CN113138696B - Identification method and device for specification of touch object contact and storage medium - Google Patents
Identification method and device for specification of touch object contact and storage medium Download PDFInfo
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- CN113138696B CN113138696B CN202110485791.1A CN202110485791A CN113138696B CN 113138696 B CN113138696 B CN 113138696B CN 202110485791 A CN202110485791 A CN 202110485791A CN 113138696 B CN113138696 B CN 113138696B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
- G06F3/0442—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using active external devices, e.g. active pens, for transmitting changes in electrical potential to be received by the digitiser
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Abstract
A method, a device and a storage medium for identifying the specification of a touch object contact, wherein the method comprises the following steps: acquiring an elastic wave signal generated when the contact is contacted with the touch substrate, and determining the contact material according to the elastic wave signal; judging the contact mode of the contact head and the touch substrate; and determining the specification of the contact according to the contact material when the contact mode of the contact and the touch substrate is judged to be the first contact mode. The application can improve the recognition accuracy of the contact specification.
Description
Technical Field
The present disclosure relates to touch technologies, and in particular, to a method and apparatus for identifying specifications of a touch object, and a storage medium.
Background
To enhance the user's experience with a meeting whiteboard or educational whiteboard, currently available whiteboards support the function of changing the color of writing according to the contact specifications of the writing instrument in contact with the whiteboard. For example, an infrared transceiver is arranged on a whiteboard frame, as shown in fig. 1, an infrared grid is formed, the infrared grid is intersected horizontally and vertically, when a contact is contacted with the whiteboard, a contact parameter is determined according to the area of the infrared grid shielded by the contact, and the specification of the contact is determined according to the contact parameter.
The method for judging the specification of the contact may misjudge, for example, when a thin writing tool contacted with the whiteboard is inclined by a certain angle, the contact parameter between the contact and the whiteboard is increased, in this case, the thin contact may be misjudged as a thick contact, and then the wrong handwriting color is output; alternatively, a thick writing instrument in contact with the whiteboard is inclined at an angle to reduce the contact parameters of the stylus with the whiteboard, in which case the thick stylus may be misjudged as a thin stylus, thereby outputting an erroneous handwriting color. The misjudgment of the contact specification can affect the user experience.
Disclosure of Invention
The application provides a method, a device and a storage medium for identifying the specification of a touch object contact, which can improve the identification accuracy of the contact specification.
The application provides a method for identifying the specification of a touch object contact, which comprises the following steps: acquiring an elastic wave signal generated when the contact is contacted with the touch substrate, and determining the contact material according to the elastic wave signal; judging the contact mode of the contact head and the touch substrate; and determining the specification of the contact according to the contact material when the contact mode of the contact and the touch substrate is judged to be the first contact mode.
Further, the method further comprises: acquiring contact parameters of the contact and the touch substrate; and when the contact mode of the contact and the touch substrate is judged to be the second contact mode, determining the specification of the contact according to the contact parameter or the contact material.
Further, determining a contact mode of the contact and the touch substrate includes: determining a contact mode of the contact head and the touch substrate according to the elastic wave signal: comparing the signal characteristics of the elastic wave signals with the signal characteristics in a signal characteristic library, and determining the contact mode of the contact and the touch substrate according to the comparison result, wherein the signal characteristic library stores the signal characteristics of the elastic wave signals corresponding to the contact of different specifications of contacts with the touch substrate in a first contact mode and a second contact mode respectively.
Further, determining a contact mode of the contact and the touch substrate includes: and determining the contact mode of the contact and the touch substrate according to the elastic wave signal and the contact parameter.
Further, determining a contact mode of the contact with the touch substrate according to the elastic wave signal and the contact parameter includes: judging the contact mode of the contact head and the touch substrate according to the elastic wave signal; when the contact parameter belongs to a preset contact range value of a first specification or a contact range value of a second specification, but the contact parameter is located outside the contact range value corresponding to the contact material determined according to the elastic wave signal, if the contact mode is judged to be the first contact mode according to the elastic wave signal, the contact mode between the contact and the touch substrate is determined to be the first contact mode, and the contact range value of the second specification contact is larger than the contact range value of the first specification contact.
