CN113030699B - Bending type board card function test fixture and device - Google Patents
Bending type board card function test fixture and device Download PDFInfo
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- CN113030699B CN113030699B CN202110237242.2A CN202110237242A CN113030699B CN 113030699 B CN113030699 B CN 113030699B CN 202110237242 A CN202110237242 A CN 202110237242A CN 113030699 B CN113030699 B CN 113030699B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2803—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2815—Functional tests, e.g. boundary scans, using the normal I/O contacts
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a bending type board card function test fixture and a device, comprising: a clamping module and a carrier module; the clamping module is placed on the upper surface of the carrier plate module; the clamping module comprises a flip module and a plate clamping seat; the shape of the upper surface of the plate clamping seat is consistent with that of the bent plate card; a pin block module is arranged in the flip module, and one end of the pin block module is hinged with the board card seat; the carrier plate module comprises a carrier plate; a needle plate is connected below the carrier plate in a floating manner, and a carrier plate probe is arranged on the needle plate; the formed device also comprises a pressing plate module, a supporting module, an action control module, a vertical driving module, a horizontal driving module and a bottom plate; the invention has the advantages that the balanced pressing action is realized through the switching of the clamping module, and the structure is simplified; the double-layer switching signal structure is adopted, so that the pulling of the probe can be prevented; meanwhile, the whole frame of the testing machine can be designed into a standard frame, so that different tested board cards can be upgraded conveniently, and the standard frame of the testing machine is favorable for reducing the design and maintenance cost.
Description
Technical Field
The invention relates to the technical field of board card testing devices, in particular to a bending type board card function testing clamp and device.
Background
With the rapid development of electronic product technology and the increasing requirements for process efficiency and yield, the electronic industry gradually starts to enhance the development and optimization of product function test equipment while improving the process efficiency of electronic products. Among them, the demand for the functional test (FCT) of the motherboard of the electronic product is the most urgent.
A common FCT tester is mainly used for testing flat boards, but research and development on the FCT tester for curved boards is delayed. For the FCT testing machine of the bent board card, the traditional structure is that a needle plate module is installed on a pressing plate module, a plurality of cylinders are adopted to drive the pressing plate module, and the pressing action vertical to the plane of the board card test point is completed. The conventional design thus has the following disadvantages:
1. because a plurality of pressing driving structures with different angles are adopted, the structure of the bending type board card testing machine is very complex, and the design cost and the maintenance cost are increased;
2. due to the adoption of a plurality of downward pressing driving structures with different angles, probes of different downward pressing driving structures are difficult to contact with a tested board card at the same time, so that local stress is synchronous, the tested board card is pulled, and the tested board card is damaged;
3. owing to adopt a plurality of drive structure that push down of different angles for overall structure can take place great difference because of the measured plate card of difference, is unfavorable for standardized structural design, is unfavorable for old part and module to multiplex, increases design and module management and control cost.
Chinese patent CN208654211U discloses a clip formula needle mould test structure, including clip apron, clip base, FPC locating piece, slider, needle membrane main part, needle board, PCB keysets and a buckle, rotate through the rotational pin between clip apron and the clip base and be connected, the buckle is installed in the other end of clip base, and the buckle is used for pinning the expansion end of clip apron, and the FPC locating piece is installed in clip base upper end, the slider is installed in the lower terminal surface of clip apron, and double-end probe installs on the slider, and the PCB keysets is installed in outside one side of clip apron, and the double-end probe is connected to the PCB keysets. Above-mentioned technical scheme provides a medium plate card holding structure, if with its application in the crooked integrated circuit board test, can be used to the unilateral structure of crooked side of centre gripping, but does not solve the problem of signal switching like this yet, is not convenient for place in whole test machine simultaneously, also is not convenient for push down the device and pushes down, so still need further improvement.
Disclosure of Invention
In view of this, the present invention provides a function test fixture for a bent board card and a device thereof, which can solve the above problems.
For this purpose, the present invention is implemented by the following technical means.
