CN101988947A - Inline element testing system and method thereof - Google Patents
Inline element testing system and method thereof Download PDFInfo
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- CN101988947A CN101988947A CN2009101608653A CN200910160865A CN101988947A CN 101988947 A CN101988947 A CN 101988947A CN 2009101608653 A CN2009101608653 A CN 2009101608653A CN 200910160865 A CN200910160865 A CN 200910160865A CN 101988947 A CN101988947 A CN 101988947A
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Abstract
The invention relates to an inline element testing system and a method thereof, wherein the system comprises first testing equipment, second testing equipment, a loading and unloading module and an instrument driving module, wherein the first testing equipment is used for carrying out a first test, and the second testing equipment is used for carrying out a second test; the instrument driving module is used for loading and unloading elements to the first testing equipment and the second testing equipment through the loading and unloading module so as to control the exclusion time of element test of the first testing equipment and the second testing equipment so that the second testing equipment carries out the second test while the first testing equipment carries out the first test, and thus inline test operation on continuous and orderly tested elements is realized.
Description
Technical field
The present invention relates to a kind of test macro and method thereof, particularly relate to a kind of stagger load or the removal element in the time of two testing apparatuss, make pipeline element test system and the method thereof of two testing apparatuss with pipeline form executive component test jobs.
Background technology
In the prior art, manufacturer carries out a test jobs to each component under test after making component under test.
Please refer to Fig. 1, it is the block diagram of the element test system of prior art, and it is by an instrument driver module 11, a Test Host 12, a power meter (Power Meter; PM) 15 and one signal transceiver 16.Wherein, Test Host 12 connects instrument driver module 11, and sees through coupling mechanism 14 power meter 15 and signal transceiver 16 in succession.Power meter 15 is in order to the signal intensity of the signal (as Radio Frequency Signal, radiofrequency signal) that sends of detecting component under test 13 and the data stability of signal transmission.
In this explanation, signal transceiver 16 refers to the master sample element of a signal transmitting and receiving with standard, modulation, demodulation ability, in order to according to received signal, and according to signal transceiver 16 whether can be correct, complete, the wireless signal that sends of modulation or demodulation component under test 13, but the modularity of the signal of test component under test 13 outputs and the transmission usefulness of component under test 13, and the signal reception result offered Test Host 12, judge for Test Host 12 whether component under test 13 normally moves.
In the system of prior art, earlier with artificial or mechanical arm clamps component under test 13 to be loaded into a carrier of Test Host 12, as component under test 13 is tested chip when (or being called wafer), and carrier is for disposing the testing circuit board of chip pocket (Socket); Also or, when component under test 13 was a tested networking card, carrier was for disposing card slot (Slot).Coupling mechanism 14 is switched earlier to be communicated with Test Host 12 and power meter 15, and Test Host 12 is obtained a driver to set component under test 13 from instrument driver module 11, controls component under test 13 again and sends a measured signal to power meter 15.
Coupling mechanism 14 is switched to be communicated with Test Host 12 and signal transceiver 16 again, and Test Host 12 control components under test 13 send a test data.Signal transceiver 16 receives this test data, and the reception result of test data is returned to Test Host 12.Test Host 12 according to the reception result of obtaining to judge whether normal operation of component under test 13.
Learn that with regard to above-mentioned in the prior art, the cover same time of test macro only can be tested a component under test.Manufacturer increases production capacity the short time, how can set up identical test macro, with a plurality of components under test of disposable test.Yet, manufacturer whenever purchases a cover test macro, only is the element test line of setting up a component under test more, and the structure of the component under test that manufactures is all identical with the testing process that component under test carries out, be that the component under test testing efficiency has promoted, the testing cost that manufacturer paid also promotes relatively.Therefore, how to effectively reduce production cost, with the production capacity that promotes component under test, the problem that should think deeply for manufacturer.
This shows that above-mentioned existing test macro obviously still has inconvenience and defective, and demands urgently further being improved in product structure, method of testing and use.In order to solve the problem of above-mentioned existence, relevant manufacturer there's no one who doesn't or isn't seeks solution painstakingly, but do not see always that for a long time suitable design finished by development, and common product and method do not have appropriate structure and method to address the above problem, and this obviously is the problem that the anxious desire of relevant dealer solves.Therefore how to found a kind of new pipeline element test system and method thereof, real one of the current important research and development problem that belongs to, also becoming the current industry utmost point needs improved target.
Summary of the invention
The objective of the invention is to, overcome the defective that existing element test system exists, and a kind of new pipeline element test system and method thereof are provided, technical matters to be solved is to make it can reduce equipment cost, and keeps certain component under test testing efficiency.
The object of the invention to solve the technical problems realizes by the following technical solutions.According to a kind of pipeline element test system that the present invention proposes, it comprises: one first testing apparatus, in order to carrying out one first test, and export one first trigger pip when finishing in this first test; One second testing apparatus is in order to carry out one second test; One handling module; An and instrument driver module, be that this handling module of control loads one first element in this first testing apparatus, this first element is carried out this first test, and this instrument driver module is when obtaining this first trigger pip, controlling this handling module unloads this first element divided by being loaded into this second testing apparatus from this first testing apparatus, with this first element is carried out this second the test, and load one second element in this first testing apparatus with this second element is carried out this first the test.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid pipeline element test system, wherein when this second testing apparatus was carried out this second test to this first element, this first testing apparatus was carried out this first test to this second element, to reach parallel execution.
Aforesaid pipeline element test system, when wherein said second testing apparatus is finished this second test of this first element, be to send one second trigger pip, this instrument driver module is that this handling module of control is from this this first element of second testing apparatus removal.
