CH7232A - New aneroid barometer - Google Patents
New aneroid barometerInfo
- Publication number
- CH7232A CH7232A CH7232A CH7232DA CH7232A CH 7232 A CH7232 A CH 7232A CH 7232 A CH7232 A CH 7232A CH 7232D A CH7232D A CH 7232DA CH 7232 A CH7232 A CH 7232A
- Authority
- CH
- Switzerland
- Prior art keywords
- new
- aneroid barometer
- aneroid
- barometer
- new aneroid
- Prior art date
Links
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH7232T | 1893-08-20 |
Publications (1)
Publication Number | Publication Date |
---|---|
CH7232A true CH7232A (en) | 1894-02-15 |
Family
ID=4193667
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CH7232A CH7232A (en) | 1893-08-20 | 1893-08-20 | New aneroid barometer |
Country Status (1)
Country | Link |
---|---|
CH (1) | CH7232A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2591666A (en) * | 1948-10-20 | 1952-04-08 | Walter H Barkas | Interferometer gauge |
US2629283A (en) * | 1951-03-13 | 1953-02-24 | Theodor W Zobel | Interference schlieren apparatus of unusually large dimensions, having means for improving the interference quality by selective one point deformation of the reflecting elements of the device |
US2743645A (en) * | 1952-08-20 | 1956-05-01 | Johansson Ab C E | Interferometric apparatus for examining the structure of reflecting surfaces |
US2995923A (en) * | 1951-12-20 | 1961-08-15 | Leitz Ernst Gmbh | Method and apparatus for measuring the thickness of adsorption layers of liquid formed between two glass surfaces |
-
1893
- 1893-08-20 CH CH7232A patent/CH7232A/en unknown
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2591666A (en) * | 1948-10-20 | 1952-04-08 | Walter H Barkas | Interferometer gauge |
US2629283A (en) * | 1951-03-13 | 1953-02-24 | Theodor W Zobel | Interference schlieren apparatus of unusually large dimensions, having means for improving the interference quality by selective one point deformation of the reflecting elements of the device |
US2995923A (en) * | 1951-12-20 | 1961-08-15 | Leitz Ernst Gmbh | Method and apparatus for measuring the thickness of adsorption layers of liquid formed between two glass surfaces |
US2743645A (en) * | 1952-08-20 | 1956-05-01 | Johansson Ab C E | Interferometric apparatus for examining the structure of reflecting surfaces |
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