CN113454661A - 产品不良成因分析的***和方法、计算机可读介质 - Google Patents

产品不良成因分析的***和方法、计算机可读介质 Download PDF

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CN113454661A
CN113454661A CN201980002712.8A CN201980002712A CN113454661A CN 113454661 A CN113454661 A CN 113454661A CN 201980002712 A CN201980002712 A CN 201980002712A CN 113454661 A CN113454661 A CN 113454661A
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analyzed
correlation
process equipment
products
determining
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兰天
王洪
柴栋
吴昊晗
沈国梁
刘伟赫
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BOE Technology Group Co Ltd
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Abstract

一种产品不良成因分析的***，包括：分布式存储设备、分析设备、显示设备；分布式存储设备，被配置为存储工厂设备产生的生产数据；分析设备包括一个或多个处理器，一个或多个处理器被配置为执行以下确定相关性的操作：从分布式存储设备存储的生产数据中获取生产记录(S101)；生产记录包括多个产品在生产过程中经历的工艺设备的信息和发生不良的信息，每个产品在生产过程中经历多个工艺设备，每个工艺设备参与且仅参与多个产品中部分产品的生产过程；根据生产记录，确定多个工艺设备中的待分析工艺设备对应待分析不良的相关性权重，根据相关性权重确定待分析工艺设备与待分析不良的相关性(S102)；显示设备，被配置为显示分析设备的分析结果。

Description

PCT国内申请，说明书已公开。

Claims (20)

  1. PCT国内申请，权利要求书已公开。
CN201980002712.8A 2019-11-29 2019-11-29 产品不良成因分析的***和方法、计算机可读介质 Pending CN113454661A (zh)

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CN114418011A (zh) * 2022-01-21 2022-04-29 京东方科技集团股份有限公司 一种产品不良成因分析的方法、设备及***、存储介质
CN114444986A (zh) * 2022-04-11 2022-05-06 成都数之联科技股份有限公司 产品分析方法及***及装置及介质
WO2023130304A1 (zh) * 2022-01-06 2023-07-13 京东方科技集团股份有限公司 数据处理方法、***、计算机可读存储介质

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CN113537751B (zh) * 2021-07-09 2024-05-17 联通(浙江)产业互联网有限公司 影响磨加工产品质量要素的确定方法和装置
US20240020105A1 (en) * 2022-07-12 2024-01-18 At&T Intellectual Property I, L.P. Targeted software and hardware updates for user equipment based on specific user profiles related to their usage

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CN104123298A (zh) * 2013-04-26 2014-10-29 华为技术有限公司 产品缺陷的分析方法和设备
CN103530467A (zh) * 2013-10-23 2014-01-22 中国兵器科学研究院 一种基于缺陷概率的工艺分析与优化设计方法
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CN114444986B (zh) * 2022-04-11 2022-06-03 成都数之联科技股份有限公司 产品分析方法及***及装置及介质

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US20210364999A1 (en) 2021-11-25
EP4068173A4 (en) 2022-11-16
WO2021102891A1 (zh) 2021-06-03
EP4068173A1 (en) 2022-10-05
KR20220107118A (ko) 2022-08-02
JP2023511464A (ja) 2023-03-20
JP7502345B2 (ja) 2024-06-18

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