Aforesaid pipeline element test system, wherein said instrument driver module judge this first testing apparatus finish to this second element this first the test, and when this second testing apparatus is not finished this second test of this first element, be that this second testing apparatus of wait is finished this second test to this first element, to control this first element of this handling module removal, control this handling module again from this this second element of first testing apparatus removal and be loaded into this second testing apparatus.
Aforesaid pipeline element test system, wherein said instrument driver module is to load a three element in this first testing apparatus, when this second testing apparatus is carried out this second test to this second element, this first testing apparatus is carried out this first test to this three element, to reach parallel execution.
Aforesaid pipeline element test system, wherein said instrument driver module comprises a plurality of drivers, and taking-up one program gives this first testing apparatus from described a plurality of drivers, sets the running parameter of this first element that is loaded or the running parameter of this second element that setting is loaded for this first testing apparatus.
Aforesaid pipeline element test system, wherein said this first testing apparatus comprises: one first main frame, connect this instrument driver module, when loading this first element, control this first element and export one first signal, and adjust at least one running parameter of this first element and output when obtaining one first revision program to this first trigger pip that should first element, and when loading this second element, control this second element and export a secondary signal, and adjust at least one running parameter of this second element and output when obtaining one second revision program to this first trigger pip that should second element; An and power meter, analyze this first signal to export one first signal intensity data, this instrument driver module provides this first revision program to this first main frame according to this first signal intensity data, and analyze this secondary signal to export a secondary signal intensity data, this instrument driver module provides this second revision program to this first main frame according to this secondary signal intensity data.
Aforesaid pipeline element test system, at least one running parameter of this of wherein said first element is selected from by this first element and exports at least one control setting value, an operating voltage, a working current of this first signal and the group that a running power is formed, and this at least one running parameter of this second element is selected from least one control setting value, an operating voltage, a working current and of exporting this secondary signal by this second element and operates the group that power is formed.
Aforesaid pipeline element test system, wherein said second testing apparatus comprises: one second main frame, connect this first main frame, when loading this first element, obtain this at least one running parameter of this first element and control this first element and export one first test data from this first main frame, and when loading this second element, obtain this at least one running parameter of this second element and control this second element and export one second test data from this first main frame, and obtain one first and determine whether this first element operates normally during data as a result, and obtain one second and determine whether this second element operates normally during data as a result; And a signal transceiver, receive this first test data with export this first as a result data to this second main frame, and receive this second test data with export this second as a result data to this second main frame.
The object of the invention to solve the technical problems also realizes by the following technical solutions.A kind of pipeline elements test method according to the present invention's proposition, be to use a pipeline element test system, this pipeline element test system comprises an instrument control module, a handling module, one first testing apparatus and one second testing apparatus, and this pipeline elements test method may further comprise the steps: control this handling module via this instrument driver module and load one first element in this first testing apparatus; This first testing apparatus is exported one first trigger pip after this first element is carried out one first test; When this instrument driver module is obtained this first trigger pip, control this first element of this handling module removal and be loaded into this second testing apparatus and carry out one second test, and load one second element and carry out this first test in this first testing apparatus; And when this second testing apparatus was carried out this second test to this first element, then this first testing apparatus was carried out this first test to this second element, to reach parallel execution.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid pipeline elements test method wherein also comprises following steps: this second testing apparatus finish to this first element carry out this second the test after, be output one second trigger pip; And when obtaining this second trigger pip, control this handling module from this this first element of second testing apparatus removal via this instrument driver module.
Aforesaid pipeline elements test method wherein also comprises following steps: after this first testing apparatus was carried out this first test to this second element, output was to this first trigger pip that should second element;
Obtain this first trigger pip that should second element when this instrument driver module, judge whether to obtain this second trigger pip that should first element; When this instrument driver module is obtained this first trigger pip that should second element but do not obtained this second trigger pip that should first element, be to return this to judge whether to obtain step to this second trigger pip that should first element; And when this instrument driver module is obtained this first trigger pip that should second element and obtained this second trigger pip that should first element, be that this handling module of control is from this this second element of first testing apparatus removal and be loaded into this second testing apparatus.
Aforesaid pipeline elements test method wherein also comprises following steps: via this second testing apparatus this second element is carried out this second test; Via this instrument driver module control this handling module load a three element to this first testing apparatus carry out this first the test; And this three element is carried out this first when test via this first testing apparatus, then this second testing apparatus is carried out this second test to reach parallel execution to this second element.
Aforesaid pipeline elements test method, this step that wherein said first testing apparatus is carried out this first test to this first element comprises: obtain one first program from this instrument driver module; Export one first signal according to this first element of this first programmed control; Utilize a power meter to analyze this first signal to export one first signal intensity data to this instrument driver module, this instrument driver module produces one first revision program according to this first signal intensity data; And obtain this first revision program to set at least one running parameter of this first element from this instrument driver module.
Aforesaid pipeline elements test method, this step that wherein said second testing apparatus is carried out this second test to this first element comprises: this at least one running parameter of obtaining this first element from this first testing apparatus; Control this first element and export one first test data; Utilize a signal transceiver to receive this first test data to produce one first data as a result; And according to this first as a result data determine whether this first element operates normally.
Aforesaid pipeline elements test method, the running parameter of wherein said first element are selected from by this first element and export at least one control setting value, an operating voltage, a working current of this first signal and the group that a running power is formed.
Aforesaid pipeline elements test method, this step that wherein said first testing apparatus is carried out this first test to this second element comprises: obtain one second program from this instrument driver module; Export a secondary signal according to this second element of this second programmed control; Analyze this secondary signal to export a secondary signal intensity data to this instrument driver module, this instrument driver module produces one second revision program according to this secondary signal intensity data; And obtain this second revision program to set at least one running parameter of this second element from this instrument driver module.
