CN102706296A - Detecting device and detecting method for thickness uniformity of silicon steel in width direction - Google Patents
Detecting device and detecting method for thickness uniformity of silicon steel in width direction Download PDFInfo
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- CN102706296A CN102706296A CN2012100753149A CN201210075314A CN102706296A CN 102706296 A CN102706296 A CN 102706296A CN 2012100753149 A CN2012100753149 A CN 2012100753149A CN 201210075314 A CN201210075314 A CN 201210075314A CN 102706296 A CN102706296 A CN 102706296A
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Abstract
The invention discloses a detecting device for thickness uniformity of silicon steel in the width direction. The detecting device comprises a control panel, a measuring device, a measuring frame and a rail, wherein the control panel is connected with the measuring device and the measuring frame, the measuring device is arranged on the measuring frame which is connected with the rail, the measuring frame is operated in a direction in conformity with the width direction of the silicon steel, and the measuring frame is C-shaped. The detecting device in the technical scheme can measure intra-plate gauge deviation of thicknesses of steel belts one by one in real time instead of a manual mode, thickness measurement precision of the detecting device is higher than that of the manual mode, data are inquired conveniently and rapidly, an automatic alarm function is realized when the intra-plate gauge deviation of steel coils do not meet requirements and troublesome manual labor is greatly reduced.
Description
Technical field
The invention belongs to the auxiliary detection equipment manufacturing technology field in the steel manufacturing process that is applied to, specifically, relate to a kind of silicon steel Width thickness evenness pick-up unit and detection method thereof.
Background technology
In steel manufacturing technology field, usually need auxiliary detection equipment that the silicon steel thickness evenness is detected, promptly the same plate difference to silicon steel detects.So-called " poor with plate " is meant the deviation of thickness on a block plate, refers to the maximal value at the thickness difference between any 2 on same the steel plate.In the processing and manufacturing process of actual steel; Thickness to the silicon strip of production run has strict requirement; Thickness is to control according to the thickness fluctuation of its central spot; The thickness that need carry out on Width and the length direction detects, and confirms according to longitudinal thickness and two kinds of assays of transverse gage with the plate difference, and it is the index that whether thickness difference meets the tolerance standard requirement on same steel plate of check.
In the prior art, lack specialized apparatus, have following technological deficiency to the detection of silicon steel thickness:
1, silicon steel all is to rely on manual work to measure with the high precision milscale with plate difference situation at present; In the measuring process because of the dynamics of the screwing size in the measuring process, the speed of screwing, condition of different influence such as hand shake when measuring; Cause the thickness results fluctuation bigger; Cause the result who measures inaccurate, seriously influence to having brought with the plate difference analysis;
2, the method for available technology adopting manual measurement wastes time and energy, for the mode of production of the high rhythm of unit; Manual measurement does not catch up with rhythm of production far away; Can not carry out online detection to the silicon steel in the production run, can't accomplish real-time monitoring, cause occurring with plate difference substandard product to unusual coil of strip; Make deterioration in quality, bring very big difficulty to the user.
Summary of the invention
Technical matters to be solved by this invention is; In the prior art; The detection that lacks to silicon steel thickness lacks specialized apparatus, and silicon steel all is to rely on manual work to measure with the high precision milscale with plate difference situation at present, causes the thickness results fluctuation bigger; Cause the result who measures inaccurate, seriously influence to having brought with the plate difference analysis; Simultaneously; Manual measurement does not catch up with rhythm of production far away, can not carry out online detection to the silicon steel in the production run, can't accomplish the real-time monitoring to unusual coil of strip; Cause occurring with plate difference substandard product; Make deterioration in quality, bring very big technical matterss such as difficulty to the user, and a kind of silicon steel Width thickness evenness pick-up unit and detection method thereof are provided.
Technical scheme provided by the present invention is; A kind of silicon steel Width thickness evenness pick-up unit; Said pick-up unit comprises control panel, measurement mechanism, measurement bay and track, and said control panel links to each other with said measurement mechanism, measurement bay, and said measurement mechanism is installed on the said measurement bay; Said measurement bay connects track, and said measurement bay traffic direction is consistent with the silicon steel Width.
Said measurement mechanism is the single-point gamma thickness gage.
