiments of the present invention, rotating the probe by the first angle θ 1 or the second angle θ 2 is: and rotating the probe clockwise or counterclockwise by a first angle theta 1 or a second angle theta 2 around a rotation center Q when the probe is in a vertical state.
In one or more embodiments of the present invention, the lower needle compensation method further includes: calculating a vertical distance HOP from the rotation center Q to the probe according to the first angle theta 1, the second angle theta 2, the first elongation D1, the second elongation D2 and the third elongation D3, and acquiring a vertical distance PL from a plane passing through the rotation center Q and perpendicular to the probe to the tip of the probe:
in one or more embodiments of the present invention, establishing a relationship between the rotation angle θ of the probe and the elongation D of the probe includes:
when the probe rotates clockwise by an angle theta, the elongation
When the probe rotates counterclockwise by an angle theta, the elongation
Wherein H0 is PL + D1.
In one or more embodiments of the present invention, establishing a relationship between the rotation angle θ of the probe and the offset amount Δ X of the probe includes:
the offset of the probe when the probe rotates by an angle theta along the probe
ΔX＝-H0P/cosθ+(H0-H0P·sinθ)·tanθ+H0P；
When the probe rotates counterclockwise by an angle theta, the offset of the probe
ΔX＝H0P/cosθ+(H0+H0P·sinθ)·tanθ-H0P；
Wherein H0 is PL + D1.
In one or more embodiments of the present invention, the lower needle compensation method further includes: and acquiring the mechanical coordinate of the probe through shooting of the camera, and finishing the x-y axis plane calibration of the probe according to the offset from the mechanical coordinate of the probe to the center of the camera.
In one or more embodiments of the invention, the mechanical coordinates of the probe are acquired through the shooting of the camera, and the x-y axis plane calibration of the probe is completed according to the offset of the mechanical coordinates of the probe to the center of the camera. The method comprises the following steps:
b1, enabling the probe to be in a vertical state;
b2, moving the probe to the upper part of the camera;
b3, shooting the probe through a camera to obtain the mechanical coordinate of the probe; and
and b4, acquiring the offset of the probe from the center of the camera according to the mechanical coordinate of the probe, and completing the calibration of the x-y axis plane of the probe.
The invention also discloses a high-precision lower pin compensation device for the flying pin test, which comprises the following components:
the flying probe testing module comprises a probe, a first driving module for driving the probe to ascend and descend and a second driving module for driving the probe to rotate according to an angle theta;
the acquisition module is used for acquiring the elongation D of the probe when the tip of the probe is in contact with a preset point on the tool correcting table; and
and the establishing module is used for establishing the relation between the rotation angle theta of the probe and the elongation D of the probe and the relation between the rotation angle theta of the probe and the offset delta X of the probe.
The invention further discloses a computer readable storage medium, wherein computer instructions are stored in the computer readable storage medium and are suitable for being loaded by a processor, so that the high-precision pin descending compensation method for the flying pin test is realized.
Compared with the prior art, the high-precision probe descending compensation method for the flying probe test can perform real-time automatic identification, automatic calibration, Z-axis direction probe correction and probe rotation needle descending calibration; the multi-angle probe descending test is realized by rotating and moving the probe, the interference generated by the flying probe test module during the test due to the fact that the distance between test points is small or under other conditions is effectively avoided, the test accuracy is high, and the precision is high.
Drawings
FIG. 1 is a system diagram of a high accuracy pin down compensation method for flying pin testing, in accordance with one embodiment of the present invention;
FIG. 2 is a schematic view of a probe in a vertical position according to an embodiment of the invention;
FIG. 3 is a schematic view of a probe rotated clockwise by a first angle according to an embodiment of the present invention;
FIG. 4 is a schematic view of a probe rotated counterclockwise by a second angle in accordance with an embodiment of the present invention;
fig. 5 is a system block diagram of a high-precision lower pin compensation device for a flying pin test according to an embodiment of the present invention.
Detailed Description
The following detailed description of the present invention is provided in conjunction with the accompanying drawings, but it should be understood that the scope of the present invention is not limited to the specific embodiments.
Throughout the specification and claims, unless explicitly stated otherwise, the word "comprise", or variations such as "comprises" or "comprising", will be understood to imply the inclusion of a stated element or component but not the exclusion of any other element or component.