Aforesaid pipeline elements test method, this step that wherein said second testing apparatus is carried out this second test to this second element comprises: this at least one running parameter of obtaining this second element from this first testing apparatus; Control this second element and export one second test data; Utilize a signal transceiver to receive this second test data to produce one second data as a result; And whether operate normally according to this this second element of second analysis as a result.
Aforesaid pipeline elements test method, the running parameter of wherein said second element are selected from by this second element and export at least one control setting value, an operating voltage, a working current of this secondary signal and the group that a running power is formed.
The present invention compared with prior art has tangible advantage and beneficial effect.By technique scheme, pipeline element test system of the present invention and method thereof have following advantage and beneficial effect at least: the disclosed pipeline element test of the present invention System and method for, first testing apparatus is carried out the time of first test, and the time of carrying out second test with second testing apparatus forms parallel or synchronous.Therefore can in the time, test second test of n element and first test of n+1 element simultaneously by a pipeline element test system, with effective reduction equipment needed thereby, and the execution efficient of lifting component under test test.
Above-mentioned explanation only is the general introduction of technical solution of the present invention, for can clearer understanding technological means of the present invention, and can be implemented according to the content of instructions, and for above-mentioned and other purposes, feature and advantage of the present invention can be become apparent, below especially exemplified by preferred embodiment, and conjunction with figs., be described in detail as follows.
Description of drawings
Fig. 1 is the block diagram of the element test system of prior art.
Fig. 2 A is the configuration diagram of pipeline element test of the present invention system preferred embodiment.
Fig. 2 B is the block diagram of pipeline element test of the present invention system preferred embodiment.
Fig. 2 C is the element loading and unloading synoptic diagram of pipeline element test of the present invention system preferred embodiment.
Fig. 2 D is the parallel testing block diagram of pipeline element test of the present invention system preferred embodiment.
Fig. 3 is the process flow diagram of pipeline elements test method of the present invention preferred embodiment.
Fig. 4 A is a sequential chart of pipeline element test flow implementation example of the present invention.
Fig. 4 B is another sequential chart of pipeline element test flow implementation example of the present invention.
Fig. 5 A is second testing apparatus loading and unloading element decision flow chart in the pipeline elements test method of the present invention.
Fig. 5 B is first testing apparatus loading and unloading element decision flow chart in the pipeline elements test method of the present invention.
Fig. 6 is the schematic flow sheet of the test of first in the pipeline elements test method of the present invention.
Fig. 7 is the schematic flow sheet of the test of second in the pipeline elements test method of the present invention.
11: instrument driver module 12: Test Host
13: component under test 14: coupling mechanism
15: power meter 16: signal transceiver
20: instrument driver module 21: power meter
22: 31: the first main frames of signal transceiver
41: the second main frames of 32: the first carriers
51: the first elements of 42: the second carriers
53: the three element of 52: the second elements
60: handling module
Embodiment
Reach technological means and the effect that predetermined goal of the invention is taked for further setting forth the present invention, below in conjunction with accompanying drawing and preferred embodiment, pipeline element test system and its embodiment of method, structure, step, feature and effect thereof that foundation the present invention is proposed are elaborated.
Please be simultaneously with reference to shown in Fig. 2 A and Fig. 2 B, Fig. 2 A is the configuration diagram of pipeline element test of the present invention system preferred embodiment, Fig. 2 B is the block diagram of pipeline element test of the present invention system preferred embodiment.The pipeline element test system of preferred embodiment of the present invention comprises an instrument driver module 20, a handling module 60, one first testing apparatus and one second testing apparatus.
First testing apparatus comprises one first main frame 31 and a power meter 21, the second testing apparatuss comprise one second main frame 41 and a signal transceiver 22.First main frame 31 and second main frame 41 have separately in order to load first carrier 32 and second carrier 42 of component under test (Device Under Test), as component under test is tested chip when (or being called wafer), and first carrier 32 and second carrier 42 are for disposing the testing circuit board of chip pocket (Socket); Also or, when component under test was a tested networking card, first carrier 32 and second carrier 42 were for disposing card slot (Slot).Power meter 21 is the signal intensities in order to test component under test output signal.
In the present embodiment, the output signal of component under test is a radiofrequency signal (Radio FrequencySignal) but not as limit.Signal transceiver 22 is meant one according to received signal and the reaction that sends signal at this, adjust the setup parameter value that is suitable for this test jobs most, and the element master sample that carries out signal reception and transmission operation according to this setup parameter value, it has standardization, near the running parameter and the running status of desired quantity, mainly be in order to receiving the signal of component under test output, but and the signal accepting state of component under test output judge the signal transmission efficiency of component under test with to the output signal modularity.
As Fig. 2 A and Fig. 2 B, instrument driver module 20 is that control handling module 60 is loaded into first carrier 32 that first main frame 31 connects with one first element 51.When first main frame, 31 detectings, first element 51 has been loaded, can obtain one first program to drive, to set and control first element 51 from instrument driver module 20.
First main frame 31 is that control first element 51 sends one first signal, this first signal is received by power meter 21, power meter 21 is signal intensities of analyzing first signal, producing one first signal intensity data, and transmits the first signal intensity data to instrument driver module 20.Instrument driver module 20 is to provide one first revision program to adjust at least one running parameter of first element 51 according to first revision program to first main frame, 31, the first main frames 31 according to the first signal intensity data.The running parameter of first element 51 is to be selected from the group that is made up of at least one control setting value, an operating voltage, a working current and a running power of first element, 51 outputs, first signal.
