CN111736061A - Pneumatic two-stage type detection equipment for high-precision circuit board - Google Patents
Pneumatic two-stage type detection equipment for high-precision circuit board Download PDFInfo
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- CN111736061A CN111736061A CN202010715042.9A CN202010715042A CN111736061A CN 111736061 A CN111736061 A CN 111736061A CN 202010715042 A CN202010715042 A CN 202010715042A CN 111736061 A CN111736061 A CN 111736061A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
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- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention relates to the technical field of circuit board detection, in particular to pneumatic two-section type detection equipment for a high-precision circuit board, which comprises a test board, a support plate, a hinged plate, a board loading module, a probe test module, a machine cover, a top plate, a plurality of two-section type cylinders and a press plate, wherein the board loading module comprises a test support plate, a compression spring is clamped between the test support plate and the top of the test board along the Z-axis direction, the probe test module comprises a first probe group and a second probe group, the length of each probe in the first probe group is the same, the length of each probe in the second probe group is the same and is greater than that of the first probe group, the output end of each two-section type cylinder is vertically downward and is in driving connection with the press plate; the invention does not need two detection devices for testing, and can complete the first-stage test and the second-stage test of the circuit board only by mounting the card once for the circuit board to be tested, so that the whole test is quicker and more convenient, and the test efficiency is higher.
Description
The technical field is as follows:
the invention relates to the technical field of circuit board detection, in particular to high-precision pneumatic two-section type circuit board detection equipment.
Background art:
the principle of the circuit board detection equipment is that a pad or a test point on a circuit board is connected through a metal probe, typical values such as a voltage value and a current value of the test circuit are obtained under the condition that the circuit board is electrified, so that whether the tested circuit is normally conducted or not is observed, devices such as a resistor, a capacitor, an inductor, a crystal oscillator and the like can be quantitatively measured, functional tests are performed on a diode, a triode, an optical coupler, a transformer, a relay, an operational amplifier, a power supply module and the like, and functional tests are performed on small-scale integrated circuits such as all 74-series, Memory type, common driving type, switching type and other ICs. The circuit board detection equipment directly tests the electrical performance of the on-line device to find the defects of the manufacturing process and the defects of the device. The component class may check for out-of-tolerance, failure or corruption of component values, program errors in the Memory class, etc. Faults such as short circuit of soldering tin, wrong insertion, reverse insertion, neglected mounting, tilting and rosin joint of pins, short circuit and disconnection of a PCB (printed circuit board) and the like can be found in the process. The tested fault is directly positioned on a specific element, a device pin and a network point, and the fault positioning is accurate.
When two-stage detection is carried out on some circuit boards, most methods in the industry at present are to put the circuit board to be tested into first detection equipment for first-stage testing, take the circuit board to be tested out of the first detection equipment after the first-stage testing is finished, and then put the circuit board into second detection equipment for second-stage testing, so that the whole process is troublesome, and the testing efficiency is low.
The invention content is as follows:
the invention aims to provide high-precision pneumatic two-stage detection equipment for a circuit board, aiming at the defects in the prior art, which can quickly and conveniently carry out two-stage detection on the circuit board and can improve the test efficiency of the circuit board.
In order to achieve the purpose, the invention adopts the technical scheme that: a high-precision pneumatic two-stage detection device for circuit boards comprises a test board, support plates respectively arranged on two sides of the top of the test board, a hinged plate arranged at the rear end of the top of the test board, a board loading module arranged at the top of the test board and used for loading circuit boards to be tested, a probe test module arranged at the top of the test board and positioned below the board loading module and used for connecting the circuit boards to be tested and leading out test signals, a cover covering the top of the test board, a top plate arranged in the cover, a plurality of two-stage cylinders arranged on the top plate and a press plate used for downwards pressing the circuit boards to be tested, wherein the board loading module comprises a test support plate used for bearing the circuit boards to be tested, a compression spring is clamped between the test support plate and the top of the test board along the Z-axis direction, the probe test module comprises a first probe group, each probe length in the second probe group is the same and is greater than the probe length of first probe group, and the equal vertical downward and drive of output of each two-stage type cylinder connects the clamp plate, and the rear end and the articulated board of cover are articulated.