Further, determining a contact mode of the contact with the touch substrate according to the elastic wave signal and the contact parameter, further includes: and when the contact parameter belongs to a preset contact range value of the first specification or a contact range value of the second specification, and the contact parameter is positioned in a contact range value corresponding to the contact material determined according to the elastic wave signal, determining that the contact mode of the contact and the touch substrate is a second contact mode.
Further, determining a contact mode of the contact with the touch substrate according to the elastic wave signal and the contact parameter, further includes: when the contact parameter is between a preset first specification contact range value and a second specification contact range value or exceeds the second specification contact range value, judging whether the distance between the contact parameter and a contact range value corresponding to a contact material determined according to the elastic wave signal is smaller than a preset value, and if so, determining that the contact mode of the contact and the touch substrate is a first contact mode; if not, the contact mode of the contact and the touch substrate is determined to be a first contact mode or a second contact mode by default, and the contact range value of the second specification contact is larger than that of the first specification contact.
Further, determining a contact mode of the contact with the touch substrate according to the elastic wave signal and the contact parameter, further includes: and when the contact parameter is smaller than a preset contact range value of the first specification contact, judging that the contact is invalid.
The present application also provides a computer readable storage medium storing one or more programs executable by one or more processors to implement the method of identifying a touch object contact specification as described above.
The application also provides a device for identifying the specification of the touch object, which comprises a memory and a processor, wherein the memory stores a program, and the program realizes the method for identifying the specification of the touch object contact when being read and executed by the processor.
According to the technical scheme provided by the application, the contact specification is determined according to the contact material determined by the elastic wave signal generated when the contact is contacted with the touch substrate, so that the influence of writing posture is small, and the obtained contact specification is more accurate than the contact specification determined according to the contact parameters of the contact and the touch substrate.
Additional features and advantages of the application will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the application. Other advantages of the application may be realized and attained by the structure particularly pointed out in the written description and drawings.
Drawings
The accompanying drawings are included to provide an understanding of the principles of the application, and are incorporated in and constitute a part of this specification, illustrate embodiments of the application and together with the description serve to explain, without limitation, the principles of the application.
FIG. 1 is a schematic diagram of a whiteboard with an infrared transceiver in the related art;
FIG. 2 is a flowchart of a method for identifying the specification of a touch object contact according to an embodiment of the present application;
FIG. 3 is a schematic diagram of a touch substrate provided with a plurality of acoustic wave sensors according to an embodiment of the present application;
FIG. 4 is a flowchart of another method for identifying specifications of a touch object contact according to an embodiment of the present application;
fig. 5 is a block diagram of an identification device for specification of a touch object contact according to an embodiment of the present application.
Detailed Description
The present application has been described in terms of several embodiments, but the description is illustrative and not restrictive, and it will be apparent to those of ordinary skill in the art that many more embodiments and implementations are possible within the scope of the described embodiments. Although many possible combinations of features are shown in the drawings and discussed in the detailed description, many other combinations of the disclosed features are possible. Any feature or element of any embodiment may be used in combination with or in place of any other feature or element of any other embodiment unless specifically limited.
The present application includes and contemplates combinations of features and elements known to those of ordinary skill in the art. The disclosed embodiments, features and elements of the present application may also be combined with any conventional features or elements to form a unique inventive arrangement as defined by the claims. Any feature or element of any embodiment may also be combined with features or elements from other inventive arrangements to form another unique inventive arrangement as defined in the claims. It is therefore to be understood that any of the features shown and/or discussed in the present application may be implemented alone or in any suitable combination. Accordingly, the embodiments are not to be restricted except in light of the attached claims and their equivalents. Further, various modifications and changes may be made within the scope of the appended claims.
Furthermore, in describing representative embodiments, the specification may have presented the method and/or process as a particular sequence of steps. However, to the extent that the method or process does not rely on the particular order of steps set forth herein, the method or process should not be limited to the particular sequence of steps described. Other sequences of steps are possible as will be appreciated by those of ordinary skill in the art. Accordingly, the particular order of the steps set forth in the specification should not be construed as limitations on the claims. Furthermore, the claims directed to the method and/or process should not be limited to the performance of their steps in the order written, and one skilled in the art can readily appreciate that the sequences may be varied and still remain within the spirit and scope of the embodiments of the present application.