Please be simultaneously with reference to Fig. 2 C and Fig. 2 D, Fig. 2 C is that the element of pipeline element test of the present invention system preferred embodiment loads and unloads synoptic diagram, Fig. 2 D is the parallel testing block diagram of pipeline element test of the present invention system preferred embodiment.When first main frame 31 judges that first element 51 has been finished first test, be that output one first trigger pip is to instrument driver module 20.Instrument driver module 20 is to judge that first element 51 finished testedly, from the first testing apparatus removal, first element 51 and be loaded into second testing apparatus, and loads one second element 52 in first testing apparatus with control handling module 60.Further specify, promptly be instrument driver module 20 control handling modules 60 from first carrier, 32 removals, first element 51, loading first element 51, and load second element 52 in first carrier 32 in second carrier 42.
When second main frame, 41 detectings, first element 51 had been loaded, second main frame 41 was running parameters of obtaining first element 51 from first main frame 31, to control first element, 51 outputs, one first test data.
This first test data is received by signal transceiver 22, as previously mentioned.Signal transceiver 22 is an element master sample, has standardized running parameter and signal transmitting and receiving pattern.After signal transceiver 22 receives first test data, the reception result that is about to first test data forms one first data as a result, this first as a result data can be transferred into first main frame 31, and transfer to second main frame 41 by first main frame 31, second main frame 41 promptly according to this first as a result data determine whether the running of first element 51 normal, promptly finish of second test of second testing apparatus to first element 51.When second testing apparatus was finished second test of first element 51, second main frame was to send one second trigger pip to instrument driver module 20, and instrument driver module 20 can be from second carrier, 42 removals, first element 51.So far finish the global test of test first element 51.
When second testing apparatus is carried out second test period to first element 51, first main frame 31 is detecting second elements 52 when being loaded on first carrier 32, and first main frame 31 can be obtained one second program to drive, to set and to control second element 52 from instrument driver module 20.In this explanation, in the present embodiment, first element 51 and second element 52 are components under test of same architecture, function, are identical so instrument driver module 20 provides first program with second program.
First main frame 31 is that control second element 52 sends a secondary signal, this secondary signal is received by power meter 21, power meter 21 is signal intensities of analyzing secondary signal, and producing a secondary signal intensity data, and transmission secondary signal intensity data is to instrument driver module 20.Instrument driver module 20 is to provide one second revision program to adjust at least one running parameter of second element 52 according to second revision program to first main frame, 31, the first main frames 31 according to secondary signal intensity data.The running parameter of second element 52 is to be selected from the group that is made up of in order at least one control setting value, an operating voltage, a working current and a running power of output secondary signal first element 51.
After first main frame 31 is finished first test to second element 52, promptly send first trigger pip of corresponding second element 52.Instrument driver module 20 is to control handling module 60 from the first testing apparatus removal, second element 52, and is loaded into second testing apparatus.When a three element 53 exists, instrument driver module 20 is to load three element 53 in first testing apparatus, second testing apparatus can be carried out second test to second element 52, then first testing apparatus is carried out first test to three element 53, tests with first test and second of second element 52 of reaching parallel execution three element 53.
In this hypothesis, the time of time ratio first test of second test is when long, judge first testing apparatus when instrument driver module 20 and finish first test second element 52, second testing apparatus is not finished second when test to first element 51 (obtain first trigger pip but do not obtain second trigger pip), instrument driver module 20 meeting waits second testing apparatus is finished second test (promptly obtaining second trigger pip) to first element 51, with control handling module 60 removals first element 51, control handling module 60 again from the first testing apparatus removal, second element 52 and be loaded into second testing apparatus.
In like manner, judging first testing apparatus when instrument driver module 20 finishes three-element first test, and second testing apparatus is not finished second when test to second element 52 (obtain first trigger pip but do not obtain second trigger pip), instrument driver module 20 meeting waits second testing apparatus is finished second test (promptly obtaining second trigger pip) to second element 52, with control handling module 60 removals second element 52, control handling module 60 again from the first testing apparatus removal three element 53 and be loaded into second testing apparatus.
Learn that thus instrument driver module 20 judges that first testing apparatus finished first test, but second testing apparatus is still when carrying out second test, needs to wait for that second test is finished carries out the operation of element removal again.
Opposite hypothesis, the time of time ratio first test of second test is short.When instrument driver module 20 judged that second testing apparatus is finished second test to first element 51, instrument driver module 20 can control handling modules 60 removals first element 51.Then first testing apparatus is finished first when test to second element 52, second testing apparatus has been finished second test to first element 51, instrument driver module 20 can be after first element 51 be finished removal, and control handling module 60 is from the first testing apparatus removal, second element 52 and be loaded into second testing apparatus.
In like manner, when instrument driver module 20 judged that second testing apparatus is finished second test to second element 52, instrument driver module 20 can control handling modules 60 removals second element 52.Then first testing apparatus is finished first when test to three element 53, second testing apparatus has been finished second test to second element 52, instrument driver module 20 can be after second element 52 be finished removal, and control handling module 60 is from the first testing apparatus removal three element 53 and be loaded into second testing apparatus.
So far learn, second testing apparatus is carried out the action of second test, carry out first action of testing with first testing apparatus, be to form parallel execution, in the time, simultaneously the testing element of two consecutive orders is carried out different test events by a pipeline element test system,, and keep the execution efficient that component under test is to a certain degree tested with effective reduction equipment needed thereby.
