CN110133880B - Crystal ball axial measuring method - Google Patents
Crystal ball axial measuring method Download PDFInfo
- Publication number
- CN110133880B CN110133880B CN201910360531.4A CN201910360531A CN110133880B CN 110133880 B CN110133880 B CN 110133880B CN 201910360531 A CN201910360531 A CN 201910360531A CN 110133880 B CN110133880 B CN 110133880B
- Authority
- CN
- China
- Prior art keywords
- crystal ball
- polaroid
- station
- backlight source
- polarizer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Sewing Machines And Sewing (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention discloses an axial measuring method of a crystal ball, which comprises the following steps: s1: the method comprises the following steps of arranging a backlight source station, a crystal ball station and a polaroid station, wherein the backlight source station is provided with a backlight source, the crystal ball station is provided with a crystal ball, and the polaroid station is provided with a polaroid; s2: the polaroid station is arranged above the backlight source station, and the polaroid is positioned on the upper surface of the backlight source; s3: arranging the crystal ball station above the polarizer station, wherein the crystal ball is positioned on the upper surface of the polarizer; s4: observing the inside of the crystal ball, wherein the inside of the crystal ball is provided with an aperture, and an arc line is arranged in the aperture; s5: displaying the direction through an arc line in the aperture, and judging the axial direction of the polaroid, wherein the direction pointed by the arc line is the axial direction of the polaroid; the crystal ball axial measurement method has the advantages of simple auxiliary equipment for detection, convenience and rapidness in operation, high detection efficiency, intuitive and obvious effect and capability of ensuring the correct direction of the polaroid when the polaroid is attached to the liquid crystal display.
Description
Field of the method
The invention relates to the technical field of axial measurement of polaroids, in particular to an axial measurement method of a crystal ball.
Background
The basic structure of the polaroid comprises a middle PVA and two layers of TAC, in the field of manufacturing of liquid crystal displays, the polaroid is a basic part of liquid crystal display, when the polaroid is attached to the liquid crystal display, the front side and the back side of the polaroid are difficult to judge through naked eyes, material waste is easily caused in the engineering process, and the working efficiency is low.
Currently, in the axial detection aspect of the polarizer, a simple, convenient and efficient detection method is needed.
Disclosure of Invention
In order to overcome the above disadvantages, the present invention provides a method for measuring an axial direction of a polarizer, which can simply and efficiently measure an axial direction of a polarizer.
In order to achieve the above purposes, the invention adopts the technical scheme that: the crystal ball axial measurement method comprises the following steps:
step S1: the method comprises the following steps of arranging a backlight source station, a crystal ball station and a polaroid station, wherein the backlight source station is provided with a backlight source, the crystal ball station is provided with a crystal ball, and the polaroid station is provided with a polaroid;
step S2: the polaroid station is arranged above the backlight source station, and the polaroid is positioned on the upper surface of the backlight source;
step S3: arranging the crystal ball station above the polarizer station, wherein the crystal ball is positioned on the upper surface of the polarizer;
step S4: observing the inside of the crystal ball, wherein an aperture is arranged in the crystal ball, and an arc line is arranged in the aperture;
step S5: displaying the direction through an arc line in the aperture, and judging the axial direction of the polaroid, wherein the direction pointed by the arc line is the axial direction of the polaroid;
when the arc line points upwards, the polarizer is axially upwards; when the arc line points downwards, the polaroid is axially below; when the arc is directed to the left, the polarizer is oriented to the left, and when the arc is directed to the right, the polarizer is oriented to the right.
Further, the diameter of the crystal ball ranges from 3 cm to 8 cm, and the optimal value is 5 cm.
Further, the backlight source is a high-brightness LED lamp.
Furthermore, the backlight source, the polarizer and the crystal ball are sequentially arranged on the same straight line.
Further, the distance between the backlight sources ranges from 1 mm to 8 mm, and the optimal distance is 5 mm.
Further, the distance between the crystal ball and the polarizer is not more than 3 mm, and the optimal distance is zero.
The invention has the following advantages and positive effects:
the crystal ball axial measurement method has the advantages of simple auxiliary equipment for detection, convenience and quickness in operation, high detection efficiency, intuitive and obvious effect, and ensures that the direction of the polaroid is correct when the polaroid is attached to the liquid crystal display, so that the production and processing working efficiency is improved.