The utility model provides a type of bending integrated circuit board functional test anchor clamps mainly includes: a clamping module and a carrier module; the clamping module is placed on the upper surface of the carrier plate module; a positioning structure is arranged between the clamping module and the carrier plate module;
the clamping module comprises at least one group of flip module, a board clamping seat and a first signal adapter plate; the shape of the upper surface of the plate clamping seat is consistent with that of the bent plate card; a needle block module is arranged in the flip module; the first signal adapter plate is electrically connected with the pin block module; one end of the flip module is hinged with the plate clamping seat;
in a working state, the bending type board card is placed on the upper surface of the board clamping seat, and the flip cover module covers the upper surface of the bending type board card and is clamped with the board clamping seat through a clamping structure; the probe of the probe block module is in contact with the test point of the bent board card;
the carrier plate module comprises a carrier plate, a needle plate, a second signal adapter plate and a signal processing plate from top to bottom in sequence; the needle plate is connected below the support plate in a floating manner, and a support plate probe is arranged on the needle plate; the carrier plate is provided with a plurality of through holes which correspond to the carrier plate probes one by one; the needle plate is electrically connected with the second signal adapter plate, and the second signal adapter plate is electrically connected with the signal processing plate;
under the working state, the carrier plate probe penetrates through the through hole to be in contact with the first signal adapter plate and forms electric connection.
Furthermore, the flip module also comprises a fixed frame, a spring hook and a flip bracket; the fixing frame is in floating connection with the overturning bracket; the fixing frame is in floating connection with the needle block module; the spring clamping hook is arranged on at least one side of the fixing frame, a clamping groove is formed in a corresponding position on the plate clamping seat, and the spring clamping hook and the clamping groove form the clamping structure; the lower part of the turning support is hinged with the plate clamping seat.
Furthermore, the lower surface of the needle block module is provided with at least two positioning pins, and the upper surface of the bending type board card is provided with corresponding positioning holes.
Furthermore, an unlocking trigger is arranged on the inner side of the clamping groove of the plate clamping seat; the unlocking trigger and the board card seat form a rotary connection structure through a rotating shaft, and a torsion spring is arranged between the unlocking trigger and the board card seat;
under the buckling state of the flip module and the plate clamping seat, one end of the unlocking trigger is lapped on the inner side of the spring clamping hook, the other end of the unlocking trigger is pressed, the hook head of the spring clamping hook is pushed out of the clamping groove, and the buckling state of the flip module and the plate clamping seat is relieved.
Further, the first signal adapter plate is mounted on the lower surface of the plate clamping seat; an insulating base plate is arranged between the first signal adapter plate and the plate clamping seat; the first signal adapter plate is electrically connected with the needle block module through a switching flexible flat cable.
On the other hand, the invention also provides a function testing device based on the function testing fixture, which further comprises a pressure plate module, a supporting module, an action control module, a vertical driving module, a horizontal driving module and a bottom plate;
the two sides of the bottom plate are provided with the vertical driving modules, and the movable ends of the vertical driving modules are fixedly connected with the pressing plate modules;
the supporting module is connected with the bottom plate in a sliding manner through a sliding mechanism; the fixed end of the horizontal driving module is arranged on the bottom plate, and the movable end of the horizontal driving module is fixedly connected with the supporting module; the clamping modules and the carrier plate modules are in a plurality of groups and are distributed on the upper surface of the supporting module in an array manner;
the pressing plate module is positioned above the supporting module;
the bottom plate is also provided with the action control module.
Further, the pressing plate module comprises a pressing plate; the lower surface of the pressing plate is provided with a rigid pressing rod, an elastic pressing rod and a stop column;
when the supporting module is positioned right below the pressing plate module, the rigid pressing rod and the elastic pressing rod are distributed right above the clamping module, and the stop column is distributed at the side position; the length of the elastic pressing rod is larger than that of the rigid pressing rod, in the pressing process of the pressing plate module, the elastic pressing rod firstly contacts the clamping module, then the rigid pressing rod contacts the clamping module, and finally the stop column contacts the support plate module.