Please refer to Fig. 3, it is for the process flow diagram of pipeline elements test method of the present invention preferred embodiment, please be beneficial to understand with reference to Fig. 4 A or Fig. 4 B simultaneously, Fig. 4 A is an example of the pipeline element test flow process sequential chart of the embodiment of the invention, Fig. 4 B is another example of the pipeline element test flow process sequential chart of the embodiment of the invention, and among Fig. 4 A, the time of first test is higher than the execution time of second test, among Fig. 4 B, the time of first test is lower than the execution time of second test.Pipeline element test flow process shown in Figure 3 is to be applied to the pipeline element test system shown in Fig. 2 A and Fig. 2 B.This pipeline elements test method comprises:
Load one first element 51 in first testing apparatus (step S110) via instrument driver module 20 control handling modules 60.
In the present embodiment, the flow gauge that is subjected to each element is divided into several operations.Suppose that the time that handling module loads component under test to the first testing apparatus is 8 seconds, from time of the second testing apparatus removal component under test also be 8 seconds, component under test was all 8 seconds from the first testing apparatus removal and time of being loaded into second testing apparatus.Among Fig. 4 A, the time that first testing apparatus is carried out first test is 32.8 seconds, and the time that second testing apparatus is carried out second test is 21.2 seconds.Among Fig. 4 B, the time that first testing apparatus is carried out first test is 21.2 seconds, and the time that second testing apparatus is carried out second test is 32.8 seconds.
As Fig. 4 A and Fig. 4 B, during from 0 second, instrument driver module 20 is that control handling module 60 loads first carrier 32 that first element, 51 to first main frames 31 are connected, and finishes the loading operation of first element 51 about 8 seconds.Yet more accurate for making the activity duration, first main frame 31 can be in detecting arbitrary component under test when being loaded on first carrier 32, and export one first alert signal prompting instrument driver module 20: element has been loaded and has finished.
First testing apparatus is exported one first trigger pip (step S120) after first element 51 is carried out one first test.
Shown in Fig. 4 A and Fig. 4 B, first main frame 31 can begin first test to first element 51 in the time of 8 seconds.First main frame 31 can be informed the specification of first element 51 that instrument driver module 20 is loaded, to obtain first program that instrument driver module 20 provides.First main frame 31 can be according at least one running parameter of first program setting, first element 51, to begin that first element 51 is carried out first test.First main frame 31 can be exported first trigger pip to instrument driver module 20 after first test is finished.
When instrument driver module 20 is obtained first trigger pip, control handling module removal first element 51 and be loaded into second testing apparatus and carry out one second test, and load one second element 52 and carry out this first test (step S130) in first testing apparatus.
With regard to Fig. 4 A, first test duration needed 32.8 seconds time, so instrument driver module 20 can be obtained first trigger pip in the time of 40.8 seconds.At this moment, instrument driver module 20 can control handling modules 60 from first carrier 32 with first element, 51 removals (unload) to load (load) in second carrier 42 that second main frame 41 connects, load first carrier 32 that one second element 52 connects in first main frame 31 again.
With regard to Fig. 4 B, first test duration needed 21.8 seconds time, so instrument driver module 20 can be obtained first trigger pip in the time of 29.2 seconds.
Second testing apparatus is loaded in first element and carries out one second test (step S140) when finishing.Learn from Fig. 4 A, handling module 60 with first element 51 from first carrier, 32 removals, and the time that is loaded into second carrier 42 need 8 seconds.Therefore to finish the time that is loaded into second carrier 42 be 48.8 seconds to first element 51, and second main frame 41 detects first element 51 and was all 48.8 seconds by the complete time that is loaded into second carrier 42.Therefore, second main frame 41 can begin at 48.8 seconds first element 51 is carried out second test, and finishes at 70.0 seconds.
About 48.8 seconds, instrument driver module 20 can be controlled handling module 60 and load one second element 52 in first carrier 32 after first element, 51 loadings be finished immediately, and second element 52 can be loaded about 56.8 seconds to be finished.
Learn that from Fig. 4 B it is about 37.2 seconds that first element 51 is finished the time that is loaded into second carrier 42, be all about 37.2 seconds by the complete time that is loaded into second carrier 42 and second main frame 41 detects first element 51.Therefore, second main frame 41 can begin at 37.2 seconds first element 51 is carried out second test, and finishes at 70.0 seconds.
In the time of 37.2 seconds, instrument driver module 20 can be controlled handling module 60 and load one second element 52 in first carrier 32 after first element, 51 loadings be finished immediately, and second element 52 can be loaded at 45.2 seconds and finish.
Yet more accurate for making the activity duration, second main frame 41 can be in detecting any component under test when being loaded on second carrier 42, exports one second alert signal prompting instrument driver module, 20 elements and be loaded and finish.
When second testing apparatus was carried out one second test to first element 51, then first testing apparatus was carried out first test to second element 52, to reach parallel execution (step S150).
Learn that from Fig. 4 A second element 52 can be loaded at 56.8 seconds and finish, first testing apparatus can begin test at 56.8 seconds second element 52 is carried out first test, and finishes at 89.6 seconds.
Learn that from Fig. 4 B second element 52 can be loaded about 45.2 seconds to be finished, first testing apparatus can begin test at 45.2 seconds second element 52 is carried out first test, and finishes at 66.4 seconds.Second testing apparatus is carried out one second action of testing to first element 51, and the action of second element 52 being carried out first test with first testing apparatus is to form parallel execution.
When execution second test was finished in 41 judgements of second main frame to first element 51 after, second main frame 41 can output one second trigger pip.When instrument driver module 20 was obtained second trigger pip, instrument driver module 20 was preferentially to control removal module 60 from the second testing apparatus removal, first element 51.