Drawings
FIG. 1 is a schematic view of the method for measuring the axial direction of a crystal ball according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1, the invention provides an axial measurement method of a crystal ball, which is characterized by comprising the following steps:
step S1: the method comprises the following steps of arranging a backlight source station, a crystal ball station and a polaroid station, wherein the backlight source station is provided with a backlight source, the crystal ball station is provided with a crystal ball, and the polaroid station is provided with a polaroid; step S2: the polaroid station is arranged above the backlight source station, and the polaroid is positioned on the upper surface of the backlight source; step S3: arranging the crystal ball station above the polarizer station, wherein the crystal ball is positioned on the upper surface of the polarizer; step S4: observing the inside of the crystal ball, wherein an aperture is arranged in the crystal ball, and an arc line is arranged in the aperture; step S5: displaying the direction through an arc line in the aperture, and judging the axial direction of the polaroid, wherein the direction pointed by the arc line is the axial direction of the polaroid; when the arc line points upwards, the polarizer is axially upwards; when the arc line points downwards, the polaroid is axially below; when the arc is directed to the left, the polarizer is oriented to the left, and when the arc is directed to the right, the polarizer is oriented to the right.
Wherein the diameter range of the crystal ball is 3 cm to 8 cm, and the optimal value is 5 cm; the backlight source is a high-brightness LED lamp; the backlight source, the polaroid and the crystal ball are sequentially arranged on the same straight line; the distance between the polarizer and the backlight source ranges from 1 mm to 8 mm, and the optimal distance is 5 mm; the distance between the crystal ball and the polaroid is not more than 3 mm, and the optimal distance is zero.
The crystal ball axial measurement method comprises the steps that a backlight source station, a polarizer plate station and a crystal ball station are arranged, the distance between a polarizer plate and the backlight source is not more than 8 mm, the optimal distance is 5 mm, the distance between the crystal ball and the polarizer plate station is not more than 3 mm, the optimal distance is zero, the diameter range of the crystal ball is 3 cm-8 cm, the optimal diameter is 5 cm, the backlight source station, the polarizer plate station and the crystal ball station are positioned on the same straight line, when a working position is set, the interior of the crystal ball is observed, an aperture is arranged in the crystal ball, an arc line is arranged in the aperture, the direction is displayed through the arc line in the aperture, the axial direction of the polarizer plate is judged, and the direction indicated by the arc line is the axial direction of the polarizer plate; when the arc line points upwards, the polarizer is axially upwards; when the arc line points downwards, the polaroid is axially below; when the arc is directed to the left, the polarizer is oriented to the left, and when the arc is directed to the right, the polarizer is oriented to the right.
In conclusion, the crystal ball axial direction measuring method provided by the invention has the advantages of simple auxiliary equipment for detection, high detection efficiency, obvious effect and intuition.
The foregoing is illustrative of the present invention and is not to be construed as limiting thereof in any way, and any simple modifications, equivalent alterations and modifications of the above embodiments, which are obvious from the practice of the method of the present invention, are intended to be included within the scope of the method of the present invention.
Claims (4)
1. The crystal ball axial measurement method is characterized by comprising the following steps:
step S1: the method comprises the following steps of arranging a backlight source station, a crystal ball station and a polaroid station, wherein the backlight source station is provided with a backlight source, the crystal ball station is provided with a crystal ball, and the polaroid station is provided with a polaroid;
wherein the diameter range of the crystal ball is 3 cm to 8 cm;
the backlight source is a high-brightness LED lamp;
the backlight source, the polarizer and the crystal ball are sequentially positioned on the same straight line;
step S2: the polaroid station is arranged above the backlight source station, and the polaroid is positioned above the backlight source;
wherein the distance between the polarizer and the backlight source ranges from 1 mm to 8 mm;
step S3: arranging the crystal ball station above the polaroid station, wherein the crystal ball is positioned above the polaroid;
wherein, the distance between the crystal ball and the polarizer is not more than 3 mm;
step S4: observing the inside of the crystal ball, wherein an aperture is arranged in the crystal ball, and an arc line is arranged in the aperture;
step S5: displaying the direction through an arc line in the aperture, and judging the axial direction of the polaroid, wherein the direction pointed by the arc line is the axial direction of the polaroid;
when the arc line points upwards, the polarizer is axially upwards; when the arc line points downwards, the polaroid is axially below; when the arc is directed to the left, the polarizer is oriented to the left, and when the arc is directed to the right, the polarizer is oriented to the right.
2. The crystal ball axial measurement method according to claim 1, characterized in that: in step S1, the optimal diameter range of the crystal ball is 5 cm.
3. The crystal ball axial measurement method according to claim 1, characterized in that: in step S2, the optimal distance in the distance range between the polarizer and the backlight source is 5 mm.