The embodiment of the application provides a method for identifying the specification of a touch object contact, as shown in fig. 2, comprising the following steps:
step S201, an elastic wave signal generated when a contact is contacted with a touch substrate is obtained, and the material of the contact is determined according to the elastic wave signal;
in this embodiment, the touch substrate includes a glass plate, a wood plate, a metal plate, or other materials that can generate elastic wave signals, or an existing touch screen, a non-touch screen, or the like; when the touch device is in actual use, elastic wave signals generated by the touch substrate due to contact can be collected through the elastic wave sensor; the elastic wave sensor may be a piezoelectric sensor;
step S202, judging a contact mode of the contact head and the touch substrate;
step 203, when the contact mode of the contact and the touch substrate is determined to be a first contact mode, determining the specification of the contact according to the contact material; the first contact mode refers to the contact angle of the contact head and the touch substrate is larger than or equal to a preset threshold value in the contact mode;
in the first contact mode, the contact material is determined according to the elastic wave signal generated when the contact is contacted with the touch substrate, the contact specification is determined according to the contact material, and the obtained contact specification is more accurate than the contact specification determined according to the contact parameters of the contact and the touch substrate.
In an exemplary embodiment, the contact parameters include at least one of: contact area, length of contact area and width of contact area.
The embodiment of the application also provides another method for identifying the specification of the touch object contact, as shown in fig. 4, wherein the method comprises the following steps:
step S401, an elastic wave signal generated when a contact is contacted with a touch substrate is obtained, and the material of the contact is determined according to the elastic wave signal;
step S402, obtaining contact parameters of the contact head and the touch substrate;
FIG. 3 is a schematic diagram of a touch substrate provided with a plurality of acoustic wave sensors, the touch substrate being a whiteboard provided with an infrared transceiver; after the touch pen is contacted with the whiteboard, the whiteboard generates elastic wave signals, the elastic wave signals are collected through a plurality of elastic wave sensors arranged on the frame of the whiteboard, and the infrared detection technology is utilized to obtain contact parameters;
although the contact parameters are obtained as the subsequent step of determining the contact material quality in the embodiment, in actual implementation, the contact parameters may be obtained before determining the contact material quality, or both may be performed in parallel;
step S403, judging a contact mode of the contact head and the touch substrate;
step S404, when judging that the contact mode of the contact and the touch substrate is a first contact mode, determining the specification of the contact according to the contact material;
and step 405, when the contact mode of the contact and the touch substrate is determined to be the second contact mode, determining the specification of the contact according to the contact parameter or the contact material.
In this embodiment, the first contact mode refers to a contact angle between the contact and the touch substrate being greater than or equal to a preset threshold in the contact mode; the second contact mode refers to an angle at which the contact angle of the contact head with the touch substrate is greater than 0 and less than a preset threshold, or equal to 0, in the contact mode.
In the embodiment, when the contact is in oblique contact with the touch substrate and the oblique contact angle is larger than a preset threshold, determining the contact specification according to the contact material; when the contact is in vertical contact or inclined contact with the touch substrate and the inclined contact angle is smaller than a preset threshold, the contact specification is determined according to the contact parameters or the contact materials, and the accuracy of the acquired contact specification is ensured.
In an exemplary embodiment, determining the contact material according to the elastic wave signal includes: acquiring signal characteristics of the elastic wave signal, wherein the signal characteristics comprise: a duty cycle of the frequency; and identifying the contact material according to the signal characteristics. Because the contact of different materials contacts with the touch screen, there is the difference in the signal characteristics of the elastic wave signals acquired by the elastic wave sensor, the embodiment utilizes the difference to realize the identification of the contact materials, and the accuracy of the contact material identification is improved.
In an exemplary embodiment, the method for obtaining the duty ratio coefficient of the frequency of the elastic wave signal may include: determining a duty ratio coefficient of a specified frequency band or a specified frequency point based on a ratio of an amplitude parameter of an elastic wave signal serving as a frequency domain signal on the specified frequency band or the specified frequency point to a sum of amplitudes of the elastic wave signal in a full frequency band; the amplitude parameter may be: amplitude, amplitude sum, maximum amplitude, average amplitude, and difference between maximum amplitude and minimum amplitude.
