CN109655691A - Power device degeneration monitoring method, device and system in board-level circuit - Google Patents
Power device degeneration monitoring method, device and system in board-level circuit Download PDFInfo
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- CN109655691A CN109655691A CN201811594169.9A CN201811594169A CN109655691A CN 109655691 A CN109655691 A CN 109655691A CN 201811594169 A CN201811594169 A CN 201811594169A CN 109655691 A CN109655691 A CN 109655691A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests
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Abstract
This application involves power device degeneration monitoring methods, device and system in a kind of board-level circuit.The described method includes: receiving the electric field induction electromotive force and magnetic field induction electromotive force of power device；According to electric field induction electromotive force and magnetic field induction electromotive force, the switching loss of power device is obtained；Based on switching loss, confirm the degraded condition of power device, to, power device degeneration monitoring method is according to the electric field induction electromotive force and magnetic field induction electromotive force of collected power device in the application board-level circuit, switching loss is obtained, and diagnoses the fault state of the power device in plate circuit according to switching loss, and then realize and be monitored to the performance of power device, when finding that possible failure occurs in power device in time to power device reparation, more serious consequence is avoided result in.
Description
Technical field
This application involves prognostic and health management technical fields, more particularly to power device in a kind of board-level circuit
Degeneration monitoring method, device and system.
Background technique
Power electronic devices is also known as power semiconductor, is mainly used for transformation of electrical energy and control circuit aspect is high-power
Electronic device, be called " heart " of electronics, usual electric current is tens of to thousands of peaces, and voltage is hundreds of lie prostrate to thousands of volts
More than, it is used widely in aerospace, rail traffic, new energy, household electrical appliances etc. field.Due to change system operating condition
Complexity easily cause the integrity problems such as ageing failure so that power electronic devices bears unbalanced electric heating stress.One
Denier power electronic devices fails, and gently then change system is caused to shut down, and brings economic loss, it is heavy then such as in power grid, aviation
It needs in the application of high reliability, serious accident may be caused.Therefore, power electronic devices is in practical applications
Guaranteed reliability it is most important.
There are mainly two types of approach for traditional power electronic devices monitoring reliability: (a) carrying out to power electronic devices reliable
Property life test, it is contemplated that the reliable life of product；(b) failure analysis is carried out to the power electronic devices to have failed, really
Its fixed failure mode and failure mechanism, propose to improve measure to power electronic devices on this basis.But it was realizing
Cheng Zhong, inventor have found that at least there are the following problems in traditional technology: traditional technology can not be accurately to the reliable of power device
Property carry out real-time monitoring.
Summary of the invention
Based on this, it is necessary in view of the above technical problems, provide power device degeneration monitoring method in a kind of board-level circuit,
Device and system.
To achieve the goals above, on the one hand, the embodiment of the present application provides power device in a kind of board-level circuit and degenerates
Monitoring method, comprising the following steps:
Receive the electric field induction electromotive force and magnetic field induction electromotive force of power device；
According to electric field induction electromotive force and magnetic field induction electromotive force, the switching loss of power device is obtained；
Based on switching loss, the degraded condition of power device is confirmed.
In one of the embodiments, according to electric field induction electromotive force and magnetic field induction electromotive force, power device is obtained
The step of switching loss includes；
By the time integral of the product of electric field induction electromotive force and magnetic field induction electromotive force, it is confirmed as the switch of power device
Loss.
It is based on switching loss in one of the embodiments, the step of confirming the degraded condition of power device includes:
When the ratio of switching loss and standard switch loss is greater than preset threshold, there is performance and moves back in confirmation power device
Change；Standard switch loss is switching loss when power device is in health status.
The ratio of switching loss and standard switch loss is obtained based on following formula in one of the embodiments:
Wherein, D indicates ratio；P (t) indicates power；p0(t) calibration power is indicated；V1(t) electric field induction electricity is indicated
Kinetic potential；V2(t) magnetic field induction electromotive force is indicated；V′1(t) electric field induction electromotive force when power device is in health status is indicated；
V′2(t) magnetic field induction electromotive force when power device is in health status is indicated.
It is based on switching loss in one of the embodiments, the step of confirming the degraded condition of power device includes:
When switching loss is greater than default loss threshold value, there is performance degradation in confirmation power device.