The test carrier plate is convexly provided with a plurality of positioning clamp columns for positioning and clamping the circuit board to be tested, each positioning clamp column is respectively abutted against the circuit board to be tested along the X-axis direction or the Y-axis direction, and the top of the test board is convexly provided with a plurality of test positioning guide columns.
The scheme is further improved in that a plurality of pressure columns are convexly arranged at the bottom of the pressure plate, and test positioning sleeves which are the same as the test positioning guide columns in number and correspond to the test positioning guide columns in position are arranged at the bottom of the pressure plate; during testing, the testing positioning guide pillar is inserted into the testing positioning sleeve.
The test board is provided with at least two support board positioning guide pillars, the test support board is provided with support board positioning holes which are the same as the support board positioning guide pillars in quantity and correspond to the support board positioning guide pillars in position, and the test support board is sleeved on the support board positioning guide pillars through the support board positioning holes.
The further improvement to above-mentioned scheme does, the both sides and the front end of cover are equipped with a plurality of buckle public end subassemblies, and the testboard top is equipped with the female end of buckle in the corresponding position department of each buckle public end subassembly, and the public end subassembly of buckle is including setting up buckle seat on the cover, articulating the public end of buckle on the buckle seat.
The further improvement to the above scheme is that the buckle male end assembly further comprises a linkage rod, and the buckle male ends in the buckle male end assemblies are connected through the linkage rod.
The further improvement of the scheme is that the buckle male end is provided with a lock catch groove along the X-axis direction, the top of the test board is provided with a lock catch assembly, the lock catch assembly comprises a lock catch seat arranged on the top of the test board, a lock catch fixing piece arranged on the lock catch seat and a lock catch sliding piece, and the lock catch end of the lock catch sliding piece penetrates through the lock catch fixing piece along the X-axis direction and is inserted into the lock catch groove of the buckle male end.
The further improvement of the scheme is that the top plate is provided with a plurality of X-axis reinforcing rods used for preventing the top plate from deforming in parallel along the X-axis direction, and the top of each X-axis reinforcing rod is provided with a plurality of Y-axis reinforcing rods used for preventing the top plate from deforming in parallel along the Y-axis direction.
The further improvement to above-mentioned scheme does, the backup pad of testboard top both sides is equipped with the bracing piece respectively with between the corresponding one side of cover, and the one end of bracing piece is connected with one side of backup pad, and the other end of bracing piece is connected with one side of cover.
The further improvement to the above scheme is that the top cover of the machine cover is provided with a test cover plate which is made of transparent materials.
The invention has the beneficial effects that: the invention provides a high-precision pneumatic two-stage detection device for a circuit board, which comprises a test board, support plates respectively arranged at two sides of the top of the test board, a hinged plate arranged at the rear end of the top of the test board, a board loading module arranged at the top of the test board and used for loading and clamping the circuit board to be tested, a probe testing module arranged at the top of the test board and positioned below the board loading module and used for connecting the circuit board to be tested and leading out a testing signal, a machine cover covering the top of the test board, a top plate arranged in the machine cover, a plurality of two-stage air cylinders arranged on the top plate and a pressing plate used for downwards pressing and pressing the circuit board to be tested, wherein the board loading module comprises a testing support plate used for bearing the circuit board to be tested, a compression spring is clamped between the testing support plate and the, the length of each probe in the first probe group is the same, the length of each probe in the second probe group is the same and is greater than that of the first probe group, the output end of each two-section type cylinder vertically faces downwards and is in driving connection with the pressing plate, and the rear end of the cover is hinged with the hinge plate; the probe testing module comprises a first probe group and a second probe group, wherein the length of each probe in the first probe group is the same, the length of each probe in the second probe group is the same and is greater than that of the probe in the first probe group, a circuit board to be tested is pressed downwards by a two-section type cylinder driving pressing plate, the circuit board to be tested is connected with each probe in the first probe group and each probe in the second probe group and is subjected to first-stage testing, after the first-stage testing is finished, the two-section type cylinder driving pressing plate is lifted upwards for a certain distance, a testing support plate is lifted upwards for a certain distance along with the pressing plate under the action of the elastic force of a compression spring, at the moment, each probe in the first probe group is disconnected with the circuit board to be tested, each probe in the second probe group is connected with the circuit board to be tested and is subjected to second-stage testing without two detection devices, the first-stage test and the second-stage test of the circuit board can be completed only by mounting the card once to be tested, the whole test is quicker and more convenient, and the test efficiency is higher.