Furthermore, a power unit of the vertical driving module is a first air cylinder, and the movable end of the first air cylinder is fixedly connected with the pressure plate module; the vertical driving module also comprises at least one group of first guide rails which are vertically arranged; and a sliding block is arranged on the first guide rail and fixedly connected with the pressing plate module.
Furthermore, the supporting module comprises a middle frame plate and a supporting frame;
the supporting frames are vertically arranged on two sides of the middle frame plate; the support frame is in sliding connection with the bottom plate through a second guide rail and a sliding block; the horizontal driving module is two sets of second cylinders which are horizontally arranged, the fixed ends of the cylinders are fixedly connected with the bottom plate, and the movable ends of the cylinders are fixedly connected with the supporting frame.
Furthermore, power units of the vertical driving module and the horizontal driving module are air cylinders; the action control module comprises a throttle valve, an electromagnetic valve and an electric control board card; the electric control board is electrically connected with the electromagnetic valve; and an external air source is connected with the air cylinder through the throttle valve and the electromagnetic valve.
The invention has the following advantages:
1. through centre gripping module with being surveyed board card signal switching to rear end signal processing board, realize that the cylinder is balanced in step and pushes down the action, simplified the clamp plate needle piece and pushed down driven complex structure, reduced design and cost.
2. By adopting a double-layer switching signal structure, the tested bent board card transmits a signal to the signal switching board of the clamping module through the manual flip structure, and then transmits the signal to the rear-end signal processing board through the rear-end pin carrier board module. The manual cover buckles the needle plate module of the test plane with different included angles, so that the test plane with different included angles can be prevented from being pulled due to the fact that the test plane with different included angles does not receive probe force at the same time.
3. Due to the fact that the clamping module is adopted for switching signal output, on the premise that the placement space of the clamping module of different tested bent plates is considered, the whole frame of the testing machine can be designed to be a standard frame, upgrading between different tested bent plates is facilitated, the standard frame of the testing machine is beneficial to reducing design and maintenance cost, and the whole reuse rate of parts is improved.
Drawings
In order to illustrate the embodiments of the present invention more clearly, the drawings that are needed in the embodiments will be briefly described below, it is obvious that the drawings in the following description are only one or several embodiments of the present invention, and that other drawings can be obtained by those skilled in the art without inventive effort.
The distribution positions and distribution numbers of the same structures shown in the drawings are only for convenience of describing the invention, but do not indicate or imply that the structures referred to must have a specific orientation, distribution numbers and therefore should not be construed as limiting the invention.
FIG. 1 is an exploded view of the test fixture structure of the present invention;
FIG. 2 is a view of the structure of the clamping module of the present invention (FIG. 2a is a perspective view; FIG. 2b is an exploded view);
FIG. 3 is a view of the flip module structure of the present invention (FIG. 3c is a perspective view; FIG. 3d is an exploded view);
FIG. 4 is an exploded view of the needle module of the present invention;
FIG. 5 is an exploded view of the board holder of the present invention;
FIG. 6 is a structural view of a carrier module according to the present invention (FIG. 6e is a perspective view; FIG. 6f is an exploded view);
FIG. 7 is a perspective view of the testing device of the present invention;
FIG. 8 is an exploded view of a testing device according to the present invention;
FIG. 9 is an exploded view of the platen module of the present invention;
FIG. 10 is an exploded view of the mounting location of the support module of the present invention;
FIG. 11 is an exploded view of the vertical drive module of the present invention;
FIG. 12 is a block diagram of an operation control module according to the present invention;
FIG. 13 is a flow chart of the clamping process of the test fixture of the present invention;
FIG. 14 is a flowchart of the operation of the testing apparatus of the present invention.