On the other hand, the embodiment of the present application also provides power device degeneration monitoring devices in a kind of board-level circuit, comprising:
Electromotive force receiving module, for receiving the electric field induction electromotive force and magnetic field induction electromotive force of power device；
Switching loss obtains module, for obtaining power device according to electric field induction electromotive force and magnetic field induction electromotive force
Switching loss；
Degraded condition confirmation module confirms the degraded condition of power device for being based on switching loss.
In another aspect, the embodiment of the present application also provides power device degeneration monitoring systems in a kind of board-level circuit, including
First Acquisition Circuit, the second Acquisition Circuit and signal processing circuit；
First Acquisition Circuit connection signal processing circuit, and it is arranged in the side of the conducting wire of the drain electrode of connection power device；
Second Acquisition Circuit connection signal processing circuit, and it is arranged in the side of the conducting wire of the drain electrode of connection power device；
Wherein, the first Acquisition Circuit is for acquiring electric field induction electromotive force；Second Acquisition Circuit is for acquiring magnetic field induction
Electromotive force；
Signal processing circuit is for realizing power device degeneration monitoring method in board-level circuit as described above.
The first Acquisition Circuit is coupled capacitor sensor in one of the embodiments,；Second Acquisition Circuit is electromagnetism electricity
Press mutual inductance transducer；Signal processing circuit is the system level chip of board-level circuit.
It in one of the embodiments, further include warning circuit；
Warning circuit connection signal processing circuit.
Also on the one hand, the embodiment of the present application also provides a kind of computer readable storage mediums, are stored thereon with computer
Program, when computer program is executed by processor the step of the realization above method.
A technical solution in above-mentioned technical proposal is had the following advantages and beneficial effects:
By the electric field induction electromotive force and magnetic field induction electromotive force that receive power device；According to electric field induction electromotive force
With magnetic field induction electromotive force, the switching loss of power device is obtained；Based on switching loss, the degraded condition of power device is confirmed,
To which power device degeneration monitoring method is according to the electric field induction electromotive force of collected power device in the application board-level circuit
With magnetic field induction electromotive force, switching loss is obtained, and diagnoses the failure shape of the power device in plate circuit according to switching loss
Condition, and then realize and the performance of power device is monitored, when finding that possible failure occurs in power device in time to power
Device reparation avoids result in more serious consequence.
Detailed description of the invention
Fig. 1 is the first pass signal of power device degeneration monitoring method in the application board-level circuit in one embodiment
Figure；
Fig. 2 is the second procedure signal of power device degeneration monitoring method in the application board-level circuit in one embodiment
Figure；
Fig. 3 is the structural block diagram of power device degeneration monitoring device in the application board-level circuit in one embodiment；
Fig. 4 is the structural block diagram of degraded condition confirmation module in one embodiment；
Fig. 5 is the structural block diagram of power device degeneration monitoring system in the application board-level circuit in one embodiment；
Fig. 6 is the structural schematic diagram of one embodiment planar-type coupled capacitor sensor；
Fig. 7 is the structural schematic diagram of one embodiment planar-type electromagnetic voltage mutual inductance transducer；
Fig. 8 is the structural schematic diagram of one embodiment neutrality figure electromagnetic voltage mutual inductance transducer.
Specific embodiment
It is with reference to the accompanying drawings and embodiments, right in order to which the objects, technical solutions and advantages of the application are more clearly understood
The application is further elaborated.It should be appreciated that specific embodiment described herein is only used to explain the application, not
For limiting the application.
In order to solve the problems, such as that traditional technology accurately the reliability to power device can not carry out real-time monitoring, at one
In embodiment, as shown in Figure 1, providing power device degeneration monitoring method in a kind of board-level circuit, comprising the following steps:
Step S110 receives the electric field induction electromotive force and magnetic field induction electromotive force of power device.
Wherein, power device is the power device on plate circuit, for example, for the power device on printed circuit board.?