Description of the drawings:
FIG. 1 is a schematic structural diagram of the present invention.
FIG. 2 is a schematic view of another embodiment of the present invention.
Fig. 3 is a schematic structural view of the opening cover of the present invention.
FIG. 4 is a schematic structural diagram of the present invention with the test cover removed.
Fig. 5 is a schematic structural diagram of the board loading module.
Fig. 6 is an enlarged view of a portion a in fig. 3.
Fig. 7 is an enlarged view at B in fig. 5.
Description of reference numerals: the test board comprises a test board 1, a support plate 2, a hinged plate 3, a board loading module 4, a test carrier 41, a carrier positioning hole 411, a compression spring 42, a positioning clamp column 43, a test positioning guide column 44, a carrier handle 45, a carrier positioning guide column 46, a probe test module 47, a first probe group 471, a second probe group 472, a cover 5, a top plate 6, a two-stage cylinder 7, a pressure plate 8, a pressure column 9, a test positioning sleeve 10, a buckle seat 11, a buckle male end 12, a buckle groove 121, an interlocking rod 13, a buckle female end 14, a buckle component 15, a buckle seat 151, a buckle fixing piece 152, a buckle sliding piece 153, an X-axis reinforcing rod 16, a Y-axis reinforcing rod 17, a support rod 18 and a test cover plate 19.
The specific implementation mode is as follows:
the invention will be further described with reference to the accompanying drawings, as shown in fig. 1-7, the invention includes a testing platform 1, support plates 2 respectively disposed at two sides of the top of the testing platform 1, a hinge plate 3 disposed at the rear end of the top of the testing platform 1, a board loading module 4 disposed at the top of the testing platform 1 for loading a circuit board to be tested, a probe testing module 47 disposed at the top of the testing platform 1 and below the board loading module 4 for connecting the circuit board to be tested and guiding out a testing signal, a cover 5 covering the top of the testing platform 1, a top plate 6 disposed in the cover 5, six two-stage air cylinders 7 uniformly disposed on the top plate 6, a pressing plate 8 for pressing the circuit board to be tested downward, the board loading module 4 includes a testing carrier plate 41 for carrying the circuit board to be tested, a compression spring 42 is interposed between the testing carrier plate 41 and the, the probe testing module 47 comprises a first probe group 471 and a second probe group 472 which are convexly arranged at the top of the testing table 1, the length of each probe in the first probe group 471 is the same, the length of each probe in the second probe group 472 is the same and is greater than that of the first probe group 471, the output end of each two-section type cylinder 7 vertically faces downwards and is in driving connection with the pressing plate 8, and the rear end of the cover 5 is hinged with the hinged plate 3; the probe testing module 47 of the present invention includes a first probe group 471 and a second probe group 472, each probe in the first probe group 471 has the same length, each probe in the second probe group 472 has the same length and is longer than the probe in the first probe group 471, the two-stage cylinder 7 drives the press plate 8 to press the circuit board to be tested downward, the circuit board to be tested is connected with each probe in the first probe group 471 and each probe in the second probe group 472 and performs a first-stage test, after the first-stage test is completed, the two-stage cylinder 7 drives the press plate 8 to lift upward for a certain distance, the testing support plate 41 rises along with the press plate 8 and lifts upward for a certain distance under the elastic force of the compression spring 42, at this time, each probe in the first probe group 471 is disconnected with the circuit board to be tested, each probe in the second probe group 472 is kept connected with the circuit board to be tested and performs a second-stage test, need not two check out test set and test, only need dress card once await measuring the circuit board and can accomplish the first stage test and the second stage test of circuit board, whole test is quick more, convenient, and efficiency of software testing is higher.