In the figure:
1-a platen module; 2-a clamping module; 3-a carrier module; 4-a support module; 5-an action control module; 6-a vertical driving module; 7-a horizontal driving module; 8-a bottom plate; 9-bending type board cards; 11-a platen; 12-a hard press bar; 13-elastic pressing rod; 14-a stop post; 21-a flip module; 22-a board cassette; 23-an insulating pad; 24-a first signal patch panel; 25-switching flexible flat cable; 31-a carrier plate; 32-a carrier probe; 33-a rear first layer needle plate; 34-a rear second layer of needle plates; 35-a third layer of rear needle plate; 36-a rear fourth layer of needle plate; 37-rear fifth layer needle plate; 38-a second signal patch panel; 39-a signal processing board; 41-middle frame plate; 42-a support frame; 43-a second guide rail; 51-up and down speed throttle; 52-up and down control solenoid valve; 53-electric control board card; 54-an in-out control solenoid valve; 55-speed throttle valve; 56-mounting a base plate; 61-a platen connection plate; 62-a first guide rail; 63-a guide rail support frame; 64-a first cylinder; 211-a fixed frame; 212-pin block module; 213-spring hook; 214-a snap base; 215-locating pins; 216-flip stand; 221-an unlocking trigger; 222-torsion spring; 2121-pin block signal adapter plate; 2122-fifth needle block at front end; 2123-front fourth layer needle block; 2124-third layer of front needle block; 2125-needle block support plate; 2126-front second layer needle block; 2127-test probes; 2128-front first layer needle plate.
Detailed Description
In the description of the present invention, it is to be understood that the terms "above", "below", "upper", "lower", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings.
The conception, the specific structure and the technical effects of the present invention will be clearly and completely described in conjunction with the embodiments and the accompanying drawings to fully understand the objects, the schemes and the effects of the present invention. It should be noted that, in the case of no conflict, the features in the embodiments of the present application may be combined with each other.
It should also be noted that, in the description of the present invention, unless otherwise explicitly specified or limited, the terms "disposed," "mounted," "connected," and the like are to be construed broadly and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood according to specific situations by those skilled in the art.
The invention will be further explained with reference to the drawings.
The utility model provides a type of bending integrated circuit board functional test anchor clamps, as shown in figure 1, includes: a clamping module 2 and a carrier module 3; the clamping module 2 is placed on the upper surface (along the arrow direction in the figure) of the carrier module 3; a positioning structure is arranged between the clamping module 2 and the carrier plate module 3; as shown in the figure, 2 positioning columns are disposed on the upper surface of the carrier module 3, and corresponding positioning holes are disposed on the lower surface of the clamping module 2, and are matched to form a positioning structure, so that the clamping module 2 can be conveniently taken and placed, and a good conduction position of the probe can be ensured.
Further, taking a board card bent at one time as an example for structural description, specifically, as shown in the shape of the bent board card 9 in fig. 2b, the clamping module 2 needs to include two sets of flip modules 21, a board card seat 22, and a first signal adapter plate 24; the shape of the upper surface of the board clamping seat 22 is consistent with that of the bent board card 9, and is in a shape of a convex triangle as shown in fig. 2. The flip module 21 is internally provided with a pin module 212; the first signal adapting board 24 is electrically connected with the pin block module 212; one end of the flip module 21 is hinged with the board card seat 22;
in a working state, the bending board card 9 is placed on the upper surface of the board card seat 22, and the flip cover module 21 covers the upper surface of the bending board card 9 and is clamped with the board card seat 22 through a clamping structure; the probes of the pin module 212 are contacted with the test points of the bent board card 9.