In another exemplary embodiment, the manner of acquiring the duty ratio coefficient of the frequency of the elastic wave signal may include: determining a duty ratio coefficient of a specified frequency band or a specified frequency point based on a ratio of an amplitude parameter of a corrected elastic wave signal serving as a frequency domain signal on the specified frequency band or the specified frequency point to a sum of amplitudes of the corrected elastic wave signal in a full frequency band; the method for acquiring the modified elastic wave signal may include: taking an envelope signal of the elastic wave signal as a frequency domain signal as a modified elastic wave signal; or, the elastic wave signal as the frequency domain signal is passed through a low pass filter to obtain a corrected elastic wave signal.
In an exemplary embodiment, the signal features may include other features in addition to the duty cycle coefficients of the frequencies, such as one or more of auxiliary time domain signal features and auxiliary frequency domain signal features; wherein the auxiliary time domain signal characteristic may be a standard deviation or variance of an elastic wave as a time domain signal or other time domain signal characteristics; the auxiliary frequency domain signal characteristic can be the amplitude sum of the elastic wave in a specified frequency band, or the amplitude difference value in the specified frequency band, or other frequency domain signal characteristics; the embodiment increases the types of the signal characteristics for material identification, and can further improve the accuracy of identification.
In an exemplary embodiment, identifying the contact material according to the signal characteristics includes: for each preset contact material, determining the probability that the contact material to be identified is the preset contact material according to the acquired signal characteristics; determining the material of a preset contact corresponding to the maximum probability as the material of the contact to be identified; the preset contact materials can be plastics, rubber and the like.
In an exemplary embodiment, determining, according to the obtained signal characteristics, a probability that a contact material to be identified is the preset contact material includes: comparing the obtained signal characteristics with signal characteristics corresponding to each preset contact material, and determining the probability of the contact material to be identified as the preset contact material according to the similarity obtained by comparison; or inputting the acquired signal characteristics into an identification model of the contact material, and determining the probability of the contact material to be identified as each preset contact material according to the identification result of the identification model, wherein the identification model is obtained by training according to signal characteristic sample data corresponding to all preset contact materials.
In an exemplary embodiment, determining a contact mode of the contact with the touch substrate includes:
determining a contact mode of the contact head and the touch substrate according to the elastic wave signal: comparing the signal characteristics of the elastic wave signals with the signal characteristics in a signal characteristic library, and determining the contact mode of the contact and the touch substrate according to the comparison result, wherein the signal characteristic library stores the signal characteristics of the elastic wave signals corresponding to the contacts with different specifications and the touch substrate in a first contact mode and a second contact mode. Under different contact modes, the pressure born by the touch substrate is different, the deformation of the touch substrate is different, and further, the generated elastic wave signals are different, for example, when a contact is knocking the touch substrate, namely, the contact is vertically contacted with the touch substrate, the pressure born by the touch substrate is larger, the force can inhibit the rebound of the touch substrate, so that the vibration amplitude of the touch substrate is larger and the vibration frequency is smaller in the vertical contact process, and therefore, the elastic wave signals are also larger in amplitude and smaller in frequency; when the contact is obliquely knocked on the touch substrate, namely the contact is obliquely contacted with the touch substrate, the pressure born by the touch substrate is reduced, the rebound influence of the force on the touch substrate is also reduced, the vibration amplitude of the touch substrate is smaller, the vibration frequency is larger, and therefore the elastic wave signal is also smaller in amplitude and larger in frequency in the oblique contact process. According to the embodiment, the characteristics that the elastic wave signals generated in the first contact mode and the second contact mode have different signal characteristics are utilized, the signal characteristics of the elastic wave signals generated through contact are compared with the signal characteristics of the elastic wave signals corresponding to the first contact mode and the second contact mode, and the contact mode can be judged according to the comparison result.