The test carrier 41 is convexly provided with eight positioning clamp columns 43 for positioning and clamping the circuit board to be tested, each positioning clamp column 43 is respectively abutted against the circuit board to be tested along the X-axis direction or the Y-axis direction, and the top of the test board 1 is convexly provided with four test positioning guide columns 44.
The bottom of the pressure plate 8 is convexly provided with a plurality of pressure columns 9, and the bottom of the pressure plate 8 is provided with test positioning sleeves 10 which have the same number and the corresponding positions with the test positioning guide columns 44; during testing, the test positioning guide post 44 is inserted into the test positioning sleeve 10, so that the positioning between the pressing plate 8 and the circuit board to be tested can be stably realized with high precision, the normal operation of circuit board testing can be ensured, and the testing efficiency of the circuit board can be improved.
The two sides of the top of the test carrier 41 are respectively provided with a carrier handle 45, the top of the test platform 1 is convexly provided with two carrier positioning guide pillars 46, the test carrier 41 is provided with carrier positioning holes 411 which have the same number and corresponding positions as the carrier positioning guide pillars 46, and the test carrier 41 is sleeved on the carrier positioning guide pillars 46 through the carrier positioning holes 411.
The both sides and the front end of cover 5 are equipped with the public end 12 subassemblies of a plurality of buckles, 1 top of testboard is equipped with the female end 14 of buckle in the corresponding position department of the public end 12 subassemblies of each buckle, the public end 12 subassemblies of buckle are including setting up buckle seat 11 on cover 5, articulate the public end 12 of buckle on buckle seat 11, the public end 12 subassemblies of buckle still include trace 13, the public end 12 of buckle in the public end 12 subassemblies of each buckle all is connected through trace 13, can be fast, open or lock cover 5 steadily.
The hasp groove 121 has been seted up along the X axle direction to buckle public end 12, testboard 1 top is equipped with hasp subassembly 15, hasp subassembly 15 is including setting up hasp seat 151 on testboard 1 top, set up hasp mounting 152 on hasp seat 151, hasp slider 153, the hasp end of hasp slider 153 passes hasp mounting 152 and inserts and locate the hasp groove 121 of buckle public end 12 along the X axle direction, can prevent to produce the maloperation in the test process, can guarantee the normal clear of test, thereby can guarantee the efficiency of test.
The support rods 18 are arranged between the support plates 2 on two sides of the top of the test board 1 and one corresponding side of the cover 5 respectively, one ends of the support rods 18 are connected with one side of the support plates 2, the other ends of the support rods 18 are connected with one side of the cover 5, the cover 5 can be upwards overturned by a certain angle through the support rods 18 and is kept, the circuit board is convenient to assemble and take, and the practicability is high.
The top lid of cover 5 is equipped with test apron 19, and test apron 19 is made by transparent material, can the inside behavior of real-time observation cover 5 through test apron 19, is convenient for find the problem, and the practicality is strong.
The working principle is as follows:
opening the cover 5, placing the circuit board to be tested on the test carrier 41, and respectively clamping four corners of the circuit board to be tested in the X-axis direction and the Y-axis direction by eight positioning clamping columns 43 on the test carrier 41; the cover 5 is tightly covered downwards, each buckle male end 12 is buckled on the corresponding buckle female end 14, and the locking end of the locking sliding piece 153 passes through the locking fixing piece 152 along the X-axis direction and is inserted into the locking groove 121 of the buckle male end 12; the two-section type air cylinder 7 drives the pressing plate 8 to move downwards, each pressing column 9 on the pressing plate 8 presses the circuit board to be tested downwards, the compression spring 42 is compressed between the circuit board to be tested and the top of the test bench 1, and the circuit board to be tested is connected with each probe in the first probe group 471 and each probe in the second probe group 472 and is subjected to first-stage test; after the first-stage test is completed, the two-stage air cylinder 7 drives the press plate 8 to lift upwards by 5mm, the test carrier plate 41 rises along with the press plate 8 and lifts upwards under the action of the elastic force of the compression spring 42, each probe in the first probe group 471 is disconnected with the circuit board to be tested, each probe in the second probe group 472 is kept connected with the circuit board to be tested, and the second-stage test is performed; after the second stage of test is finished, the two-section type air cylinder 7 drives the pressing plate 8 to lift back upwards to the initial position, and the circuit board to be tested rises along with the pressing plate 8 and lifts back upwards to the initial position under the action of the elastic force of the compression spring 42; pulling out the locking end of the locking slider 153 from the locking groove 121 of the male buckle end 12, snapping the male buckle end 12 out of the female buckle end 14, opening the cover 5, and taking out the circuit board to complete the whole testing process of the circuit board; the invention does not need two detection devices for testing, and can complete the first-stage test and the second-stage test of the circuit board only by mounting the card once for the circuit board to be tested, so that the whole test is quicker and more convenient, and the test efficiency is higher.