Preferably, as shown in fig. 3, the flip module 21 further includes a fixing frame 211, a spring hook 213, and a flip bracket 216; the fixing frame 211 is in floating connection with the turning support 216; the fixing frame 211 is in floating connection with the needle block module 212; spring hooks 213 are arranged on both sides of the fixing frame 211, corresponding positions on the board card seat 22 are provided with slots, and the spring hooks 213 and the slots form a fastening structure; the lower portion of the flip bracket 216 is hinged to the card holder 22. Wherein, floating connection structure specifically is equal altitude screw and spring, through trompil in the corner to penetrate equal altitude screw and form clearance fit (keeping partial radial activity allowance), overlap like the spring in the offside, form floating structure, also prevent like this that machining error from leading to the structure to push down the in-process pressure partially, and then damage probe. The first signal adapter plate 24 is mounted on the lower surface of the plate clamping seat 22; an insulating pad plate 23 is arranged between the first signal adapter plate 24 and the board card seat 22; the first signal transfer board 24 is electrically connected to the pin block module 212 through the transfer flex cable 25. Further, the spring hook 213 may be integrated with the fixing frame 211, and the spring steel is selected as the main material, or as shown in fig. 3, the spring hook may be designed as a split structure, and assembled in a later stage, specifically, in order to add the hook base 214, the upper portion of the hook is fixed on both sides of the fixing frame 211 by the hook base 214, but a small amount of space is left, and the spring is additionally installed between the hook base 214 and the upper portion of the hook. Further, for the pin module 212, as shown in fig. 4, a multi-layer stacked structure is formed, which includes, from top to bottom: a pin block signal adapter plate 2121, a front fifth-layer pin block 2122, a front fourth-layer pin block 2123, a front third-layer pin block 2124, a pin block support plate 2125, a front second-layer pin block 2126, and a front first-layer pin plate 2128, and a test probe 2127 is mounted therein. The test probes 2127 directly contact with the test contacts of the bent board card 9, and transmit signals to the pin block signal adapter plate 2121, and then the pin block signal adapter plate 2121 transmits the signals to the first signal adapter plate 24 through the flexible flat cable 25.
Preferably, the lower surface of the pin block module 212 is provided with two positioning pins 215, and the upper surface of the bending type board card 9 is provided with corresponding positioning holes, so that the positioning accuracy can be conveniently maintained when the flip module 21 is fastened, and meanwhile, due to the adoption of a floating connection structure, the positioning pins 215 are not clamped in the positioning holes due to the turning fastening.
Preferably, as shown in fig. 5, the inner sides of the two card slots of the card seat 22 are provided with unlocking triggers 221; the unlocking trigger 221 and the board seat 22 form a rotary connection structure through a rotating shaft, and a torsion spring 222 is arranged between the unlocking trigger 221 and the board seat 22; when the flip module 21 and the board holder 22 are locked, one end of the unlocking trigger 221 is engaged with the inner side of the spring hook 213, and the other end is pressed to push the hook of the spring hook 213 out of the slot, thereby releasing the locked state of the flip module 21 and the board holder 22.
As shown in fig. 6, the carrier module 3 comprises, from top to bottom, a carrier 31, a needle plate, a second signal adapter plate 38, and a signal processing plate 39; a needle plate is connected below the carrier plate 31 in a floating manner, and a carrier plate probe 32 is arranged on the needle plate; a plurality of through holes are formed on the carrier plate 31 and correspond to the carrier plate probes 32 one by one; the pin plate is electrically connected with the second signal transfer plate 38, and the second signal transfer plate 38 is electrically connected with the signal processing plate 39; the floating connection structure is the same as the structure, and the floating connection structure adopts a mode that equal-height screws are combined with springs. Preferably, the needle plate is of a multilayer laminated structure and sequentially comprises from top to bottom: a rear first layer needle plate 33, a rear second layer needle plate 34, a rear third layer needle plate 35, a rear fourth layer needle plate 36 and a rear fifth layer needle plate 37.
In the operating state, the carrier probes 32 pass through the through holes to contact the first signal transfer board 24 and make electrical connection, so that the test signals can be conducted out through the second signal transfer board 38 and the signal processing board 39.
Working process (shown in combination with fig. 13):
s11, the original state of the clamping module is that the flip module is turned and pressed in place.
S12, pressing the triggers at two sides, the triggers will push open the spring hook in the buckling state, release the flip module, and make it turn freely.