Example 1
As shown in fig. 1, a high-precision pin descending compensation method for flying pin testing includes the following steps.
In step 1, a first elongation D1 of the probe is obtained when the tip of the probe in a vertical state is in contact with a first preset point E1 on the tool calibration table.
Specifically, step 1 may include steps a1 to a 3. As shown in fig. 2 in conjunction with fig. 1, in step a1, the probe is brought into a vertical state.
In step a2, the probe is moved to above the first preset point E1 on the tool calibration table.
In step a3, the probe is moved downwards, and if the probe tip contacts with the first preset point E1 on the tool calibration table to form a closed loop, the first elongation D1 of the probe tip in the z-axis direction is recorded.
The tool correcting table can correspond to a PCB (printed circuit board) or a tool correcting mechanism which is arranged independently. In the present embodiment, the table surface of the tool calibration table and the calibration plane W are located in the same plane.
As shown in fig. 3 in conjunction with fig. 1, in step 2, the probe is rotated by a first angle θ 1, and a second elongation D2 of the probe is obtained when the tip of the probe contacts a first preset point E1 on the tool calibration table after the rotation. Illustrated in fig. 3 is that after the probe is rotated clockwise by the first angle θ 1, the probe tip is extended by the second elongation D2 such that the probe tip is brought into contact with the second preset point E2. In order to bring the probe tip into contact with the first preset point E1 on the tool table, the probe needs to be horizontally moved rightward by an offset amount Δ X' and then elongated by a second elongation amount D2. It is noted here that whether the probe tip is in contact with the first preset point E1 or the second preset point E2, the probe tip is extended by a second extension D2.
As shown in fig. 4 in conjunction with fig. 1, in step 3, the probe is rotated by a second angle θ 2, and a third elongation D3 of the probe is obtained when the tip of the probe contacts the first preset point E1 on the calibration table after the rotation. Illustrated in fig. 4 is that after the probe is rotated counterclockwise by the second angle θ 2, the probe tip is extended by the third elongation D3 such that the probe tip is brought into contact with the third preset point E3. In order to bring the probe tip into contact with the first preset point E1 on the tool table, the probe needs to be horizontally moved leftward by an offset amount Δ X "and then elongated by a third elongation D3. It is noted here that whether the probe tip is in contact with the first preset point E1 or the third preset point E3, the probe tip is extended by a third extension D3.
In step 2 and step 3, rotating the probe by the first angle θ 1 or the second angle θ 2 is: when the probe is in a vertical state, the probe is rotated clockwise or counterclockwise by a first angle theta 1 or a second angle theta 2 at a rotation center Q. In other embodiments, the first angle θ 1 and the second angle θ 2 may be sequentially rotated only in the clockwise direction or the first angle θ 1 and the second angle θ 2 may be sequentially rotated only in the counterclockwise direction. The number of rotations is not particularly limited.
In step 4, a relationship between the rotation angle θ of the probe and the elongation D of the probe and a relationship between the rotation angle θ of the probe and the offset Δ X of the probe are established.
In step 5, the probe needle descending compensation parameter is determined according to the rotation angle of the probe. And (4) determining the rotation angle of the probe according to the probe inserting model established in the step (4), and finally determining the position of the probe inserting and inserting compensation parameters.
In the present embodiment, first, a vertical distance HOP from the rotation center Q to the probe is calculated from the first angle θ 1, the second angle θ 2, the first elongation D1, the second elongation D2, and the third elongation D3, and a vertical distance PL from a plane passing through the rotation center Q and perpendicular to the probe tip is acquired:
the relationship between the rotation angle theta of the probe and the elongation D of the probe is then established, i.e.
When the probe rotates clockwise by an angle theta, the elongation
When the probe rotates counterclockwise by an angle theta, the elongation
Wherein H0 is PL + D1.
Establishing a relationship between the rotation angle theta of the probe and the amount of displacement deltaX of the probe, i.e.
The offset of the probe when the probe rotates along the probe by a certain angle theta
ΔX＝-H0P/cosθ+(H0-H0P·sinθ)·tanθ+H0P；
When the probe rotates counterclockwise by an angle theta, the offset of the probe
ΔX＝H0P/cosθ+(H0+H0P·sinθ)·tanθ-H0P；
Wherein H0 is PL + D1.