Said pick-up unit also comprises measuring system platform, automatic analytical database and display screen, and said gamma thickness gage links to each other with display screen with said measuring system platform, automatic analytical database.
Said measurement bay is a C shape measurement bay.
Be provided with analysis module in the said measuring system platform, said analysis module can calculate maximal value, minimum value, the mean value of each measurement point of silicon steel Width thickness through logic analysis, and said measuring system platform links to each other with said display screen.
Said measuring system platform also comprises mobile control module, and mobile control module is controlled the predeterminated position that said C shape measurement bay rests on the silicon steel Width respectively, and said measuring system platform links to each other with said control panel.
A kind of silicon steel Width thickness evenness detection method is characterized in that,
The first step, single-point gamma thickness gage are installed on the C shape testing stand, and testing stand connects track;
In second step, on the silicon steel Width, preset uniformly-spaced measurement point of A, B, C, D, E;
In the 3rd step, C shape testing stand drives the operation of single-point gamma thickness gage silicon steel Width through track, wherein, and when measuring the A point; By " A " button, C shape measurement bay 1 moves to A point on control panel, move into place stop after, the pilot lamp warning; By " measurements " button, thicknessmeter is measured then, measure certain data after, press " stopping "; Cancellation is measured, and by that analogy, B, C, D, E point is measured;
The 4th step, move automatic analytical database, data change the volume reel number, just can show information such as thickness difference maximal value between the maximum thickness, minimum value, mean value, each measurement point of each measurement point, minimum value, mean value, reach graphic analyses;
The 5th step, press conclusion button, when the single-point gamma thickness gage quit work, C shape testing stand was left production line automatically through track.
Adopt technical scheme provided by the present invention; Can effectively solve in the prior art; The detection that lacks to silicon steel thickness lacks specialized apparatus, and silicon steel all is to rely on manual work to measure with the high precision milscale with plate difference situation at present, causes the thickness results fluctuation bigger; Cause the result who measures inaccurate, seriously influence to having brought with the plate difference analysis; Simultaneously, manual measurement does not catch up with rhythm of production far away, can not carry out online detection to the silicon steel in the production run; Can't accomplish real-time monitoring, cause occurring, make deterioration in quality with plate difference substandard product to unusual coil of strip; Bring very big technical matterss such as difficulty to the user; Simultaneously, technical scheme provided by the present invention also has, and can replace manual work that thickness of strips is measured with the plate difference in real time one by one; Measure thickness and precision and be higher than the manual measurement thickness and precision; Data query is convenient and swift, to the undesirable coil of strip of plate difference, automatic warning function is arranged; Significantly reduced loaded down with trivial details hand labor.
Description of drawings
In conjunction with accompanying drawing, the present invention is further described:
Fig. 1 is C shape measurement bay 1 of the present invention and silicon steel structural representation;
Wherein, 1 is C shape measurement bay.
Embodiment
Carry out data analysis according to sample results in the prior art; The same plate difference quality condition that reaction is whole; But for not monitoring one by one with the coil of strip of plate difference abnormal quality individually, cause under ignorant situation, will being sold to the user, brought difficulty for user's use with plate difference unacceptable product.Generally be furnished with a single-point type gamma thickness gage at silicon steel annealing unit inlet, the web width central point carried out thickness measure, its function be the operator according to detecting one-tenth-value thickness 1/10, find to handle when thickness deviation is above standard scope;
The invention belongs to steel manufacturing technology field; It is a kind of method of on-line monitoring silicon steel Width thickness evenness (hereinafter to be referred as " poor ") situation with plate; Avoided dispatching a person worker's measuring error and heavy measurement labor capacity, solved with a plate difference quality problems monitoring technique difficult problem one by one with plate.