And S13, after the flip cover module is opened, manually placing the tested bent board card on the board card seat according to the positioning hole of the tested bent board card.
S14, the flip cover module is turned over and covered, and a force perpendicular to the plane of the tested board card is applied to the pin module, so that the spring hook is buckled in the clamping groove, and the stable contact of the front-end test probe on the tested bent board card test point is realized.
On the other hand, the present invention provides a function testing apparatus based on the function testing jig in the above embodiment, which is shown in fig. 7 and 8, and mainly includes a pressing plate module 1, a supporting module 4, an action control module 5, a vertical driving module 6, a horizontal driving module 7, and a bottom plate 8;
the bottom plate 8 is of a flat plate structure, the two sides of the bottom plate are provided with vertical driving modules 6, and the movable end of each vertical driving module 6 is fixedly connected with the pressing plate module 1; preferably, as shown in fig. 11, the power unit of the vertical driving module 6 is a first air cylinder 64, and the movable end of the first air cylinder 64 is fixedly connected with the pressure plate module 1 through a pressure plate connecting plate 61; each vertical driving module 6 further comprises two groups of first guide rails 62 which are vertically arranged; the first rail 62 is fixed to the upper surface of the base plate by a rail support bracket 63. The first guide rail 62 is provided with a slide block which is fixedly connected with the pressure plate connecting plate 61.
The supporting module 4 is connected with the bottom plate 8 in a sliding way through a sliding mechanism; the fixed end of the horizontal driving module 7 is arranged on the bottom plate 8, and the movable end is fixedly connected with the supporting module 4; the clamping modules 2 and the carrier plate modules 3 are four groups in total and are distributed on the upper surface of the supporting module 4 in an array manner; preferably, as shown in fig. 10, the supporting module 4 includes a middle frame plate 41, a supporting frame 42; the middle frame plate 41 is provided with four mounting positions for mounting the carrier plate module 3, and two sides of the middle frame plate are vertically provided with support frames 42; the supporting frame 42 is in sliding connection with the bottom plate 8 through a second guide rail 43 and a sliding block; further, the second guide rail 43 may be optionally fixed to the support frame 42, and two sliding blocks are disposed on each guide rail, and the sliding blocks are fixed to the bottom plate 8. Horizontal drive module 7 is the second cylinder of two sets of levels settings, the stiff end and the bottom plate 8 fixed connection of cylinder, expansion end and support frame 42 fixed connection.
The pressing plate module 1 is positioned above the supporting module 4; preferably, as shown in fig. 9, the pressure plate module 1 includes a pressure plate 11, and a hard pressure rod 12, an elastic pressure rod 13, and a stop column 14 are disposed on a lower surface of the pressure plate 11; when the supporting module 4 is positioned under the pressure plate module 1, a rigid pressing rod 12 and an elastic pressing rod 13 are distributed right above the clamping module 2, and a stop column 14 is distributed at the side position; the length of the elastic pressing rod 13 is greater than that of the rigid pressing rod 12, and during the pressing process of the pressing plate 11, the elastic pressing rod 13 contacts the clamping module 2 first, then the rigid pressing rod 12 contacts the clamping module 2, and finally the stop column 14 contacts the carrier plate module 3.
The bottom plate 8 is also provided with an action control module 5; preferably, as shown in fig. 12, the motion control module 5 includes an up-down speed throttle 51, an up-down control solenoid 52, an electric control board 53, an in-out control solenoid 54, and an in-out speed throttle 55. The up-down speed throttle valve 51 and the up-down control electromagnetic valve 52 are connected with the cylinder in the vertical driving module 6; the inlet and outlet control electromagnetic valve 54 and the inlet and outlet speed throttle valve 55 are connected with the cylinder in the horizontal driving module 7; from this, each cylinder is connected through choke valve, solenoid valve to outside air supply, and automatically controlled integrated circuit board 53 electricity links and controls whole solenoid valves to this control action of vertical drive module 6 and horizontal drive module 7 realizes automated control. The operation control module 5 is mounted on the base plate 8 via a mounting pad 56.