Please be simultaneously with reference to Fig. 5 A and Fig. 5 B, Fig. 5 A is second testing apparatus loading and unloading element process flow diagram of pipeline elements test method of the present invention preferred embodiment, and Fig. 5 B is second testing apparatus loading and unloading element process flow diagram of pipeline elements test method of the present invention preferred embodiment.Cooperative figure 4A and Fig. 4 B are beneficial to understand simultaneously.These loading and unloading operation be by instrument driver module 20 judge execution, the second testing apparatus removal element mode is shown in Fig. 5 A:
When second testing apparatus finish first element carried out one second test after, be output one second trigger pip (step S201).Instrument drives 20 groups of moulds when obtaining this second trigger pip, and control handling module 60 is from the second testing apparatus removal, first element (step S202).
On behalf of second testing apparatus, this two step promptly inform that instrument driver module 20 finishes second test of first element 51, please 20 pairs first elements of instrument driver module 51 carry out the operation of element removal, promptly finishes the global test operation of first element 51.With regard to Fig. 4 A and Fig. 4 B, second testing apparatus can be asked instrument driver module 20 removals first element 51 in the time of 70 seconds, and removal is finished in the time of 78 seconds.
On the other hand, the first testing apparatus removal element mode is shown in Fig. 5 B:
When instrument driver module 20 is obtained first trigger pip of corresponding second element 52, be second trigger pip (step S210) that judges whether to obtain corresponding first element 51.
Obtain first trigger pip of corresponding second element 52 when instrument driver module 20, can learn first testing apparatus finished to second element 52 first the test, and judge whether to obtain earlier second trigger pip of corresponding first element 51, whether finish second test to judge second testing apparatus to first element 51.
When instrument driver module 20 is obtained first trigger pip of corresponding second element 52, but when not obtaining second trigger pip of corresponding first element 51, promptly represent second testing apparatus not finish second test to first element 51.At this moment, instrument driver module 20 can be to any steering order of handling module 60 outputs, and handling module 60 is to be in to stop situation.Instrument driver module 20 can continue to judge whether to obtain second trigger pip of corresponding first element 51.In this explanation, these types are the test duration test macros longer than the test duration of first test that are applied to second test.Shown in Fig. 4 B, second element was finished the time of first test at 66.4 seconds, instrument driver module 20 is not obtained second trigger pip of corresponding first element 51 as yet, so can not do any action, after obtaining second trigger pip of first element 51 in 70 seconds, and after first element 51 is done removal, in the time of promptly 78.0 seconds, controls handling module 60 again and load second element, 52 to second testing apparatuss.
When instrument driver module 20 is obtained first trigger pip of corresponding second element 52 and has been obtained second trigger pip of corresponding first element 51, be control handling module 60 from the first testing apparatus removal, second element 52 and be loaded into second testing apparatus, via second testing apparatus second element 52 is carried out second test (step S220).As Fig. 4 A, when instrument driver module 20 was obtained second trigger pip of corresponding first element 51 at 70.0 seconds, represent second testing apparatus to finish second test of execution before, instrument driver module 20 can be after the element removal operation of finishing second testing apparatus, in the time of promptly 89.6 seconds, control handling module 60 with second element 52 from the first testing apparatus removal and be loaded into second testing apparatus.
When a three element existed, instrument driver module 20 can load three element to the first testing apparatus during second test execution by control handling module 60, for first testing apparatus three element 53 is carried out first test (step S230).
Yet when second testing apparatus was carried out second test to second element 52, first testing apparatus was carried out first action of testing to three element 53, to reach parallel execution.
Please refer to Fig. 6, it is to describe with first element 51 at this, but is applicable to the component under test that respectively is loaded into first testing apparatus for the schematic flow sheet of first test of pipeline elements test method of the present invention preferred embodiment.The method comprises:
First testing apparatus obtains one first program (step S121) from instrument driver module 20, to drive, to set and to control first element 51 by first program.
First testing apparatus is controlled first element, 51 outputs, one first signal (step S122).First main frame 31 is the running parameter according to first program setting, first element 51 after obtaining first program, and controls first element, 51 outputs, one first signal.
Utilize a power meter 21 to analyze first signal to export one first signal intensity data to instrument driver module 20, instrument driver module 20 is to produce one first revision program (step S123) according to the first signal intensity data.
In this explanation, instrument driver module 20 is the optimal operation data with first element 51, instrument driver module 20 can with the first signal intensity data therewith the optimal operation data compare, determine the running parameter that first element 51 is more suitable, adjust first program according to this running parameter and form first revision program, export to first main frame 31 again.
First testing apparatus obtains first revision program from instrument driver module 20, to set at least one running parameter (step S124) of first element 51, adjusts the running parameter of first element 51 again according to first revision program.
The running parameter of first element 51 is to be selected from the group that is made up of at least one control setting value, an operating voltage, a working current and a running power of first element, 51 outputs, first signal.
Please refer to Fig. 7, it is to describe with first element 51 at this, but is applicable to the component under test that respectively is loaded into second testing apparatus for the schematic flow sheet of second test of pipeline elements test method of the present invention preferred embodiment.The method comprises:
Second testing apparatus obtains at least one running parameter (step S141) of first element 51 from first testing apparatus.The reason that obtains the running parameter of first element 51 from first testing apparatus has two, one to be that second main frame 41 can identical controlled variable be controlled first element 51 and carried out work; Another person is, obtains all data of first element 51 from first main frame 31, and right to carry out the data matching ratio, the running parameter of avoiding second main frame 41 to use other component under test is controlled first element 51.
Second testing apparatus is controlled first element, 51 outputs, one first test data (step S142).Second main frame 41 is to set and control first element, 51 outputs, first test data according to above-mentioned running parameter.