In another exemplary embodiment, determining a contact pattern of the contact with the touch substrate includes: determining a contact mode of the contact and the touch substrate according to the elastic wave signal and a contact parameter of the contact and the touch substrate comprises the following steps: judging the contact mode of the contact head and the touch substrate according to the elastic wave signal; when the contact parameter belongs to a preset contact range value of a first specification or a contact range value of a second specification, but the contact parameter is located outside the contact range value corresponding to the contact material determined according to the elastic wave signal, if the contact mode is judged to be the first contact mode according to the elastic wave signal, the contact mode between the contact and the touch substrate is determined to be the first contact mode, and the contact range value of the second specification contact is larger than the contact range value of the first specification contact. In this embodiment, the first specification contact and the second specification contact may be divided according to the thickness of the contacts, where the contact range value corresponding to the thick contact is greater than the contact range value corresponding to the thin contact. In this embodiment, when the contact parameter is located outside the contact range value corresponding to the contact material determined according to the elastic wave signal, it is indicated that the contact specification determined according to the contact parameter and the contact specification determined according to the contact material are inconsistent, if the contact mode is determined to be the first contact mode according to the elastic wave signal at this time, the contact specification determined by the contact material is taken as the finally output contact specification, and at this time, the contact mode of the contact and the touch substrate is determined to be the first contact mode.
In an exemplary embodiment, determining a contact mode of the contact with the touch substrate according to the elastic wave signal and the contact parameter further includes: and when the contact parameter belongs to a preset contact range value of the first specification or a contact range value of the second specification, and the contact parameter is positioned in a contact range value corresponding to the contact material determined according to the elastic wave signal, determining that the contact mode of the contact and the touch substrate is a second contact mode. In this embodiment, when the contact parameter is located within the contact range value corresponding to the contact material determined according to the elastic wave signal, it is indicated that the contact specification determined according to the contact parameter is consistent with the contact specification determined according to the contact material, and the contact specification may be determined according to the contact material or the contact specification may be determined according to the contact parameter, where the contact mode of the contact and the touch substrate is determined as the second contact mode.
In an exemplary embodiment, determining a contact mode of the contact with the touch substrate according to the elastic wave signal and the contact parameter further includes:
when the contact parameter is between a preset first specification contact range value and a second specification contact range value or exceeds the second specification contact range value, judging whether the distance between the contact parameter and a contact range value corresponding to a contact material determined according to the elastic wave signal is smaller than a preset value, and if so, determining that the contact mode of the contact and the touch substrate is a first contact mode; if not, the contact mode of the contact head and the touch substrate is determined to be a first contact mode or a second contact mode by default. In this embodiment, when the contact specification cannot be determined by the contact parameter, if the contact parameter is close to the contact range value corresponding to the contact material determined according to the elastic wave signal, the contact specification determined by the contact material is used as the final output contact specification, and at this time, the contact mode of the contact and the touch substrate is determined as the first contact mode. The preset value is equivalent to a tolerance degree for erroneous judgment, and the larger the preset value is, the higher the tolerance is, and the greater the possibility of errors is. The preset value may be determined based on empirical or experimental data.
In an exemplary embodiment, determining a contact mode of the contact with the touch substrate according to the elastic wave signal and the contact parameter further includes: and when the contact parameter is smaller than a preset contact range value of the first specification contact, judging that the contact is invalid. In this embodiment, when the contact parameter is smaller than the preset contact range value of the first specification contact, it is indicated that the contact area of the contact with the touch substrate is too small, and the contact is determined as an ineffective contact.
The embodiment of the application also provides a computer readable storage medium, which stores one or more programs, and the one or more programs can be executed by one or more processors to implement the method for identifying the specification of the touch object contact according to the previous embodiment.
The embodiment of the application also provides a device for identifying the specification of the touch object contact, as shown in fig. 5, which comprises a memory 501 and a processor 502, wherein the memory 501 stores a program, and the program realizes the method for identifying the specification of the touch object contact described in the previous embodiment when being read and executed by the processor 502.
Those of ordinary skill in the art will appreciate that all or some of the steps, systems, functional modules/units in the apparatus, and methods disclosed above may be implemented as software, firmware, hardware, and suitable combinations thereof. In a hardware implementation, the division between the functional modules/units mentioned in the above description does not necessarily correspond to the division of physical components; for example, one physical component may have multiple functions, or one function or step may be performed cooperatively by several physical components. Some or all of the components may be implemented as software executed by a processor, such as a digital signal processor or microprocessor, or as hardware, or as an integrated circuit, such as an application specific integrated circuit. Such software may be distributed on computer readable media, which may include computer storage media (or non-transitory media) and communication media (or transitory media). The term computer storage media includes both volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data, as known to those skilled in the art. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital Versatile Disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can be accessed by a computer. Furthermore, as is well known to those of ordinary skill in the art, communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and includes any information delivery media.
