CN104569554A - Double-power-supply voltage detection circuit - Google Patents
Double-power-supply voltage detection circuit Download PDFInfo
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- CN104569554A CN104569554A CN201510042774.5A CN201510042774A CN104569554A CN 104569554 A CN104569554 A CN 104569554A CN 201510042774 A CN201510042774 A CN 201510042774A CN 104569554 A CN104569554 A CN 104569554A
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- supply voltage
- power
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- photoelectrical coupler
- detection circuit
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Abstract
The invention relates to a double-power-supply voltage detection circuit. The double-power-supply voltage detection circuit comprises power supply input and further comprises voltage decreasing resistors R1, R2 and R3, an adjustable resistor RV1, amplitude limiting protection diodes D1 and D2, resistors R4, R5, R6 and R7, photoelectric couplers U1a, U1b, U2a and U2b and capacitors CD1 and CD2. The resistors R4 and R6 and the photoelectric coupler U1b form a feedback circuit, and the resistors R5 and R7 and the photoelectric coupler U2b form another feedback circuit. The double-power-supply voltage detection circuit effectively solves the problem that because the photoelectric couplers are affected by environment temperature, temperature excursion occurs, the linearity degree of the photoelectric couplers is greatly increased, and the requirement for accurately measuring a voltage signal of the double-power-supply product is met better; technology errors generated in the production process are reduced for the photoelectric couplers, and assembling and wiring of a user are facilitated.
Description
Technical field
The present invention relates to voltage detecting technical field, more particularly, relate to a kind of dual-supply voltage testing circuit.
Background technology
Tradition is in the dual-supply voltage testing circuit of core with photoelectrical coupler; only has a photoelectrical coupler; its as semiconductor devices; in use affect measurement and protection precision because the change of environment temperature makes the signal of transmission produce temperature drift and certain nonlinearity erron, cause the error that voltage measurement generation is larger.Conventional solution adopts temperature compensation or adopts operational amplifier to coordinate and realizes non-liner revision, but general temperature compensation low precision, what have increases nonlinearity erron on the contrary; And adopt operational amplifier to coordinate the temperature drift that can not solve photoelectrical coupler; If adopt two kinds of compensation methodes all taken into account, not only complex circuit designs, and increase cost and reduce reliability.Also have existing dual-supply voltage testing circuit to commonly use and need be connected respective power supply A, B, C, N with standby power supply, neutral line N can not be lacked.
Therefore, prior art urgently has greatly improved.
Summary of the invention
The technical problem to be solved in the present invention is, for the above-mentioned defect of prior art, a kind of dual-supply voltage testing circuit is provided, comprise: power supply inputs, described dual-supply voltage testing circuit also comprises: dropping resistor R1, R2, R3, adjustable resistance RV1, limited amplitude protection diode D1, D2, resistance R4, R5, R6, R7, photoelectrical coupler U1a, U1b, U2a, U2b and electric capacity CD1, CD2; Wherein resistance R4, R6 and photoelectrical coupler U1b forms a road feedback circuit; Resistance R5, R7 and photoelectrical coupler U2b form another road feedback circuit.
At dual-supply voltage testing circuit of the present invention, described photoelectrical coupler adopts a unit package and Ua and Ub in same unit package.
Implement dual-supply voltage testing circuit of the present invention, there is following beneficial effect: adopt photoelectrical coupler to form voltage feedback circuit, effectively can solve the temperature drift problem that photoelectrical coupler produces by the impact of environment temperature, and its linearity is improved greatly, more meet the requirement that dual power supply product voltage signal is accurately measured; Photoelectrical coupler adopts a unit package and U1a and U1b in same unit package, reduce the fabrication error that photoelectrical coupler produces in process of production, such two photoelectrical couplers temperature characterisitic the same, the temperature drift produced can be cancelled out each other, and effectively can resist the temperature drift problem produced due to the impact of environment temperature; Dual-supply voltage testing circuit is commonly used and only need be connected respective A, B, c-power supply with standby power supply, does not need to connect neutral line N, not only facilitates assembling but also facilitate terminal block.
Accompanying drawing explanation
Below in conjunction with drawings and Examples, the invention will be further described, in accompanying drawing:
The dual-supply voltage testing circuit schematic diagram of Fig. 1 to be Traditional photovoltaic coupling mechanism be core;
Fig. 2 is Traditional photovoltaic coupling mechanism is the dual-supply voltage testing circuit schematic diagram that core band amplifier coordinates;
Fig. 3 is the circuit theory diagrams of the first embodiment of dual-supply voltage testing circuit of the present invention.
Embodiment
Refer to Fig. 1, for Traditional photovoltaic coupling mechanism is the dual-supply voltage testing circuit schematic diagram of core.As shown in Figure 1; only has a photoelectrical coupler; its as semiconductor devices, in use affect measurement and protection precision because the change of environment temperature makes the signal of transmission produce temperature drift and certain nonlinearity erron, cause the error that voltage measurement generation is larger.
Refer to Fig. 2, for Traditional photovoltaic coupling mechanism is the dual-supply voltage testing circuit figure schematic diagram that core band amplifier coordinates.Adopt temperature compensation or adopt operational amplifier to coordinate and realize non-liner revision, but general temperature compensation low precision, what have increases nonlinearity erron on the contrary; And adopt operational amplifier to coordinate the temperature drift that can not solve photoelectrical coupler.