In the plate circuit course of work, power device continuous handoff procedure state between on and off, thus, it will lead to power device
Part and its drain between conducting wire on electric current and voltage constantly convert, the electric current of variation can generate the magnetic of variation around conducting wire
, the voltage of variation causes the electric field change around conducting wire.Electric field induction electromotive force be using can induction field variation first
Acquisition Circuit collects, i.e., electric field induction electromotive force is the electromotive force for incuding the electric field of variation and generating.Magnetic field induction electromotive force
For using can induced magnetic field variation the second Acquisition Circuit collect, i.e., magnetic field induction electromotive force be induction changing magnetic field produce
Raw electromotive force.
Step S120 obtains the switching loss of power device according to electric field induction electromotive force and magnetic field induction electromotive force.
In a specific embodiment, according to electric field induction electromotive force and magnetic field induction electromotive force, power device is obtained
Switching loss the step of in；
By the time integral of the product of electric field induction electromotive force and magnetic field induction electromotive force, it is confirmed as the switch of power device
Loss.
It should be noted that during power device constantly switches between on and off, the first Acquisition Circuit
The electric field induction electromotive force of acquisition is proportional to the v for the voltage that power device connects in its drain conductors0(t)；Second Acquisition Circuit
The magnetic field induction electromotive force of acquisition is proportional to the i for the electric current that power device connects in its drain conductors0(t)。
Specifically, obtaining switching loss based on following formula:
Wherein,Indicate switch power.Therefore, function is proportional to by the retrievable switching loss of the formula
The true switching loss of rate device.Power device is proportional to by the switching loss that the formula is got to connect in its drain conductors
True switching loss.
Step S130 is based on switching loss, confirms the degraded condition of power device.
It should be noted that the switching loss of power device is gradually increased with the degeneration of power device.It therefore can basis
The switching loss got by the application method, to judge the degraded condition of power device, switching loss is bigger, then illustrates function
Rate device loss is more serious.
In a specific embodiment, it is based on switching loss, the step of confirming the degraded condition of power device includes:
When switching loss is greater than default loss threshold value, there is performance degradation in confirmation power device.
Wherein, presetting loss threshold value is to carry out proper ratio diminution to the true loss power of power device to obtain.
In the application board-level circuit in each embodiment of power device degeneration monitoring method, by the electricity for receiving power device
Field induced electromotive force and magnetic field induction electromotive force；According to electric field induction electromotive force and magnetic field induction electromotive force, power device is obtained
The switching loss of part；Based on switching loss, the degraded condition of power device is confirmed, thus, power device in the application board-level circuit
Part degeneration monitoring method obtains switch damage according to the electric field induction electromotive force and magnetic field induction electromotive force of collected power device
Consumption, and according to the fault state of the power device in switching loss diagnosis plate circuit, and then realize the performance to power device
Be monitored, when finding that possible failure occurs in power device in time to power device reparation, avoid result in it is more serious after
Fruit.
In one embodiment, as shown in Fig. 2, power device degeneration monitoring method in a kind of board-level circuit, including it is following
Step:
Step S210 receives the electric field induction electromotive force and magnetic field induction electromotive force of power device；
The time integral of the product of electric field induction electromotive force and magnetic field induction electromotive force is confirmed as power by step S220
The switching loss of device；
Step S230, when the ratio of switching loss and standard switch loss is greater than preset threshold, confirmation power device goes out
Existing performance degradation；Standard switch loss is switching loss when power device is in health status.
It should be noted that step S210 is identical as step S110 in the above embodiments of the present application, details are not described herein again.
Wherein, standard switch loss is switching loss when power device is in health status.Specifically, being adopted using first
Collector acquisition power device is in electric field induction electromotive force when health status, acquires power device using the second Acquisition Circuit
Magnetic field induction electromotive force when in health status is obtained then using treatment process identical with the application acquisition switching loss
Standard switch is taken to be lost.
Judge whether power device performance degradation, above-mentioned ratio occurs using switching loss and the ratio of standard switch loss
Value is bigger, and the performance degradation for illustrating power device is more serious.
In one embodiment, the ratio of switching loss and standard switch loss is obtained based on following formula:
Wherein, D indicates ratio；P (t) indicates power；p0(t) calibration power is indicated；V1(t) electric field induction electricity is indicated
Kinetic potential；V2(t) magnetic field induction electromotive force is indicated；V′1(t) electric field induction electromotive force when power device is in health status is indicated；
V′2(t) magnetic field induction electromotive force when power device is in health status is indicated.It should be noted that power p (t) is to pass through
Magnetic field induction electromotive force and electric field induction electromotive force obtain, calibration power p0(t) function when health status is in for power device
Rate.