As shown in Figure 1; Technical scheme provided by the present invention is, a kind of silicon steel Width thickness evenness pick-up unit, and said pick-up unit comprises control panel, measurement mechanism, measurement bay and track; Said control panel links to each other with said measurement mechanism, measurement bay; Said measurement mechanism is installed on the said measurement bay, and said measurement bay connects track, and said measurement bay traffic direction is consistent with the silicon steel Width.Said measurement mechanism is the single-point gamma thickness gage.Said pick-up unit also comprises measuring system platform, automatic analytical database and display screen, and said gamma thickness gage links to each other with display screen with said measuring system platform, automatic analytical database.Said measurement bay is a C shape measurement bay 1.Be provided with analysis module in the said measuring system platform, said analysis module can calculate maximal value, minimum value, the mean value of each measurement point of silicon steel Width thickness through logic analysis, and said measuring system platform links to each other with said display screen.Said measuring system platform also comprises mobile control module, and mobile control module is controlled said C shape respectively and measured 1 predeterminated position that rests on the silicon steel Width, and said measuring system platform links to each other with said control panel.
The objective of the invention is the single-point type thicknessmeter is transformed, make the single-point thicknessmeter can realize the function that thickness deviation detects, can accomplish with the plate difference measurements again, realize that each volume silicon steel product thickness accurately monitors with the plate difference.
Technical scheme of the present invention:
1) single-point gamma thickness gage working method is: C shape measurement bay 1 drives the middle part that the ray emission device directly reaches strip width through track, opens ray then, measures thickness, and when quitting work, C shape measurement bay 1 is left production line automatically through track;
Technological transformation point: on the strip width direction, draft several measurement demand points; For example: portion is respectively A, B, C, D, E or the like to the limit from band steel middle part; On C shape measurement bay 1 moving track, do corresponding braking point; When C shape measurement bay 1 moves to the point that needs measurement, stop, measuring, computer record amount data;
2) independent development thicknessmeter measuring system platform;
When needing to measure the A point, by " A " button, C shape measurement bay 1 moves to the A point on control panel; Move into place stop after, pilot lamp is reported to the police, then by " measurement " button; Thicknessmeter is measured, measure certain data after, by " stopping "; Cancellation is measured, and by that analogy, demand point is measured.
3) develop automatic analytical database, data change the volume reel number, just can show information such as thickness difference maximal value between the maximum thickness, minimum value, mean value, each measurement point of each measurement point, minimum value, mean value, and graphic analyses.
The present invention utilizes measurement bay, track and the radionetric survey system of original single-point thicknessmeter, new measurement point is preset, and accomplished location, measurement and the data preservation of each measurement point;
Measuring method: when needing to measure the A point, by " A " button, C shape measurement bay 1 moves to the A point on control panel; Move into place stop after, pilot lamp is reported to the police, then by " measurement " button; Thicknessmeter is measured, measure certain data after, by " stopping "; Cancellation is measured, and by that analogy, demand point is measured.
Develop automatic analytical database, just can show information such as thickness difference maximal value between the maximum thickness, minimum value, mean value, each measurement point of each measurement point, minimum value, mean value, and graphic analyses.
Claims (7)
1. silicon steel Width thickness evenness pick-up unit; It is characterized in that; Said pick-up unit comprises control panel, measurement mechanism, measurement bay and track, and said control panel links to each other with said measurement mechanism, measurement bay, and said measurement mechanism is installed on the said measurement bay; Said measurement bay connects track, and said measurement bay traffic direction is consistent with the silicon steel Width.
2. a kind of silicon steel Width thickness evenness pick-up unit according to claim 1 is characterized in that said measurement mechanism is the single-point gamma thickness gage.
3. a kind of silicon steel Width thickness evenness pick-up unit according to claim 1 and 2; It is characterized in that; Said pick-up unit also comprises measuring system platform, automatic analytical database and display screen, and said gamma thickness gage links to each other with display screen with said measuring system platform, automatic analytical database.
4. a kind of silicon steel Width thickness evenness pick-up unit according to claim 3 is characterized in that said measurement bay is a C shape measurement bay (1).
5. a kind of silicon steel Width thickness evenness pick-up unit according to claim 3; It is characterized in that; Be provided with analysis module in the said measuring system platform; Said analysis module can calculate maximal value, minimum value, the mean value of each measurement point of silicon steel Width thickness through logic analysis, and said measuring system platform links to each other with said display screen.
6. a kind of silicon steel Width thickness evenness pick-up unit according to claim 3; It is characterized in that; Said measuring system platform also comprises mobile control module; Mobile control module is controlled the predeterminated position that said C shape measurement bay (1) rests on the silicon steel Width respectively, and said measuring system platform links to each other with said control panel.