4. The crystal ball axial measurement method according to claim 1, characterized in that: in step S3, the optimal distance between the crystal ball and the polarizer is zero.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910360531.4A CN110133880B (en) | 2019-04-30 | 2019-04-30 | Crystal ball axial measuring method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910360531.4A CN110133880B (en) | 2019-04-30 | 2019-04-30 | Crystal ball axial measuring method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110133880A CN110133880A (en) | 2019-08-16 |
| CN110133880B true CN110133880B (en) | 2022-03-18 |
Family
ID=67575954
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910360531.4A Active CN110133880B (en) | 2019-04-30 | 2019-04-30 | Crystal ball axial measuring method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110133880B (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103698015A (en) * | 2014-01-06 | 2014-04-02 | 清华大学深圳研究生院 | Polarization detector and polarization detecting method |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101915661A (en) * | 2010-09-03 | 2010-12-15 | 无锡市奥达光电子有限责任公司 | Method and device for detecting optical axis angle of polarization property component |
| CN201867273U (en) * | 2010-11-17 | 2011-06-15 | 江苏淘镜有限公司 | Checking box for checking polarized lenses |
| CN203705145U (en) * | 2013-12-02 | 2014-07-09 | 鞍山和光科技有限公司 | Novel polarization detector |
| KR20160005445A (en) * | 2014-07-07 | 2016-01-15 | 동우 화인켐 주식회사 | Apparatus of inspecting defect of polarizing plate and method of inspecting the same |
| CN105387937A (en) * | 2015-11-05 | 2016-03-09 | 黑龙江大学 | Detection method and apparatus of elliptically polarized light |
| CN108572143B (en) * | 2017-03-13 | 2020-12-08 | 南宁师范大学 | Full polarization measuring microscope |
-
2019
- 2019-04-30 CN CN201910360531.4A patent/CN110133880B/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103698015A (en) * | 2014-01-06 | 2014-04-02 | 清华大学深圳研究生院 | Polarization detector and polarization detecting method |
Non-Patent Citations (1)
| Title |
|---|
| 偏振光通过透镜的偏振状态分析;王礼娟，黄佐华，陈凤超;《光学与光电技术》;20071231;第5卷(第6期);全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110133880A (en) | 2019-08-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105372857B (en) | Glass substrate, liquid crystal display panel and liquid crystal display device | |
| WO2008023270A3 (en) | Multiple screen size render-engine | |
| JP2016529562A (en) | Liquid crystal display, liquid crystal display test method, and electronic apparatus | |
| CN208596208U (en) | A kind of liquid crystal display simple detection device | |
| CN110133880B (en) | Crystal ball axial measuring method | |
| CN104019752B (en) | The thickness evenness detection method of display screen, Apparatus and system | |
| KR101668039B1 (en) | Method for Light Test of Display Panel | |
| CN204087751U (en) | A kind of LCDs electric detection means | |
| CN201476805U (en) | Colorful high-brightness liquid crystal display digital instrument | |
| CN103693409A (en) | Device for detecting positive and negative surfaces of clamps for aligning and combining of PDP (plasma display panel) screen | |
| CN204808830U (en) | Luminance detection device | |
| CN203551795U (en) | Leakage detection device for nuts | |
| CN202548254U (en) | LCD (liquid crystal display) screen detecting device capable of displaying detection graphics | |
| CN205860982U (en) | Hand-held gap Quick measurer | |
| CN212989811U (en) | Monochrome liquid crystal display device capable of visually detecting copper pin | |
| CN203083938U (en) | Pill selection lamp inspection bench for soft capsule workshop | |
| CN202101624U (en) | Tool for defect checking of photovoltaic component | |
| CN110470217A (en) | The detection method of battery core ending state | |
| CN210154517U (en) | Steel machined part detection equipment | |
| CN103743363A (en) | Holder window measuring apparatus | |
| CN204556226U (en) | Lower light source ignition tool operator's console | |
| CN202195924U (en) | Light type adjusting machine | |
| CN204405429U (en) | A kind of measurement and positioning device for stretching experiment | |
| CN203672338U (en) | Product end face flatness inspection device | |
| CN103033137B (en) | A kind of high-pressure mercury lamp electrode assemblie 3 stretching measurement apparatus |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20220207 Address after: 523000 Room 401, building 6, No. 1, Zhiquan high tech Park Road, Dongkeng Town, Dongguan City, Guangdong Province Applicant after: Dongguan Yicai Technology Co.,Ltd. Address before: 523000 buildings 7 and 8, Zhengde Road Industrial Service Zone, Dongkeng Town, Dongguan City, Guangdong Province Applicant before: DONGGUAN OUBOTAI PHOTOELECTRIC Co.,Ltd. |
|
| GR01 | Patent grant | ||
| GR01 | Patent grant |