Utilize a signal transceiver 22 to receive first test data to produce one first data (step S143) as a result.As previously mentioned, signal transceiver 22 itself is exactly the element master sample of standard specification, signal transceiver 22 produces first data as a result according to the reception situation of first test data when obtaining this first test data, first as a result data can be given second main frame 41 by passback.
Second testing apparatus according to first as a result data determine whether first element 51 operates normal (step S144).Second main frame 41 obtains first as a result during data, its first test data with output can be compared, but to judge whether first element 51 is the element of normal operation.With regard to time flow shown in Fig. 4 A or Fig. 4 B, so far, the total test jobs of first element 51 is finished, and is finished in 70 seconds.
In like manner, second element 52 in two the test the following explanations of flow process:
First testing apparatus obtains one second program from instrument driver module 20, to drive, to set and to control second element 52 by second program.First main frame 31 is the running parameter according to second program setting, second element 52 after obtaining second program, and controls second element, 52 outputs, one secondary signal.
Second testing apparatus obtains first revision program from instrument driver module 20, to set at least one running parameter of second element 52, adjusts the running parameter of second element 52 again according to second revision program.The running parameter of second element 52 is to be selected from the group that is made up of at least one control setting value, an operating voltage, a working current and a running power of second element, 52 output secondary signals.
After second element 52 was loaded on second testing apparatus, second testing apparatus obtained at least one running parameter of second element 52 from first testing apparatus.Second main frame 41 is to set and control second element, 52 outputs, second test data according to above-mentioned running parameter.
Second main frame 41 obtains second as a result during data, its second test data with output can be compared, but to judge whether second element 52 is the element of normal operation.With regard to flow process shown in Fig. 4 A or Fig. 4 B, so far, the total test jobs of second element 52 is finished, and is finished in 118.8 seconds.
Learn from Fig. 4, instrument driver module 20 is that loading member is interspersed in the time that second testing apparatus is carried out second test in the time of first testing apparatus, to be interspersed in first testing apparatus from the time of the second testing apparatus removal element and carry out the time of first test, and the time that will shift loading member is interspersed in the neutral gear of the time and second time of testing of first test.
With regard to present embodiment, the execution time of pipeline component test equipment is divided into a plurality of identical chronomeres, carry out first of first testing apparatus separately in very first time unit and test, carry out separately outside second test of second testing apparatus with last chronomere.In unit At All Other Times, each chronomere is synchronously or second test of first test of parallel execution first testing apparatus and second testing apparatus, makes the behavioral test that can finish a plurality of components under test in the chronomere in fact.
With regard to Fig. 4 A, each time interval is about 48.8 seconds.In the time of 0 second to 8 seconds, finish first element 51 and be loaded into first testing apparatus, finished first test of first element 51 at 8 seconds to 40.8 seconds.And during 40.8 seconds to 48.8 seconds, first element 51 shifts from first testing apparatus and is loaded into second testing apparatus, and at this moment, first chronomere finishes.
48.8 during second, second testing apparatus began second test of first element 51, finished second test of first element 51 to 70.0 seconds, and finished the removal of first element 51 in 78 seconds.Second element 52 can be finished the action that is loaded on first testing apparatus during 48.8 seconds to 56.8 seconds, first testing apparatus was to begin in 56.8 seconds second element 52 is carried out first test, finished first test to second element 52 at 89.6 seconds.And during 89.6 seconds to 97.6 seconds, second element 52 is to finish to be transferred to be loaded into second testing apparatus, and at this moment, second chronomere finishes.And second chronomere starts at, and each chronomere meets first test of above-mentioned parallel execution first testing apparatus and second test of second testing apparatus.
With regard to Fig. 4 B, except that first time interval is 37.2 seconds, other the time interval is about 40.8 seconds.In the time of 0 second to 8 seconds, finish first element 51 and be loaded into first testing apparatus, finished first test of first element 51 at 8 seconds to 29.2 seconds.And during 29.2 seconds to 37.2 seconds, first element 51 shifts from first testing apparatus and is loaded into second testing apparatus, and at this moment, first chronomere finishes.
37.2 during second, second testing apparatus began second test of first element 51, finished second test of first element 51 to 70.0 seconds, and finished the removal of first element 51 in 78 seconds.Second element 52 can be finished the action that is loaded on first testing apparatus during 37.2 seconds to 45.2 seconds, first testing apparatus was to begin in 45.2 seconds second element 52 is carried out first test, finished first test to second element 52 at 66.4 seconds.But first element was just finished removal at 78.0 seconds, so during 78.0 seconds to 86.0 seconds, second element 52 just can be transferred and be loaded into second testing apparatus, at this moment, second chronomere finishes.And second chronomere starts at, and each chronomere meets first test of above-mentioned parallel execution first testing apparatus and second test of second testing apparatus.
Learn that from Fig. 4 A and Fig. 4 B it is 78 seconds that each component under test is finished the tested time, with two components under test, general element test system needs 156 seconds.And pipeline elements test method and system that the present invention discloses, the tested time of two components under test only needs 126.8 seconds, shortens 30 seconds nearly.With four components under test, general element test system needs 316 seconds, and pipeline elements test method and system that the present invention discloses, the tested time of four components under test only needs 224.6 seconds, shortens 92 seconds nearly.
Therefore, component under test is many more, can shorten in fact than the general more test duration of element test system.And need not to set up hardware device, effectively reduce the equipment needed thereby cost really, and keep the execution efficient of component under test test to a certain degree.