Specifically, in one example, being with what the first Acquisition Circuit was constituted in the conducting wire that power device connects its drain electrode
System be linear time invariant system and power device to connect the conducting wire of its drain electrode and the system of the second Acquisition Circuit composition be linear
Under the premise of time-invariant system, the ratio of switching loss and standard switch loss is obtained based on following procedure:
V1(t)→V′1(t)
V2(t)→V′2(t)
Calibration power under device health status at this time:
p0(t)=i0(t)*v0(t)
According to the superimposed characteristics and uniform properties of linear time invariant system:
I (t)=i0(t)*a→V1(t)=V '1(t)*a
V (t)=v0(t)*b→V2(t)=V '2(t)*b
Power under device degradation state at this time:
P (t)=I (t) * V (t)
Power and calibration power ratio:
Further, the electric field induction electromotive force and magnetic field induction electromotive force of T time can be also acquired, field induction electric is calculated
Integral of the product of gesture and magnetic field induction electromotive force in T time obtains switching loss, according under the health status in T time and
Switching loss under degenerate state judges the degraded condition of device, specific:
In the application board-level circuit in each embodiment of power device degeneration monitoring method, opened using switching loss and standard
Whether the ratio for closing loss there is the criterion of performance degradation as confirmation power device, and power device cannot be collected by avoiding
True switching loss bring error, so that more accurately monitoring the degraded condition of power device, more to maintenance power device
Added with benefit.
It should be understood that although each step in the flow chart of Fig. 1 and 2 is successively shown according to the instruction of arrow,
It is these steps is not that the inevitable sequence according to arrow instruction successively executes.Unless expressly stating otherwise herein, these steps
There is no stringent sequences to limit for rapid execution, these steps can execute in other order.Moreover, in Fig. 1 or 2 at least
A part of step may include that perhaps these sub-steps of multiple stages or stage are not necessarily in same a period of time to multiple sub-steps
Quarter executes completion, but can execute at different times, the execution in these sub-steps or stage be sequentially also not necessarily according to
Secondary progress, but in turn or can replace at least part of the sub-step or stage of other steps or other steps
Ground executes.
In one embodiment, as shown in figure 3, providing power device degeneration monitoring device in a kind of board-level circuit, packet
It includes:
Electromotive force receiving module 310, for receiving the electric field induction electromotive force and magnetic field induction electromotive force of power device；
Switching loss obtains module 320, for obtaining power device according to electric field induction electromotive force and magnetic field induction electromotive force
The switching loss of part；
Degraded condition confirmation module 330 confirms the degraded condition of power device for being based on switching loss.
In one embodiment, as shown in figure 4, power device degeneration monitoring device, degraded condition in a kind of board-level circuit
Confirmation module includes:
First performance degeneration confirmation module 410, for being greater than default threshold in the ratio of switching loss and standard switch loss
When value, there is performance degradation in confirmation power device；Standard switch loss is switching loss when power device is in health status.
In one embodiment, as shown in figure 4, power device degeneration monitoring device, degraded condition in a kind of board-level circuit
Confirmation module further include:
Second performance degradation confirmation module 420, for confirming power device when switching loss is greater than default loss threshold value
There is performance degradation.
Specific restriction about power device degeneration monitoring device in board-level circuit may refer to above for plate grade electricity
The restriction of power device degeneration monitoring method in road, details are not described herein.Power device, which is degenerated, in above-mentioned board-level circuit monitors dress
Modules in setting can be realized fully or partially through software, hardware and combinations thereof.Above-mentioned each module can be in the form of hardware
It is embedded in or independently of the storage that in the processor in computer equipment, can also be stored in a software form in computer equipment
In device, the corresponding operation of the above modules is executed in order to which processor calls.