It is understood that the above description is only a preferred embodiment of the present invention, and all equivalent changes or modifications of the structure, features and principles described in the present invention are included in the scope of the present invention.
Claims (10)
1. The utility model provides a pneumatic two-stage type check out test set of high accuracy circuit board which characterized in that: comprises a test bench (1), support plates (2) respectively arranged at two sides of the top of the test bench (1), a hinged plate (3) arranged at the rear end of the top of the test bench (1), a board loading module (4) arranged at the top of the test bench (1) and used for loading and clamping a circuit board to be tested, a probe test module (47) arranged at the top of the test bench (1) and positioned below the board loading module (4) and used for connecting the circuit board to be tested and leading out a test signal, a cover (5) covering the top of the test bench (1), a top plate (6) arranged in the cover (5), a plurality of two-section type air cylinders (7) arranged on the top plate (6), and a press plate (8) used for downwards pressing the circuit board to be tested, wherein the board loading module (4) comprises a test support plate (41) used for bearing the circuit board to be tested, and a compression spring (, the probe test module (47) comprises a first probe group (471) and a second probe group (472) which are convexly arranged at the top of the test board (1), the length of each probe in the first probe group (471) is the same, the length of each probe in the second probe group (472) is the same and is greater than that of the probe in the first probe group (471), the output end of each two-section cylinder (7) is vertically downward and drives the connecting pressing plate (8), and the rear end of the cover (5) is hinged to the hinged plate (3).
2. The high-precision pneumatic two-stage circuit board detection device of claim 1, wherein: the test carrier plate (41) is convexly provided with a plurality of positioning clamp columns (43) used for positioning and clamping the circuit board to be tested, each positioning clamp column (43) is respectively abutted against the circuit board to be tested along the X-axis direction or the Y-axis direction, and the top of the test bench (1) is convexly provided with a plurality of test positioning guide columns (44).
3. The high-precision pneumatic two-stage circuit board detection device as claimed in claim 2, wherein: the bottom of the pressure plate (8) is convexly provided with a plurality of pressure columns (9), and the bottom of the pressure plate (8) is provided with test positioning sleeves (10) which have the same number and the corresponding positions with the test positioning guide columns (44); during testing, the testing positioning guide post (44) is inserted into the testing positioning sleeve (10).
4. The high-precision pneumatic two-stage circuit board detection device of claim 1, wherein: the test device is characterized in that two sides of the top of the test carrier plate (41) are respectively provided with a carrier plate handle (45), the top of the test platform (1) is convexly provided with at least two carrier plate positioning guide pillars (46), the test carrier plate (41) is provided with carrier plate positioning holes (411) which are the same in number and correspond to the carrier plate positioning guide pillars (46), and the test carrier plate (41) is sleeved on the carrier plate positioning guide pillars (46) through the carrier plate positioning holes (411).
5. The high-precision pneumatic two-stage circuit board detection device of claim 1, wherein: the utility model discloses a multifunctional testing machine, including cover (5), the both sides of cover (5) and front end are equipped with a plurality of buckle public end (12) subassemblies, and testboard (1) top is equipped with buckle female end (14) in the corresponding position department of each buckle public end (12) subassembly, and buckle public end (12) subassembly is including setting up buckle seat (11) on cover (5), hinging in buckle public end (12) on buckle seat (11).