Working process (shown in combination with fig. 14):
s21, the original state of the tester is the condition that the pressure plate module is lifted, the support module does not horizontally extend outwards, and the clamping module is not placed on the middle frame plate; the horizontal driving module pushes out the supporting module under the instruction of the action control module.
And S22, manually placing the four groups of clamping modules on the carrier plate module according to the positioning holes of the clamping modules.
S23, the horizontal driving module pulls back the supporting module under the instruction of the motion control module.
S24, the vertical driving module presses down the pressure plate module under the instruction of the action control module, the force is transmitted to the clamping module and the support plate module through the pressure rod and the stop column, the support plate descends, the support plate probe is exposed out of the upper surface of the support plate, the pressure plate continues to downwards compress the support plate probe to a reasonable stroke, and the stable contact between the support plate probe and the first signal transfer plate is realized.
Although the present invention has been described in detail with reference to examples, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted without departing from the spirit and scope of the invention as defined in the appended claims.
Claims (10)
1. The utility model provides a type of bending integrated circuit board functional test anchor clamps which characterized in that includes: a clamping module (2) and a carrier module (3); the clamping module (2) is placed on the upper surface of the carrier plate module (3); a positioning structure is arranged between the clamping module (2) and the carrier plate module (3);
the clamping module (2) comprises at least one group of flip module (21), a board clamping seat (22) and a first signal transfer board (24); the shape of the upper surface of the plate clamping seat (22) is consistent with that of the bent plate card (9); a needle block module (212) is arranged in the flip module (21); the first signal transfer board (24) is electrically connected with the pin block module (212); one end of the flip module (21) is hinged with the plate clamping seat (22);
in a working state, the bending type board card (9) is placed on the upper surface of the board card seat (22), and the flip cover module (21) covers the upper surface of the bending type board card (9) and is clamped with the board card seat (22) through a clamping structure; probes of the pin block module (212) are contacted with the test points of the bent board card (9);
the carrier plate module (3) sequentially comprises a carrier plate (31), a needle plate, a second signal transfer plate (38) and a signal processing plate (39) from top to bottom; the needle plate is connected below the carrier plate (31) in a floating manner, and a carrier plate probe (32) is arranged on the needle plate; the carrier plate (31) is provided with a plurality of through holes which are in one-to-one correspondence with the carrier plate probes (32); the pin plate is electrically connected with the second signal transfer plate (38), and the second signal transfer plate (38) is electrically connected with the signal processing plate (39);
in a working state, the carrier plate probe (32) penetrates through the through hole to be in contact with the first signal transfer plate (24) and forms electric connection.
2. The functional test fixture of claim 1, wherein the flip module (21) further comprises a fixing frame (211), a spring hook (213), and a flip bracket (216); the fixing frame (211) is in floating connection with the overturning bracket (216); the fixed frame (211) is in floating connection with the needle block module (212); at least one side of the fixed frame (211) is provided with the spring clamping hook (213), a clamping groove is arranged at a corresponding position on the plate clamping seat (22), and the spring clamping hook (213) and the clamping groove form the clamping structure; the lower part of the overturning bracket (216) is hinged with the plate clamping seat (22).
3. The functional test fixture of claim 2, wherein the lower surface of the pin block module (212) is provided with at least two positioning pins, and the upper surface of the bent type board card (9) is provided with corresponding positioning holes.
4. The functional test fixture of claim 2, wherein an unlocking trigger (221) is provided inside the card slot of the board card holder (22); the unlocking trigger (221) and the plate clamping seat (22) form a rotary connection structure through a rotating shaft, and a torsion spring (222) is arranged between the unlocking trigger (221) and the plate clamping seat (22);
under flip module (21) with board cassette (22) lock state, unblock trigger (221) one end overlap joint in the inboard of spring trip (213), press the other end, will the eave tile of spring trip (213) is released the draw-in groove removes flip module (21) with the lock state of board cassette (22).