In one embodiment, as shown in figure 5, additionally providing power device degeneration monitoring system in a kind of board-level circuit,
Including the first Acquisition Circuit 11, the second Acquisition Circuit 13 and signal processing circuit 15；
First Acquisition Circuit, 11 connection signal processing circuit 15, and it is arranged in the conducting wire of the drain electrode of connection power device 171
Side；Second Acquisition Circuit, 13 connection signal processing circuit 15, and be arranged in the conducting wire of the drain electrode of connection power device 171
Side；
Wherein, the first Acquisition Circuit 11 is for acquiring electric field induction electromotive force；Second Acquisition Circuit 13 is for acquiring magnetic field
Induced electromotive force；
Signal processing circuit 15 is for realizing power device degeneration monitoring method in board-level circuit described in the embodiment of the present application.
Further, the first Acquisition Circuit 11 is coupled capacitor sensor；Second Acquisition Circuit 13 is electromagnetic voltage mutual inductance
Sensor；Signal processing circuit 15 is the system level chip of board-level circuit.
It further, further include warning circuit 19；
19 connection signal processing circuit 15 of warning circuit.
Wherein, it is power device on 17 that power device 171, which is board-level circuit,.Power device moves back in the application board-level circuit
Changing monitoring system to be arranged on board-level circuit is on 17.
Coupled capacitor sensor can sense for plane coupled capacitor sensor (as shown in Figure 6) or solid type coupled capacitor
Device.Electromagnetic voltage mutual inductance transducer can be plane electromagnetic mutual induction of voltage sensor (as shown in Figure 7) or solid type electromagnetic voltage
Mutual inductance transducer (as shown in Figure 8).
System level chip is to carry on board-level circuit, constructs the application using the system level chip carried on board-level circuit
Power device degeneration monitoring system in board-level circuit, is conducive to the control of cost, is also beneficial to the saving of resource.System level chip
Function be that the current signal that will be received and voltage signal carry out feature extraction and obtain characteristic, and according to characteristic into
Row prediction in real time, obtains reliability prediction result.
Warning circuit can be voice guard, light crossing-signal etc., performance occur in confirmation power device and retract, issue and remind
To remind related personnel.
In the application board-level circuit in each embodiment of power device degeneration monitoring system, the sensor of use belongs to non-connect
Touching, can be directly arranged on board-level circuit, be controlled using the system level chip on board-level circuit plate, and obtain power device
Degradation information, can online real-time perception power device degeneration, and alarm, it is at low cost, easy of integration, it is easy to spread to answer
With.
In one embodiment, a kind of computer readable storage medium is provided, computer program is stored thereon with, is calculated
Machine program performs the steps of when being executed by processor
Receive the electric field induction electromotive force and magnetic field induction electromotive force of power device；
According to electric field induction electromotive force and magnetic field induction electromotive force, the switching loss of power device is obtained；
Based on switching loss, the degraded condition of power device is confirmed.
In one embodiment, it is also performed the steps of when computer program is executed by processor
When the ratio of switching loss and standard switch loss is greater than preset threshold, there is performance and moves back in confirmation power device
Change；Standard switch loss is switching loss when power device is in health status.
In one embodiment, it is also performed the steps of when computer program is executed by processor
When switching loss is greater than default loss threshold value, there is performance degradation in confirmation power device.
In one embodiment, it is also performed the steps of when computer program is executed by processor
By the time integral of the product of magnetic field induction electromotive force and electric field induction electromotive force, it is confirmed as the switch of power device
Loss.
Those of ordinary skill in the art will appreciate that realizing all or part of the process in above-described embodiment method, being can be with
Relevant hardware is instructed to complete by computer program, the computer program can be stored in a non-volatile computer
In read/write memory medium, the computer program is when being executed, it may include such as the process of the embodiment of above-mentioned each method.Wherein,
To any reference of memory, storage, database or other media used in each embodiment provided herein,
Including non-volatile and/or volatile memory.Nonvolatile memory may include read-only memory (ROM), programming ROM
(PROM), electrically programmable ROM (EPROM), electrically erasable ROM (EEPROM) or flash memory.Volatile memory may include
Random access memory (RAM) or external cache.By way of illustration and not limitation, RAM is available in many forms,
Such as static state RAM (SRAM), dynamic ram (DRAM), synchronous dram (SDRAM), double data rate sdram (DDRSDRAM), enhancing
Type SDRAM (ESDRAM), synchronization link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM
(RDRAM), direct memory bus dynamic ram (DRDRAM) and memory bus dynamic ram (RDRAM) etc..