6. The high-precision pneumatic two-stage circuit board detection device of claim 5, wherein: the buckle male end (12) component further comprises a linkage rod (13), and the buckle male ends (12) in the buckle male end (12) components are connected through the linkage rod (13).
7. The high-precision pneumatic two-stage circuit board detection device of claim 5, wherein: the buckle male end (12) is provided with a lock catch groove (121) along the X-axis direction, the top of the test platform (1) is provided with a lock catch component (15), the lock catch component (15) comprises a lock catch seat (151) arranged on the top of the test platform (1), a lock catch fixing piece (152) arranged on the lock catch seat (151) and a lock catch sliding piece (153), and the lock catch end of the lock catch sliding piece (153) penetrates through the lock catch fixing piece (152) along the X-axis direction and is inserted into the lock catch groove (121) of the buckle male end (12).
8. The high-precision pneumatic two-stage circuit board detection device of claim 1, wherein: the roof (6) are provided with a plurality of X axle stiffeners (16) that are used for preventing roof (6) from deforming side by side along the X axle direction, and the top of each X axle stiffener (16) is provided with a plurality of Y axle stiffeners (17) that are used for preventing roof (6) from deforming side by side along the Y axle direction.
9. The high-precision pneumatic two-stage circuit board detection device of claim 1, wherein: the test bench is characterized in that supporting rods (18) are arranged between the supporting plates (2) on the two sides of the top of the test bench (1) and the corresponding side of the machine cover (5) respectively, one ends of the supporting rods (18) are connected with one side of the supporting plates (2), and the other ends of the supporting rods (18) are connected with one side of the machine cover (5).
10. The high-precision pneumatic two-stage circuit board detection device of claim 1, wherein: the top cover of cover (5) is equipped with test apron (19), and test apron (19) are made by transparent material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010715042.9A CN111736061A (en) | 2020-07-23 | 2020-07-23 | Pneumatic two-stage type detection equipment for high-precision circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010715042.9A CN111736061A (en) | 2020-07-23 | 2020-07-23 | Pneumatic two-stage type detection equipment for high-precision circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN111736061A true CN111736061A (en) | 2020-10-02 |
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ID=72657362
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010715042.9A Pending CN111736061A (en) | 2020-07-23 | 2020-07-23 | Pneumatic two-stage type detection equipment for high-precision circuit board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111736061A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114217102B (en) * | 2021-09-29 | 2022-08-09 | 杭州长川科技股份有限公司 | Module testing device |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102778590A (en) * | 2012-07-20 | 2012-11-14 | 昆山迈致治具科技有限公司 | Fixture suitable for circuit board testing table |
| CN105403826A (en) * | 2016-01-04 | 2016-03-16 | 京东方科技集团股份有限公司 | Test tool |
| CN205120747U (en) * | 2015-11-04 | 2016-03-30 | 深圳市精泰达科技有限公司 | Novel pneumatic two -period form test equipment |
| CN109425813A (en) * | 2017-08-18 | 2019-03-05 | 中华精测科技股份有限公司 | Detection device |
-
2020
- 2020-07-23 CN CN202010715042.9A patent/CN111736061A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102778590A (en) * | 2012-07-20 | 2012-11-14 | 昆山迈致治具科技有限公司 | Fixture suitable for circuit board testing table |
| CN205120747U (en) * | 2015-11-04 | 2016-03-30 | 深圳市精泰达科技有限公司 | Novel pneumatic two -period form test equipment |
| CN105403826A (en) * | 2016-01-04 | 2016-03-16 | 京东方科技集团股份有限公司 | Test tool |
| CN109425813A (en) * | 2017-08-18 | 2019-03-05 | 中华精测科技股份有限公司 | Detection device |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114217102B (en) * | 2021-09-29 | 2022-08-09 | 杭州长川科技股份有限公司 | Module testing device |
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