The above, it only is preferred embodiment of the present invention, be not that the present invention is done any pro forma restriction, though the present invention discloses as above with preferred embodiment, yet be not in order to limit the present invention, any those skilled in the art, in not breaking away from the technical solution of the present invention scope, when the method that can utilize above-mentioned announcement and technology contents are made a little change or be modified to the equivalent embodiment of equivalent variations, in every case be the content that does not break away from technical solution of the present invention, according to technical spirit of the present invention to any simple modification that above embodiment did, equivalent variations and modification all still belong in the scope of technical solution of the present invention.
Claims (10)
1. pipeline element test system is characterized in that comprising:
One first testing apparatus is tested in order to carry out one first, and exports one first trigger pip when finishing in this first test;
One second testing apparatus is in order to carry out one second test;
One handling module; And
One instrument driver module, be that this handling module of control loads one first element in this first testing apparatus, this first element is carried out this first test, and this instrument driver module is when obtaining this first trigger pip, controlling this handling module unloads this first element divided by being loaded into this second testing apparatus from this first testing apparatus, with this first element is carried out this second the test, and load one second element in this first testing apparatus with this second element is carried out this first the test.
2. pipeline element test according to claim 1 system is characterized in that wherein when this second testing apparatus was carried out this second test to this first element, this first testing apparatus was carried out this first test to this second element, to reach parallel execution.
3. pipeline element test according to claim 1 system, it is characterized in that wherein said second testing apparatus finishes this second when test to this first element, send one second trigger pip, this instrument driver module is that this handling module of control is from this this first element of second testing apparatus removal, judge this first testing apparatus when described instrument driver module and finish this first test this second assembly, and when this second testing apparatus is not finished this second test of this first assembly, be that this second testing apparatus of wait is finished this second test to this first assembly, to control this first assembly of this handling module removal, control this handling module again from this this second assembly of first testing apparatus removal and be loaded into this second testing apparatus, described afterwards instrument driver module also loads a three element in this first testing apparatus, when this second testing apparatus is carried out this second test to this second element, this first testing apparatus is carried out this first test to this three element, to reach parallel execution.
4. pipeline element test according to claim 1 system, it is characterized in that wherein said instrument driver module comprises a plurality of drivers, and taking-up one program gives this first testing apparatus from described a plurality of drivers, sets the running parameter of this first element that is loaded or the running parameter of this second element that setting is loaded for this first testing apparatus.
5. pipeline element test according to claim 4 system is characterized in that wherein said this first testing apparatus comprises:
One first main frame, connect this instrument driver module, when loading this first element, control this first element and export one first signal, and adjust at least one running parameter of this first element and output when obtaining one first revision program to this first trigger pip that should first element, and when loading this second element, control this second element and export a secondary signal, and adjust at least one running parameter of this second element and output when obtaining one second revision program to this first trigger pip that should second element; And
One power meter, analyze this first signal to export one first signal intensity data, this instrument driver module provides this first revision program to this first main frame according to this first signal intensity data, and analyze this secondary signal to export a secondary signal intensity data, this instrument driver module provides this second revision program to this first main frame according to this secondary signal intensity data.
6. pipeline element test according to claim 5 system is characterized in that wherein said second testing apparatus comprises:
One second main frame, connect this first main frame, when loading this first element, obtain this at least one running parameter of this first element and control this first element and export one first test data from this first main frame, and when loading this second element, obtain this at least one running parameter of this second element and control this second element and export one second test data from this first main frame, and obtain one first and determine whether this first element operates normally during data as a result, and obtain one second and determine whether this second element operates normally during data as a result; And
One signal transceiver, receive this first test data with export this first as a result data to this second main frame, and receive this second test data with export this second as a result data to this second main frame.
7. pipeline elements test method, be to use a pipeline element test system, this pipeline element test system comprises an instrument control module, a handling module, one first testing apparatus and one second testing apparatus, it is characterized in that this pipeline elements test method may further comprise the steps:
Control this handling module via this instrument driver module and load one first element in this first testing apparatus;
This first testing apparatus is exported one first trigger pip after this first element is carried out one first test;
When this instrument driver module is obtained this first trigger pip, control this first element of this handling module removal and be loaded into this second testing apparatus and carry out one second test, and load one second element and carry out this first test in this first testing apparatus; And
When this second testing apparatus was carried out this second test to this first element, then this first testing apparatus was carried out this first test to this second element, to reach parallel execution.
8. pipeline elements test method according to claim 7 is characterized in that wherein also comprising following steps:
This second testing apparatus finish to this first element carry out this second the test after, be output one second trigger pip; And
When obtaining this second trigger pip, control this handling module from this this first element of second testing apparatus removal via this instrument driver module.
9. pipeline elements test method according to claim 8 is characterized in that wherein also comprising following steps:
After this first testing apparatus was carried out this first test to this second element, output was to this first trigger pip that should second element;
Obtain this first trigger pip that should second element when this instrument driver module, judge whether to obtain this second trigger pip that should first element;
When this instrument driver module is obtained this first trigger pip that should second element but do not obtained this second trigger pip that should first element, be to return this to judge whether to obtain step to this second trigger pip that should first element; And
When this instrument driver module is obtained this first trigger pip that should second element and obtained this second trigger pip that should first element, be that this handling module of control is from this this second element of first testing apparatus removal and be loaded into this second testing apparatus.
10. pipeline elements test method according to claim 9 is characterized in that wherein also comprising following steps:
Via this second testing apparatus this second element is carried out this second test;
Via this instrument driver module control this handling module load a three element to this first testing apparatus carry out this first the test; And
When via this first testing apparatus this three element being carried out this first test, then this second testing apparatus is carried out this second test to reach parallel execution to this second element.
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| KR100857911B1 (en) * | 2007-02-01 | 2008-09-10 | 미래산업 주식회사 | Sorting Apparatus for Semiconductor Test Handler and Sorting Method |
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