According to a formula corresponding to the elongation D and the offset delta X of the probe, the extension D of the lower needle compensation parameter of the probe and the offset delta X of the lower needle compensation parameter of the probe can be finally determined through clockwise or anticlockwise rotation angle theta of the probe.
The lower needle compensation method further comprises the following steps: and acquiring the mechanical coordinate of the probe through shooting of the camera, and completing the x-y axis plane calibration of the probe according to the offset from the mechanical coordinate of the probe to the center of the camera.
Specifically, steps b1 to b4 may be included. In step b1, the probe is brought into a vertical state.
In step b2, moving the probe above the camera;
in step b3, the probe is photographed by a camera, the mechanical coordinates of the probe are acquired, the image coordinates of the center of the probe in the photographed image are located using Blob analysis, and the image coordinates of the center of the probe are converted into the mechanical coordinates of the center of the probe.
In step b4, the offset of the probe from the center of the camera is obtained according to the mechanical coordinates of the probe, so as to complete the x-y axis plane calibration of the probe.
As shown in fig. 5, an embodiment of the present invention further discloses a high-precision lower pin compensation device for a flying pin test, including: a flying probe testing module 10, an acquisition module 20, and a setup module 30.
The flying probe testing module 10 includes a probe, a first driving module for driving the probe to ascend and descend, and a second driving module for driving the probe to rotate according to an angle theta. The flying probe test module 10 includes a plurality of probes and a plurality of first and second drive modules. In this embodiment, two probes are provided, one for the high frequency probe and one for the low frequency probe. Each probe is installed with a first driving module and a second driving module in a matched mode, the first driving module and the second driving module are matched to drive the probes to rotate and move correspondingly, and the probes can be in contact with preset points on the cutter correcting table which is located in the same plane with the needle correcting plane. Each probe operates independently and does not interfere with each other. In the present embodiment, two sets of flying probe test modules 10 are provided.
The acquisition module 20 is used for acquiring the elongation D of the probe and the rotation angle theta of the probe when the tip of the probe is in contact with a preset point on the tool calibration table; and
the establishing module 30 is used for establishing a relation between the rotation angle theta of the probe and the elongation D of the probe and a relation between the rotation angle theta of the probe and the offset delta X of the probe.
One embodiment of the present invention further provides a computer readable storage medium, in which computer instructions are stored, and the computer instructions are suitable for being loaded by a processor, so as to implement the high-precision pin compensation method for the flying pin test.
The foregoing description of specific exemplary embodiments of the invention has been presented for the purposes of illustration and description. It is not intended to limit the invention to the precise form disclosed, and obviously many modifications and variations are possible in light of the above teaching. The exemplary embodiments were chosen and described in order to explain certain principles of the invention and its practical application to enable one skilled in the art to make and use various exemplary embodiments of the invention and various alternatives and modifications as are suited to the particular use contemplated. It is intended that the scope of the invention be defined by the claims and their equivalents.
Claims (10)
1. A high-precision lower needle compensation method for flying needle testing is characterized by comprising the following steps:
acquiring a first elongation D1 of the probe when the tip of the probe is in contact with a preset point on the tool correcting table in a vertical state;
rotating the probe according to a first angle theta 1 to obtain a second elongation D2 of the probe when the tip of the probe is in contact with a preset point on the cutter correcting table after rotation;
rotating the probe according to a second angle theta 2 to obtain a third elongation D3 of the probe when the tip of the probe is in contact with a preset point on the cutter correcting table after rotation;
establishing a relation between the rotation angle theta of the probe and the elongation D of the probe and a relation between the rotation angle theta of the probe and the offset delta X of the probe; and
and determining the lower probe compensation parameters of the probe according to the rotation angle of the probe.
2. The method for compensating for a high-precision lower pin for a flying pin test as claimed in claim 1, wherein obtaining a first elongation D1 of the probe when the probe tip in a vertical state is in contact with a predetermined point on the calibration table comprises:
a1, enabling the probe to be in a vertical state;
a2, moving the probe to the position above a preset point on the tool correcting table; and
and a3, moving the probe downwards, and recording the first elongation D1 of the probe tip in the z-axis direction if the probe tip contacts with a preset point on the tool correcting table to form a closed loop.