7. a silicon steel Width thickness evenness detection method is characterized in that,
The first step, single-point gamma thickness gage are installed on the C shape testing stand, and testing stand connects track;
In second step, on the silicon steel Width, preset uniformly-spaced measurement point of A, B, C, D, E, preset corresponding braking point on C type testing stand moving track;
In the 3rd step, C shape testing stand drives the operation of single-point gamma thickness gage silicon steel Width through track, wherein, and when measuring the A point; By " A " button, C shape measurement bay (1) moves to A point on control panel, move into place stop after, the pilot lamp warning; By " measurements " button, thicknessmeter is measured then, measure certain data after, press " stopping "; Cancellation is measured, and by that analogy, B, C, D, E point is measured;
The 4th step, move automatic analytical database, data change the volume reel number, just can show information such as thickness difference maximal value between the maximum thickness, minimum value, mean value, each measurement point of each measurement point, minimum value, mean value, reach graphic analyses;
The 5th step, press conclusion button, when the single-point gamma thickness gage quit work, C shape testing stand was left production line automatically through track.
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| Application Number | Priority Date | Filing Date | Title |
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| CN2012100753149A CN102706296A (en) | 2012-03-21 | 2012-03-21 | Detecting device and detecting method for thickness uniformity of silicon steel in width direction |
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| CN2012100753149A CN102706296A (en) | 2012-03-21 | 2012-03-21 | Detecting device and detecting method for thickness uniformity of silicon steel in width direction |
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| CN102706296A true CN102706296A (en) | 2012-10-03 |
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| CN2012100753149A Pending CN102706296A (en) | 2012-03-21 | 2012-03-21 | Detecting device and detecting method for thickness uniformity of silicon steel in width direction |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105606044A (en) * | 2016-03-11 | 2016-05-25 | 浙江工业大学 | Device being able to continuously detect thickness of steel belt on line |
| CN109029200A (en) * | 2018-08-01 | 2018-12-18 | 上海宝钢包装钢带有限公司 | A kind of off-line checking method of Varying-thickness Automobile Plate |
| CN112275807A (en) * | 2020-09-30 | 2021-01-29 | 首钢集团有限公司 | Method and device for detecting edge platform of hot-rolled strip steel profile |
Citations (4)
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|---|---|---|---|---|
| JPH0593617A (en) * | 1991-10-02 | 1993-04-16 | Permelec Electrode Ltd | Apparatus for continuously measuring thickness of foil |
| JPH09280847A (en) * | 1996-04-09 | 1997-10-31 | Nittetsu Elex Co Ltd | Thickness gage of radioactive rays |
| JP2001021335A (en) * | 1999-07-08 | 2001-01-26 | Mitsubishi Heavy Ind Ltd | Plate thickness measuring device for rolled line and its method |
| CN201455009U (en) * | 2009-04-27 | 2010-05-12 | 北京金自天正智能控制股份有限公司 | X-ray thickness gauge with automatic alloy compensation function |
-
2012
- 2012-03-21 CN CN2012100753149A patent/CN102706296A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0593617A (en) * | 1991-10-02 | 1993-04-16 | Permelec Electrode Ltd | Apparatus for continuously measuring thickness of foil |
| JPH09280847A (en) * | 1996-04-09 | 1997-10-31 | Nittetsu Elex Co Ltd | Thickness gage of radioactive rays |
| JP2001021335A (en) * | 1999-07-08 | 2001-01-26 | Mitsubishi Heavy Ind Ltd | Plate thickness measuring device for rolled line and its method |
| CN201455009U (en) * | 2009-04-27 | 2010-05-12 | 北京金自天正智能控制股份有限公司 | X-ray thickness gauge with automatic alloy compensation function |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105606044A (en) * | 2016-03-11 | 2016-05-25 | 浙江工业大学 | Device being able to continuously detect thickness of steel belt on line |
| CN109029200A (en) * | 2018-08-01 | 2018-12-18 | 上海宝钢包装钢带有限公司 | A kind of off-line checking method of Varying-thickness Automobile Plate |
| CN112275807A (en) * | 2020-09-30 | 2021-01-29 | 首钢集团有限公司 | Method and device for detecting edge platform of hot-rolled strip steel profile |
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Application publication date: 20121003 |