Claims (10)
1. The method for identifying the specification of the touch object contact is characterized by comprising the following steps of:
acquiring an elastic wave signal generated when the contact is contacted with the touch substrate, and determining the contact material according to the elastic wave signal;
judging the contact mode of the contact head and the touch substrate;
and determining the specification of the contact according to the contact material when the contact mode of the contact and the touch substrate is judged to be the first contact mode.
2. The method according to claim 1, wherein the method further comprises:
acquiring contact parameters of the contact and the touch substrate;
and when the contact mode of the contact and the touch substrate is judged to be the second contact mode, determining the specification of the contact according to the contact parameter or the contact material.
3. The method of claim 2, wherein the step of determining the position of the substrate comprises,
judging the contact mode of the contact head and the touch substrate comprises the following steps:
determining a contact mode of the contact head and the touch substrate according to the elastic wave signal: comparing the signal characteristics of the elastic wave signals with the signal characteristics in a signal characteristic library, and determining the contact mode of the contact and the touch substrate according to the comparison result, wherein the signal characteristic library stores the signal characteristics of the elastic wave signals corresponding to the contact with different specifications in a first contact mode and a second contact mode of the touch substrate respectively.
4. The method of claim 2, wherein the step of determining the position of the substrate comprises,
judging the contact mode of the contact head and the touch substrate comprises the following steps:
and determining the contact mode of the contact and the touch substrate according to the elastic wave signal and the contact parameter.
5. The method of claim 4, wherein the step of determining the position of the first electrode is performed,
determining a contact mode of the contact with the touch substrate according to the elastic wave signal and the contact parameter, including:
judging the contact mode of the contact head and the touch substrate according to the elastic wave signal;
when the contact parameter belongs to a preset contact range value of a first specification or a contact range value of a second specification, but the contact parameter is located outside the contact range value corresponding to the contact material determined according to the elastic wave signal, if the contact mode is judged to be the first contact mode according to the elastic wave signal, the contact mode between the contact and the touch substrate is determined to be the first contact mode, and the contact range value of the second specification contact is larger than the contact range value of the first specification contact.
6. The method of claim 5, wherein the step of determining the position of the probe is performed,
determining a contact mode of the contact with the touch substrate according to the elastic wave signal and the contact parameter, and further comprising:
and when the contact parameter belongs to a preset contact range value of the first specification or a contact range value of the second specification, and the contact parameter is positioned in a contact range value corresponding to the contact material determined according to the elastic wave signal, determining that the contact mode of the contact and the touch substrate is a second contact mode.
7. The method of claim 5, wherein the step of determining the position of the probe is performed,
determining a contact mode of the contact with the touch substrate according to the elastic wave signal and the contact parameter, and further comprising:
when the contact parameter is between a preset first specification contact range value and a second specification contact range value or exceeds the second specification contact range value, judging whether the distance between the contact parameter and a contact range value corresponding to a contact material determined according to the elastic wave signal is smaller than a preset value, and if so, determining that the contact mode of the contact and the touch substrate is a first contact mode; if not, the contact mode of the contact head and the touch substrate is determined to be a first contact mode or a second contact mode by default.
8. The method of claim 5, wherein the step of determining the position of the probe is performed,
determining a contact mode of the contact with the touch substrate according to the elastic wave signal and the contact parameter, and further comprising:
and when the contact parameter is smaller than a preset contact range value of the first specification contact, judging that the contact is invalid.
9. A computer readable storage medium storing one or more programs executable by one or more processors to implement the method of any of claims 1-8.
10. An identification device of a touch object contact specification comprising a memory and a processor, the memory storing a program which, when read by the processor for execution, implements the method of any one of claims 1 to 8.
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CN113655902B (en) * | 2021-07-26 | 2024-04-26 | 北京钛方科技有限责任公司 | Touch signal determining method and device and storage medium |
CN113805725B (en) * | 2021-08-03 | 2024-04-23 | 广州创知科技有限公司 | Display control method and device for interactive panel |
CN115904112B (en) * | 2021-09-29 | 2024-06-28 | 广州众远智慧科技有限公司 | Interaction device and touch feedback method thereof |
CN114115558B (en) * | 2021-11-04 | 2024-06-11 | 北京钛方科技有限责任公司 | Touch pen identification method, device and system, storage medium and touch pen |
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