CH523500A - Einrichtung zur Überwachung einer Materialbahn - Google Patents

Einrichtung zur Überwachung einer Materialbahn

Info

Publication number
CH523500A
CH523500A CH565071A CH565071A CH523500A CH 523500 A CH523500 A CH 523500A CH 565071 A CH565071 A CH 565071A CH 565071 A CH565071 A CH 565071A CH 523500 A CH523500 A CH 523500A
Authority
CH
Switzerland
Prior art keywords
monitoring
material web
web
Prior art date
Application number
CH565071A
Other languages
English (en)
Inventor
Tapio Tirkkonen Erkki
Original Assignee
Datex Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Datex Oy filed Critical Datex Oy
Publication of CH523500A publication Critical patent/CH523500A/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems

Landscapes

  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Paper (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CH565071A 1970-04-20 1971-04-19 Einrichtung zur Überwachung einer Materialbahn CH523500A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI109570A FI45797C (fi) 1970-04-20 1970-04-20 Materiaalirainojen säteilymittauslaite.

Publications (1)

Publication Number Publication Date
CH523500A true CH523500A (de) 1972-05-31

Family

ID=8505091

Family Applications (1)

Application Number Title Priority Date Filing Date
CH565071A CH523500A (de) 1970-04-20 1971-04-19 Einrichtung zur Überwachung einer Materialbahn

Country Status (6)

Country Link
CA (1) CA932976A (de)
CH (1) CH523500A (de)
DE (1) DE2119062A1 (de)
FI (1) FI45797C (de)
FR (1) FR2089925A5 (de)
GB (1) GB1352043A (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3336659A1 (de) * 1982-10-12 1984-04-12 Sentrol Systems Ltd., Downsview, Ontario Feuchtigkeitsmessgeraet zum messen des feuchtigkeitsgehalts einer laufenden materialbahn
DE10305598A1 (de) * 2003-02-11 2004-08-19 Voith Paper Patent Gmbh Messverfahren und Messeinrichtung zur Bestimmung des Feuchtigkeitsgehaltes einer Materialbahn

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4785336A (en) * 1986-12-04 1988-11-15 Libbey-Owens-Ford Co. Device for monitoring characteristics of a film on a substrate
US5019710A (en) * 1989-03-30 1991-05-28 Measurex Corporation Optical system for detecting properties of traveling sheet materials
FI120053B (fi) 2000-12-22 2009-06-15 Metso Automation Oy Menetelmä ja laitteisto liikkuvan paperirainan kosteusprofiilin säätämiseksi

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3336659A1 (de) * 1982-10-12 1984-04-12 Sentrol Systems Ltd., Downsview, Ontario Feuchtigkeitsmessgeraet zum messen des feuchtigkeitsgehalts einer laufenden materialbahn
DE10305598A1 (de) * 2003-02-11 2004-08-19 Voith Paper Patent Gmbh Messverfahren und Messeinrichtung zur Bestimmung des Feuchtigkeitsgehaltes einer Materialbahn

Also Published As

Publication number Publication date
FI45797C (fi) 1972-09-11
GB1352043A (en) 1974-05-15
DE2119062A1 (de) 1971-12-23
FR2089925A5 (de) 1972-01-07
CA932976A (en) 1973-09-04
FI45797B (de) 1972-05-31

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Legal Events

Date Code Title Description
PL Patent ceased