3. The method for compensating the high accuracy of the lower probe for the flying probe test according to claim 2, wherein rotating the probe by the first angle θ 1 or the second angle θ 2 is: when the probe is in a vertical state, the probe is rotated clockwise or counterclockwise by a first angle theta 1 or a second angle theta 2 at a rotation center Q.
4. The high-precision pin descending compensation method for the flying pin test according to claim 3, wherein the pin descending compensation method further comprises: calculating a perpendicular distance HOP from the rotation center Q to the probe according to the first angle theta 1, the second angle theta 2, the first elongation D1, the second elongation D2 and the third elongation D3, and acquiring a perpendicular distance PL from a plane passing through the rotation center Q and perpendicular to the probe to the tip of the probe:
5. the high-precision pin descending compensation method for the flying pin test according to claim 4, wherein the establishing of the relationship between the rotation angle θ of the probe and the elongation D of the probe comprises:
when the probe rotates clockwise by an angle theta, the elongation
When the probe rotates counterclockwise by an angle theta, the elongation
Wherein H0 is PL + D1.
6. The method for compensating for a high accuracy lower pin for a flying pin test as set forth in claim 4, wherein the establishing of the relationship between the rotation angle θ of the probe and the offset Δ X of the probe comprises:
the offset of the probe when the probe rotates by an angle theta along the probe
ΔX＝-H0P/cosθ+(H0-H0P·sinθ)·tanθ+H0P；
When the probe rotates counterclockwise by an angle theta, the offset of the probe
ΔX＝H0P/cosθ+(H0+H0P·sinθ)·tanθ-H0P；
Wherein H0 is PL + D1.
7. The high-precision pin descending compensation method for flying pin test according to claim 1, wherein the pin descending compensation method further comprises: and acquiring the mechanical coordinate of the probe through shooting of the camera, and completing the x-y axis plane calibration of the probe according to the offset from the mechanical coordinate of the probe to the center of the camera.
8. The method for compensating the flying probe with the high precision as claimed in claim 7, wherein the mechanical coordinates of the probe are obtained by the camera, and the x-y plane calibration of the probe is completed according to the offset of the mechanical coordinates of the probe to the center of the camera. The method comprises the following steps:
b1, enabling the probe to be in a vertical state;
b2, moving the probe to the upper part of the camera;
b3, shooting the probe through a camera to obtain the mechanical coordinate of the probe; and
and b4, acquiring the offset of the probe from the center of the camera according to the mechanical coordinate of the probe, and completing the calibration of the x-y axis plane of the probe.
9. The utility model provides a flying probe test is with high accuracy compensation arrangement that descends needle which characterized in that includes:
the flying probe testing module comprises a probe, a first driving module for driving the probe to ascend and descend and a second driving module for driving the probe to rotate according to an angle theta;
the acquisition module is used for acquiring the elongation D of the probe and the rotation angle theta of the probe when the tip of the probe is in contact with a preset point on the tool correcting table; and
and the establishing module is used for establishing the relation between the rotation angle theta of the probe and the elongation D of the probe and the relation between the rotation angle theta of the probe and the offset delta X of the probe.
10. A computer readable storage medium having stored thereon computer instructions adapted to be loaded by a processor to implement the method of high accuracy pin-down compensation for flying pin testing as claimed in any one of claims 1 to 9.
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| CN202210121930.7A CN114460442B (en) | 2022-02-09 | 2022-02-09 | High-precision needle drop compensation method and device for flying needle test and storage medium |
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| CN202210121930.7A CN114460442B (en) | 2022-02-09 | 2022-02-09 | High-precision needle drop compensation method and device for flying needle test and storage medium |
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| CN116858858A (en) * | 2023-07-04 | 2023-10-10 | 河南众驰富联精工科技有限公司 | Turntable workpiece tip detection device and workpiece tip coordinate calculation method |
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| CN116858858A (en) * | 2023-07-04 | 2023-10-10 | 河南众驰富联精工科技有限公司 | Turntable workpiece tip detection device and workpiece tip coordinate calculation method |
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| CN114460442B (en) | 2023-04-18 |
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