Each technical characteristic of above embodiments can be combined arbitrarily, for simplicity of description, not to above-described embodiment
In each technical characteristic it is all possible combination be all described, as long as however, the combination of these technical characteristics be not present lance
Shield all should be considered as described in this specification.
The several embodiments of the application above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneously
The limitation to claim therefore cannot be interpreted as.It should be pointed out that coming for those of ordinary skill in the art
It says, without departing from the concept of this application, various modifications and improvements can be made, these belong to the protection of the application
Range.Therefore, the scope of protection shall be subject to the appended claims for the application patent.
Claims (10)
1. power device degeneration monitoring method in a kind of board-level circuit, which comprises the following steps:
Receive the electric field induction electromotive force and magnetic field induction electromotive force of power device；
According to the electric field induction electromotive force and the magnetic field induction electromotive force, the switching loss of the power device is obtained；
Based on the switching loss, the degraded condition of the power device is confirmed.
2. power device degeneration monitoring method in board-level circuit according to claim 1, which is characterized in that according to the electricity
Induced electromotive force and the magnetic field induction electromotive force, in the step of obtaining the switching loss of the power device；
By the time integral of the product of the electric field induction electromotive force and the magnetic field induction electromotive force, it is confirmed as the power device
The switching loss of part.
3. power device degeneration monitoring method in board-level circuit according to claim 1 or 2, which is characterized in that be based on institute
The step of stating switching loss, confirming the degraded condition of the power device include:
When the ratio of the switching loss and standard switch loss is greater than preset threshold, confirm that performance occurs in the power device
It degenerates；The standard switch loss is the switching loss when power device is in health status.
4. power device degeneration monitoring method in board-level circuit according to claim 3, which is characterized in that in the switch
When the ratio of loss and standard switch loss is greater than preset threshold, confirm that the power device occurred in the step of performance degradation,
The ratio of the switching loss and standard switch loss is obtained based on following formula:
Wherein, D indicates the ratio；P (t) indicates power；p0(t) calibration power is indicated；V1(t) the electric field induction electricity is indicated
Kinetic potential；V2(t) the magnetic field induction electromotive force is indicated；V'1(t) the electric field sense when power device is in health status is indicated
Answer electromotive force；V'2(t) the magnetic field induction electromotive force when power device is in health status is indicated.
5. power device degeneration monitoring method in board-level circuit according to claim 1 or 2, which is characterized in that be based on institute
The step of stating switching loss, confirming the degraded condition of the power device include:
When the switching loss is greater than default loss threshold value, confirm that performance degradation occurs in the power device.
6. power device degeneration monitoring device in a kind of board-level circuit characterized by comprising
Electromotive force receiving module, for receiving the electric field induction electromotive force and magnetic field induction electromotive force of power device；
Switching loss obtains module, described for obtaining according to the electric field induction electromotive force and the magnetic field induction electromotive force
The switching loss of power device；
Degraded condition confirmation module confirms the degraded condition of the power device for being based on the switching loss.
7. power device degeneration monitoring system in a kind of board-level circuit, which is characterized in that including the first Acquisition Circuit, the second acquisition
Circuit and signal processing circuit；
First Acquisition Circuit connects the signal processing circuit, and be arranged in the drain electrode of connection power device conducting wire one
Side；Second Acquisition Circuit connects the signal processing circuit, and is arranged in the conducting wire for connecting the drain electrode of the power device
Side；
Wherein, first Acquisition Circuit is for acquiring electric field induction electromotive force；Second Acquisition Circuit is for acquiring magnetic field
Induced electromotive force；
The signal processing circuit is moved back for realizing power device in the board-level circuit as described in claim 1 to 5 any one
Change monitoring method.
8. power device degeneration monitoring system in board-level circuit according to claim 7, which is characterized in that described first adopts
Collector is coupled capacitor sensor；Second Acquisition Circuit is electromagnetic voltage mutual inductance transducer；The signal processing circuit
For the system level chip of board-level circuit.
9. power device degeneration monitoring system in board-level circuit according to claim 7 or 8, which is characterized in that further include
Warning circuit；
The warning circuit connects the signal processing circuit.
10. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the computer program
The step of method described in any one of claim 1 to 5 is realized when being executed by processor.
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