5. The functional test fixture of claim 1, wherein the first signal patch panel (24) is mounted to a lower surface of the board socket (22); an insulating base plate (23) is arranged between the first signal transfer plate (24) and the plate clamping seat (22); the first signal transfer board (24) is electrically connected with the pin block module (212) through a transfer flexible flat cable (25).
6. The functional test device consisting of the functional test fixture according to any one of claims 1-5, further comprising a platen module (1), a support module (4), an action control module (5), a vertical drive module (6), a horizontal drive module (7), and a base plate (8);
the two sides of the bottom plate (8) are provided with the vertical driving modules (6), and the movable end of each vertical driving module (6) is fixedly connected with the pressing plate module (1);
the supporting module (4) is connected with the bottom plate (8) in a sliding manner through a sliding mechanism; the fixed end of the horizontal driving module (7) is arranged on the bottom plate (8), and the movable end of the horizontal driving module is fixedly connected with the supporting module (4); the clamping modules (2) and the carrier plate modules (3) are in multiple groups, and are distributed on the upper surface of the supporting module (4) in an array manner;
the pressing plate module (1) is positioned above the supporting module (4);
the bottom plate (8) is also provided with the action control module (5).
7. Functional test device according to claim 6, characterized in that the platen module (1) comprises a platen (11); the lower surface of the pressing plate (11) is provided with a hard pressing rod (12), an elastic pressing rod (13) and a stop column (14);
when the supporting module (4) is positioned under the pressing plate module (1), the rigid pressing rod (12) and the elastic pressing rod (13) are distributed over the clamping module (2), and the stop column (14) is distributed at the side position; the length of the elastic pressing rod (13) is larger than that of the rigid pressing rod (12), in the pressing process of the pressing plate module (1), the elastic pressing rod (13) contacts the clamping module (2) firstly, then the rigid pressing rod (12) contacts the clamping module (2), and finally the stop column (14) contacts the support plate module (3).
8. The function testing device according to claim 6, characterized in that the power unit of the vertical driving module (6) is a first air cylinder (64), and the movable end of the first air cylinder (64) is fixedly connected with the pressure plate module (1); the vertical driving module (6) further comprises at least one group of first guide rails (62) which are vertically arranged; the first guide rail (62) is provided with a sliding block, and the sliding block is fixedly connected with the pressing plate module (1).
9. Functional testing device according to claim 6, characterized in that the support module (4) comprises a centre frame plate (41), a support frame (42);
the supporting frames (42) are vertically arranged on two sides of the middle frame plate (41); the support frame (42) is in sliding connection with the bottom plate (8) through a second guide rail (43) and a sliding block; horizontal drive module (7) is the second cylinder that two sets of levels set up, the stiff end of cylinder with bottom plate (8) fixed connection, the expansion end with support frame (42) fixed connection.
10. The function testing device of claim 6, wherein the power units of the vertical driving module (6) and the horizontal driving module (7) are air cylinders; the action control module (5) comprises a throttle valve, an electromagnetic valve and an electric control board card (53); the electric control board card (53) is electrically connected with the electromagnetic valve; and an external air source is connected with the air cylinder through the throttle valve and the electromagnetic valve.
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CN114910776A (en) * | 2022-04-27 | 2022-08-16 | 珠海市精实测控技术有限公司 | Intensive testing arrangement of PCB board components and parts |
CN114994498B (en) * | 2022-05-17 | 2023-03-10 | 珠海精实测控技术股份有限公司 | Function testing device for bent PCB |
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Address after: 519125 area a, 29 Xinke 1st Road, Baijiao Science and Technology Industrial Park, Doumen District, Zhuhai City, Guangdong Province Patentee after: Zhuhai Jingshi Measurement and Control Technology Co.,Ltd. Address before: 519125 area a, 29 Xinke 1st Road, Baijiao Science and Technology Industrial Park, Doumen District, Zhuhai City, Guangdong Province Patentee before: P&R. MEASUREMENT Inc. |