Incorporated by reference to consulting Fig. 3, be the circuit theory diagrams of the first embodiment of dual-supply voltage testing circuit of the present invention.As shown in Figure 3, in the first embodiment provided by the invention, at least comprise: power supply inputs, dropping resistor R1, R2, R3, adjustable resistance RV1, limited amplitude protection diode D1, D2, resistance R4, R5, R6, R7, photoelectrical coupler U1a, U1b, U2a, U2b and electric capacity CD1, CD2; Wherein resistance R4, R6 and photoelectrical coupler U1b forms a road feedback circuit; Resistance R5, R7 and photoelectrical coupler U2b form another road feedback circuit.
Described dual-supply voltage testing circuit, described photoelectrical coupler adopts a unit package and Ua and Ub in same unit package.
The present invention is by the design of above first embodiment, can accomplish to adopt photoelectrical coupler to form voltage feedback circuit, effectively can solve the temperature drift problem that photoelectrical coupler produces by the impact of environment temperature, and its linearity is improved greatly, more meet the requirement that dual power supply product voltage signal is accurately measured; Photoelectrical coupler adopts a unit package and U1a and U1b in same unit package, reduce the fabrication error that photoelectrical coupler produces in process of production, such two photoelectrical couplers temperature characterisitic the same, the temperature drift produced can be cancelled out each other, and effectively can resist the temperature drift problem produced due to the impact of environment temperature; Dual-supply voltage testing circuit is commonly used and only need be connected respective A, B, c-power supply with standby power supply, does not need to connect neutral line N, not only facilitates assembling but also facilitate terminal block.
The present invention is described according to specific embodiment, but it will be understood by those skilled in the art that when not departing from the scope of the invention, can carry out various change and equivalent replacement.In addition, for adapting to the specific occasion of the technology of the present invention, can many amendments be carried out to the present invention and not depart from its protection domain.Therefore, the present invention is not limited to specific embodiment disclosed herein, and comprises all embodiments dropping into claims.
Claims (2)
1. a dual-supply voltage testing circuit, comprise: power supply inputs, it is characterized in that, described dual-supply voltage testing circuit also comprises: dropping resistor R1, R2, R3, adjustable resistance RV1, limited amplitude protection diode D1, D2, resistance R4, R5, R6, R7, photoelectrical coupler U1a, U1b, U2a, U2b and electric capacity CD1, CD2; Wherein resistance R4, R6 and photoelectrical coupler U1b forms a road feedback circuit; Resistance R5, R7 and photoelectrical coupler U2b form another road feedback circuit.
2. dual-supply voltage testing circuit according to claim 1, is characterized in that, described photoelectrical coupler adopts a unit package and Ua and Ub in same unit package.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510042774.5A CN104569554A (en) | 2015-01-28 | 2015-01-28 | Double-power-supply voltage detection circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510042774.5A CN104569554A (en) | 2015-01-28 | 2015-01-28 | Double-power-supply voltage detection circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104569554A true CN104569554A (en) | 2015-04-29 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510042774.5A Pending CN104569554A (en) | 2015-01-28 | 2015-01-28 | Double-power-supply voltage detection circuit |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112486056A (en) * | 2020-10-30 | 2021-03-12 | 国网山东省电力公司日照供电公司 | Cell dual-power operation mode detection device and working method thereof |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2938119Y (en) * | 2006-08-08 | 2007-08-22 | 浙江德力西电器股份有限公司 | Photoelectric coupling AC voltage separation measuring circuit |
| CN103364613A (en) * | 2013-07-15 | 2013-10-23 | 长城电器集团有限公司 | Voltage signal conditioning circuit of automatic reclosing lock breaker in time of electric leakage |
| CN203337717U (en) * | 2013-07-15 | 2013-12-11 | 长城电器集团有限公司 | Voltage signal conditioning circuit for electric leakage auto-reclosing circuit breaker |
| CN204389569U (en) * | 2015-01-28 | 2015-06-10 | 长城电器集团有限公司 | Dual-supply voltage testing circuit |
-
2015
- 2015-01-28 CN CN201510042774.5A patent/CN104569554A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2938119Y (en) * | 2006-08-08 | 2007-08-22 | 浙江德力西电器股份有限公司 | Photoelectric coupling AC voltage separation measuring circuit |
| CN103364613A (en) * | 2013-07-15 | 2013-10-23 | 长城电器集团有限公司 | Voltage signal conditioning circuit of automatic reclosing lock breaker in time of electric leakage |
| CN203337717U (en) * | 2013-07-15 | 2013-12-11 | 长城电器集团有限公司 | Voltage signal conditioning circuit for electric leakage auto-reclosing circuit breaker |
| CN204389569U (en) * | 2015-01-28 | 2015-06-10 | 长城电器集团有限公司 | Dual-supply voltage testing circuit |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112486056A (en) * | 2020-10-30 | 2021-03-12 | 国网山东省电力公司日照供电公司 | Cell dual-power operation mode detection device and working method thereof |
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Application publication date: 20150429 |
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| RJ01 | Rejection of invention patent application after publication |